ASME B89 1 13-2013 Micrometers《千分尺》.pdf

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1、AN AMERICAN NATIONAL STANDARD ASME B89.1.13-2013Revision of ASME B89.1.13-2001 (R2006)MicrometersASME B89.1.13-2013Revision of ASME B89.1.13-2001 (R2006)MicrometersAN AMERICAN NATIONAL STANDARDTwo Park Avenue New York, NY 10016 USADate of Issuance: September 30, 2013This Standard will be revised whe

2、n the Society approves the issuance of a new edition.ASME issues written replies to inquiries concerning interpretations of technical aspects of thisStandard. Periodically certain actions of the ASME B89 Committee may be published as Cases.Cases and interpretations are published on the ASME Web site

3、 under the Committee Pages athttp:/cstools.asme.org/ as they are issued.Errata to codes and standards may be posted on the ASME Web site under the Committee Pages toprovide corrections to incorrectly published items, or to correct typographical or grammatical errorsin codes and standards. Such errat

4、a shall be used on the date posted.The Committee Pages can be found at http:/cstools.asme.org/. There is an option available toautomatically receive an e-mail notification when errata are posted to a particular code or standard.This option can be found on the appropriate Committee Page after selecti

5、ng “Errata” in the “PublicationInformation” section.ASME is the registered trademark of The American Society of Mechanical Engineers.This code or standard was developed under procedures accredited as meeting the criteria for American NationalStandards. The Standards Committee that approved the code

6、or standard was balanced to assure that individuals fromcompetent and concerned interests have had an opportunity to participate. The proposed code or standard was madeavailable for public review and comment that provides an opportunity for additional public input from industry, academia,regulatory

7、agencies, and the public-at-large.ASME does not “approve,” “rate,” or “endorse” any item, construction, proprietary device, or activity.ASME does not take any position with respect to the validity of any patent rights asserted in connection with anyitems mentioned in this document, and does not unde

8、rtake to insure anyone utilizing a standard against liability forinfringement of any applicable letters patent, nor assume any such liability. Users of a code or standard are expresslyadvised that determination of the validity of any such patent rights, and the risk of infringement of such rights, i

9、sentirely their own responsibility.Participation by federal agency representative(s) or person(s) affiliated with industry is not to be interpreted asgovernment or industry endorsement of this code or standard.ASME accepts responsibility for only those interpretations of this document issued in acco

10、rdance with the establishedASME procedures and policies, which precludes the issuance of interpretations by individuals.No part of this document may be reproduced in any form,in an electronic retrieval system or otherwise,without the prior written permission of the publisher.The American Society of

11、Mechanical EngineersTwo Park Avenue, New York, NY 10016-5990Copyright 2013 byTHE AMERICAN SOCIETY OF MECHANICAL ENGINEERSAll rights reservedPrinted in U.S.A.CONTENTSForeword ivCommittee Roster . vCorrespondence With the B89 Committee vi1 Scope. 12 Definitions 13 References 14 Micrometers General. 25

12、 Outside Micrometers. 36 Inside Micrometers 37 Depth Micrometers 58 Micrometers With Digital Readout 6Figures5-1 Typical Outside Micrometer 36-1 Typical Inside Micrometer 57-1 Typical Depth Micrometer 68.1-1 Mechanical Digital Micrometer . 68.2-1 Electronic Digital Micrometer . 6Tables5.1-1 Maximum

13、Permissible Errors of Outside Micrometers (Metric System) . 45.1-2 Maximum Permissible Errors of Outside Micrometers (Inch System) . 45.6-1 Metric-Measure Setting Standards 55.6-2 Inch-Measure Setting Standards 56.1-1 Maximum Permissible Errors of Inside Micrometers (Metric System) . 56.1-2 Maximum

14、Permissible Errors of Inside Micrometers (Inch System) . 57.3.1-1 Maximum Permissible Errors of Depth Micrometers (Metric System) . 67.3.1-2 Maximum Permissible Errors of Depth Micrometers (Inch System) . 6Nonmandatory AppendicesA Good Operating Procedure . 7B Environmental Considerations 9C Test Me

15、thods 10D Uncertainty for Micrometer Calibrations 13E Comparison With ISO 3611:2010 17iiiFOREWORDASME Standards Committee B89 on Dimensional Metrology, under procedures approved bythe American National Standards Institute (ANSI), has the responsibility of preparing standardsthat encompass the inspec

16、tion and the means of measuring characteristics of various geometricalparameters, such as diameter, length, flatness, parallelism, concentricity, taper, and squareness.Since micrometers are widely used for the measurement and comparison of some of these features,the B89 Consensus Committee authorize

17、d formation of Project Team B89.1.13 to prepare thisStandard.This Standard is a revision of the first edition, ASME B89.1.13-2001. The 2001 edition was basedin part on Federal Specification GGG-C-105C, published by the General Services Administration(GSA), as well as manufacturers current practices

18、and technologies. In 2010, the InternationalOrganization for Standardization (ISO) published a revision of ISO 3611, the ISO standard foroutside micrometers. The goal of this revision to ASME B89.1.13 is to bring some harmonizationbetween these ISO and ASME standards while not changing the fundament

19、al concepts of ASMEB89.1.13-2001. In particular, the terminology and definitions associated with specifications andtesting methods have been harmonized. In addition, this revision has been updated with manyof the concepts developed and standardized by the ASME B89.7 subcommittee.This Standard was ap

20、proved by the American National Standards Institute on February 20, 2013.ivASME B89 COMMITTEEDimensional Metrology(The following is the roster of the Committee at the time of approval of this Standard.)STANDARDS COMMITTEE OFFICERSB. Parry, ChairS. D. Phillips, Vice ChairF. Constantino, SecretarySTAN

21、DARDS COMMITTEE PERSONNELT. Charlton, Jr., Charlton AssociatesD. J. Christy, Mahr Federal, Inc.F. Constantino, The American Society of Mechanical EngineersG. A. Hetland, International Institute of Geometric Dimensioningand TolerancingM. P. Krystek, Physikalisch-Technische BundesanstaltM. Liebers, Pr

22、ofessional Instruments Co.SUBCOMMITTEE 1 LENGTHD. Sawyer, Chair, National Institute of Standards and TechnologyC. J. Blackburn, National Institute of Standards and TechnologyM. Braine, National Institute of Standards and TechnologyD. Carlson, L.S. Starrett Co.D. J. Christy, Mahr Federal, Inc.T. D. D

23、oiron, National Institute of Standards and TechnologyPROJECT TEAM 1.13 MICROMETERSJ. G. Salsbury, Chair, Mitutoyo America Corp.E. W. Blackwood, The Boeing Co.D. Carlson, L.S. Starrett Co.K. W. John, U.S. Air ForceK. Kokal, Micro Laboratories, Inc.A. Kumar, Mitutoyo America Corp.W. C. Lehmus, Diamond

24、 Technical Services, Inc.vE. P. Morse, University of North Carolina at CharlotteB. Parry, The Boeing Co.P. Pereira, Caterpillar, Inc.S. D. Phillips, National Institute of Standards and TechnologyJ. G. Salsbury, Mitutoyo America Corp.D. Sawyer, National Institute of Standards and TechnologyR. L. Thom

25、pson, U.S. Air ForceD. T. Harris, Glastonbury Southern GageK. Kokal, Micro Laboratories, Inc.E. P. Morse, University of North Carolina at CharlotteJ. G. Salsbury, Mitutoyo America Corp.E. S. Stanfield, National Institute of Standards and TechnologyW. A. Watts, Glastonbury Southern GageB. Parry, The

26、Boeing Co.P. Pereira, Caterpillar, Inc.S. Ramsdale, Honeywell Federal Manufacturing Order Department: 22 Law Drive, P.O.Box 2900, Fairfield, NJ 07007-2900 (www.asme.org)ASTM E18-08, Standard Test Methods for RockwellHardness of Metallic MaterialsIEEE/ASTM SI 10-2010, American National Standardfor Me

27、tric PracticePublisher: American Society for Testing and Materials(ASTM International), 100 Barr Harbor Drive, P.O.Box C700, West Conshohocken, PA 19428-2959(www.astm.org)ISO 1:2002, Geometrical Product Specifications (GPS) Standard reference temperature for geometrical prod-uct specification and ve

28、rificationISO 3611:2010, Geometrical product specifications(GPS) Dimensional measuring equipment:Micrometers for external measurements Designand metrological characteristicsPublisher: International Organization for Standardiza-tion (ISO) Central Secretariat, 1, ch. de la Voie-Creuse,Case postale 56,

29、 CH-1211 Geneve 20, Switzerland/Suisse (www.iso.org)JCGM 100:2008, Evaluation of measurement data Guide to the expression of uncertainty in measure-ment (GUM)ASME B89.1.13-2013JCGM 106:2012, Evaluation of measurement data Therole of measurement uncertainty in conformityassessmentJCGM 200:2008, Inter

30、national vocabulary of met-rology Basic and general concepts and associatedterms (VIM)Publisher: Joint Committee for Guides in Metrology,Bureau International des Poids et Mesures (BIPM),Pavillon de Breteuil, 92312 Se vres CEDEX, France(http:/www.bipm.org/en/committees/jc/jcgm/)4 MICROMETERS GENERAL4

31、.1 General DesignThe general design and workmanship of micrometersshall be such to ensure compliance with the require-ments of this Standard under all operational orienta-tions, unless otherwise specified by the manufacturer.4.2 ResolutionMicrometers using the metric system shall read tothe least co

32、unt of 0.01 mm, 0.002 mm, or 0.001 mm.Micrometers using the inch system shall read to the leastcount of 0.001 in., 0.0001 in., or 0.00005 in. Smaller valuesmay be specified by the micrometer manufacturer.4.3 FinishThe surface of graduated parts shall have a satinchrome or dull, nonglare finish. All

33、other exposed partsnot used as measuring components shall be coated toprevent corrosion. Exposed surfaces of measuring com-ponents shall have a ground finish with surfaceroughness not to exceed 0.8 H9262m (32 H9262in.) Ra, exceptwhere otherwise specified within this Standard.4.4 Identification Marki

34、ngIn addition to other markings, instruments shall bemarked in a permanent and legible manner with themanufacturers name or trademark so that the part num-ber, range of the instrument, and the source of the manu-facturer can be readily determined.4.5 AdjustmentsEach micrometer shall have a means for

35、 the user toset the instrument to zero or to the reference point. Eachinstrument shall be adjustable to compensate for wearon the measuring faces and/or wear between the screwportion of the spindle and the nut.4.6 Micrometers Screw SpindleThe screw spindle material shall be stabilized, preci-sion gr

36、ound, and have a hardness not less than 60 HRC.The fit between the spindle and its bearings, includingthe nut, shall be free turning without perceptible back-lash, end shake, or side shake.4.7 Measuring FacesAll measuring faces shall have a hardness not lessthan 60 HRC.24.8 GraduationsThe graduation

37、s shall have the depth reduced belowthe surface of the component carrying the graduationsand shall be of contrasting color. Variations in width ofthe graduated lines on the thimble and fiducial line onthe barrel shall not exceed 0.030 mm (0.0012 in.).4.9 Effect of Spindle Locking DeviceFor micromete

38、rs equipped with a spindle lockingdevice, when the spindle is locked, the micrometer indi-cation shall not change by more than 0.002 mm for ametric-reading micrometer and 0.0001 in. for an inch-reading micrometer.4.10 Definition of an IndicationThe specified maximum permissible errors (the MPEvalues

39、) apply to any and all unique measurement indica-tions made under reasonable use of the micrometer.Averaging of several test values, or other data treatment,is not permitted when determining conformance tospecifications.4.11 TemperatureAll specifications are to be evaluated in accordancewith ISO 1:2

40、002 (20C) unless another temperature isspecified.Unless otherwise stated by the manufacturer, theeffective coefficient of thermal expansion (CTE) of amicrometer in the temperature range 10C to 30C shallbe (11.5 1.0) x 10-6/C. If not, then the effective CTEwith its uncertainty shall be supplied by th

41、emanufacturer.NOTE: Corrections for linear thermal expansion should be con-sidered when calibrating or using a micrometer.4.12 Decision RulesUnless otherwise stated, the default decision rulewhen determining the conformance of a micrometer tospecifications is simple 4:1 acceptance in accordancewith

42、ASME B89.7.3.1.NOTE: An example of determining conformance to specificationis shown in Nonmandatory Appendix D, para. D-6.7.4.13 TraceabilityAll the length standards, e.g., gage blocks, used indetermining the conformance of a micrometer to specifi-cations must have metrological traceability perASME

43、B89.7.5.4.14 SpecificationsThe micrometer manufacturer or user may specifysmaller tolerance limits and maximum permissibleerrors than shown in this Standard. Specifications forlarger size micrometers and setting standards may alsobe stated in accordance with this Standard. To conformto this Standard

44、, the same terms, definitions, and sym-bols shall apply and be employed. Any and all differ-ences must be stated in completeness.ASME B89.1.13-20135 OUTSIDE MICROMETERS (SEE FIG. 5-1)5.1 FrameThe frame shall be shaped to permit the measurementof a cylinder having a diameter equal to the maximumcapac

45、ity of the micrometer caliper. The cross sectiondesign and the frame material shall be such that whena force of 10 N for metric-reading micrometers or 2 lb forinch-reading micrometers is applied to the anvil contactface parallel to the spindle axis, the flexure of the frameshall not exceed the toler

46、ance limits specified inTable 5.1-1 or 5.1-2. The frame may be insulated to pre-vent the transmission of body heat.5.2 Measuring FacesFor outside micrometers with flat measuring faces,the maximum flatness error allowable shall not exceed1 H9262m (40 H9262in.) for each face. Surface finish shall note

47、xceed 0.1 H9262m(4H9262in.) Ra.5.3 SpindleAnvil AlignmentThe misalignment between the anvil and spindle shallnot exceed the maximum values indicated in Table 5.1-1or 5.1-2 at any point within the measuring range of themicrometer.5.4 Maximum Permissible Errors (MPE)5.4.1 Length Measurement Error. Wit

48、h the microme-ter set to read zero at minimum travel, the length mea-surement error of indication, when using full measuringface contact, shall not exceed the maximum values indi-cated in Table 5.1-1 or 5.1-2 at any point within themeasuring range of the instrument. Length measure-ment error is calc

49、ulated as the difference between amicrometer indication and the reference value of themeasurement standard.5.4.2 Parallelism Error. The parallelism error ofindication is the maximum difference in successive mea-surements using partial measuring face contact at anyposition on the measuring faces, but at the same nominalpoint in the measuring range of the micrometer. Theparallelism error shall not exceed the maximum valuesindicated in Table 5.1-1 or 5.1-2 at any point within themeasuring range of the micrometer.5.4.3 Repeatability. In ISO 3611:2010, repe