BS EN 113001-1981 Harmonized system of quality assessment for electronic components - Blank detail specification camera tubes《电子元器件质量保证协调体系 空白详细规范 摄像管》.pdf

《BS EN 113001-1981 Harmonized system of quality assessment for electronic components - Blank detail specification camera tubes《电子元器件质量保证协调体系 空白详细规范 摄像管》.pdf》由会员分享，可在线阅读，更多相关《BS EN 113001-1981 Harmonized system of quality assessment for electronic components - Blank detail specification camera tubes《电子元器件质量保证协调体系 空白详细规范 摄像管》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS EN 113001:1997 Incorporating Amendment No.1 to BS CECC13001:1984 (renumbers BS as BSEN113001:1997) Harmonized system of quality assessment for electronic components Blank detail specification: Cameratubes The European Standard EN113001:1991 has the status of a British Standard IC

2、S 31.100BSEN113001:1997 BSI 03-2000 ISBN 0 580 34750 8 National foreword This British Standard has been prepared by Technical Committee EPL/39 and is the English language version of EN113001:1991 Harmonized system of quality assessment for electronic components Blank detail specification: Camera tub

3、es, published by the European Committee for Electrotechnical Standardization (CENELEC) Electronic Components Committee (CECC). Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Standards Catalogue under

4、the section entitled “International Standards Correspondence Index”, or using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct applica

5、tion. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theEN title page, pages2 to9 and a back cover. This standard has been updated (see copyright date) and ma

6、y have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No. Date CommentsBSEN113001:1997 BSI 03-2000 i Contents Page National foreword Inside front cover Foreword 2 Text of EN113001 3ii blankEUROPEAN STANDA

7、RD NORME EUROPENNE EUROPISCHE NORM EN113001 December1991 UDC: Descriptors: Quality, electronic components, tubes English version Blank Detail Specification: Camera tubes Spcification Particulire Cadre: Tubes de prise de vues Vordruck fr Bauartspezifikation: Eine deutsche Version liegt zur Zeit nicht

8、 vor* This European Standard was approved by the CENELEC Electronic Components Committee(CECC) on20 November1991. The text of this standard consists of the text of CECC13001 Issue1 1980 of the corresponding CECC Specification. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations

9、 which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC membe

10、r. This European Standard exists in three official versions (English, French, German*). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CE

11、NELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identical, with the exception o

12、f the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1991 Co

13、pyright reserved to CENELEC members Ref.No.EN113001:1991EEN113001:1991 BSI 03-2000 2 Foreword The CENELEC Electronic Components Committee(CECC) is composed of those member countries of the European Committee for Electrotechnical standardization (CENELEC) who wish to take part in a harmonized System

14、for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognised Mark, or Certificate, of Conformity.

15、The components produced under the System are thereby accepted by all member countries without further testing. This document has been formally approved by the CECC, and has been prepared for those member countries, taking part in the System who wish to issue national harmonized specifications for CA

16、MERA TUBES. It should be read in conjunction with document CECC00100: Basic Rules(1974). Preface This blank detail specification was proposed by CECC Working Group11: “ELECTRO-OPTICAL DEVICES”. It is a blank detail specification for camera tubes relating to the generic specification CECC13000. The t

17、ext of this specification was circulated to the CECC, for voting, in document CECC (Secretariat)302 in September1974 and following ratification of the Report on the Voting in CECC (Secretariat)444 in October1975 was approved by the CECC Management Committee for printing as a CECC Specification. It i

18、s recognised that the layout proposed cannot be applied to all detail specifications based on this document. The CECC Management Committee at its meeting in Copenhagen in March1979 decided that as the German National Authorized Institution would not be implementing the requirements of this CECC blan

19、k detail specification, the text should be published in the English and French versions only.EN113001:1991 BSI 03-2000 3 Key for page4 The numbers between square brackets on page4 correspond to the following indications which should be given: Identification of the detail specification Identification

20、 of the component NOTEWhen a device is so designed that it can satisfy several applications, this should be stated in the detail specification, in which case the characteristics and inspection requirements relevant to these applications should be met simultaneously(these may appear in different colu

21、mns of a detail specification or in different detail specifications, as the case may be). 1 The name of the National Standards Organization under whose authority the detail specification is drafted 2 The CECC Symbol and the number allotted to the national detail specification by the CECC General Sec

22、retariat 3 The number and issue number of the national generic and sectional specifications 4 The national number of the detail specification, date of issue and any further information required by the national system, together with any amendment numbers if issued. 5 A short description of the type o

23、f component 6 Information on typical construction(where applicable) 7 Outline drawing and/or reference to the relevant document for outlines 8 Application or group of applications covered(seenote below) 9 Reference data on the most important properties, to allow comparison between the various compon

24、ent types.EN113001:1991 4 BSI 03-2000 1 page: of: CECC13001 XXX 2 ELECTRONIC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: 3 4 DETAIL SPECIFICATION FOR: PHOTOCONDUCTIVE CAMERA TUBES 5 TYPE NUMBER(S) DESCRIPTION and CONSTRUCTION Diameter of faceplate Spectral range(visible, ultra violet or infra

25、red etc.) Methods of focusing and deflection Mesh connection (that is separate or internal) 6 OUTLINE DRAWING (not for inspection purposes) 7 APPLICATION(S) 8 LEVEL OF QUALITY ASSESSMENT CONNECTIONS AND ELECTRODEDESIGNATIONS DATA (not for inspection purposes) 9 Mechanical Mounting position and acces

26、sories and magnetic shielding Mass Environmental (where appropriate) Limiting values (absolute maximum rating system IEC134) Min Max Units Heater voltage Heater to cathode, positive voltage negative voltage First anode (accelerator electrode) voltage Focus electrode voltage Control grid voltage Mesh

27、 voltage Faceplate illuminance Faceplate temperature Signal electrode voltage a a a a a a a a a a a a a V V V V V V V lx C V Seethe relevant Qualified Products List for availability of components qualified under this detail specification. a denotes that a value shall be inserted in the detail specif

28、ication.EN113001:1991 BSI 03-2000 5 Operating conditions and typical characteristics Min Max Units Heater current at V f = a V a a mA Scanned area dimensions a x a mm Alignment coil current or field a a When the tube is operated under the conditions given below, the characteristic values which follo

29、w them are attainable: = a V focus field= a Tesla = a V scan standards a = a V faceplate temperature = a C = a V (or electrodes as designated on Page4) At least one of the following conditions shall be inserted in the detail specification: (1) Signal electrode voltage set to obtain dark current I d

30、= a nA a a V Faceplate illuminance, E = a lx Signal current a a nA Resolution, expressed as the percentage modulation of a grating pattern given in line pairs per mm, TV lines or MHz a % Decay lag, expressed as the percentage of the signal amplitude. a ms after termination of illumination a % (2) Si

31、gnal electrode voltage set to obtain signal current I S = a nA at faceplate illuminance E = a lx a a V Dark current a nA Resolution, expressed as the percentage modulation of a grating pattern given in line pairs per mm, TV lines or MHz a % Decay lag, expressed as the percentage of the signal amplit

32、ude. a ms after termination of illumination a % (3) Signal electrode voltage set to a volts Faceplate illuminance E= a lx Signal current a a nA Dark current a nA Resolution, expressed as the percentage modulation of a grating pattern given in line pairs per mm, TV lines or MHz. a % Decay lag, expres

33、sed as the percentage of the signal amplitude. a ms after termination of illumination a % a denotes that a value or unit shall be inserted in the detail specification. V g 1 V g 2 V g 3 V g 4EN113001:1991 6 BSI 03-2000 Marking See2.4 of CECC13000. Ordering information Related document CECC13000: Cam

34、era Tubes. Structural similarity Additional information A manufacturer may, at his discretion, give Advice on mounting the tube Deflection coil position Recommendation on impedance of associated circuits Recommendations for shielding from magnetic fields and for location and orientation of magnetic

35、components in the vicinity of the tube Advice on the operation of the tube for correct or best performance, including alignment procedure Graphs on characteristic relationships and, (if applicable), optical characteristics of the faceplate. TEST CONDITIONS AND INSPECTION REQUIREMENTS These are given

36、 in the following tables. The test conditions to be used shall be specified in the detail specification as required for a given type, in line with the requirements given in CECC13000 for the relevant test. All references to clause numbers are made with respect to CECC13000 unless otherwise stated. X

37、-radiation A warning note on hazards to health, and recommended safeguards Group A Lot-by-lot General test conditions a(unless otherwise specified for particular tests). Seealso sub-clauses 4.1 to 4.8 of IEC151-26. All potentials are defined with respect to the cathode. All tests are non destructive

38、 AQL: given in% Inspection or Test Reference CECC13000 Conditions of Test Inspection requirements Min Max Units IL AQL Sub-group A1 100% Visual inspection 4.3 As specified 4.3 Gas test Signal current/sensitivity (1) Signal electrode voltage, Signal current or (2) Signal electrode voltage, Dark curre

39、nt or (3) Signal current, Darkcurrent 4.5.16 4.5.4 4.5.4.1 or 4.5.4.2 or 4.5.4.3 As specified At least one of the following conditions shall be selected: (1) Dark current I d = a nA E= a lx or (2) Signal current I S= a nA E= a lx or (3) Signal electrode voltage= a V E= a lx a a a a a a a a a a a nA/

40、4A V nA V nA nA nA Picture blemishes 4.5.5 As specified As specified in detail specification a denotes that a value shall be inserted in the detail specification.EN113001:1991 BSI 03-2000 7 Group A Lot-by-lot Inspection or Test Reference CECC13000 Conditions of Test Inspection requirements Min Max U

41、nits IL AQL Sub-group A2 Picture cut-off control grid voltage Signal current uniformity Alignment coil current or field 4.5.6 4.5.9 4.5.10 As specified As specified As specified a a a a V % a II 1,5 Sub-group A3 Heater current or voltage Heater-to-cathode leakage current 4.5.1 4.5.2 As specified As

42、specified a a a a 4A S4 6,5 a denotes that a value shall be inserted in the detail specification. Group B Lot by lot General test conditions as for Group A Only tests marked (D) are destructive. AQL: given in% Inspection or Test Reference CECC13000 Conditions of Test Inspection requirements Min Max

43、Units IL AQL Dimensions, major 4.4 See4.4 Seeinspection drawing S4 4,0 If the detail specification includes additional tests which are destructive tests, these shall be marked (D).EN113001:1991 8 BSI 03-2000 Group C Periodic General test conditions as for Group A Only tests marked (D) are destructiv

44、e AQL: given in% Inspection or Test Reference CECC13000 Conditions of Test Inspection requirements Min Max Units IL AQL Sub-group C1 Periodicity up to three months I 1,5 Resolution Decay lag Electrode leakage current 4.5.7 4.5.8.2 4.5.3 As specified As specified As specified a a a % % 4A Sub group C

45、2 Periodicity up to one year I 6,5 Microphony 4.5.11.1 or 4.5.11.2 As specified As specified in the relevant test procedure Image retention (afterimage) 4.5.12 As specified a s If the detail specification includes additional tests which are destructive tests, these shall be marked (D). a denotes tha

46、t a value shall be inserted in the detail specification. Group D Qualification approval only General test conditions as for Group A Only tests marked (D) are destructive Inspection or Test Reference CECC13000 Conditions of Test Inspection requirements Min Max Units IL AQL If the detail specification

47、 includes tests in this group, the sample size and acceptance criterion shall be as prescribed in3.4. If any of the tests are destructive, these shall be marked (D).EN113001:1991 BSI 03-2000 9 Appendix to the detail specification Each detail specification shall include an appendix containing the fol

48、lowing as applicable. Inspection drawing showing the dimensions to be inspected under each sub-group and also the position of the alignment coil to be used for the relevant electrical test. Picture Blemishes specification of conditions of test and performance requirement.BS EN 113001:1997 BSI 389 Ch

49、iswick High Road London W4 4AL BSIBritishStandardsInstitution BSI is the independent national body responsible for preparing BritishStandards. It presents the UK view on standards in Europe and at the international level. It is incorporated by Royal Charter. Revisions BritishStandards are updated by amendment or revision. Users of BritishStandards should make sure that they possess the latest amendments or editions. It is the constant aim of BSI to improve the qualit