DLA DSCC-VID-V62 12601-2012 MICROCIRCUIT DIGITAL-LINEAR ENHANCED LOW INPUT VOLTAGE MODE SYNCHRONOUS BUCK CONTROLLER MONOLITHIC SILICON.pdf
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1、 REVISIONS LTR DESCRIPTION DATE APPROVED Prepared in accordance with ASME Y14.24 Vendor item drawing REV PAGE REV PAGE REV STATUS OF PAGES REV PAGE 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Phu H. Nguyen DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ Original d
2、ate of drawing YY MM DD CHECKED BY Phu H. Nguyen TITLE MICROCIRCUIT, DIGITAL-LINEAR, ENHANCED, LOW INPUT VOLTAGE MODE SYNCHRONOUS BUCK CONTROLLER, MONOLITHIC SILICON 12-12-14 APPROVED BY Thomas M. Hess SIZE A CODE IDENT. NO. 16236 DWG NO. V62/12601 REV PAGE 1 OF 11 AMSC N/A 5962-V034-13 Provided by
3、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/12601 REV PAGE 2 1. SCOPE 1.1 Scope. This drawing documents the general requirements of a high performance enhanced, low input voltage mo
4、de synchronous buck controller microcircuit, with an operating temperature range of -55C to +125C. 1.2 Vendor Item Drawing Administrative Control Number. The manufacturers PIN is the item of identification. The vendor item drawing establishes an administrative control number for identifying the item
5、 on the engineering documentation: V62/12601 - 01 X E Drawing Device type Case outline Lead finish number (See 1.2.1) (See 1.2.2) (See 1.2.3) 1.2.1 Device type(s). Device type Generic Circuit function 01 TPS40021-EP Enhanced, low input voltage mode synchronous buck controller 1.2.2 Case outline(s).
6、The case outlines are as specified herein. Outline letter Number of pins JEDEC PUB 95 Package style X 16 JEDEC MO-153 Plastic small outline 1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacturer: Finish designator Material A Hot so
7、lder dip B Tin-lead plate C Gold plate D Palladium E Gold flash palladium Z Other Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/12601 REV PAGE 3 1.3 Absolute maximum ratin
8、gs. 1/ Input voltage range, (VIN): SS/SD, VDD, PVDD, OSNS -0.3 V to 6.0 V BOOT2, BOOT1 . VSW+ 6.0 V SW . -3.0 V to 10.5 V SWT (SW transient 50 ns) -5.0 V FB, ILIM . -0.3 V to 6.0 V Output voltage range, (VOUT): COMP, PWRGD, RT -0.3 V to 6.0 V Sink current, (IS): PWDGD 10 mA Maximum junction temperat
9、ure, (TJ) . 150C Storage temperature range (Tstg) . -65C to 150C Lead temperature 1.6 mm (1/16 inch) from case for 10 seconds 260C 1.4 Thermal characteristics. Thermal resistance Thermal metric 2/ Case outline X Units Junction to ambient thermal resistance, JA3/ 38.3 C/W Junction to case (top) therm
10、al resistance, JCtop4/ 28 Junction to board thermal resistance, JB5/ 9 Junction to top characterization parameter, JT6/ 0.4 Junction to board characterization parameter, JB7/ 8.9 Junction to case (bottom) thermal resistance, JCbot8/ 2.9 1.5 Recommended operating conditions. Input voltage, (VIN) 2.25
11、 V to 5.5 V Operating temperature range, (TJ) -55C to 125C 1/ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “r
12、ecommended operating conditions” is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. All voltage values are with respect to the network ground terminal unless otherwise noted. 2/ For more information about traditional and new thermal metr
13、ics, see manufacturer data. 3/ The junction to ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-k-board, as specified in JESD51-7, in an environment described in JESD51-2a. 4/ The junction to case (top) thermal resistance is obtained by simula
14、ting a cold plate test on the package top. No specified JEDEC- standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. 5/ The junction to board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temper
15、ature, as described in JESD51-8. 6/ The junction to top characterization parameter, JT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining JA, using a procedure described in JESD51-2a (sections 6 and 7). 7/ The junction to board ch
16、aracterization parameter, JB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining JA, using a procedure described in JESD51-2a (sections 6 and 7). 8/ The junction to case (bottom) thermal resistance is obtained by simulating a cold
17、plate test on the exposed (power) pad. No specified JEDEC- standard test exists, but a close description can be found in the ANSI SEMI standard G30-88 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE ID
18、ENT NO. 16236 DWG NO. V62/12601 REV PAGE 4 2. APPLICABLE DOCUMENTS JEDEC SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC) JEDEC PUB 95 Registered and Standard Outlines for Semiconductor Devices JESD51-2 Integrated Circuits Thermal Test Method Environment Conditions Natural Convection (Still Air) JESD51-7
19、High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages JESD51-8 Junction-to-board thermal resistance Theta-JB or RJB(Copies of these documents are available online at http:/www.jedec.org or from JEDEC Solid State Technology Association, 3103 North 10th Street, Suite 240S, A
20、rlington, VA 22201-2107). AMERICAN NATIONAL STANDARDS INSTITUTE (ANSI) STANDARD ANSI SEMI STANDARD G30-88 - Test Method for Junction-to-Case Thermal Resistance Measurements for Ceramic Packages (Applications for copies should be addressed to the American National Standards Institute, Semiconductor E
21、quipment and Materials International, 1819 L Street, NW, 6 th floor, Washington, DC 20036 or online at http:/www.ansi.org) 3. REQUIREMENTS 3.1 Marking. Parts shall be permanently and legibly marked with the manufacturers part number as shown in 6.3 herein and as follows: A. Manufacturers name, CAGE
22、code, or logo B. Pin 1 identifier C. ESDS identification (optional) 3.2 Unit container. The unit container shall be marked with the manufacturers part number and with items A and C (if applicable) above. 3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical
23、performance characteristics are as specified in 1.3, 1.4, and table I herein. 3.4 Design, construction, and physical dimension. The design, construction, and physical dimensions are as specified herein. 3.5 Diagrams. 3.5.1 Case outline. The case outline shall be as shown in 1.2.2 and figure 1. 3.5.2
24、 Terminal connections. The terminal connections shall be as shown in figure 2. 3.5.3 Internal block diagram. The internal block diagram shall be as shown in figure 3. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHI
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