DLA SMD-5962-94554-1994 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL 1-OF-16 DECODER DEMULTIPLEXER MONOLITHIC SILICON《硅单片 十六分之一解码器 信号分离器 改进型肖脱基TTL 双极数字微型电路》.pdf

《DLA SMD-5962-94554-1994 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL 1-OF-16 DECODER DEMULTIPLEXER MONOLITHIC SILICON《硅单片 十六分之一解码器 信号分离器 改进型肖脱基TTL 双极数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-94554-1994 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL 1-OF-16 DECODER DEMULTIPLEXER MONOLITHIC SILICON《硅单片 十六分之一解码器 信号分离器 改进型肖脱基TTL 双极数字微型电路》.pdf（16页珍藏版）》请在麦多课文档分享上搜索。

1、SMD-5962-94554 9999996 O059803 545 REV SHEET REV sHEE!r 15 RFN STAluS OF PMIC N/A STANDARDIZED MILITARY DRAWING THIS DRAUING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A PREPARED BY Larry T. Gauder _ CHECKED BY Thomas M. Hess APPROVED BY Monica L. Poetki

2、ng DRAUING APPROVAL DATE 94-03-14 REVISION LEVEL D-SE EXEEONICS SUPPLY CB?IER DAYTON, OHIO 45444 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, 1-OF-16 DECODER/DEMULTIPLEXER, MONOLITHIC SI LI CON SIZE I CAGE 0IX)E I A 67268 5962-94554 SHEET 1 OF 15 )ESC FORM 193 JUL 91 DISTRIIUTION STATEMENT

3、 A. Approved for public release; distribution is unlimited. 5962-E172-94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SWPE 1.1 Scope. This drawing form a part of a one part - one part nunber docunentation system (see 6.6 herein). Two product as

4、surance classes consisting of military high reliability (device classes 9, and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Nunber (PIN). Device class M microcircuits represent non-JAN class B mi

5、crocircuits in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjurction with conpliant non-JAM devices“. Uhm available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 pIw. The PIN shall be as shown in the following example: 9455

6、4 i i Federa 1 RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (se 1.2.5) li1 L / (see 1.2.3) / Drawing nunber STANDARD1 ZED MILITARY DRAWING 1.2.1 RHA desimator. Device classes M RHA marked devices shall meet the

7、 MIL-1-38535 appendix A specified RHA levels and shall be marked uith the appropriate RHA designator. Device classes Q and Y RHA marked devices shall meet the MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-1 indicates a non-RHA device. 1.2.2 Device

8、 tw(s). The device type(s) shall identify the circuit function as follows: Device tme Generic nunber Circuit function o1 54F154 1 -of -16 decoder/demul t iplexer 1.2.3 Device class designator. The device class designator shall be a single letter identifying the product assurance level as folkom: SIZ

9、E A 5962-94554 . Oevice class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance uith 1.2.1 of MIL-STO-883 1.2. Q or V Certificat ion and qual if i cat i on to MIL- 1-38535 Case wtline(sl. Outline letter Descr iDt i ve de

10、si gnator Termi na 1 s Package style The case outLineCs) shall be as designated in MIL-STD-1835 and as folows: K L 3 GDFPZ-F24 or CFP3-F24 24 GDIP3-TZ4 or CDlP4-124 24 CPCCl-NZ8 28 flat package dual-in-line package square chip carrier package 1.2.5 Lead finish. The lead finish shall be as specified

11、in MIL-STD-883 (see 3.1 herein) for class M or MIL-1-38535 for classes Q and V. designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable uithout preference. Finish letter alX1a shall not be marked on the microcircuit or its packaging. The

12、“X“ I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I REVISION LEVEL 1 SHEETs DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-94554 9999996 0059803 318 1.3 Absolute maximun ratings. I/ Supply voltage range (Vc 1-

13、 - - - - - - - - - - - - - - - inpit voltage range (v,! - - - - - - - - - - - - - - - - Input current range (IIN) - - - - - - - - - - - - - - - - Voltage applied to output (VOUTI - - - - - - - - - - - - Current applied to output (I ) - - - - - - - - - - - - Storage tenperature range - w! - - - - - -

14、 - - - - - - - Lead temperature (soldering, 10 seconds) - - - - - - - - Junction temperature (TJ) - - - - - - - - - - - - - - - - Maxim power dissipation (P,): 2/- - - - - - - - - - - - Thermal resistance, junction-to-case (eJc) - - - - - - - 1.4 Recmended operating conditions. Supply voltage range

15、(Vcc)- - - - - - - - - - - - - - - - Maximum input clamp current, (iI )- - - - - - - - - - - - Maxim high Level output curren!, (I, 1- - - - - - - - - Maxim low level output current, (i 9 - - - - - - - - - High level input voltage, (VI 1 - - - - - - - - - - - - - LOW Level input voltage. CV, - - - -

16、 - - - - - - - - - Case operating tenperature range (TC) - - - - - - - - - Input rise and fall times, (tr, tf) 9LI - - - - - - - 1.5 Digitat losic testing for device classes P and V. Fault coverage measurement of manufacturing -0.5 V dc to +7.0 V dc -0.5 V dc to +7.0 V dc -30 mA to 5.0 niA -0.5 V to

17、 +Ycc 40 mA -65C to +15DaC +300C +17s0c 220 mw See MIL-STD-1835 4.5 V dc to 5.5 V dc -ia nd -1 fl 20 na 2.5 ns 2.0 v +0.8 V -55Oc to +125“C logic test; (MIL-STD-883, test method 5072) - - - - - - - - - - - - 3J percent 2. APPLICABLE DOCUMENTS 2.1 Government specification. standards, bulletin. and ha

18、ndbook. Unless otherwise specified, the following specification, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICA

19、TION Mi LITARY MIL-1-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS HILI TARY MIL-STO-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STO-I835 - Microcircuit Case Outlines. I/ 2J z/ Stresses above the absolute maxi

20、mun rating may cause permanent damage to the device. maximun levels may degrade performance and affect reliability. Maxim power dissipation is defined as Vcc x Icc and must uithstand the added PD due to the short circuit output test (e.g., Values will be added when they become available. Extended op

21、eration at the 10s). STANDARD1 ZED MILITARY DRAWING I SIZE I A 5962-94554 I I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I REVISION LEVEL I SHEET3 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-94554 9999996

22、0059804 254 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 . HiLITARY MIL-BUL-103 - List of Standardized Military Drawings WIDS). SIZE A 5962-94554 REVISION LEVEL SHEET 4 HANDBOOK MLLITARY MIL-HDBK-780 - Standardized Military Drawings. (Copies of the specification

23、, standards, bulletin, and handbook required by manufacturers in connection with specif it acquisition functions should be obtained from the contracting activity or as directed by the contracting activity-) In the event of a conflict between the text of this drawing and the references cited herein,

24、the text of this drawing shall take precedence. 2.2 Order of precedence. 3. REWIREMENTS 3.1 Item requirements. The individual item requirements for device class N shall be in accordance with 1.2.1 of NIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ a

25、nd as specified herein. device manufacturers Quality Nanagement (QM) pian, and as specified herein. specified in HIL-STD-883 (see 3.1 herein) for device class M and MIL-1-38535 for device classes Q and V herein. The individual item requirements for device classes Q and V shall be in accordance with

26、MIL-i-38535, the 3.2 Desiqn, construction, and physical dimensions. The design, construction, and physical dimensions shall be as 3.2.1 Case outline(s1. The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. 3.2.3 Truth table. 3.2.4 Loqic diaqrani. 3.2.5 Test circu

27、it and switchins waveforms. figure 4. The terminal connections shall be as specified on figure I. The truth table shall be as specified on figure 2. The logic diagram shall be as specified on figure 3. The test circuit and switching waveforms shall be as specified on 3.2.6 Radiation exposure circuit

28、. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified The radiation exposure circuit shall be as specified when available. herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and s

29、halL apply over the full case operating temperature range. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. accordance with MIL-STD-883 (see 3.1 herein). NIL-BUL-103. 3.4 Electrical test requirements. 3.5 Fa

30、rking. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M shall be in In addition, the manufacturers PIN may also be marked as listed in Marking for device classes Q and V shall be in accordance with MIL-1-38535. 3.5.1 Certification/compliance mark. The compliance

31、 mark for device class M shall be a “C“ as required in MiL-STD-883 (see 3.1 herein). in MIL-1-38535. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-94554

32、m 9999996 0059805 190 m REVISION LEVEL SHEET 5 TABLE I. Electrical wrformance characteristics. Group A subgroups Limits Unit - V - V Test Conditions -55C S TC 5 +12SoC 4.5 V and 5.5 V unless otherwise specified vcc = 4.5 v VIH = 2.0 v = 0.8 v :w; = -1.0 PA - Max Min ish level output voltage ou level

33、 output vo 1 tage “OL - Icc 0.5 = 4.5 v $ = 2.0 v = 0.8 v 1/ = 20 M vcc = 5.5 v Inputs = GND, Outputs open 40 upply current 1, 2, 3 nput clamp voltage “IK IHl - 1 -1.2 = 4.5 v ?= -ia inA igh level input current 5.5 v % 2.7 V 1, 2, 3 20 vcc = 5.5 v VI, 7.0 V 1. 2. 3 1 O0 ow level input current vcc 5.

34、5 v VIN = 0.5 V 1, 2. 3 -0.6 ;hart circuit output current vcc = 5.5 v 3 1, 2, 3 -150 See footnote at end c A I I 5962-94554 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CEWCER DAYTON, OHIO 45444 DESC FORM 19% JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted wit

35、hout license from IHS-,-,-TABLE I. Electrical wrformance characteristics - Continued. vCc = 4.5 v and 5.5 v CL = 50 pF vcc = 5.0 v 53 v vcc = 5.0 v RL = SOW See figure 4. V = 4.5 v and 7 :unct i ona 1 test 9 10, 11 I PHLI 3.5 10.0 ns 3.0 11.5 tPH12 r 9 IO, 11 4.0 9.0 ns 3.5 10.5 I vcc = 5.0 STANDARD

36、1 ZED MILITARY DRAWiWG Vcc = 5.0 V - SIZE A 5962-94554 Limits Unit 7. 8 I *I 10, 11 ns 9 I 2.0 I 7.5 I n.5 -tTtTl 10. 11 1 y Due to test equipment limitations actual test conditions for VI, - 2.2 V. conditions are guaranteed. Not more than one output should be shorted at a time. For testing losi the

37、 use of high speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings i

38、n other parameter tests. in any sequence of parameter tests, Ios tests should be performed last. However, the specified test Limits and I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OBI0 45444 1 REVISION LEVEL I SHEET DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking per

39、mitted without license from IHS-,-,-Device type Case outline Terminal number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 SIZE A O K and L Terminal symbol - - 1 2 Q4 Q5 7 Q9 90 1 1 92 94 EO A3 A2 A1 AO vcc - - - - - 6 - - 8 - - GND - - - 13 - - 1 5 - - 5962-94554 3 Term

40、inal symbol nc - - - Q2 Q3 4 5 - - NC 6 - - 7 PP 10 - - - GND NC - 91 Q12 - 13 14 15 - - EO E1 s A2 AO vcc NC STANDARD1 ZED MILITARY DRAWING I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I REvlsloN LEVEL I SHEET7 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networki

41、ng permitted without license from IHS-,-,-OUTPUTS INPUTS L H X X xx H L X X xx H H X X xx L L L L LL L L L L LH L L L L HL L L L L HH L L L H LL L L L H LH L L L H HL L L L H HH L L H L LI. i L H L LH L L H L HL L L H L HH L L H H LL L L H H LH L L H H HL L L H H HH H HHHHHHHHHH H H H H H H HHHHHHHH

42、HH H H H H H H HHHHHHHHHH H H H H H L HHHHHHHHHH H H H H H H LHHHHHHHHH H H H H H H HLHHHHHHHH H H H H H H HHLHHHHHHH H H H H II H HHHLHHHHHH H H H H H H HHHHLHHHHH H H H H H H HHHHHLHHHH H H H H H H HHHHHHLHHH H H H H H H HHHHHHHLHH H H H H H H HHHHHHHHLH H H H H H H HHHHHHHHHL H H H H H H HHHHHHHH

43、HH L H H H H H HHHHHHHHHH H L H H H H HHHHHHHHHH H H L H H H HHHHHHHHHH H H H L H H HHHHHHHHHH H H H H L H = High voltage level L = Low voltage level X = Irrelevant STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 - FIGURE 2. Truth table. SIZE A 5962-94554 REVISION

44、LEVEL SHEET 8 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5b2-94554 = b 0059809 83b STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 1 SIZE A 5962-94554 REVISION LEVEL SHEET 9 Vcc= PIN 24 GND = PIN 12 FIGURE

45、3. Loqic diaqram. I I I ESC FORM 193A .TUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SND-5962-94554 M 9999996 00598LO 558 FAMILY REP. RATE PULSE WIDTH t 54 f HHr 500 ns 5 2.5 ns OH VOL - on THL 5 2.5 ns ov NEGATIVE PULSE t. THL 4 tf 1 POS1 T

46、 I VE 0.3 V -0v 0.3 V REVISION LEVEL SHEET 10 FIGURE 4. Test circuit and suitching waveforms. I I STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CEWTER DAYTON, OHIO 45444 DESC FORM 193A JUT, 91 *IZE A I I 5962-94554 Provided by IHSNot for ResaleNo reproduction or networking permitted with

47、out license from IHS-,-,-IN b-1 “OUT DEVICE UNDER TEST PULSE GENERATOR r . SIZE STANDARD1 ZED A NOTES: 1. Pulse generator characteristics: 2. CL = 50 pF. 4. 5. 6. VM = 1.5 V. PRR = 1 MHz, tr = tf S 2.5 ns duty cycle = 50 percent. CL includes probe and jig capacitance. RT = Termination resistance sho

48、uld be equal to ZwT of pulse generator. 3. R = soon. FIGURE 4. Test circuit and suitching waveforms.continwd 5962-94554 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I REVISION LEVEL SHEET I l1 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without

49、license from IHS-,-,-iLi SMD-59b2-94554 m 9999996 0059812 320 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a atanuactrtrer in order to be listed as an approved