BS EN 125100-1977 Harmonized system of quality assessment for electronic components sectional specification magnetic oxide cores for inductor applications《电子元器件质量评定统一体系 分规范 电感应器用磁性.pdf

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1、BRITISH STANDARD BS EN 125100:1993 CECC 25100:1976 Incorporating Amendment No. 1 Harmonized system of quality assessment for electronic components Sectional specification: Magnetic oxide cores for inductor applications The European Standard EN 125100:1991 has the status of a British StandardBSEN1251

2、00:1993 This British Standard, having been prepared under the directionof the Electronics Components Standards Committee, was published underthe authority of the Executive Board on 31August1977 BSI 12-1999 The following BSI references relate to the work on this standard: Committee reference ECL/20 D

3、raft for comment 74/24802 DC ISBN 0 580 09605 X Cooperating organizations The Electronic Components Standards Committee, under whose direction this British Standard was prepared, consists of representatives from the following: British Electrical and Allied Manufacturers Association (BEAMA) Electrici

4、ty Supply Industry in England and Wales Electronic Components Board Electronic Engineering Association* Institution of Electronic and Radio Engineers Ministry of Defence* National Supervising Inspectorate* Post Office Radio and Electronic Components Manufacturers Federation* Society of British Aeros

5、pace Companies Limited* Telecommunication Engineering and Manufacturing Association (TEMA)* Trades Union Congress The organizations marked with an asterisk in the above list were directly represented on the committee entrusted with the preparation of this British Standard. Amendments issued since pu

6、blication Amd. No. Date of issue Comments 7577 February 1993 Indicated by a sideline in the marginBSEN125100:1993 BSI 12-1999 i Contents Page Cooperating organizations Inside front cover National foreword ii Foreword 2 Section 1. Scope 1 Section 2. General 1 2.1 Related documents 1 2.2 Classificatio

7、n 1 Section 3. Quality assessment procedures 1 Section 4. Additional information 2 Section 5. Blank detail specification 2 5.1 Identification of the harmonized detail specification 2 5.2 Identification of the core 3 5.3 Limiting conditions 3 5.4 Marking of components and package 3 5.4.1 Component 3

8、5.4.2 Package 3 5.5 Characteristics 3 5.5.1 Visual examination 3 5.5.2 Dimensions 3 5.5.3 Effective properties 3 5.5.4 Electrical properties 4 5.5.5 Mechanical properties 4 5.6 Certified test records 4 5.7 Additional information 4 5.8 Ordering information 5 5.9 Format of the detail specification 5BS

9、EN125100:1993 ii BSI 12-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)25100“Harmonized system of quality assessment for electronic components. Sec

10、tional specification: Magnetic oxide cores for inductor applications”. In 1991 the CENELEC Electronic Components Committee (CECC) accepted CECC 25100:1976 as European Standard EN 125100:1991. As a consequence of implementing the European Standard this British Standard is renumbered as BSEN 125100 an

11、d any reference to BS CECC 25100 should be read as a reference to BS EN 125100. This standard is a harmonized specification within the CECC system. The existing non-harmonized British Standard, BS 9631:1974 “Rules for the preparation of detail specifications for ferrite cores of assessed quality for

12、 use in inductors-Full assessment”, will eventually be superseded by this standard, but for a period both standards will remain in force because of current approvals to BS 9631. Terminology and conventions. The text of the CECC specification has been accepted as suitable for publication, without dev

13、iation, as a British Standard. Certain terminology and conventions are used, however, that are not identical with those used in British Standards. Attention is particularly drawn to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full

14、point (a full stop on the baseline) as the decimal marker. Cross references. The British Standard harmonized with CECC 00100 is BS9000 “General requirements for electronic components of assessed quality”. For each of the following references to other International Standards that are given in the tex

15、t, there is an equivalent British Standard; these are listed below. Reference to International Standard Equivalent British Standard IEC 68 BS 2011 Methods for the environmental testing of electronic components and electronic equipment IEC 68-1:1968 Part 1.1:1977 General IEC 133:1967 BS 4061:1966 Dim

16、ensions of pot cores made of ferromagnetic oxides for use in telecommunications and allied electronic equipment IEC 410:1973 BS 6001:1972 Sampling procedures and tables for inspection by attributes CECC 25000:1976 BS E9630:1976 Harmonized system of quality assessment for electronic components. Gener

17、ic specification: Inductor and transformer cores for telecommunication NOTEThere are as yet no equivalent British Standards for IEC205, IEC367, IEC424. The committee responsible for this standard has studied these and confirms that, for the purposes of this standard, their technical requirements are

18、 acceptable.BSEN125100:1993 BSI 12-1999 iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligation

19、s. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, theENtitle page, page 2, the CECC title page, page ii, pages1 to 10 and abackcover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in

20、 the amendment table on the inside front cover.iv blankEUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 125100 December 1991 Descriptors: Quality, electronic components, cores English version Sectional Specification: Magnetic oxide coresforinductorapplications Spcification Intermdiaire: Noyaux e

21、n oxyde magntique destins aux bobines dinductance Rahmenspezifikation: Kerne aus magnetischen Oxiden inSpulenanwendungen This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on20November1991. The text of thisstandard consists of the text of CECC25100 Issue11976 o

22、f the corresponding CECC Specification. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such

23、 national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member int

24、o its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portuga

25、l, Spain, Sweden, Switzerland and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Eu

26、ropisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1991 Copyright reserved to CENELEC members Ref. No. EN 125100:1991 EEN125100:1991 BSI 12-1999 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of

27、 the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the system is to facilitate international trade by the harmonization of specifications and quality assessment procedures fo

28、r electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This document has been formally approved by the CECC, and has been prepared f

29、or those member countries taking part in the System who wish to issue national harmonized specifications for MAGNETIC OXIDE CORES FOR INDUCTOR APPLICATIONS. It should be read in conjunction with document CECC00100: Basic Rules (1974). At the date of printing of this document, the member countries of

30、 the CECC are Belgium, Denmark, Germany, France, Ireland, Italy, the Netherlands, Norway, Sweden, Switzerland, the UnitedKingdom, and copies of it can be obtained from the National Committees of the CENELEC in these countries. Preface This sectional specification was prepared by CECC Working Group 1

31、2: “Magnetic components”. In accordance with the requirements of document CECC00100, it is based, wherever possible, on the Recommendations of the International Electrotechnical Commission and in particular on IEC Publication367: Cores for inductors and transformers for telecommunications. The text

32、of this sectional specification was circulated to the CECC in document CECC(Secretariat)372in June 1975 and was formally approved by the CECC for printing as a CECC Specification.ii blankCECC25100:1976 BSI 12-1999 1 Section 1. Scope This sectional specification prescribes the characteristics, rating

33、s and inspection requirements for magnetic cores of assessed quality. Such cores, intended for inductors and transformers in tuned circuits for professional and industrial applications, consist of at least two parts forming a substantially closed magnetic circuit. It selects from the generic specifi

34、cation CECC25000, the appropriate methods of test to be used in detail specifications derived from this specification, and contains the test schedules to be used in the preparation of such specifications. Each test schedule, referenced by a CECC number, when taken with the appropriate information in

35、 Section 5 of this specification, forms a blank detail specification. The cores covered by this specification may be used with an adjuster which provides for change of inductance for tuning. Section 2. General 2.1 Related documents Document CECC25000and any other reference documents, as appropriate.

36、 2.2 Classification A core is classified by: shape: e.g. pot core, X core, RM core . . . size: e.g.18 11, X22, RM6. . . class (combined electromagnetic properties, e.g. temperature coefficient and losses at given frequencies). Since no systematic classification of the electromagnetic properties is a

37、vailable in the CECC, each detail specification shall clearly define the class to which it applies. It may also state the appropriate class designation. Normally, a detail specification will cover cores of one shape, size and class. Section 3. Quality assessment procedures The tests given in the fol

38、lowing table shall be included in each detail specification for magnetic oxide inductor and tuned transformer cores. These tests shall be carried out in accordance with measuring methods presented in Sections2and4of CECC25000. Visual examination and measurement of dimensions may be carried out on ha

39、lf cores prior to pairing or on a set, all other tests of Groups A and C being carried out on a set, where a “set” is defined as a pair of cores. Temperature coefficient shall be measured on gapped sets. Temperature factor may be determined on either ungapped or on gapped sets. Disaccommodation fact

40、or, or disaccommodation, may be measured on toroidally wound half cores either on ungapped or gapped sets. The method to be used for all Group B tests shall be defined in the detail specification. The load tests for the adjuster mechanism are only applicable if the cores are supplied with the fixed

41、part of the adjuster attached; the torque test is only applicable if the adjusters are supplied with these cores.CECC25100:1976 2 BSI 12-1999 Section 4. Additional information Additional information in the form of curves and graphs may be given by the manufacturers. This should not be used for inspe

42、ction purposes. Section 5. Blank detail specification The following information should be included in each detail specification together with the required values. The general data necessary to identify the harmonized detail specification and the component shall preferably be presented as shown in5.9

43、. Numbers between square brackets on page6correspond to indications given in5.1 and5.2. 5.1 Identification of the harmonized detail specification Table for quality conformance inspection Group Test Inspection level AQL % A Visual examination Marking I 1,5 Dimensions Primary I 1 Lot by lot Secondary

44、S3 4 Inductance factor I 1 Loss factor or quality factor S3 4 Hysteresis constant or tan h S3 4 Temperature coefficient or Temperature factor S3 4 B Disaccommodation factor or Disaccommodation S2 4 Lot by lot Load test on fixed part of adjuster for inclusion later Adjuster torque test for inclusion

45、later C Periodic on one delivery batch Range of inductance adjustment for inclusion later Contribution of the adjusting device to the coreinstability for inclusion later Compression load test 15sets 1defective allowable Every 6 months The name of the National Standards Organization under whose autho

46、rity the detailspecificationis drafted 1 The CECC number of the relevant blank detail specification allotted by the CECCGeneralSecretariat 2 The number and issue number of the national generic specification 3 The national number of the detail specification, date of issue and any further informationr

47、equired by the national system 4CECC25100:1976 BSI 12-1999 3 5.2 Identification of the core 5.3 Limiting conditions (not for inspection purposes) 5.4 Marking of components and package 5.4.1 Component (minimum information) 1) Class or grade of material (may be in coded form) A Lvalue (where space per

48、mits) (may be numerical value only, e.g.100) Manufacturers trade-mark and date of manufacture (where space permits) 5.4.2 Package (minimum information in the following sequence) Detail specification reference Manufacturers component designation reference and name of manufacturer or trade-mark Manufa

49、cturer batch identification code Quantity A Lvalue 5.5 Characteristics 5.5.1 Visual examination The conditions, workmanship and finish shall be satisfactory as determined by visual examination. The permissibility of any physical imperfections shall be judged on the basis of IEC424. The permissible percentage of chipping shall be stated in the detail specification. The marking shall be distinctly legible as determined by visual examination. If an adhesive is used to bond the fixed part of the adjuster to the ferrite, it should no