IEC 61290-3-2-2008 Optical amplifiers - Test methods - Part 3-2 Noise figure parameters - Electrical spectrum analyzer method《光纤放大器.试验方法.第3-2部分 噪音图形参数.电气光谱分析法》.pdf
《IEC 61290-3-2-2008 Optical amplifiers - Test methods - Part 3-2 Noise figure parameters - Electrical spectrum analyzer method《光纤放大器.试验方法.第3-2部分 噪音图形参数.电气光谱分析法》.pdf》由会员分享,可在线阅读,更多相关《IEC 61290-3-2-2008 Optical amplifiers - Test methods - Part 3-2 Noise figure parameters - Electrical spectrum analyzer method《光纤放大器.试验方法.第3-2部分 噪音图形参数.电气光谱分析法》.pdf(38页珍藏版)》请在麦多课文档分享上搜索。
1、 IEC 61290-3-2Edition 2.0 2008-07INTERNATIONAL STANDARD NORME INTERNATIONALEOptical amplifiers Test methods Part 3-2: Noise figure parameters Electrical spectrum analyzer method Amplificateurs optiques Mthodes dessais - Partie 3-2: Paramtres du facteur de bruit Mthode de lanalyseur spectral lectriqu
2、e IEC61290-3-2:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm,
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16、 FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61290-3-2Edition 2.0 2008-07INTERNATIONAL STANDARD NORME INTERNATIONALEOptical amplifiers Test methods Part 3-2: Noise figure parameters Electrical spectrum analyzer method Amplificateurs opti
17、ques Mthodes dessais - Partie 3-2: Paramtres du facteur de bruit Mthode de lanalyseur spectral lectrique INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE QICS 33.180.30 PRICE CODECODE PRIXISBN 2-8318-9898-6 Registered trademark of the International Electrotechnica
18、l Commission Marque dpose de la Commission Electrotechnique Internationale 2 61290-3-2 IEC:2008 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope and object6 2 Normative references .6 3 Symbols, acronyms and abbreviations7 4 Apparatus.8 5 Test specimen 10 6 Procedure 10 6.1 Frequency-scanning technique: ca
19、libration11 6.2 Frequency-scanning technique: measurement.12 6.3 Selected-frequency technique: calibration and measurement 13 6.4 Measurement accuracy limitations.13 7 Calculation .14 7.1 Calculation of calibration results14 7.2 Calculation of test results for the frequency-scanning technique15 7.3
20、Calculation of test results for the selected-frequency technique.15 8 Test results 16 Bibliography17 Figure 1 Scheme of a measurement set-up 9 61290-3-2 IEC:2008 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ OPTICAL AMPLIFIERS TEST METHODS Part 3-2: Noise figure parameters Electrical spectrum analyz
21、er method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardizat
22、ion in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is e
23、ntrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the Int
24、ernational Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects sinc
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