IEEE C37 17-2012 en Trip Systems for Low-Voltage (1000 V and below) AC and General Purpose (1500 V and below) DC Power Circuit Breakers《低压(1000 V及以下)交流和通用(1500 .pdf

《IEEE C37 17-2012 en Trip Systems for Low-Voltage (1000 V and below) AC and General Purpose (1500 V and below) DC Power Circuit Breakers《低压(1000 V及以下)交流和通用(1500 .pdf》由会员分享，可在线阅读，更多相关《IEEE C37 17-2012 en Trip Systems for Low-Voltage (1000 V and below) AC and General Purpose (1500 V and below) DC Power Circuit Breakers《低压(1000 V及以下)交流和通用(1500 .pdf（27页珍藏版）》请在麦多课文档分享上搜索。

1、 IEEE Standard for Trip Systems for Low-Voltage (1000 V and below) AC and General Purpose (1500 V and below) DC Power Circuit Breakers Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 18 September 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions o

2、f any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2012 IEEE. All rights reserved. iv Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with

3、 the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge ac

4、tion that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and

5、use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users

6、of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition

7、 of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/

8、index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed

9、at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Copyright 2012 IEEE. All rights reserved. v Patents Attention is called to the possibility that implementation of this standard may require use of subject matter

10、 covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the

11、 statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and cond

12、itions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be requi

13、red, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this stand

14、ard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2012 IEEE. All rights reserved. vi Participants At

15、the time this IEEE standard was completed, the IEEE C37.17 Working Group had the following membership: Jeff Mizener, ChairPaul Barnhart David Dunne Doug Edwards Keith Flowers Nancy Gunderson Allan Morse George Nourse T. W. Olsen Michael D. Sigmon Alan Storms Paul Terry At the time this standard was

16、completed, the Low Voltage Switchgear Devices subcommittee of the IEEE Switchgear Committee had the following membership: Keith Flowers, Chair Charles A. Morse, Secretary Paul Barnhart Dave Dunne Doug Edwards Michael Flack Sahadev Gohil Harry Josten Michael Lafond Albert Livshitz Nigel McQuin Jeff M

17、izener George Nourse T. W. Olsen Robert J. Puckett Michael D. Sigmon Alan Storms Paul Sullivan At the time this standard was completed, the Switchgear Committee of the IEEE Power Engineering Society had the following membership: Ken Edwards, Chair T. W. Olsen, Vice-chair Paul B. Sullivan, Secretary

18、Michael Wactor, Standards Coordinator Roy Alexander Chris Ambrose Michael Anderson John Angelis Mauricio Aristizabal Charles Ball Paul Barnhart Lloyd Beard Robert Behl W.J. (Bill) Bergman Stan Billings Antone Bonner Anne Bosma John Brunke Ted Burse Eldridge Byron Raymond Capra Chih Chow Frank DeCesa

19、ro Patrick Di Lillo Alexander Dixon Randall Dotson Denis Dufournet Pete Dwyer Ken Edwards Doug Edwards Leslie Falkingham Lawrence Farr Keith Flowers Marcel Fortin David Galicia Mietek Glinkowski Sahadev Gohil Keith Gray Helmut Heiermeier Luther Holloman Danny Hoss James Houston Richard Jackson Cory

20、Johnson Harry Josten Dan Konkle Stephen Lambert Ward Laubach John Leach David Lemmerman George Lester Hua Ying Liu Albert Livshitz Russell Long James Marek Frank Mayle Deepak Mazumdar Neil McCord Nigel McQuin Steven Meiners Jeffery Mizener Georges Montillet Anne Morgan Charles Morse Frank Muench Yas

21、in Musa Jeffrey Nelson T. W. Olsen Miklos Orosz Donald Parker Robert Puckett Carl Reigart Hugh Ross Timothy Royster Roderick Sauls Devki Sharma Michael D. Sigmon Robert Smith H. Smith James Smith Francois Soulard David Stone Paul Sullivan James Swank Thomas Tobin Michael Wactor Charles Wagner John W

22、ebb John Wood Richard York Jan Zawadzki Copyright 2012 IEEE. All rights reserved. vii The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Satish Aggarwal Paul Barnhart Thomas Basso Rob

23、ert Beavers Steven Bezner William Bloethe Ted Burse Tommy Cooper Gary Donner Douglas Edwards Gary Engmann Keith Flowers Kenneth Gettman Randall Groves Nancy Gunderson Gary Heuston Andrew Jones James Jones Ethan Kim Joseph L. Koepfinger Boris Kogan Jim Kulchisky Saumen Kundu Chung-Yiu Lam John Leach

24、Albert Livshitz R. Long Greg Luri Steven Meiners Jeffrey Merryman James Mitchem Jeffery Mizener Georges Montillet Charles Morse Jerry Murphy Dennis Neitzel Michael S. Newman George Nourse T. W. Olsen Miklos Orosz Bansi Patel Michael Roberts Charles Ross Bartien Sayogo Gil Shultz Michael D. Sigmon Ja

25、mes Smith Jerry Smith Alan Storms Paul Sullivan David Tepen John Vergis John Webb Larry Yonce When the IEEE-SA Standards Board approved this standard on June 8, 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Satish Aggarwal Masayuki

26、 Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov T. W. Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Y

27、uYuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Patrick Gibbons IEEE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Pro

28、gram Development Copyright 2012 IEEE. All rights reserved. viii Introduction This introduction is not part of IEEE Std C37.17-2012, IEEE Standard for Trip Systems for Low-Voltage (1000 V and below) AC and General Purpose (1500 V and below) DC Power Circuit Breakers. This standard supersedes and upda

29、tes the 1997 edition and all previous revised editions of the original standard published in 1956, all written by the National Electrical Manufacturers Association. In 2003, responsibility for future revisions of C37.17 was transferred from NEMA to IEEE. This standard pertains to direct-acting overc

30、urrent, reverse-current, and undervoltage trip devices of both the electromechanical and electronic types, integral with low-voltage ac and general purpose dc circuit breakers covered by IEEE Std C37.13, IEEE Std C37.14, and IEEE Std C37.16. This revision is aligned with the amended requirements of

31、related assemblies, including low-voltage power circuit breakers (IEEE Std C37.13, IEEE Std C37.14, IEEE Std C37.16, and ANSI C37.50) and metal-enclosed low-voltage power circuit breaker switchgear (IEEE Std C37.20.1TMand ANSI C37.51). Requirements and references for electromechanical devices are in

32、cluded for historical continuity. This standard does not apply to molded-case circuit breakers. This revision of the standard updates the terminology, and reflects technology and current practices in the industry, as well as the capabilities of modern electronic tripping systems. Where appropriate,

33、certain historical information has been retained for reference purposes. It is noted that modern electronic systems may have extended capabilities compared to historic systems. Copyright 2012 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 2. Normative references 2 3

34、. Definitions 3 4. Preferred trip device current ratings or settings (amperes) . 4 5. Types and response of direct-acting overcurrent trip functions 5 5.1 General 5 5.2 Long-time delay . 5 5.3 Short-time delay 5 5.4 Instantaneous . 5 5.5 Neutral overload 5 5.6 Ground fault . 6 5.7 Functions modifyin

35、g the response of direct-acting overcurrent trip functions 6 6. Calibration of direct-acting overcurrent trip functions . 6 6.1 General 6 6.2 Long-time delay trip functions (electromechanical devices only) . 7 6.3 Long-time delay trip functions (electronic devices only) 7 6.4 Short-time delay trip f

36、unctions 7 6.5 Instantaneous trip functions (high range) 7 6.6 Instantaneous trip functions (low range electromechanical devices only) . 7 6.7 Neutral trip functions . 7 6.8 Ground fault trip functions 8 7. Delay times of direct-acting overcurrent trip functions 8 7.1 Long-time-delay trip functions

37、8 7.2 Short-time-delay trip functions 8 7.3 Short-time-delay ground fault trip function . 8 8. Reverse-current trip devices for general purpose dc circuit breakers 10 9. Undervoltage trip devices 10 9.1 General .10 9.2 Drop-out voltage range .10 9.3 Pickup or seal in voltage .11 9.4 Maximum operatin

38、g voltage .11 10. Tests 11 11. Software process verification 11 Annex A (informative) Illustrative time overcurrent characteristics 12 Annex B (informative) Bibliography15 Copyright 2012 IEEE. All rights reserved. 1 IEEE Standard for Trip Systems for Low-Voltage (1000 V and below) AC and General Pur

39、pose (1500 V and below) DC Power Circuit Breakers IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for det

40、ermining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in

41、 all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This sta

42、ndard pertains to the requirements for direct acting current and voltage protective functions of: a) direct-acting overcurrent electromechanical trip devices b) direct-acting overcurrent electronic trip systems c) reverse-current trip systems for dc circuit breakers d) undervoltage trip devices that

43、 are integral with low-voltage ac and dc power circuit breakers covered by IEEE Std C37.13, IEEE Std C37.14, and IEEE Std C37.16.11Information on references can be found in Clause 2. IEEE Std C37.17-2012 IEEE Standard for Trip Systems for Low-Voltage (1000 V and below) AC and General Purpose (1500 V

44、 and below) DC Power Circuit Breakers Copyright 2012 IEEE. All rights reserved. 2Additional information, communication and/or additional internal or external protective functions or devices are not covered by this standard. This standard should not be interpreted to restrict the inclusion of such fu

45、nctionality in the device. 1.2 Purpose The purpose of this standard is to provide the requirements for direct-acting overcurrent and/or undervoltage protective systems associated with low-voltage power circuit breakers. It is aligned with the requirements of related assemblies, including low-voltage

46、 power circuit breaker (IEEE Std C37.13, IEEE Std C37.14, IEEE Std C37.16, and ANSI C37.50) and metal-enclosed low-voltage power circuit breaker switchgear (IEEE Std C37.20.1 and ANSI C37.51). This standard includes minimum requirements for available settings and time delay characteristics as well a

47、s operational and calibration requirements. The functional requirements for the overall circuit breaker, including test requirements (whether design, production, or conformance) are specified in the latest versions of IEEE Std C37.13, IEEE Std C37.14, IEEE Std C37.16, and ANSI C37.50. 2. Normative r

48、eferences The following referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For und

49、ated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. ANSI C37.50, American National Standard for SwitchgearLow-Voltage AC Power Circuit Breakers Used in EnclosuresTest Procedures.2ANSI C37.51, American National Standard for SwitchgearMetal-Enclosed Low-Voltage AC Power Circuit Breaker Switchgear AssembliesConformance Test Procedures. IEEE Std C37.13, IEEE Standard for Low-Voltage AC Power Circuit Breakers Used in Enclosures.3, 4IEEE Std C37.14, IEEE Standard for Low-Voltage DC Power Circuit Breakers