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    IEEE 1450 2-2002 en IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450 -1999) for DC Level Specification (IEEE Computer Soci.pdf

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    IEEE 1450 2-2002 en IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450 -1999) for DC Level Specification (IEEE Computer Soci.pdf

    1、 IEC 62527Edition 1.0 2007-11INTERNATIONAL STANDARD Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification IEC 62527:2007(E)IEEE Std.1450.2-2002IEEE 1450.2THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved. IEEE is a registered trad

    2、emark in the U.S. Patent any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the Internationa

    3、l Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each te

    4、chnical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Pu

    5、blications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their n

    6、ational and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared t

    7、o be in conformity with an IEC Publication. 6) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC/IEEE 62527 has been

    8、processed through Technical Committee 93: Design automation. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting 1450.2(2005) 93/249/FDIS 93/260/RVDFull information on the voting for the approval of this standard can be found in the report on voting indicate

    9、d in the above table. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed

    10、, withdrawn, replaced by a revised edition, or amended. IEC 62527:2007(E)IEEE 1450.2-2002(E) 4 Published by IEC under licence from IEEE. 2002 IEEE. All rights reserved.IEC/IEEE Dual Logo International StandardsThis Dual Logo International Standard is the result of an agreement between the IEC and th

    11、e Institute of Electrical and Electronics Engineers, Inc. (IEEE). The original IEEE Standard was submitted to the IEC for consideration under the agreement, and the resulting IEC/IEEE Dual Logo International Standard has been published in accordance with the ISO/IEC Directives. IEEE Standards docume

    12、nts are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensus development process, approved by the American National Standards Institute, which brings together vol

    13、unteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of the Institute and serve without compensation. While the IEEE administers the process and establishes rules to promote fairness in the consensus development process, the IEEE d

    14、oes not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of an IEC/IEEE Dual Logo International Standard is wholly voluntary. The IEC and IEEE disclaim liability for any personal injury, property or other damage, of any nature whatsoever,

    15、 whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the publication, use of, or reliance upon this, or any other IEC or IEEE Standard document. The IEC and IEEE do not warrant or represent the accuracy or content of the material contained herein, and exp

    16、ressly disclaim any express or implied warranty, including any implied warranty of merchantability or fitness for a specific purpose, or that the use of the material contained herein is free from patent infringement. IEC/IEEE Dual Logo International Standards documents are supplied “AS IS”. The exis

    17、tence of an IEC/IEEE Dual Logo International Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEC/IEEE Dual Logo International Standard. Furthermore, the viewpoint expressed at the time a

    18、 standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to review at least every five years for revision or reaffirmation. When a document is more than five yea

    19、rs old and has not been reaffirmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. In publishing and making this docume

    20、nt available, the IEC and IEEE are not suggesting or rendering professional or other services for, or on behalf of, any person or entity. Neither the IEC nor IEEE is undertaking to perform any duty owed by any other person or entity to another. Any person utilizing this, and any other IEC/IEEE Dual

    21、Logo International Standards or IEEE Standards document, should rely upon the advice of a competent professional in determining the exercise of reasonable care in any given circumstances. Interpretations Occasionally questions may arise regarding the meaning of portions of standards as they relate t

    22、o specific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that any interpretation has also received

    23、the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments

    24、 for revision of IEC/IEEE Dual Logo International Standards are welcome from any interested party, regardless of membership affiliation with the IEC or IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Commen

    25、ts on standards and requests for interpretations should be addressed to: Secretary, IEEE-SA Standards Board, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA and/or General Secretary, IEC, 3, rue de Varemb, PO Box 131, 1211 Geneva 20, Switzerland. Authorization to photocopy portions of a

    26、ny individual standard for internal or personal use is granted by the Institute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service

    27、, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTE Attention is called to the possibility that implementation of this standard may re

    28、quire use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE

    29、 standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. IEC 62527:2007(E)IEEE 1450.2-2002(E) 5 Published by IEC under licence from IEEE. 2002 IEEE. All rights reserved.IEEE Standard for Extensions to Standard Test Interface Language

    30、(STIL) (IEEE Std 1450TM-1999)for DC Level SpecificationSponsorTest Technology Standards Committeeof theIEEE Computer SocietyApproved 11 December 2002IEEE-SA Standards BoardAbstract: This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels.STIL language constructs are de

    31、fined to specify the DC conditions necessary to execute digital vec-tors on automated test equipment (ATE). STIL language extensions include structures for: (a) spec-ifying the DC conditions for a device under test; (b) specifying DC conditions either globally, bypattern burst, by pattern, or by vec

    32、tor; (c) specifying alternate DC levels; and (d) selecting DC levelsand alternate levels within a period, much the same as timed format events.Keywords: automated test equipment (ATE), comparator, DC levels, device power supply (DPS),device under test (DUT), driver, driver termination, dynamic load,

    33、 functional test, parametric mea-surement unit (PMU), power sequence, slew rate, voltage clampIEC 62527:2007(E)IEEE 1450.2-2002(E) 6 Published by IEC under licence from IEEE. 2002 IEEE. All rights reserved.IEEE Introductiong54g87g68g81g71g68g85g71g3g55g72g86g87g3g44g81g87g72g85g73g68g70g72g3g47g68g8

    34、1g74g88g68g74g72g3g11g54g55g44g47g12g3g11g44g40g40g40g3g54g87g71g3g20g23g24g19g16g20g28g28g28g12g3g90g68g86g3g71g72g89g72g79g82g83g72g71g3g68g81g71g3g68g83g83g85g82g89g72g71g3g90g76g87g75g3g68g81g3g76g81g87g72g81g16g87g76g82g81g68g79g79g92g3g70g82g81g86g87g85g68g76g81g72g71g3g86g70g82g83g72g17g3g58g

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    37、6g76g82g81g3g82g73g3g39g38g3g79g72g89g72g79g86g3g87g82g3g87g75g72g3g54g55g44g47g3g86g87g68g81g71g68g85g71g17g55g75g85g72g72g3g80g68g76g81g3g87g82g83g76g70g86g3g90g72g85g72g3g76g71g72g81g87g76g73g76g72g71g3g68g86g3g83g85g76g82g85g76g87g76g72g86g3g73g82g85g3g87g75g72g3g90g82g85g78g17g3g55g75g72g86g72g

    38、3g76g81g70g79g88g71g72g3g83g72g85g16g83g76g81g3g85g72g73g72g85g72g81g70g72g3g79g72g89g72g79g86g3g73g82g85g3g86g76g74g81g68g79g83g76g81g86g3g11g72g17g74g17g15g3g57g44g43g15g3g57g44g47g15g3g57g50g43g15g3g57g50g47g12g15g3g71g72g89g76g70g72g3g83g82g90g72g85g3g86g88g83g83g79g92g3g79g72g89g72g79g86g3g11g8

    39、9g82g79g87g68g74g72g3g68g81g71g3g70g88g85g85g72g81g87g12g15g3g68g81g71g3g83g82g90g72g85g3g86g72g84g88g72g81g70g76g81g74g87g82g3g87g75g72g3g71g72g89g76g70g72g3g88g81g71g72g85g3g87g72g86g87g17g3g39g88g85g76g81g74g3g87g75g72g3g70g82g88g85g86g72g3g82g73g3g71g72g89g72g79g82g83g80g72g81g87g15g3g87g90g82g3

    40、g82g87g75g72g85g3g76g80g83g82g85g87g68g81g87g3g87g82g83g76g70g86g3g90g72g85g72g3g68g71g71g85g72g86g86g72g71g17g55g75g72g86g72g3g76g81g70g79g88g71g72g71g3g87g75g72g3g70g68g83g68g69g76g79g76g87g92g3g73g82g85g3g86g90g76g87g70g75g76g81g74g3g79g72g89g72g79g86g3g90g76g87g75g76g81g3g68g3g83g72g85g76g82g71g

    41、15g3g68g81g71g3g73g82g85g3g86g90g76g87g70g75g76g81g74g3g79g72g89g72g79g86g3g69g72g87g90g72g72g81g3g89g72g70g87g82g85g86g76g81g3g68g3g83g68g87g87g72g85g81g17IEC 62527:2007(E)IEEE 1450.2-2002(E) 7 Published by IEC under licence from IEEE. 2002 IEEE. All rights reserved.1. Overviewg55g75g76g86g3g86g87g

    42、68g81g71g68g85g71g3g72g91g87g72g81g71g86g3g44g40g40g40g3g54g87g71g3g20g23g24g19g16g20g28g28g28g20g3g11g54g55g44g47g12g3g87g82g3g86g88g83g83g82g85g87g3g87g75g72g3g71g72g73g76g81g76g87g76g82g81g3g82g73g3g39g38g3g79g72g89g72g79g86g17g3g55g75g72g3g39g38g3g79g72g89g72g79g86g76g81g73g82g85g80g68g87g76g82g

    43、81g3g70g82g81g86g76g86g87g86g3g82g73g3g87g75g72g3g83g72g85g16g83g76g81g3g85g72g73g72g85g72g81g70g72g3g79g72g89g72g79g86g15g3g87g75g72g3g71g72g89g76g70g72g3g83g82g90g72g85g3g86g88g83g83g79g92g3g11g39g51g54g12g3g79g72g89g72g79g86g15g3g68g81g71g3g87g75g72g3g86g72g84g88g72g81g70g16g76g81g74g3g82g73g3g87

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