ASTM F24-2009(2015) Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces《表面粒状杂质的测量和计数的标准试验方法》.pdf
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1、Designation: F24 09 (Reapproved 2015)Standard Test Method forMeasuring and Counting Particulate Contamination onSurfaces1This standard is issued under the fixed designation F24; the number immediately following the designation indicates the year of originaladoption or, in the case of revision, the y
2、ear of last revision.Anumber in parentheses indicates the year of last reapproval.Asuperscriptepsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers the size distribution analysis ofparticulate contamination, 5 m or greater in size, either
3、on, orwashed from, the surface of small electron-device components.A maximum variation of two to one (633 % of the average oftwo runs) should be expected for replicate counts on the samesample.1.2 The values stated in SI units are to be regarded asstandard. No other units of measurement are included
4、 in thisstandard.2. Terminology2.1 Definitions:2.1.1 particulate contaminanta discrete quantity of matterthat is either foreign to the surface on which it rests or may bewashed from the surface on which it rests by the ultrasonicenergy procedure herein described.2.1.2 particle sizethe maximum dimens
5、ion of the particle.2.1.3 fibera particle longer than 100 m and with a lengthto width ratio of greater than 10:1.2.1.4 planar surfacea surface that does not move out ofthe depth of field of the microscope when the area to beobserved is traversed under the highest magnification to beused.3. Summary o
6、f Method3.1 This test method comprises two procedures for prepar-ing specimens for microscopical analysis: one for adheredparticles on planar surfaces and the second for particulatecontamination removed from irregular surfaces.3.2 A single optical analysis procedure is presented forparticle enumerat
7、ion in stated size ranges.3.3 For planar surfaces, the component is mounted on asuitable flat support and mounted on the microscope stage. Forirregular surface components, the contamination is removed bysubjecting the component to an ultrasonic cavitation field whileimmersed in water containing a de
8、tergent.3.4 The contamination is subsequently transferred to amembrane filter disk by filtration and then examined micro-scopically.3.5 Microscopical analysis of the contaminant is conductedat two magnifications using a gating measurement techniquewith oblique incident lighting.3.6 Particles are cou
9、nted in three size ranges: 100 m, 25to 100 m, 5 to 25 m, and fibers.3.7 For low-contamination levels on irregularly shapedcomponents, a procedure for running a blank is described.3.8 The method requires strict adherence to the proceduresfor cleaning apparatus.4. Apparatus4.1 Microscope, with mechani
10、cal stage, approximately 45and 100. For 100 magnification, the recommended objectiveis 10 to 12 (but a minimum of 6) with a numerical apertureof 0.15 minimum. The optimum equipment is a binocularmicroscope with a micrometer stage. A stereomicroscopeshould not be used in this procedure.4.2 Ocular Mic
11、rometer, B particulate contamination;size distribution analysis; surfacesAPPENDIXES(Nonmandatory Information)(Informative)X1. SELECTION OF ULTRASONIC EQUIPMENTX1.1 To provide uniform and reliable ultrasonic energy, thefollowing factors should be considered in selecting the equip-ment:X1.1.1 The type
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