BS EN 62433-4-2016 EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation Conducted immunity modelling (ICIM-CI)《EMC IC建模 用于RF抗干扰能力的行为模拟集成电路模型 传导抗扰度建.pdf

《BS EN 62433-4-2016 EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation Conducted immunity modelling (ICIM-CI)《EMC IC建模 用于RF抗干扰能力的行为模拟集成电路模型 传导抗扰度建.pdf》由会员分享，可在线阅读，更多相关《BS EN 62433-4-2016 EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation Conducted immunity modelling (ICIM-CI)《EMC IC建模 用于RF抗干扰能力的行为模拟集成电路模型 传导抗扰度建.pdf（112页珍藏版）》请在麦多课文档分享上搜索。

1、EMC IC modellingPart 4: Models of integrated circuits for RF immunity behavioural simulation Conducted immunity modelling (ICIM-CI)BS EN 62433-4:2016BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06National forewordThis British Standard is the UK implementation of EN

2、62433-4:2016. It isidentical to IEC 62433-4:2016.The UK participation in its preparation was entrusted to TechnicalCommittee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the ne

3、cessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2016.Published by BSI Standards Limited 2016ISBN 978 0 580 87527 4ICS 31.200 Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was

4、 published under the authority of theStandards Policy and Strategy Committee on 30 November 2016. Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 62433-4:2016EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62433-4 October 2016 ICS 31.200 English Version EMC

5、 IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI) (IEC 62433-4:2016) Modles de circuits intgrs pour la CEM - Partie 4: Modles de circuits intgrs pour la simulation du comportement dimmunit aux radiofrquences - Modlis

6、ation de limmunit conduite (ICIM-CI) (IEC 62433-4:2016) EMV-IC-Modellierung - Teil 4: Modelle integrierter Schaltungen fr die Simulation des Verhaltens der HF-Strfestigkeit - Modellierung der Strfestigkeit gegen leitungsgefhrte Strungen (ICIM-CI) (IEC 62433-4:2016) This European Standard was approve

7、d by CENELEC on 2016-06-29. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such nationa

8、l standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own

9、language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia,

10、France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de

11、 Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2016 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62433-4:2016 E BS EN 62433-4:2016

12、EN 62433-4:2016 2 European foreword The text of document 47A/988/FDIS, future edition 1 of IEC 62433-4, prepared by SC 47A “Integrated circuits” of IEC/TC 47 “Semiconductor devices” was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62433-4:2016. The following dates are fix

13、ed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2017-04-21 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2019-10-21 Attention is drawn to the

14、possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62433-4:2016 was approved by CENELEC as a European

15、 Standard without any modification. BS EN 62433-4:2016EN 62433-4:2016 3 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensab

16、le for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

17、 EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu Publication Year Title EN/HD Year IEC 62132-1 - Circuits intgrs - Mesure de limmunit lectromagntique - Partie 1: Conditions gnrales et dfinitions EN 6

18、2132-1 - IEC 62132-4 - Circuits intgrs - Mesure de limmunit lectromagntique 150 kHz 1 GHz - Partie 4: Mthode dinjection directe de puissance RF EN 62132-4 - IEC 62433-2 - Modles de circuits intgrs pour la CEM - Partie 2: Modles de circuits intgrs pour la simulation du comportement lors de perturbati

19、ons lectromagntiques - Modlisation des missions conduites (ICEM-CE) EN 62433-2 - ISO 8879 1986 Traitement de linformation - Systmes bureautiques - Langage normalis de balisage gnralis (SGML) - - ISO/IEC 646 1991 Technologies de linformation - Jeu ISO de caractres cods 7 lments pour lchange dinformat

20、ion - - CISPR 17 - Mthodes de mesure des caractristiques dantiparasitage des dispositifs de filtrage CEM passifs EN 55017 - BS EN 62433-4:2016 2 IEC 62433-4:2016 IEC 2016 CONTENTS FOREWORD . 7 1 Scope 9 2 Normative references. 9 3 Terms, definitions, abbreviations and conventions 10 3.1 Terms and de

21、finitions 10 3.2 Abbreviations 11 3.3 Conventions 11 4 Philosophy 12 5 ICIM-CI model description 12 5.1 General . 12 5.2 PDN description 14 5.3 IBC description . 15 5.4 IB description 16 6 CIML format 17 6.1 General . 17 6.2 CIML structure 18 6.3 Global keywords . 19 6.4 Header section 19 6.5 Lead d

22、efinitions . 20 6.6 SPICE macro-models 21 6.7 Validity section 23 6.7.1 General . 23 6.7.2 Attribute definitions 23 6.8 PDN 25 6.8.1 General . 25 6.8.2 Attribute definitions 26 6.8.3 PDN for a single-ended input or output . 29 6.8.4 PDN for a differential input . 36 6.8.5 PDN multi-port description

23、39 6.9 IBC . 40 6.9.1 General . 40 6.9.2 Attribute definitions 41 6.10 IB . 42 6.10.1 General . 42 6.10.2 Attribute definitions 43 6.10.3 Description 48 7 Extraction 50 7.1 General . 50 7.2 Environmental extraction constraints . 50 7.3 PDN extraction 51 7.3.1 General . 51 7.3.2 S-/Z-/Y-parameter mea

24、surement . 51 7.3.3 RFIP technique 51 7.4 IB extraction 52 7.4.1 General . 52 7.4.2 Direct RF power injection test method 52 BS EN 62433-4:2016IEC 62433-4:2016 IEC 2016 3 7.4.3 RF Injection probe test method . 54 7.4.4 IB data table 55 7.5 IBC . 56 8 Validation of ICIM-CI hypotheses . 56 8.1 General

25、 . 56 8.2 Linearity 57 8.3 Immunity criteria versus transmitted power 58 9 Model usage 59 Annex A (normative) Preliminary definitions for XML representation 61 A.1 XML basics . 61 A.1.1 XML declaration . 61 A.1.2 Basic elements 61 A.1.3 Root element . 61 A.1.4 Comments . 62 A.1.5 Line terminations .

26、 62 A.1.6 Element hierarchy 62 A.1.7 Element attributes 62 A.2 Keyword requirements . 62 A.2.1 General . 62 A.2.2 Keyword characters . 63 A.2.3 Keyword syntax 63 A.2.4 File structure 63 A.2.5 Values . 65 Annex B (informative) ICIM-CI example with disturbance load . 68 Annex C (informative) Conversio

27、ns between parameter types 69 C.1 General . 69 C.2 Single-ended input or output 69 C.3 Differential input or output . 70 Annex D (informative) Example of ICIM-CI macro-model in CIML format . 74 Annex E (normative) CIML Valid keywords and usage 79 E.1 Root element keywords . 79 E.2 File header keywor

28、ds 79 E.3 Validity section keywords 81 E.4 Global keywords . 81 E.5 Lead keyword 82 E.6 Lead_definitions section attributes . 82 E.7 Macromodels section attributes . 83 E.8 Pdn section keywords 84 E.8.1 Lead element keywords 84 E.8.2 Netlist section keywords . 86 E.9 Ibc section keywords . 87 E.9.1

29、Lead element keywords 87 E.9.2 Netlist section keywords . 89 E.10 Ib section keywords . 89 E.10.1 Lead element keywords 89 E.10.2 Max_power_level section keywords 91 E.10.3 Voltage section keywords . 91 E.10.4 Current section keywords . 93 BS EN 62433-4:2016 4 IEC 62433-4:2016 IEC 2016 E.10.5 Power

30、section keywords . 94 E.10.6 Test_criteria section keywords . 95 Annex F (informative) PDN impedance measurement methods using vector network analyzer . 97 F.1 General . 97 F.2 Conventional one-port method . 97 F.3 Two-port method for low impedance measurement . 97 F.4 Two-port method for high imped

31、ance measurement . 98 Annex G (informative) RFIP measurement method description 99 G.1 General . 99 G.2 Obtaining immunity parameters . 99 Annex H (informative) Immunity simulation with ICIM model based on pass/fail test 101 H.1 ICIM-CI macro-model of a voltage regulator IC 101 H.1.1 General . 101 H

32、.1.2 PDN extraction . 101 H.1.3 IB extraction 101 H.1.4 SPICE-compatible macro-model . 102 H.2 Application level simulation and failure prediction 102 Annex I (informative) Immunity simulation with ICIM model based on non pass/fail test . 104 Bibliography . 106 Figure 1 Example of ICIM-CI model stru

33、cture 13 Figure 2 Example of an ICIM-CI model of an electronic board . 14 Figure 3 Example of an IBC network . 16 Figure 4 ICIM-CI model representation with different blocks 16 Figure 5 CIML inheritance hierarchy . 18 Figure 6 Example of a netlist file defining a sub-circuit 22 Figure 7 PDN electric

34、al schematics 29 Figure 8 PDN represented as a one-port black-box . 29 Figure 9 PDN represented as S-parameters in Touchstone format 32 Figure 10 PDN represented as two-port S-parameters in Touchstone format . 33 Figure 11 Example structure for defining the PDN using circuit elements . 34 Figure 12

35、Example of a single-ended PDN Netlist main circuit definition 35 Figure 13 Example of a single-ended PDN Netlist with both sub-circuit and main circuit definitions . 35 Figure 14 Differential input schematic . 37 Figure 15 PDN represented as a two-port black-box . 37 Figure 16 PDN data format for di

36、fferential input or output 37 Figure 17 Differential inputs of an operational amplifier example . 39 Figure 18 ICIM-CI Model for a 74HC08 component . 40 Figure 19 Example IB file obtained from DPI measurement . 50 Figure 20 Test setup of the DPI immunity measurement method as specified in IEC 62132-

37、4 . 52 Figure 21 Principle of single and multi-pin DPI 53 Figure 22 Electrical representation of the DPI test setup . 54 Figure 23 Test setup of the RFIP measurement method derived from the DPI method . 55 BS EN 62433-4:2016IEC 62433-4:2016 IEC 2016 5 Figure 24 Example setup used for illustrating IC

38、IM-CI hypotheses 57 Figure 25 Example of linearity assumption validation 58 Figure 26 Example of transmitted power criterion validation 59 Figure 27 Use of the ICIM-CI macro-model for simulation . 59 Figure A.1 Multiple XML (CIML) files 64 Figure A.2 XML files with data files (*.dat) 64 Figure A.3 X

39、ML files with additional files 65 Figure B.1 ICIM-CI description applied to an oscillator stage for extracting IB 68 Figure C.1 Single-ended DI 69 Figure C.2 Differential DI . 70 Figure C.3 Two-port representation of a differential DI 70 Figure C.4 Simulation of common-mode injection on a differenti

40、al DI based on DPI . 72 Figure C.5 Equivalent common-mode input impedance of a differential DI . 72 Figure C.6 Determination of transmitted power for a differential DI 72 Figure D.1 Test setup on an example LIN transceiver . 74 Figure D.2 PDN data in touchstone format (s2p), data measured using VNA

41、. 76 Figure D.3 PDN data of leads 6 (LIN) and 7 (VCC) . 77 Figure D.4 IB data in ASCII format (.txt), data measured using DPI method Injection on VCC pin . 77 Figure D.5 IB data for injection on VCC pin . 78 Figure F.1 Conventional one-port S-parameter measurement 97 Figure F.2 Two-port method for l

42、ow impedance measurement . 98 Figure F.3 Two-port method for high impedance measurement 98 Figure G.1 Test setup of the RFIP measurement method derived from DPI method . 99 Figure G.2 Principle of the RFIP measurement method . 99 Figure H.1 Electrical schematic for extracting the voltage regulators

43、ICIM-CI . 101 Figure H.2 ICIM-CI extraction on the voltage regulator example 102 Figure H.3 Example of a SPICE-compatible ICIM-CI macro-model of the voltage regulator . 102 Figure H.4 Example of a board level simulation on the voltage regulators ICIM-CI with PCB model and other components including

44、parasitic elements 103 Figure H.5 Incident power as a function of frequency that is required to create a defect with a 10 nF filter 103 Figure I.1 Example of an IB file for a given failure criterion . 104 Figure I.2 Comparison of simulated transmitted power and measured immunity behaviour . 105 Tabl

45、e 1 Attributes of Lead keyword in the Lead_definitions section . 20 Table 2 Compatibility between the Mode and Type fields for correct CIML annotation 20 Table 3 Subckt definition 21 Table 4 Definition of the Validity section . 23 Table 5 Definition of the Lead keyword for Pdn section . 25 Table 6 V

46、alid data formats and their default units in the Pdn section . 28 Table 7 Valid file extensions in the Pdn section 28 Table 8 Valid fields of the Lead keyword for single-ended PDN . 30 BS EN 62433-4:2016 6 IEC 62433-4:2016 IEC 2016 Table 9 Netlist definition. 34 Table 10 Valid fields of the Lead key

47、word for differential PDN . 38 Table 11 Differences between the Pdn and Ibc section fields 41 Table 12 Valid fields of the Lead keyword for IBC definition 42 Table 13 Definition of the Lead keyword in Ib section 43 Table 14 Max_power_level definition 44 Table 15 Voltage, Current and Power definition

48、 45 Table 16 Test_criteria definition . 45 Table 17 Default values of Unit_voltage, Unit_current and Unit_power tags as a function of data format 48 Table 18 Valid file extensions in the Ib section 48 Table 19 Example of IB table pass/fail criteria 56 Table A.1 Valid logarithmic units 66 Table C.1 S

49、ingle-ended parameter conversion 70 Table C.2 Differential parameter conversion . 71 Table C.3 Power calculation . 73 Table E.1 Root element keywords 79 Table E.2 Header section keywords 80 Table E.3 Validity section keywords . 81 Table E.4 Global keywords . 82 Table E.5 Lead element definition 82 T