EN 61000-4-29-2000 en Electromagnetic Compatibility (EMC) Part 4-29 Testing and Measurement Techniques - Voltage Dips Short Interruptions and Voltage Variations on D C Input Power .pdf

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1、BRITISH STANDARD Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests The European Standard EN 61000-4-29:2000 has the status of a British Standard ICs 33.100.20 BS EN 61

2、000-4-29: 2001 IEC 6 1000-4-29: 2000 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW BS EN 61000-4-29:2001 Amd. No. National foreword Date Comments This British Standard is the official English language version of EN 61000-4-29:2000. It is identical with IEC 61000-4-29:2000. T

3、he UK participation in its preparation was entrusted by Technical Committee GEL210, EMC-Policy, to Subcommittee GEL 121018, Low frequency disturbances, which has the responsibility to: This British Standard, having been prepared under the direction of the Electrotechnical Sector Committee, was publi

4、shed under the authority of the Standards Committee and comes into effect on 15 July 2001 - - aid enquirers to understand the text; present to the responsible internationallEuropean committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor re

5、lated international and European developments and promulgate them in the UK. - A list of organizations represented on this subcommittee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC 27-1 has bee

6、n renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references Attention is drawn to the fact that CEN and CENELEC Standards normally include an annex which lists normative refe

7、rences to international publications with their corresponding European publications. The British Standards which implement these international or European publications may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using t

8、he “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity fro

9、m legal obligations. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 19, and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication O BSI 07-2001 ISB

10、N O 580 37205 7 EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61 00014129 November 2000 ICs 33.100.20 English version Electromagnetic compatibility (EMC) Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity

11、tests (IEC 61 000-4-29:2000) Compatibilit lectromagntique (CEM) Partie 4-29: Techniques dessai et de mesure - Essais dimmunit aux creux de tension, coupures brves et variations de tension sur les accs dalimentation en courant continu (CE1 61 000-4-29:2000) Elektromagnetische Vertrglichkeit (EMV) Tei

12、l 4-29: Prf- und Messverfahren - Prfungen der Strestigkeit gegen Spannungseinbrche, Kurzzeitunterbrechungen und Spannungsschwan kungen an Gleichstrom-Netzeingngen (IEC 61 000-4-29:2000) This European Standard was approved by CENELEC on 2000-1 1-01. CENELEC members are bound to comply with the CENKEN

13、ELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any

14、CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versi

15、ons. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrot

16、echnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat rue de Stassart 35, B - 1050 Brussels O 2000 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No

17、. EN 61000-4-29:2000 E Page 2 EN 61000-4-29:2000 Foreword The text of document 77A/307/FDIS, future edition 1 of IEC 61000-4-29, prepared by SC 77A, Low- frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN

18、 61000-4-29 on 2000-1 1-01. The following dates were fixed: - latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement - latest date by which the national standards conflicting with the EN have to be withdrawn Annexes desi

19、gnated “normative“ are part of the body of the standard. Annexes designated “informative“ are given for information only. In this standard, annexes B and ZA are normative and annex A is informative. Annex ZA has been added by CENELEC. (dop) 2001-08-01 (dow) 2003-1 1-01 Endorsement notice The text of

20、 the International Standard IEC 61000-4-29:2000 was approved by CENELEC as a European Standard without any modification. Page 3 EN 61000-4-29:2000 CONTENTS Page INTRODUCTION 4 Clause 1 Scope and object . 5 2 Normative references . 6 3 Definitions 6 4 General 7 5 Test levels . 7 6 Test generator . 9

21、6.1 Characteristics and performances of the generator 9 6.2 Verification of the characteristics of the generator 10 8 Test procedure 11 Laboratory reference conditions . 12 Execution of the test 12 0 7 Test Set-up . 11 8.1 8.2 9 Evaluation of test results . 13 10 Test report 13 Annex A (informative)

22、 Example of test generators and test Set-up . 15 Annex B (normative) Inrush current measurement . 17 corresponding European publications 19 Annex ZA (normative) Normative references to international publications with their Figure A.l . Example of test generator based on two power sources with intern

23、al switching . 16 generator 18 Figure B.2 . Circuit for measuring the peak inrush current of an EUT . 18 Figure A.2 . Example of test generator based on a programmable power supply 16 Figure B.l . Circuit for measuring the peak inrush current drive capability of a test O Table la . Preferred test le

24、vels and durations for voltage dips 8 Table 1 b . Preferred test levels and durations for short interruptions 8 Table IC . Preferred test levels and durations for voltage variations . 8 O BSI 07-2001 Page 4 EN 61000-4-29:2000 INTRODUCTION IEC 61000 is published in separate parts, according to the fo

25、llowing structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not

26、 fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measure ment tech n iq ues Testing techniques Part 5: installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Eac

27、h part is further subdivided into several parts, published either as International Standards, technical specifications or technical reports, some of which have already been published as sections. Others will be published with the part number followed by a dash and a second number identifying the sub

28、division (example: 61000-6-1). This part is an International Standard which gives test procedures related to voltage dips, short interruptions and voltage variations on d.c. input power ports. O BSI 07-2001 Page 5 EN 61000-4-29:2000 E LE CTRO MAG N ET1 C COM PATI B I LITY (EM C) - Part 4-29: Testing

29、 and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests 1 Scope and object This part of IEC 61000 defines test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of elect

30、rical or electronic equipment. This standard is applicable to low voltage d.c. power ports of equipment supplied by external d.c. networks. The object of this standard is to establish a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, shor

31、t interruptions or voltage variations on d.c. input power ports. a This standard defines: - the range of test levels; - the test generator; - the test Set-up; - the test procedure. The test described hereinafter applies to electrical and electronic equipment and systems. It also applies to modules o

32、r subsystems whenever the EUT (equipment under test) rated power is greater than the test generator capacity specified in clause 6. The ripple at the d.c. input power port is not included in the scope of this part of IEC 61000. It is covered by IEC 61 000-4-1 71) This standard does not specify the t

33、ests to be applied to particular apparatus or systems. Its main aim is to give a general basic reference to IEC product committees. These product committees (or users and manufacturers of equipment) remain responsible for the appropriate choice of the tests and the severity level to be applied to th

34、eir equipment. a 1) IEC 61000-4-17, Electromagnetic compatibility (EMC) - Part 4-1 7: Testing and measurement techniques - Ripple on d.c. input power port immunity test a O BSI 07-2001 Page 6 EN 61000-4-29:2000 2 Normative references The following normative documents contain provisions which, throug

35、h reference in this text, constitute provisions of this part of IEC 61000. For dated references, subsequent amendments to, or revisions of, any of these publications do not apply. However, parties to agreements based on this part of IEC 61000 are encouraged to investigate the possibility of applying

36、 the most recent editions of the normative documents indicated below. For undated references, the latest edition of the normative document referred to applies. Members of IS0 and IEC maintain registers of currently valid International Standards. IEC 60050( 161 ), International Electrotechnical Vocab

37、ulary (IEV) - Chapter 161: Electro- magnetic compatibility IEC 61000-4-1 1, Electromagnetic compatibility (EMC) - Part 4: Testing and measuring techniques - Section 1 1: Voltage dips, short interruptions and voltage variations immunity tests 3 Definitions For the purposes of this part of IEC 61000 t

38、he definitions of IEC 60050(161) and the following definitions and terms apply. 3.1 EUT equipment under test 3.2 immunity (to a disturbance) the ability of a device, equipment or system to perform without degradation in the presence of an electromagnetic disturbance IEV 161-01-20 3.3 voltage dip a s

39、udden reduction of the voltage at a point in the low voltage d.c. distribution system, followed by voltage recovery after a short period of time, from a few milliseconds up to a few seconds IEV 161-08-10, modified 3.4 short interruption the disappearance of the supply voltage at a point of the low v

40、oltage d.c. distributed system for a period of time typically not exceeding 1 min. In practice, a dip with amplitude at least 80 YO of the rated voltage may be considered as an interruption. 3.5 voltage variation a gradual change of the supply voltage to a higher or lower value than the rated voltag

41、e. The duration of the change can be short or long. o 3.6 malfunction the termination of the ability of an equipment to carry out intended functions, or the execution of unintended functions by the equipment. O BSI 07-2001 a 4 General The operation of electrical or electronic equipment may be affect

42、ed by voltage dips, short interruptions or voltage variations of the power supply. Voltage dips and short interruptions are mainly caused by faults in the d.c. distribution system, or by sudden large changes of load. Is also possible for two or more consecutive dips or interruptions to occur. Faults

43、 in the d.c. distribution system may inject transient overvoltages into the distribution network; this particular phenomenon is not covered by this standard. Page 7 EN 61000-4-292000 Voltage interruptions are primarily caused by the switching of mechanical relays when changing from one source to ano

44、ther (e.9. from generator set to battery). During a short interruption, the d.c. supply network may present either a “high impedance“ or “low impedance“ condition. The first condition can be due to switching from one source to another; the second condition can be due to the clearing of an overload o

45、r fault condition on the supply bus. The latter can cause reverse current (negative peak inrush current) from the load. a These phenomena are random in nature and can be characterised in terms of the deviation from the rated voltage, and duration. Voltage dips and short interruptions are not always

46、abrupt. The primary cause of voltage variations is the discharging and recharging of battery systems; however they are also created when there are significant changes to the load condition of the d.c. network. 5 Test levels The rated voltage for the equipment (UT) shall be used, as a reference for t

47、he specification of the voltage test level. The following shall be applied for equipment with a rated voltage range: - if the voltage range does not exceed 20 % of its own lower limit, a single voltage from the range may be used as a basis for test level specification (UT); - in all other cases, the

48、 test procedure shall be applied for both the lower and upper limits of the rated voltage range. a The following voltage test levels (in % UT) are used: - O %, corresponding to interruptions; - 40 % and 70 %, corresponding to 60 % and 30 % dips; - 80 % and 120 %, corresponding to I20 % variations. T

49、he change of the voltage is abrupt, in the range of ps (see generator specification in clause 6). The preferred test levels and durations are given in tables la, 1 b and IC. The levels and durations shall be selected by the product committee. 0 BSI 07-2001 Page 8 EN 61000-4-29:2000 Test The test conditions of “high impedance” and “low impedance” reported in table 1 b refer to the output impedance of the test generator as seen by the EUT during the voltage interruption; additional information is given in the definition of the test generator and test proce