IEEE 1450 2-2002 en IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450 -1999) for DC Level Specification (IEEE Computer Soci.pdf

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1、 IEC 62527Edition 1.0 2007-11INTERNATIONAL STANDARD Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification IEC 62527:2007(E)IEEE Std.1450.2-2002IEEE 1450.2THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved. IEEE is a registered trad

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29、 standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. IEC 62527:2007(E)IEEE 1450.2-2002(E) 5 Published by IEC under licence from IEEE. 2002 IEEE. All rights reserved.IEEE Standard for Extensions to Standard Test Interface Language

30、(STIL) (IEEE Std 1450TM-1999)for DC Level SpecificationSponsorTest Technology Standards Committeeof theIEEE Computer SocietyApproved 11 December 2002IEEE-SA Standards BoardAbstract: This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels.STIL language constructs are de

31、fined to specify the DC conditions necessary to execute digital vec-tors on automated test equipment (ATE). STIL language extensions include structures for: (a) spec-ifying the DC conditions for a device under test; (b) specifying DC conditions either globally, bypattern burst, by pattern, or by vec

32、tor; (c) specifying alternate DC levels; and (d) selecting DC levelsand alternate levels within a period, much the same as timed format events.Keywords: automated test equipment (ATE), comparator, DC levels, device power supply (DPS),device under test (DUT), driver, driver termination, dynamic load,

33、 functional test, parametric mea-surement unit (PMU), power sequence, slew rate, voltage clampIEC 62527:2007(E)IEEE 1450.2-2002(E) 6 Published by IEC under licence from IEEE. 2002 IEEE. All rights reserved.IEEE Introductiong54g87g68g81g71g68g85g71g3g55g72g86g87g3g44g81g87g72g85g73g68g70g72g3g47g68g8

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35、75g76g79g72g3g39g38g3g79g72g89g72g79g86g3g90g72g85g72g3g72g91g83g79g76g70g76g87g79g92g3g72g91g70g79g88g71g72g71g3g73g85g82g80g3g87g75g68g87g3g86g70g82g83g72g15g3g76g87g3g90g68g86g3g68g83g83g68g85g72g81g87g3g87g75g68g87g39g38g3g79g72g89g72g79g86g3g90g72g85g72g3g68g81g3g68g85g72g68g3g82g73g3g76g81g87g

36、72g85g72g86g87g3g68g81g71g3g76g80g83g82g85g87g68g81g70g72g3g87g82g3g87g75g72g3g54g55g44g47g3g88g86g72g85g3g70g82g80g80g88g81g76g87g92g17g3g55g75g72g3g51g20g23g24g19g17g21g3g58g82g85g78g76g81g74g42g85g82g88g83g3g90g68g86g3g73g82g85g80g72g71g3g87g82g3g68g71g71g85g72g86g86g3g87g75g72g3g72g91g87g72g81g8

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39、9g82g79g87g68g74g72g3g68g81g71g3g70g88g85g85g72g81g87g12g15g3g68g81g71g3g83g82g90g72g85g3g86g72g84g88g72g81g70g76g81g74g87g82g3g87g75g72g3g71g72g89g76g70g72g3g88g81g71g72g85g3g87g72g86g87g17g3g39g88g85g76g81g74g3g87g75g72g3g70g82g88g85g86g72g3g82g73g3g71g72g89g72g79g82g83g80g72g81g87g15g3g87g90g82g3

40、g82g87g75g72g85g3g76g80g83g82g85g87g68g81g87g3g87g82g83g76g70g86g3g90g72g85g72g3g68g71g71g85g72g86g86g72g71g17g55g75g72g86g72g3g76g81g70g79g88g71g72g71g3g87g75g72g3g70g68g83g68g69g76g79g76g87g92g3g73g82g85g3g86g90g76g87g70g75g76g81g74g3g79g72g89g72g79g86g3g90g76g87g75g76g81g3g68g3g83g72g85g76g82g71g

41、15g3g68g81g71g3g73g82g85g3g86g90g76g87g70g75g76g81g74g3g79g72g89g72g79g86g3g69g72g87g90g72g72g81g3g89g72g70g87g82g85g86g76g81g3g68g3g83g68g87g87g72g85g81g17IEC 62527:2007(E)IEEE 1450.2-2002(E) 7 Published by IEC under licence from IEEE. 2002 IEEE. All rights reserved.1. Overviewg55g75g76g86g3g86g87g

42、68g81g71g68g85g71g3g72g91g87g72g81g71g86g3g44g40g40g40g3g54g87g71g3g20g23g24g19g16g20g28g28g28g20g3g11g54g55g44g47g12g3g87g82g3g86g88g83g83g82g85g87g3g87g75g72g3g71g72g73g76g81g76g87g76g82g81g3g82g73g3g39g38g3g79g72g89g72g79g86g17g3g55g75g72g3g39g38g3g79g72g89g72g79g86g76g81g73g82g85g80g68g87g76g82g

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