IEEE N42 45-2011 en American National Standard for Evaluating the Image Quality of X-ray Computed Tomography (CT) Security-Screening Systems《X射线计算机断层扫描(CT)安全屏蔽系.pdf
《IEEE N42 45-2011 en American National Standard for Evaluating the Image Quality of X-ray Computed Tomography (CT) Security-Screening Systems《X射线计算机断层扫描(CT)安全屏蔽系.pdf》由会员分享,可在线阅读,更多相关《IEEE N42 45-2011 en American National Standard for Evaluating the Image Quality of X-ray Computed Tomography (CT) Security-Screening Systems《X射线计算机断层扫描(CT)安全屏蔽系.pdf(57页珍藏版)》请在麦多课文档分享上搜索。
1、 American National Standard for Evaluating the Image Quality of X-ray Computed Tomography (CT) Security-Screening Systems Sponsored by the National Committee on Radiation Instrumentation, N42 IEEE 3 Park Avenue New York, NY 10016-5997 USA 23 May 2011 Accredited by the American National Standards Ins
2、titute ANSI N42.45-2011ANSI N42.45- 2011 American National Standard for Evaluating the Image Quality of X-ray Computed Tomography (CT) Security-Screening Systems Sponsor National Committee on Radiation Instrumentation, N42 Accredited by the American National Standards Institute Secretariat Institute
3、 of Electrical and Electronics Engineers, Inc. Approved 26 January 2011 American National Standards Institute Abstract: Test methods and test articles for the evaluation of the image quality of CT security-screening systems are provided. The quality of data for automated analysis is the primary conc
4、ern. This standard does not address the systems ability to use its image data to automatically detect explosives or other threat materials, which is typically verified by an appropriate regulatory body. Keywords: ANSI N42.25, computed tomography, contraband, detection, explosives, image quality, lug
5、gage, screening, security The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2011 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 23 May 2011. Printed in the United States of America. IEEE is
6、 a registered trademark in the U.S. Patent +1-978-750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. v Copyright 2011 IEEE. All rights reserved. Introduction This introduction is not part of
7、 ANSI 42.45-2011, American National Standard Evaluating the Image Quality of X-ray Computed Tomography (CT) Security-Screening Systems. This standard is the responsibility of the Accredited American Standards Committee on Radiation Instrumentation, N42. The standard was approved on N42 letter ballot
8、. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or refer
9、ring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available fo
10、r a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities a
11、nd private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendm
12、ents, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended throug
13、h the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process
14、, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Cur
15、rent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. vi Copyright 2011 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent ri
16、ghts. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validit
17、y or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the v
18、alidity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vii Copyright 2011 IEEE. All rights reserved. Participants At the time it approved this standard, the Accredited S
19、tandards Committee on Radiation Instrumentation, N42, had the following members: Michael P. Unterweger, Chair Michael Kipness, Administrative secretary Organization represented Name of representative CanberraBob Huckins Chew, M.HJack M. Selby Commerce Dept, U.S. NIST .Michael P. Unterweger Computer
20、Dependability Associates, LLC.Gary Johnson Consultant Frank X. Masse Department of Homeland Security. Peter Shebell Entergy-ANO Ron Schwartz Health Physics Soc. Sandy Perle Harvard University Joseph Ring Institute of Electrical any deviations shall be noted by the evaluators in the manually recorded
21、 data. If the system is approved to operate under more than one configuration, the user may want to request the test be carried out at all appropriate settings. Evaluation is to be based on images or other data normally used in standard mode of operation. The exposure time and level shall be chosen
22、as that used when the CT system is operated for the intended use in the security screening application. A calibration of the CT system shall be carried out prior to any testing. Any recalibration of the CT system shall be allowed according to the standard operation of the system. In order to assure
23、that the system is using a configuration approved by the appropriate regulatory agency, the user may wish to request that the vendor provide the specific settings used during the evaluation such as: tube voltage(s), amperage, voxel size, belt speed, etc. The test articles (see Clause 5) shall be pre
24、sented to the system in a controlled position and orientation. The main axis of each test article should be parallel to the conveyor belt motion direction and the front of the article shall enter the system first (front designated via labeling). The test method described in 6.3 determines the angle
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