ECA EIA-60384-22-2014 Fixed Capacitors for Use in Electronic Equipment C Part 22 Sectional Specification C Fixed Surface Mount Multilayer Capacitors of Ceramic Dielectric Class 2.pdf

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1、 EIA STANDARD Fixed Capacitors for Use in Electronic Equipment Part 22: Sectional Specification Fixed Surface Mount Multilayer Capacitors of Ceramic Dielectric, Class 2 EIA-60384-22 (IEC 60384-22:2011, IDT) October 2014 ANSI/EIA-60384-22-2014 Approved: October 3, 2014 EIA-60384-22 NOTICE EIA Enginee

2、ring Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper prod

3、uct for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude th

4、eir voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any li

5、ability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is identical (IDT) with the International Standard IEC Publication 60384-22:2011: Fixed Capacitors for Use in Electronic Equipment Part 22: Sectional Specificati

6、on Fixed Surface Mount Multilayer Capacitors of Ceramic Dielectric, Class 2. This document is the EIA Standard EIA-60384-22 2014 Edition 2: Fixed Capacitors for Use in Electronic Equipment Part 22: Sectional Specification Fixed Surface Mount Multilayer Capacitors of Ceramic Dielectric, Class 2. The

7、text, figures and tables of IEC 60384-22:2011 are used in this Standard with the consent of the IEC and the American National Standards Institute (ANSI). These materials are subject to copyright claims of IEC and ECIA. No part of this publication may be reproduced in any form, including an electroni

8、c retrieval system, without the prior written permission of ECIA. All requests pertaining to EIA-60384-22 2014 Edition 2: Fixed Capacitors for Use in Electronic Equipment Part 22: Sectional Specification Fixed Surface Mount Multilayer Capacitors of Ceramic Dielectric, Class 2 should be submitted to

9、ECIA at the address below. The IEC copyrighted material has been reproduced with permission from ANSI. The IEC Foreword and Introduction are not part of the requirements of this standard but are included for information purposes only. This Standard does not purport to address all safety problems ass

10、ociated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5271, formulated under

11、the cognizance of the P-2.1 Committee on EIA National Ceramic Dielectric Capacitors Standards and given final approval by the Steering Committee for Passive Electronic Components Standards (S-1). Published by Electronic Components Industry Association 2014 Engineering Department 2214 Rock Hill Road,

12、 Suite 265 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 In

13、verness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5184), International (303-397-7956) i CONTENTS FOREWORD 1 1 General . 3 1.1 Scope . 3 1.2 Object . 3 1.3 Normative references 3 1.4 Information to be given in a detail specification . 4 1.4.1 Outline drawing and dimensions .

14、 4 1.4.2 Mounting . 4 1.4.3 Rating and characteristics 4 1.4.4 Marking . 5 1.5 Terms and definitions 5 1.6 Marking . 6 1.6.1 Information for marking 6 1.6.2 Marking on the body . 6 1.6.3 Requirements for marking . 6 1.6.4 Marking of the packaging 6 1.6.5 Additional marking . 6 2 Preferred rating and

15、 characteristics . 6 2.1 Preferred characteristics 6 2.1.1 Preferred climatic categories 6 2.2 Preferred values of ratings . 7 2.2.1 Rated temperature (TR) 7 2.2.2 Rated voltage (UR) . 7 2.2.3 Category voltage (UC) 7 2.2.4 Preferred values of nominal capacitance and associated tolerance values . 8 2

16、.2.5 Temperature characteristic of capacitance 9 2.2.6 Dimensions 10 3 Quality assessment procedures 10 3.1 Primary stage of manufacture 10 3.2 Structurally similar components 10 3.3 Certified records of released lots 10 3.4 Qualification approval 10 3.4.1 Qualification approval on the basis of the

17、fixed sample size procedures 10 3.4.2 Tests . 11 3.5 Quality conformance inspection 16 3.5.1 Formation of inspection lots 16 3.5.2 Test schedule 16 3.5.3 Delayed delivery 16 3.5.4 Assessment levels . 16 4 Test and measurement procedures . 18 4.1 Special preconditioning 18 4.2 Measuring conditions .

18、18 4.3 Mounting . 18 4.4 Visual examination and check of dimensions. 18 ii 4.4.1 Visual examination . 18 4.4.2 Requirements 18 4.5 Electrical tests . 20 4.5.1 Capacitance. 20 4.5.2 Tangent of loss angle (tan ) 21 4.5.3 Insulation resistance 21 4.5.4 Voltage proof . 22 4.5.5 Impedance (if required by

19、 the detail specification) . 23 4.5.6 Equivalent series resistance ESR (if required by the detail specification) . 23 4.6 Temperature characteristic of capacitance 23 4.6.1 Special preconditioning 23 4.6.2 Measuring conditions . 23 4.6.3 Requirements 24 4.7 Shear test . 24 4.8 Substrate bending test

20、 . 24 4.8.1 Initial measurement 24 4.8.2 Final inspection 24 4.9 Resistance to soldering heat 25 4.9.1 Special preconditioning 25 4.9.2 Initial measurement 25 4.9.3 Test conditions 25 4.9.4 Recovery . 26 4.9.5 Final inspection, measurements and requirements . 26 4.10 Solderability 27 4.10.1 Test con

21、ditions 27 4.10.2 Recovery . 28 4.10.3 Final inspection, measurements and requirements . 28 4.11 Rapid change of temperature . 28 4.11.1 Special preconditioning 28 4.11.2 Initial measurement 28 4.11.3 Number of cycles . 28 4.11.4 Recovery . 28 4.11.5 Final inspection, measurements and requirements .

22、 28 4.12 Climatic sequence . 29 4.12.1 Special preconditioning 29 4.12.2 Initial measurement 29 4.12.3 Dry heat 29 4.12.4 Damp heat, cyclic, Test Db, first cycle . 29 4.12.5 Cold 29 4.12.6 Damp heat, cyclic, Test Db, remaining cycles 29 4.12.7 Final inspection, measurements and requirements . 30 4.1

23、3 Damp heat, steady state 30 4.13.1 Special preconditioning 30 4.13.2 Initial measurement 30 4.13.3 Conditions of test . 30 4.13.4 Recovery . 31 4.13.5 Final inspection, measurements and requirements . 31 iii 4.14 Endurance 31 4.14.1 Special preconditioning 31 4.14.2 Initial measurement 32 4.14.3 Co

24、nditions of test . 32 4.14.4 Recovery . 32 4.14.5 Final inspection, measurements and requirements . 32 4.15 Robustness of terminations (only for capacitors with strip termination) . 33 4.15.1 Test conditions 33 4.15.2 Final inspection and requirements . 33 4.16 Component solvent resistance (if requi

25、red) . 33 4.17 Solvent resistance of the marking (if required) 33 4.18 Accelerated damp heat, steady state (if required) 33 4.18.1 Initial measurement 33 4.18.2 Conditioning 34 4.18.3 Recovery . 34 4.18.4 Final measurements . 34 Annex A (normative) Guidance for the specification and coding of dimens

26、ions of fixed surface mount multilayer capacitors of ceramic dielectric, Class 2 35 Annex B (informative) Capacitance ageing of fixed capacitors of ceramic dielectric, Class 2 36 Annex C (informative) Temperature characteristics of capacitance for the reference temperature of 25 C 39 Bibliography .

27、40 Figure 1 Fault: crack or fissure . 19 Figure 2 Fault: crack or fissure . 19 Figure 3 Separation or delamination . 19 Figure 4 Exposed electrodes 19 Figure 5 Principal faces . 20 Figure 6 Reflow temperature profile 26 Figure A.1 Dimensions . 35 Table 1 Preferred values of category voltages . 7 Tab

28、le 2 Preferred tolerances 9 Table 3 Temperature characteristic of capacitance 9 Table 4 Fixed sample size test plan for qualification approval, assessment level EZ . 12 Table 5 Tests schedule for qualification approval 13 Table 6a Lot-by-lot inspection 17 Table 6b Periodic test 17 Table 7 Measuring

29、conditions . 20 Table 8 Tangent of loss angle limits . 21 Table 9 Test voltages 22 Table 10 Details of measuring conditions 23 Table 11 Reflow temperature profiles for Sn-Ag-Cu alloy . 26 Table 12 Maximum capacitance change 27 iv Table 13 Maximum capacitance change 29 Table 14 Number of damp heat cy

30、cles 29 Table 15 Final inspection, measurements and requirements 30 Table 16 Test conditions for damp heat, steady state 31 Table 17 Final inspection, measurements and requirements 31 Table 18 Endurance test conditions (UC= UR) 32 Table 19 Endurance test conditions (UC UR) 32 Table 20 Final inspecti

31、on, measurements and requirements of endurance test . 33 Table 21 Initial requirements 34 Table 22 Conditioning 34 Table A.1 Dimensions 35 Table C.1 Temperature characteristics of capacitance for the reference temperature of 25 C . 39 Table C.2 Measuring conditions of temperature characteristic of c

32、apacitance for the reference temperature of 25 C 39 EIA-60384-22 Page 1 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Part 22: Sectional specification Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2 FOREWORD 1) The International

33、 Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fi

34、elds. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any I

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39、ons. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, a

40、ccess to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including i

41、ndividual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance up

42、on, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements

43、 of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60384-22 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equipment. This second edition c

44、ancels and replaces the first edition published in 2004 and contains the following significant technical changes with respect to the previous edition. The measuring frequency of 1 MHz has been reduced to 1 kHz for 100 pF, see 4.5.1 Capacitance. The test voltage of 1,2 UR at UR 1 000 V has been added

45、 in 4.5.4 Voltage proof. Detail test conditions have been added in 4.7 Shear test and 4.8 Substrate bending test. Test conditions applying lead free solder alloy (Sn-Ag-Cu) have been included in 4.9 Resistance to soldering heat and 4.10 Solderability. EIA-60384-22 Page 2 A selection of the test cond

46、itions according to marketing needs has been stated in 4.13 Damp heat, steady state. The dimensions of 0402 M in Annex A have been added. The temperature characteristics code of capacitance for the reference temperature of 25 C has been added, see Annex C. The text of this standard is based on the f

47、ollowing documents: FDIS Report on voting 40/2128/FDIS 40/2141/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The list of all

48、parts of the IEC 60384 series, under the general title Fixed capacitors for use in electronic equipment, can be found on the IEC web site. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstor

49、e.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. EIA-60384-22 Page 3 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Part 22: Sectional specification Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2 1 General 1.1 Scope This part of is applicable to fixed unencapsulated surface mount multilayer capacitors of ceramic dielec