BS CECC 90200-1988 Harmonized system of quality assessment for electronic components sectional specification analogue monolithic integrated circuits《电子元器件用质量评估协调体系 分规范 模拟单块集成电路》.pdf

《BS CECC 90200-1988 Harmonized system of quality assessment for electronic components sectional specification analogue monolithic integrated circuits《电子元器件用质量评估协调体系 分规范 模拟单块集成电路》.pdf》由会员分享，可在线阅读，更多相关《BS CECC 90200-1988 Harmonized system of quality assessment for electronic components sectional specification analogue monolithic integrated circuits《电子元器件用质量评估协调体系 分规范 模拟单块集成电路》.pdf（56页珍藏版）》请在麦多课文档分享上搜索。

1、BSI BS*CECC 90200 O1 = 1b24bb9 0431317 245 I BS CECC 90200 : 1988 UDC 621.3.049.774 0 British Standards Institution. No part of this publication may be phatocopied w Omemvise reproduced without the priw pami- in writing i British Standard Harmonized system of quality assessment for electronic compon

2、ents: Sect iona I spec if ica t ion: Analogue monolithic integrated circuits Systme harmonis dassurance de la qualit des composants lectroniques Spcification intermdiaire: Circuits intgrs monolithiques analogiques Harmonisiertes Gtebesttigungssystem fr Bauelemente der Elektronik Rahmenspezifikation:

3、 Analoge monolithische integrierte Schaltungen British Standards Institution BSI BS+CECC 90200 OL W L624664 0433338 LBL = BS CECC 90200 : 1988 National foreword i This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELE

4、C Electronic Components Committee (CECC) 90200 : 1987 ?Harmonized system of quality assessment for electronic components : Sectional specification : Analogue monolithic integrated circuits?.ac amended by Amendment No. 1 published in 1994. It supersedes BS CECC 90200 : 1983, which is withdrawn. It sh

5、ould be noted that the withdrawal of BS CECC 90200 : 1983 does not affect the validity of approvals which make reference to that standard. This standard gives the terminology, quality assessment procedure, test and measurement procedure applicable to the sub-family of analogue monolithic integrated

6、circuits. It also includes the common blank detail specification for analogue monolithic integrated circuits. This standard is a harmonized specification within the CECC system and should be read in conjunction with BS CECC 90000. This standadspecifies the use of substances and/or test procedures th

7、at may be injurious to health if adequate precautions are not taken. It refers only to technical suitability and in no way absolves eitherthe supplier or the user from statutory obligations relating to health and safety at any stage of manufacture or use. The BSI prescribed layout for a harmonized d

8、etail specification will in due course be incorporated in the revised BS 9000: Part 1 : 1981, by amendment. This second issue of BS CECC 90200 results from amendments and additions which have been agreed since the first issue was published in 1983. Terminology and conventions. The text of the CECC s

9、pecification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal marker. In British

10、 Standards it is current practice to use a full point on the baseline as the decimal marker. A i:1 Cross-references International standard IEC 68-2-30 : 1980 IEC 148: 1969 IEC617-13: 1978 IEC 747- 1 : 1983 IEC 747-10: 1984 IEC 748-1 : 1984 IEC 748-3 : 1986 CECC 90000 : 1985 CECC90100:1986 Correspond

11、ing British Standard BS 201 1 Basic environmental testing procedures Part 2.1 Db : 1981 Test Db and guidance: Damp heat, cyclic (1 2 + 12 hour cycle) (Identical) BS 3363 : 1980 Specification for letter symbols for semiconductor devices and integrated microcircuits (Identical) BS 3939 Guide for graph

12、ical symbols for electrical power, telecommunications and electronics diagrams Part 13 : 1985 Analogue elements (Identical) BS 6493 Semiconductor devices: discrete devices and integrated circuits Part 1 Discrete devices Section 1.1 : 1984 General (Identical) BS 9970 Harmonized system of quality asse

13、ssment for electronic components: Semiconductor devices Part O : 1985 Generic specification (Identical) BS 6493 Semiconductor devices : discrete devices and integrated circuits Part 2 Integrated circuits Section 2.1 : 1985 General (Identical) BS 6493 Semiconductor devices Part 2 Integrated circuits

14、Section 2.3 : 1987 Recommendations for analogue integrated circuits (Identical) BS CECC 90000: 1985 Harmonized system of quality assessment for electronic components Generic specification : Monolithic integrated circuits (Identical) BS CECC 901 O0 : 1986 Harmonized system of quality assessment for e

15、lectronic components Sectional specification : Digital monolithic integrated circuits (Identical Compliance with a British Standard does not of itself confer immunity from legal obligations. - ?_.,?. r.i.i-_Li-Z- . . - . . - - - - BSI BS*CECC 90200 OL Lb24bb9 0431319 018 CECC 90200 CECC Frderverein

16、fr Elektrotechnische Normung (FEN) e. V. f. Cenelec Electronic Components Committee English version Harmonized System of Quaiiry nssessment for Electronic Components SECTION AL S PE C I FI CATI O N : ANALOGUE MONOLITHIC I N T E G RAT E D C I RC U I T S (1- Systeme Harmonis dAssurance de la Qualit de

17、s Composants Electroniques SPEZI FI CATI0 N INTER M EDIAI R E: CIRCUITS INTEGRES MONOLITHIQUES ANALOG I Q U ES Harmonisiertes Gtebesttigungssystem fr Bauelemente der Elektronik RAH M E N S PE2 I FI KAT1 O N : ANALOGE MONOLITHISCHE INTEGRIERTE SCHALTUNG EN .I - CECC 90200 1987 A- Clause 1 2 2.1 2.2 2

18、.3 3 3.1 3.2 4 4.1 4.1 -1 4.1.2 4.1.3 4.2 5 5.1 5.2 5.3 5.4 5.5 5.6 CONTENTS FOREWORD PREFACE SCOPE GENERAL Related documents Preferred voltages for analogue monolithic integrated circuits Symbols and terminology QUALITY ASSESSMENT PROCEDURES Structurally similar circuits Certified test records TEST

19、 AND MEASUREMENT PROCEDURES Electrical measurement procedures Measuring methods for linear amplifiers (including operational amplifiers) Measuring methods for voltage regulators Measuring methods for analogue switches Endurance tests COMMON BLANK DETAIL SPECIFICATION FOR ANALOGUE MONOLITHIC INTEGRAT

20、ED CIRCUITS Introduction Front page Identification of the component and supplementary information Ratings (limiting values) (not for inspection purposes) Recommended conditions for use and associated characteristics (not for inspection purposes) Supplementary information Page 3 3 5 5 5 5 5 7 7 8 9 9

21、 9 11 11 14 14 14 15 17 17 ia 18 ANNEX A: Non IEC measuring methods -1- 1 - .L 29 CECC 90 200 Issue 2 Amendment 1 BSI BSSCECC 90200 O1 Lb24bb9 0431321 77b FOREWORQ The CENELEC Ektronic Components Committoe (CECC) is composed of those member countries of the Europoan Committoo for Electrotachniul Sta

22、ndardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. Tho object of the SyttOm is to facilitate international trade by the harmonization of the specifiutions and quality assessment procedures for electronic components, and by the grant of

23、an internationally recognized Mark, or Cwtificate. of Corhrmity. Tho components producod under tho System aro thereby accePted by all member countries without further testing, This specification has been formally approved by the CECC, and ha) been prepared for those countries taking part in the Syst

24、em who wish to issue national harm0niz.d specifications for ANALOQUE MONOLITHIC INTEGRATED CIRCUITS. It should be read in conjunction with the current rogulations for the CECC System. At the date of printing of this specification the member countries of the CECC are Austrra, Belgium. hnmark, Finland

25、, Franco, Qermany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden. Switzerland. and the United Kingdom. PREFACE This sectional specification (SS) was prepared by CECC WO 9 “Integrated Circuits“. li is based. wherever possible. on the Publications of the International Electrotechnic

26、al Commission and in particular on IEC 747 : Semiconductor devices : Discrete devices and intograted circuits. IEC 7*8 : Semiconductor devices : Integrated circutls. IEC 749 : Semiconductor devtces : Mechanical and climatic test methods. lhe taxt of this second Issue consists of the text of CECC 90

27、200 Issue 1 (1983) and Amendment 1 (1985) amended in accordance with the ratified new material introduced by the following document. pocument pate of Voting Remrt on the Votinq CECC (Secretariat) 1947 September 1986 CECC (S=retariat)2008 In accordance with the decision of the CECC Management Committ

28、ee this specification is published initially in French and English. The German text will follow as mon as it has been prepared. EFFECTIVE DATE This second luue shall become effective for all new qualification approvals from 1 July 1987 Issue 1 will remain valid for existing qualification approvals u

29、ntil further notice. but it is recommended that current qualifiutions should be modified in accordance with luue 2 during a transition period of 2 years Previous page is blank -3- CECC 90 200 Issue 2 1 2 2.1 2.2 ,I 2.3 2.3.1 BSI BS*CECC 90200 01 lb2Ybb 0433322 bo2 SCOPF This specification applies to

30、 analogue monolithic intograted circuits listed in soction 4 and shall be read in conjunction with CECC 90 OOO. It defines : - electrical measurernont method:, - electrical enduram tosts. The common blank detail specitication (BDS), contained in this SS, COtnpriSe8 those requirements which are commo

31、n for all analogue circuits. GENERAL Ro1at.d documents In each case the lrtert iuuo of the documents prior to the date of iuuo of this document is valid. IEC 148 IEC 617 IEC 617-13 iEC 747 IEC 147-1 IEC 747-10 IEC 748 IEC 748-1 IEC 748-3 : : Graphical symbols for diagrams. : Part 13 : Analogue eleme

32、nts. : Semiconductor devices - Discrete devices and integrated circuits. : Part 1 : General. : Part 10 : Generic specification for discrete devices and integrated Circuits. : !3emicondudor devices - Integrated circuits. : Part 1 : General. : Part 3 : Analogue inteqrated circuits. Lotter symbols for

33、semiconductor dovicri and integrated miCrOcirCUitS. (Chapter XI) CECC 90 o00 : GS : Monolithic integrated circuits. Preferred voltages tor analogue monolithic integrated circuits. Preferred values are given in IEC 748-1 Chapter IV. subclause 6.1. b. Symbols and terminology. Letter symbols lho lotter

34、 symbols shall k usrd in aceordance wth IEC 148, Chapter XI. To indicate a dofind value of an electrical quwtity denoted by a baric letter. the following system shall be used : - A for the most positive (lead negative) value ol tho range. - B for the lead posnive (mod negativo) value of the rango. E

35、xamples (soe Fig. i). -5- CECC 30 200 Issue 2 Previous page is blank BSI BSxCECC 70200 O1 D Lb24669 0433323 549 D O t 8 +- +o Fq. 1 2.3.2 Grrphd ryrnbolr Graphid rymblr shall k used in accordance with IEC 617-13. 2.3.3 Terminology For terminology. IEC 748-1 rhall e umd, and in parttcular Chapter N.

36、-6- CECC 90 200 Irrue 2 BSI BSSCECC 90200 O1 1b24bb 0433324 485 QUALiTf ASSESSMENT PROCEDURES 3.1 Structurally similar circuit8 (sw 3.2 of CECC Sa ooo) t -7- CECC 90 200 Issue 2 BSI BS*CECC 90200 O1 Lb24bb 0433325 311 H 3.1.4 For tasting of Su-Groups : C9 - storage. dry heat C10 - storage. cold The

37、devices are structurally similar provided that all the following criteria are satisfied : - they have hen designed to the same design rules ; - they hew been manufactured on the same production line including identical packages. using the ame technical processes starting from the primary stage. 3.1

38、.S For teding of SuMroup O1 - electrial endurance (8 o00 h) Intograted circuits producd concurrently in the same production line up to and including final sealing in their encaprulrtions using the same types of machines end app.ratU8 and using the ame integrated circuit design rules may k grouped to

39、gether tor the purposo of obtaining samples. the claim for grouping shall be doclared in tho qualification approval test roport to the srtlsfadion of the ONS. Integrated circuits may be groupo together tor the purpose of Obtrining Samples tor electrical endurance tests under tha same or similar test

40、 conditions, provided that the same basic design rules (for example. element geometry. spacing, thickness of tho chip. etc. 1 and internal sub- circuits (for example, multi-emitter input, phase splitter, totem pole output, etc.) ere used. When the above conditions rpply, manufacturers may take a sin

41、gle sample ot any one type to assess the lot if it can be demonstrated to the satisfaction of the ONS that the charactorioticts) being tested are not signifiuntly dependant upon the selection. If there is a significant difference, the typo selected for the common electrical endurance tests shall be

42、represented by the more complex circuit or that with a critical rating giving the greatest risk of tatlure. 3.2 Certified test records Certified test records shall give the following information. unless otherwise specified : - attributes information for tests in SubGroups : 82, 83, 64, BS, C3, C4, C

43、S, C6. C7, C8, C3, c10 ; - measurement information before and after endurance test : C8 and 01. -8- CECC 30 200 Issue 2 . . .-.*. “_ BSI BSlrCECC 90200 O3 9 1624669 0433326 258 m 4 TEST AND MEASUREMENT PROCEDURES 4.1 Eiectriui measuroment proculdures (soo 4.1 and 4.5 of CECC 90 o001 4. 1. 1 Musuring

44、 mothodr for linear amplifiers (including oporational amplitiers) (i) iEC methods : The horeafler listed electrical measuring methods, with reference to the relOV also national reference if different. 141 If different from the CECC number, the national number of the DS, date ot issue and any further

45、 information required by the national system, together with any amendment numbers. IS1 Type number, a short description of the type by : - function (tor oxampie voltage regulator) - number of mdepsndent circuits per plckge - number and bnd of inputs and outputs - material and type ot construction (s

46、ilicon. monolithic, multichip. bipolar, MOS) - pertormanee, tor example high output power. high speed. low power consumption - electrostatic sensitivity (where appliuble) . (61 lntormation on typtui construdion (whoro applicable) For IS1 arid f61 the text to be givon in tho OS should k suitablo for

47、tho ontry in CECC 00 200 and CECC 00 300. (71 An outline drawing with main dimonrions which are of importance for intorchang0abiLty. and/or roforence to tho approprmte national or international document for outlines. Altornatiwly, this drawing may k givon in an annox to the DS. Ce3 Quality assoumari

48、t kvei(s1 g Referem data giving information on the most important properties of tho component, which allow oomparison between the various component types intended tor the same, or for similar. applications. - 15 - CECC 90 2w Issue 2 BS*CECC 90200 O1 9 1624669 0433333 498 = Cl 1 Specrtiution iviilabl

49、e from : WQut for front Mae ot datai I soecifiutioq CECC 90 2OX-XXX i1 Page total number of pagw : I 193 Information about manuficturers who have components qualified to this debil spscrtiutron IS available In in tho current CECC O0 200 : Oualified Products List. i II R - 16 - CECC 90 200 Issue 2 ES1 BSSCECC 90200 01 m Lb24bb9 0433334 324 m 5.3 idenficaon of the component m wppkmmtrry intormrtkn 5.3.1 Debil drawlng with dlmenslons wRh referem to EC or NaCtorul Muda 5.3.2 Dewiptkn of the materials for tha pckae ifof exam