DLA SMD-5962-90838 REV D-2008 MICROCIRCUIT HYBRID LINEAR HIGH CURRENT HIGH POWER DUAL OPERATIONAL AMPLIFIER MONOLITHIC SILICON《单片微电路混合线性高电流大功率二运算放大器》.pdf

《DLA SMD-5962-90838 REV D-2008 MICROCIRCUIT HYBRID LINEAR HIGH CURRENT HIGH POWER DUAL OPERATIONAL AMPLIFIER MONOLITHIC SILICON《单片微电路混合线性高电流大功率二运算放大器》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-90838 REV D-2008 MICROCIRCUIT HYBRID LINEAR HIGH CURRENT HIGH POWER DUAL OPERATIONAL AMPLIFIER MONOLITHIC SILICON《单片微电路混合线性高电流大功率二运算放大器》.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 02, case outline Y, and vendor CAGE 51651. Make corrections to table I. 95-06-09 K. A. Cottongim B Add device type 03. 05-11-16 Raymond Monnin C Table I, Output voltage peak test, conditions column for subgroups 5 and 6, correct R

2、L= 10 k to RL= 10 . Output current peak test, conditions column, subgroups 4, 5, and 6, add min to both VOUTconditions. 06-03-08 Raymond Monnin D Table I: Input bias current, device type 03, subgroups 2 and 3, add new min and max limits of 150 nA. Input offset current, device type 03, subgroups 2 an

3、d 3, add new min and max limits of 50 nA. -gz 08-03-27 Robert M. Heber REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OH

4、IO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, HIGH CURRENT, HIGH POWER, DUAL, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-03-10

5、AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-90838 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E316-08Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90838 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

6、43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PI

7、N). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 90838 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) des

8、ignator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s

9、). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 OMA2541SKB, MSK 2541B High power, dual operational amplifier 02 OMA2541SKCB High power, dual operational amplifier 03 MSK 2541B High power, dual operational amplifier 1.2.3 Device class des

10、ignator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels

11、are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G

12、Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (G

13、roup A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure th

14、at the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated

15、in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Flange mount Y See figure 1 12 Dual-in-line (power) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59

16、62-90838 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltages (VCC) . 40 V dc Differential Input voltage. VCCCommon mode inpu

17、t voltage VCC Maximum power dissipation (PD) 2/ 3/. 125 W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC): Device types 01 and 03. 2.2C/W Device type 02 1.5C/W Junction temperature (TJ) . +200C 1.4 Recommended operatin

18、g conditions. Supply voltage (VCC). 34 V dc Ambient operating temperature range (TA). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless

19、 otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - I

20、nterface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.da

21、ps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this

22、document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-385

23、34 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements a

24、s defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Ex

25、tended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate 2.2C/W above +25C. 3/ TA +25C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90838 DEFENSE SUPPLY CENTER COLU

26、MBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2

27、.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specifie

28、d operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The

29、 device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (va

30、riables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level

31、control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA

32、shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampli

33、ng and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be

34、in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Preseal burn-in test, method 1030 of MIL-STD-883, (optional for classes H and K). (1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be

35、 made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1030 of MIL-STD-883. (2) TAas specified in accordance with table I of me

36、thod 1015 of MIL-STD-883. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit sha

37、ll specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. c. Interim and final electrical test parameters shall be as specified in t

38、able II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90838 DEFENSE SUPPLY CENTER COLUM

39、BUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TA +125C VCC= 34 V dc unless otherwise specified Group A subgroups Device type Min Max Unit 01,02 -1 +1 Input offset voltage VIOTA= +25C

40、 1 03 -1.5 +1.5 mV 01,02 -30 +30 Input offset voltage drift VIOT TA= -55C and +125C 2,3 03 -50 +50 V/C 1 All -50 +50 pA 01,02 -50 +50 Input bias current IIB2,3 03 -150 +150 nA 1 All -30 +30 pA 01,02 -20 +20 Input offset current IOS2,3 03 -50 +50 nA 1 -10 +10 +PSRR -VCC= -34 V dc, +VCC= +10 V dc to +

41、40 V dc 2,3 All -20 +20 V/V 1 -10 +10 Power supply rejection ratio -PSRR +VCC= +34 V dc, -VCC= -10 V dc to -40 V dc 2,3 All -20 +20 V/V 1 95 Common mode rejection ratio CMRR VCM= 22 V dc, f = dc 2,3 All 90 dB Supply currents ICCVCM= 0 V, no load condition, total supply current 1,2,3 All -60 +60 mA I

42、O= 5 A peak, RL= 5.6, 10 kHz sine wave, TA= +25C 4 28.0 Output voltage peak VOPRL= 10, 10 kHz sine wave, TA= -55C and +125C 5,6 All 30 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

43、 A 5962-90838 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA +125C VCC= 34 V dc unless otherwise specified Group A subgroups Device type Min

44、Max Unit RL= 5.6, VOUT= 28 V min, TA= +25C 4 5 Output current peak IOPRL= 10, VOUT= 30 V min, TA= -55C and +125C 5,6 All 3 A 4 95 Voltage gain AVSRL= 10 k 5,6 All 86 dB Slew rate SR RL= 10.0, TA= +25C 7 All 6 V/s 1/ Unless otherwise specified, these tests are for each amplifier. Provided by IHSNot f

45、or ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90838 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Inches Millimeters Symbol Min Max Min Max A 1.510 1.55

46、0 38.35 39.37 B .745 .770 18.92 19.56 C .260 .340 6.60 0.84 D .038 .042 0.97 1.07 E .080 .100 2.03 2.67 F 40 Basic 40 BasicG .500 Basic 12.7 Basic H 1.186 Basic 30.12 Basic J .593 Basic 15.06 Basic K .400 .500 10.16 12.70 Q .151 .161 3.84 4.09 R .980 1.020 24.89 25.911 NOTES: 1. The U. S. preferred

47、system of measurement is the metric SI. This case outline was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound shall take precedence. 2. Leads in true position within 0.01 inch (0.25 mm) R at MMC at seating pl

48、ane. 3. Pin numbers are for reference and may not be marked on package. FIGURE 1. Case outlines. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90838 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case outline Y. Inches Millimeters Symbol Min Max Min M