DLA SMD-5962-87607 REV C-2013 MICROCIRCUIT LINEAR VOLTAGE-TO-FREQUENCY CONVERTER MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in table I. Page 4. Output current pin 1 test, VCC= 40 V, subgroups 2, 3: change limits to -132 A min and -146 A max. Page 5. Frequency output, saturation voltage test, Ipin3 = 3.2 mA: guarantee parameter. VFCnonlinearity test, subgroups

2、5, 6: guarantee parameter. Add test conditions for TcAV, AV, PFS. 87-09-03 N. A. HAUCK B Added footnote to temperature stability of gain, TcAV, test in table I. Added figure 2. -rrp 07-08-29 ROBERT M. HEBER C Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 13-01-22 C. SAFFL

3、E CURRENT CAGE CODE 67268 THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY MARCIA B. KELLEHER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil S

4、TANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCENZO APPROVED BY N. A. HAUCK MICROCIRCUIT, LINEAR, VOLTAGE-TO-FREQUENCY CONVERTER, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-06-24 AMSC N/A REVISION LEVEL

5、 C SIZE A CAGE CODE 14933 5962-87607 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E139-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87607 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHE

6、ET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-876

7、07 01 G A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LM131AH Precision voltage-to-frequency converter 1.2.2 Case outline(s).

8、The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage . 40 V Output short circu

9、it to GND . Continuous Output short circuit to VCCContinuous Input voltage -0.2 V to +VSStorage temperature range . -65C to +150C Power dissipation (PD) 670 mW Thermal resistance, junction-to-ambient (JA) 150C/W 1.4 Recommended operating conditions. Ambient operating temperature range (TA) . -55C to

10、 +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87607 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification

11、, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 -

12、 Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawing

13、s. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict

14、between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item require

15、ments shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional cer

16、tification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein.

17、 These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and phy

18、sical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.

19、2.3 Schematic diagram. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are a

20、s specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo

21、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87607 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C 4

22、V VCC 40 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Input comparator offset voltage VIOVCC= 5 V 1, 2, 3 01 -10 10 mV Input comparator offset current IIOVCC= 5 V 1 01 -100 100 nA 2, 3 -150 150 Input comparator bias current IIBVCC= 5 V 1 01 -300 nA 2, 3 -500 Common

23、mode voltage 2/ range VCM1, 2, 3 01 -0.2 V Timer threshold voltage, 2/ pin 5 VTH1 01 63 70 % of VCCTimer input bias current, pin 5 IIBVCC= 5 V, VPIN 5 3 V 1 01 -0.1 0.1 A 2, 3 -0.2 0.2 VCC= 5 V, VPIN 5 3.7 V 1 0.5 2, 3 2 Saturation voltage, pin 5 VSATVCC= 5 V, IPIN 5= 5 mA 1, 2, 3 01 0.5 V Output cu

24、rrent, pin 1 IOUTVCC= 5 V, VPIN 1= 0 V, 1 01 -126 -144 A RS= 13.6 k 2, 3 -132 -146 VCC= 40 V, VPIN 1= 0 V, 1 -126 -144 RS= 13.6 k 2, 3 -132 -146 Output current change IOUTVCC= 40 V 1 01 1 A 2, 3 1.5 Off-state output leakage, pin 1 IOFFVCC= 5 V 1 01 -6 6 nA 2, 3 -50 50 VCC= 40 V 1 -6 6 2, 3 -50 50 Se

25、e footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87607 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performanc

26、e characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C 4 V VCC 40 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Reference voltage, pin 2 VREFVCC= 5 V 1, 2, 3 01 1.76 2.02 V VCC= 40 V 1.76 2.02 Frequency output, saturation voltage VSATVCC= 5 V, IPIN 3= 5

27、 mA 1, 2, 3 01 0.5 V IPIN 3= 3.2 mA 2/ 1, 2, 3 0.4 Off-state output leakage, pin 3 IOFFVCC= 5 V 1 01 1 A 2, 3 1.2 VCC= 40 V 1 1 2, 3 1.2 Power supply current ICCVCC= 5 V 1 01 2 4 mA 2, 3 1.8 5.2 VCC= 40 V 1 2.5 6 2, 3 1.5 7 VFCnonlinearity 2/ VCC= 15 V, 4 01 -0.01 0.01 %FS 5.5 V VIN 11 V 5, 6 -0.02

28、0.02 Conversion accuracy scale factor AVVCC= 15 V, VIN= -10 V, 4 01 -0.95 1.05 kHz/V RS= 14 k 5, 6 0.945 1.055 Temperature stability 3/ of gain TcAV VIN= -10 V, RS= 14 k 4, 5, 6 01 -50 50 ppm/C Change of gain with VCCAV 15 V VCC 20 V 4 01 -0.06 0.06 %V Rated full scale 4/ frequency PFS VIN= -10 V 4

29、01 10 kHz Overrange frequency 4/ PFS VIN= -11 V 4 01 10 % 1/ See figure 2. 2/ Guaranteed parameter, not tested. 3/ TcAV tests, which require a read and record measurement at each temperature extreme plus a calculation, may be omitted except when sampling for Group A and for Group C and D endpoint me

30、asurements. 4/ Parameter tested go-no-go only. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87607 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Device type

31、01 Case outline G Terminal number Terminal symbol 1 CURRENT OUTPUT 2 REFERENCE CURRENT 3 FREQUENCY OUTPUT 4 GND 5 R/C 6 THRESHOLD 7 COMPARATOR INPUT 8 VSFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR

32、CUIT DRAWING SIZE A 5962-87607 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 NOTES: 1. Use stable components with low temperature coefficients. 2. This resistor can be 5 k or 10 k for VS= 8 V to 22 V, but must be 10 k for VS= 4.5 V to 8 V. 3. Use low

33、offset voltage and low offset current operational amplifiers for A1. FIGURE 2. Test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87607 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVE

34、L C SHEET 8 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due

35、 to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced wit

36、h a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein).

37、The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conforma

38、nce as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land a

39、nd Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampl

40、ing and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-

41、in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, b

42、iases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optiona

43、l at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be a

44、s specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87607 DLA LAND AND MARITIME COLUMBUS,

45、OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*, 2, 3,

46、 4, 5, 6 Group A test requirements (method 5005) 1, 2, 3, 4, 5, 6 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3, 4, 5, 6 * PDA applies to subgroup 1. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state

47、life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the input

48、s, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design