BS EN 114000-1984 Harmonized system of quality assessment for electronic components generic specification photomultiplier tubes《电子元器件质量评定协调体系 通用规范 光电倍增管》.pdf

《BS EN 114000-1984 Harmonized system of quality assessment for electronic components generic specification photomultiplier tubes《电子元器件质量评定协调体系 通用规范 光电倍增管》.pdf》由会员分享，可在线阅读，更多相关《BS EN 114000-1984 Harmonized system of quality assessment for electronic components generic specification photomultiplier tubes《电子元器件质量评定协调体系 通用规范 光电倍增管》.pdf（32页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS EN 114000:1993 CECC 14000:1984 Incorporating Amendment No. 1 Harmonized system of quality assessment for electronic components Generic specification: Photomultiplier tubes The European Standard EN 114000:1991 has the status of a British StandardBS EN114000:1993 This British Stand

2、ard, having been prepared under the direction of the Electronic Component Standards Committee, was published under the authority of the Board of BSI and comes into effect on 30 November 1984 BSI 11-1999 The following BSI references relate to the work on this standard: Committee reference ECL/5 Draft

3、 for comment 80/29001 DC ISBN 0 580 13996 4 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Committee (ECL/-) to Technical Committee ECL/5 upon which the following bodies were represented: Electronic Compo

4、nents Industry Federation GAMBICA (BEAMA Ltd.) Ministry of Defence National Supervising Inspectorate United Kingdom Atomic Energy Authority Amendments issued since publication Amd. No. Date of issue Comments 7575 February 1993 Indicated by a sideline in the marginBS EN114000:1993 BSI 11-1999 i Conte

5、nts Page Committees responsible Inside front cover National foreword ii Foreword iii Text of CECC 14000 1 Publications referred to Inside back coverBS EN114000:1993 ii BSI 11-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Com

6、mittee. It is identical with CENELEC Electronic Components Committee (CECC)14000:1984 “Harmonized system of quality assessment for electronic components: Generic specification: Photomultiplier tubes”. In1991 the CENELEC Electronic Components Committee (CECC) accepted CECC14000:1984 as European Stand

7、ard EN114000:1991. As a consequence of implementing the European Standard this British Standard is renumbered as BSEN114000 and any reference to BS CECC14000 should be read as a reference to BS EN114000. This standard gives the terminology, quality assessment procedures and test and measurement cond

8、itions applicable to the entire family of photomultiplier tubes. Any sectional and blank detail specification dealing with a particular sub-family of photomultiplier tubes required to be used in conjunction with this standard will include those tests that are considered appropriate to the sub-family

9、 and will also give more detailed information relative to the sub-family. This standard is a harmonized specification within the CECC system. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some te

10、rminology and certain conventions are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-referenc

11、es. The British Standard which implements CECC00100 is BS9000 “General requirements for a system for electronic components of assessed quality”. Part 2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. The related British Standards for IEC50 and IEC410:1973

12、 are BS4727 and BS6001:1972 respectively. International Standards Corresponding British Standards ISO 1000:1981 BS 5555:1981 Specification for SI units and recommendations for the use of their multiples and of certain other units (Identical) IEC 67:1966 BS 448 Dimensions of electronic tubes and valv

13、es Part 1:1981 IEC dimensions (Identical) IEC 68 BS 2011 Basic environmental testing procedures (The relevant Parts are all identical) IEC 117 BS 3939 Graphical symbols for electrical power, telecommunications and electronics diagrams Section 29:1978 Aircraft electrical systems (Technically equivale

14、nt) CECC 00007:1973 BS E9007:1975 Specification for harmonized system of quality assessment for electronic components. Basic specification: Sampling plans and procedures for inspection by attributes (Identical)BS EN114000:1993 BSI 11-1999 iii NOTEThere are, at present, no corresponding British Stand

15、ards for IEC27, IEC100, IEC134, IEC151 (Parts1 and15) IEC306 (Parts1and4) and IEC462. The Committee responsible for this standard has studied these and confirm that, for the purposes of this standard, their technical requirements are acceptable. A British Standard does not purport to include all the

16、 necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, t

17、he EN title page, page 2, the CECC title page, pages ii to iv, pages 1 to 18, aninside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.iv blankEUROPEAN S

18、TANDARD NORME EUROPENNE EUROPISCHE NORM EN 114000 December 1991 Descriptors: Quality, electronic components, tubes English version Generic Specification: Photomultiplier tubes Spcification Gnrique: Tubesphotomultiplicateurs Fachgrundspezifikation: EinedeutscheVersionliegt zur Zeit nicht vor* This Eu

19、ropean Standard was approved by the CENELEC Electronic Components Committee (CECC) on 20November1991. The text of this standard consists of the text of CECC14000 Issue11984 of the corresponding CECC Specification. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipul

20、ate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This Europ

21、ean Standard exists in three official versions (English, French, German*). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members

22、 are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. The membership of the CECC is identical, with the exception of the national

23、 electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1991 Copyright reserv

24、ed to CENELEC members Ref. No. EN 114000:1991 E2 blankCECC 14000:1984 ii BSI 11-1999 Contents Page Foreword iii Section 1. Scope 1 Section 2. General 1 2.1 Order of precedence 1 2.2 Related documents 1 2.3 Units, symbols and terminology 2 2.4 Marking 2 Section 3. Quality assessment procedures 2 3.1

25、Primary stage of manufacture 2 3.2 Structurally similar devices 2 3.3 Qualification approval procedures 3 3.4 Supplementary procedure for qualification approval 3 3.5 Quality conformance inspection 3 3.6 Sampling requirement for small lots or expensive items 3 3.7 Re-submission of rejected lots 4 3.

26、8 Certified test records 4 3.9 Delayed delivery 4 3.10 Unchecked parameters 4 3.11 Periodic inspection 4 3.12 Release for delivery before the completion of Group B tests 4 Section 4. Test and measurement procedures 5 4.1 Standard conditions for testing 5 4.2 Alternative test methods 6 4.3 Visual exa

27、mination 6 4.4 Dimensions 6 4.5 Electrical test and measurement procedures 6 4.6 Mechanical test and measurement procedures 18 4.7 Environmental test and measurement procedures 18 4.8 Endurance test methods 18 Figure 1 12 Figure 2 13CECC 14000:1984 BSI 11-1999 iii Foreword The CENELEC Electronic Com

28、ponents Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the har

29、monization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This spe

30、cification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for PHOTOMULTIPLIER TUBES. It should be read in conjunction with document CECC00100: Basic Rules(1974). At the date of printing

31、of this document the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the UnitedKingdom. Copies of it can be obtained from the addressees shown on the blue fly-sheet. Preface This s

32、pecification was prepared by CECC Working-Group11: Electro-optical devices. In accordance with the requirements of document CECC00100 it is based, wherever possible, on the Recommendations of the International Electrotechnical Commission and in particular on IEC306-4: Methods of measurement for phot

33、omultipliers. The text of this specification was circulated to the CECC for voting in the document indicated below and was ratified by the President of the CECC for printing as a CECC Specification: This specification will be supplemented by blank detail specifications applicable to each sub-family

34、of photomultiplier tubes. The CECC Management Committee at its meeting in Copenhagen in March1979 decided that as the German National Authorized Institution would not be implementing the requirements of this CECC generic specification, the text should be published in the English and French versions

35、only. Document Voting Date Report on the Voting CECC(Secretariat)973 April 1981 CECC(Secretariat)1061iv blankCECC 14000:1984 BSI 11-1999 1 Section 1. Scope This document relates to photomultiplier tubes of assessed quality. Section 2. General 2.1 Order of precedence Where any discrepancies ocur for

36、any reason, documents shall rank in the following order of authority: 1) the detail specification 2) the generic specification 3) document CECC00100 or any other international (for example IEC) documents to which reference is made. The same order of precedence shall apply to equivalent national docu

37、ments. 2.2 Related documents ISO 1000 1973 SI units and recommendations for the use of their multiples and of certain other units. IEC 27 Letter symbols to be used in electrical technology IEC 27-1 1971 Part 1 General IEC 50 International Electrotechnical Vocabulary IEC 67 1966 Dimensions of electro

38、nic tubes and valves IEC 68 Basic environmental testing procedures (see CECC 00006) IEC 100 1962 Methods for the measurement of direct interelectrode capacitances of electronic tubes and valves IEC 117 Recommended graphical symbols IEC 134 1961 Rating systems for electronic tubes and valves and anal

39、ogous semi-conductor devices IEC 151 Measurements of the electrical properties of electronic tubes IEC 151-1 1963 Measurement of electrode current IEC 151-15 Methods of measurement of spurious and unwanted electrode currents IEC 306 Measurement of photosensitive devices IEC 306-1 1969 Basic recommen

40、dations IEC 306-4 1971 Methods of measurement for photomultipliers IEC 410 1973 Sampling plans and procedures for inspection by attributes (see CECC 00007) IEC 462 Standard test procedures for photomultiplier tubes for scintillation counting CECC 00007 Basic specification: Sampling plans and procedu

41、res for inspection by attributes CECC 00100 1974 Basic RulesCECC 14000:1984 2 BSI 11-1999 2.3 Units, symbols and terminology Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken from the following documents: Any other units, symbols and terminology peculiar to

42、a component covered by this generic specification, shall be taken from other relevant IEC or ISO documents to be listed under “Related Documents”. For the purpose of this specification, the following additional symbols shall apply: 2.3.1 Terminology For the purpose of this specification, the followi

43、ng shall apply: 1) In a photomultiplier with “n” dynodes, the first dynode shall be that following the cathode, the nth dynode shall be that preceding the anode. 2) A dynode chain is a chain of resistors across a high voltage source, from which all electrode voltages are derived. 3) Overall voltage

44、is the voltage between photocathode and anode. 4) The illuminant A is defined as a source with a colour temperature of 2 856 20K. (See4.1.2) 2.4 Marking The detail specification shall prescribe the identification criteria and other information to be shown on the component and/or on the packing. Any

45、identification code used shall be described in full, or reference made to the appropriate document. The use of potentially dangerous material in the construction of the tube shall be indicated in accordance with the national safety requirements. Section 3. Quality assessment procedures 3.1 Primary s

46、tage of manufacture The primary stage of manufacture, in accordance with 7ofCECC00107, is the assembly of the electrode structure. The use of the procedure of 7.2.2ofCECC00107 is prohibited. 3.2 Structural similarity When simultaneous or successive production is proceeding on several types of tubes

47、having common features, those common features may be sampled from the range of types instead of from each lot of each type. ISO 1000 1973 SI units and recommendations for the use of their multiples and of certain other units. IEC 27 1973 Letter symbols to be used in electrical technology IEC 50 Inte

48、rnational Electrotechnical Vocabulary IEC 117 Recommended graphical symbols Dynode d 1 , d 2 , d 3etc. Cathode luminous sensitivity sk v Cathode spectral sensitivity sk e (2) Anode luminous sensitivity sa v Anode spectral sensitivity sa e (2) Anode dark current i daCECC 14000:1984 BSI 11-1999 3 Admi

49、ssible common features and associated tests include the following as examples: 3.2.1 Envelope and terminations Dimensions Robustness of terminations Solderability Damp heat testing 3.2.2 Electrode structure including mounting and location Capacitances Inter-electrode insulation Vibration and shock 3.2.3 Number of dynodes: the design and construction of the anode, dynodes, and other electrodes Response pulse duration Anode pulse rise time Transit time Transit time jitter 3.2.4 Photocathode and window material Catho