DLA SMD-5962-90795 REV C-2009 MICROCIRCUIT HYBRID LINEAR 16-BIT HIGH SPEED A D CONVERTER.pdf

《DLA SMD-5962-90795 REV C-2009 MICROCIRCUIT HYBRID LINEAR 16-BIT HIGH SPEED A D CONVERTER.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-90795 REV C-2009 MICROCIRCUIT HYBRID LINEAR 16-BIT HIGH SPEED A D CONVERTER.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make changes to table I. Rewrite entire document. 94-01-18 K. A. Cottongim B Add device types 03 and 04. 99-06-28 K. A. Cottongim C Update drawing. -gz 09-06-16 Joseph D. RodenbeckTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SH

2、ET REV SHET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Gary Zahn CHECKED BY Robert M. Heber DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY William K. Heckman STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS A

3、VAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-12-19 MICROCIRCUIT, HYBRID, LINEAR, 16-BIT, HIGH SPEED, A/D CONVERTER AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-90795 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E355-09Provided by IHSNot

4、for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90795 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance cla

5、sses as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as show

6、n in the following example: 5962 - 90795 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked

7、devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Maximum linearity e

8、rror 01 HS9576S/B BIP 16-bit A/D converter, bipolar 0.006% FSR 02 HS9576T/B BIP 16-bit A/D converter, bipolar 0.003% FSR 03 HS9576S/B UNI 16-bit A/D converter, unipolar 0.006% FSR 04 HS9576T/B UNI 16-bit A/D converter, unipolar 0.003% FSR 1.2.3 Device class designator. This device class designator s

9、hall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device per

10、formance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard

11、 military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devi

12、ces which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adve

13、rsely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ST

14、ANDARD MICROCIRCUIT DRAWING SIZE A 5962-90795 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package s

15、tyle X See figure 1 32 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage range (VCC) . 0 V dc to +16 V dc Negative supply voltage range (VEE) 0 V dc to -16 V dc Logic supply voltage range (VDD). -0.5 V dc

16、to +7.0 V dc Analog ground to logic ground. 0.5 V dc Logic inputs to logic ground . 0 V dc to +6.5 V dc Analog inputs to analog ground . 0 V dc to +16.5 V dc Voltage on logic outputs. 0 V dc to +7.0 V dc Power dissipation (PD) . 2.0 W Thermal resistance, junction-to-case (JC). 40C/W Lead temperature

17、 (soldering, 10 seconds) +300C Storage temperature range -65C to +150C Junction temperature (TJ) +170C 1.4 Recommended operating conditions. Positive supply voltage range (VCC) . +14.55 V dc to +15.45 V dc Negative supply voltage range (VEE) -14.55 V dc to -15.45 V dc Logic supply voltage range (VDD

18、). +4.75 V dc to +5.25 V dc Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specifie

19、d, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard f

20、or Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ from the Standardization Document Ord

21、er Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and r

22、egulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permi

23、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90795 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H,

24、 and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or opti

25、mize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, co

26、nstruction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as speci

27、fied on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requireme

28、nts shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vend

29、or similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each d

30、evice type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon req

31、uest. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-3853

32、4 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-3853

33、4 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in te

34、st, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outp

35、uts, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except inte

36、rim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90795 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-39

37、90 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TC+125C unless otherwise specified Group A subgroups Device type Min Max Unit -2.5 +2.5 -5.0 +5.0Bipolar 01,02 -10.0 +10.0 0 +5.0 0 +10.0Input voltage VINUnipolar

38、1,2,3 03,04 0 +20.0 V High level input voltage VIH 1,2,3 All 2.0 V Low level input voltage VIL 1,2,3 All 0.8 V High level output voltage VOH 1,2,3 All 2.4 V Low level output voltage VOL 1,2,3 All 0.40 V ICCVCC= +15.45 V dc +23 IEEVEE= -15.45 V dc -38 Supply currents IDDVDD= +5.25 V dc 1,2,3 All +37

39、mA 01,03 -0.006 +0.006 End point definition, TC= +25C 4 02,04 -0.003 +0.003 01,03 -0.036 +0.036 TC= +125C 5 02,04 -0.023 +0.023 01,03 -0.030 +0.030 Integral linearity error ILETC= -55C 6 02,04 -0.019 +0.019 %FSR TC= +25C 4 All -0.006 +0.006 01,03 -0.006 +0.046 TC= +125C 5 02,04 -0.006 +0.026 01,03 -

40、0.006 +0.038 Differential linearity error DLETC= -55C 6 02,04 -0.006 +0.022 %FSR See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90795 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, O

41、HIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC+125C unless otherwise specified Group A subgroups Device type Min Max Unit Adjustable to zero, TC= +25C 4 -0.2 +0.2 TC= +125C 5 -0.35 +0

42、.35 Gain error AE TC= -55C 6 All -0.32 +0.32 %FSR Bipolar (adjustable to zero), TC= +25C 4 -0.2 +0.2 Bipolar (adjustable to zero), TC= -55C, +125C 5,6 01,02 -0.30 +0.30 Unipolar (adjustable to zero), TC= +25C 4 -0.1 +0.1 Offset error OE Unipolar (adjustable to zero), TC= -55C, +125C 5,6 03,04 -0.125

43、 +0.125 %FSR Noise at transitions (3 sigma) 2/ Peak to peak 4,5,6 All +0.003 %FSR 12-bit conversion time tconPin 32 to pin 13, 12-bit accurate 9,10,11 All 13 s 14-bit conversion time tconPin 32 to pin 15, 14-bit accurate 9,10,11 All 15 s 16-bit conversion time tconPin 32 open, 16-bit accurate 9,10,1

44、1 All 17 s 1/ Unless otherwise specified, VCC= +14.55 V dc to +15.45 V dc, VEE= -14.55 V dc to -15.45 V dc, and VDD= +4.75 V dc to +5.25 V dc. 2/ Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits spe

45、cified in table for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90795 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR

46、 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A 4.90 .193 b 0.41 0.51 .016 .020 c 0.23 0.30 .009 .012 D 43.69 1.720 E 27.94 1.100 e 2.54 TYP .100 TYP eA 22.61 23.11 .890 .910 L 5.21 .205 Q 0.38 0.89 .015 .035 NOTES: 1. The U.S. preferred system of measurement is the metric SI. This i

47、tem was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. Unless otherwise specified, tolerance is .005 (0.13 mm). 3. Pin numbers are for reference only. FIGURE 1. Case outline. Provide

48、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90795 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 Device types All Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 Bit 1 (MSB) Bit 2 Bi