EN 62496-2-2-2011 en Optical circuit boards - Part 2-2 Measurements - Dimensions of optical circuit boards《光学电路板 第2-2部分 测量 光电路板尺寸》.pdf
《EN 62496-2-2-2011 en Optical circuit boards - Part 2-2 Measurements - Dimensions of optical circuit boards《光学电路板 第2-2部分 测量 光电路板尺寸》.pdf》由会员分享,可在线阅读,更多相关《EN 62496-2-2-2011 en Optical circuit boards - Part 2-2 Measurements - Dimensions of optical circuit boards《光学电路板 第2-2部分 测量 光电路板尺寸》.pdf(32页珍藏版)》请在麦多课文档分享上搜索。
1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationOptical circuit boardsPart 2-2: Measurements Dimensions of optical circuit boardsBS EN 62496-2-2:2011National forewordThis British Standard is the UK implementation of EN 62496-2
2、-2:2011. It is identical to IEC 62496-2-2:2011.The UK participation in its preparation was entrusted to Technical Committee GEL/86, Fibre optics.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the nece
3、ssary provisions of a contract. Users are responsible for its correct application. BSI 2011ISBN 978 0 580 69815 6 ICS 33.180.01Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy
4、 Committee on 30 June 2011.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 62496-2-2:2011EUROPEAN STANDARD EN 62496-2-2 NORME EUROPENNE EUROPISCHE NORM March 2011 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electr
5、otechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62496-2-2:2011 E ICS 33.180.01 English version Optical circuit
6、 boards - Part 2-2: Measurements - Dimensions of optical circuit boards (IEC 62496-2-2:2011) Cartes circuits optiques - Partie 2-2: Mesures - Dimensions des cartes circuits optiques (CEI 62496-2-2:2011) Optische Leiterplatten - Teil 2-2: Messungen - Abmessungen optischer Leiterplatten (IEC 62496-2-2
7、:2011) This European Standard was approved by CENELEC on 2011-03-03. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliogra
8、phical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of
9、 a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, G
10、reece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 62496-2-2:2011EN 62496-2-2:2011 - 2 - Foreword The text of document 86/378/FDIS, future edit
11、ion 1 of IEC 62496-2-2, prepared by IEC TC 86, Fibre optics, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62496-2-2 on 2011-03-03. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical na
12、tional standard or by endorsement (dop) 2011-12-03 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2014-03-03 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62496-2-2:2011 was approved by CENELEC as a
13、 European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60793-2 NOTE Harmonized as EN 60793-2. IEC 62496 series NOTE Harmonized in EN 62496 series. _ BS EN 62496-2-2:2011- 3 - EN 62496-2-2:2011 Anne
14、x ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest editi
15、on of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-1 - Environmental testing - Part 1: General and guidance EN
16、60068-1 - IEC 60793-1-45 (mod) - Optical fibres - Part 1-45: Measurement methods and test procedures - Mode field diameter EN 60793-1-45 - IEC 61189-2 - Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2: Test methods for materials for
17、interconnection structures EN 61189-2 - IEC 62496-2-1 - Optical circuit boards - Basic test and measurement procedures - Part 2-1: Measurements - Optical attenuation and isolation FprEN 62496-2-1 - IEC 62496-4 - Optical circuit boards - Part 4: Interface standards - General and guidance FprEN 62496-
18、4 - ISO 10360-2 - Geometrical product specifications (GPS) - Acceptance and reverification tests for coordinate measuring machines (CMM) - Part 2: CMMs used for measuring linear dimensions EN ISO 10360-2 - BS EN 62496-2-2:2011 2 62496-2-2 IEC:2011 CONTENTS 1 Scope . . 6 2 Normative references . 6 3
19、Terms and definitions . 6 4 Measurement condition 7 5 Objects to be measured and their procedures . 7 6 Measurement procedures for dimensions . 7 6.1 Core shape 7 6.1.1 Measuring equipment 7 6.1.2 Procedure 9 6.2 Coordinates of I/O ports . 9 6.2.1 Measurement procedure for end face I/O type OCB . 9
20、6.2.2 Measurement procedure for surface I/O port type OCB . 11 6.3 Outer shape of optical circuit board . 14 6.3.1 Method 1 (reference) Use of observation system 14 6.3.2 Method 2 (alternative) Use of dimensional drawing . . 15 6.4 Misalignment angle of I/O ports 16 6.4.1 Observation of cross sectio
21、n . 16 6.5 Mirror angle 19 6.5.1 Method 1 (reference) Use of observation system 19 6.5.2 Method 2 (alternative) Use of confocal microscope . . 20 6.6 Hole . . 21 6.6.1 Method 1 (reference) Use of observation system 21 6.6.2 Method 2 (alternative) Use of laser scanning . . 22 Annex A (informative) Pa
22、ttern pitch 24 Bibliography . 27 Figure 1 Example of measuring equipment capable of observing core shape . 8 Figure 2 Example of sample set-up for observation of core shape (end face I/O type OCB or a sliced sample) 8 Figure 3 Example of sample set-up using a halogen lamp house with light-guide fibr
23、e for observation of core shape (surface I/O type OCB) . 9 Figure 4 Example of optical position adjustment system for end face I/O type OCB 10 Figure 5 Example of optical position adjustment system for surface I/O type OCB 13 Figure 6 Example of verification with a dimensional drawing for a fibre fl
24、exible OCB . 16 Figure 7 Misalignment angle of I/O ports in end face I/O type OCB 17 Figure 8 Misalignment angle of I/O ports in surface I/O type OCB 17 Figure 9 Parameters for misalignment angle in end face I/O type OCB . 18 Figure 10 Parameters for misalignment angle in surface I/O type OCB . 18 F
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