ECA CB6-A-1987 Guide for the Use of Quartz Crystal Units for Freqency Control《频率控制和选择用石英晶体元件使用指南》.pdf
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1、EIA COMPONENTS BULLETIN Guide for the Use of Quartz Crystal Units for Frequency CntroI CB6-A (Revision of CB8) OCTOBER 1987 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT EIA CBb-A 87 3234600 0557562 567 NOTICE IA Engineering Standards and Publications are designed to serve the public inte
2、rest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Pub- lic
3、ations shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than IA members, whether the stand
4、ard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materials, or processes. By such action, EIA does not assume any liability to any patent owner, nor doe
5、s it assume any obligation whatever to parties adopting the Recom- mended Standard or Publication. This document was developed by the P-11 Committee on Quartz Crystal Devices. Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street,N.W. Washington, D.C. 20006 Printed in
6、 U.S.A. CI36 -A TABLE OF CONTENTS 1 . INTRODUCTION AND SCOPE 1 1.2. Technical Preamble 4 1.1. GENERAL . 1 2 . CRYSTAL HOLDER CLASSIFICATION 6 2.1. HOLDERS . 7 2.1.1. CATEGORIES OF HOLDERS 7 2.1.2. NON-STANDARD HOLDERS . 7 2.2. CRYSTAL CONNECTIONS . 8 2.3. MOUNTING 8 3 . FREauENCY 9 3.1. MODES OF VIB
7、RATION AND FREQUENCY RANGES . 9 3.2. OVERTONE CRYSTAL UNITS . 11 3.2.1. GENERAL . 11 3.2.2. CHARACTERISTICS . 12 4 . FREQUENCY-TEMPERATURE DEPENDENCE . 13 4.1. PARABOLIC CURVES . 14 4.2. AT-CUT CURVE . 14 4.3. SPECIFYING FREQ . TOLERANCE AND OPERATING TEMP 16 5 . FREQ . STABILITY RELATED TO THE COND
8、 . OF USING . 16 5.1. FACTORS AFFECTING THE FREQUENCY STABILITY 16 5.1.1. OSCILLATOR NETWORK 17 5.1.2. CRYSTAL UNIT 17 5.2. TYPE OF OSCILLATORS 17 5.2.1. POSITIVE REACTANCE OSCILLATORS 18 5.2.2. SERIES RESONANCE OSClLLATORS 20 5.2.3. CRYSTAL Q AND TTS IMPLICATIONS 22 5.2.4. SERIES-MODE OSCILLATORS U
9、SING THE MEACHAM . 23 5.2.5. INTEGRATED CIRCUIT CRYSTAL OSCILLATORS 26 5.3. LEVEL CONTROL . 28 5.4. LOAD CAPACITANCE . 29 5.5. LEVEL OF DRIVE . 30 5.6. LEVEL CONTROL 31 6 . SPECIAL REQUIREMENTS . 32 6.1. TOT . FREQ . VARIATION OVER THE OPERATING TEMP . 32 6.2. FREQ . VARIATION OUTSIDE THE OPERATING
10、TEMP . RANGE 32 6.3. FREQUENCY PULLING 33 6.4. SERIES RESONANCE OPER . OF FUNDAMENTAL CRYSTAL UNITS 34 6.5. CLIMATIC AND MECHANICAL EXTREMES . 34 6.6. MARKING . 35 7 . MEASURING METHODS AND TEST CONDITIONS 35 8 . TECHNICAL DATA TO ACCOMPANY ORDER FORM . 35 i EIA CBb-A 7 3234b00 0559564 33T CB6 -A LI
11、ST OF TABLES 3-1: TABLE l IO 5-1: TABLE 329 ii EIA CBb-A 87 3234600 0559565 276 M CB6-A Page 1 1. INTRODUCTION AND SCOPE This document has been compiled in response to a generally expressed desire on the part of both users and manufacturers for a guide to the use of quartz crystal units for frequenc
12、y control so that they may be used to their best advantage. The most conmon error has been the assumption on the part of some users that the crystal unit is an absolute frequency-determining device. This idea has persisted, probably due to the fact that the frequency tolerances in earlier equipment
13、were suff- iciently wide that frequency variation imposed by the associated circuit conditions were small enough to be ignored. It is not the function of this brief document to explain theory nor to attempt to cover all the eventualities which may arise in practical circumstances. It does draw atten
14、tion to some of the more fundamental questions which should be considered by the user of quartz crystal units for new applications. Such a procedure will reduce considerably the users risk of unsatisfactory performance. 1.1 GENERAL Although the performance of a quartz crystal unit depends mostly on
15、its design and fabrication its performance is influenced by other circuit components associated with it. For example, small variations in the input impedance of the oscillator circuit may result in modification of the frequency of oscillation beyond the permissible limits The quartz crystal unit is
16、a mechanical vibrating system which is EIA CBb-A 7 3234600 0559566 LO2 CB6-A Page 2 driven by the electrical current supplied to it. The amplitude of the vibration is proportional to the current. If the amplitude is great enough the quartz will fracture resulting in catastrophic failure. Heat is gen
17、erated in the quartz as it vibrates. The resulting rise in temperature is proportional to the square of the current. Driving the unit at levels higher than the specified value may result in excessive frequency changes. An even more serious problem is the effect of thermal gradients in the quartz. Th
18、ese may result from excessive drive levels or from ex- ternal heat sources such as the heaters in ovens. TtL* thermal gradients produce stresses in the quartz which may result in very large frequency perturbations, High drive levels also tend to create or aggravate coupled modes resulting in changes
19、 in the parameters of the crystal unit and in un- desired responses. Since temperature and thermal gradients influence the frequency of a crystal unit some time is required for the frequency to become stable after turn-on. The time required depends upon the design and the drive level. Ordinarily the
20、 frequency becomes substantially stable after a few minutes of operations. Sometimes permanent changes in the frequency occur, especially after the unit has been operated at a high drive level. Effects of this nature may result from various causes. For example: internal fractures in the quartz cause
21、d by excessive strain, loss of electrode metal due to the acceleration forces which may well exceed a million times that of gravity, permanent displacement in the crystal lattice of the quartz, inelastic properties of the mounting systems, displacement of dust particles on the surface of the quartz,
22、 etc. Sometimes the equivalent resistance of a crystal unit is found to EIA CBb-A 87 3234600 0559567 O47 cB6-A Page 3 change with the drive level, This phenomenon is particularly comn in units designed to be operated at very low drive levels. It is thought to be due, in most cases, to surface effect
23、s such as loose Flating or particles of som foreign material on the surface of the quartz. Although a crystal unit should be operated at the drive level for which it was designed, any change of resistance with drive level is usually an indication of inadequate processing technique. Whenever possible
24、 the oscillator circuit should be designed to utilize a standard crystal unit and care should be taken to insure that the crystal unit is operated at its rated drive level. In special cases where no standard crystal unit is available, the circuit designer should work closely with the crystal manufac
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