DLA SMD-5962-00516 REV D-2012 MICROCIRCUIT LINEAR POSITIVE 5-VOLT ADJUSTABLE PRECISION VOLTAGE REFERENCE MONOLITHIC SILICON.pdf
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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add case outline H and make change to long term stability test as specified in table I. - ro 01-11-16 R. MONNIN B Add case outlines P and 2. Make changes to 1.2.4, 1.3, and figure 1. - lgt 02-04-22 R. MONNIN C Drawing updated to reflect current r
2、equirements. -rrp 08-10-27 R. HEBER D Add device type 02. Delete radiation exposure circuit. - ro 12-06-06 C. SAFFLE REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http
3、:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY RAYMOND MONNIN MICROCIRCUIT, LINEAR, POSITIVE 5-VOLT ADJUSTABLE PRECISION VOLTAGE REFERENCE, MONOLITHIC SI
4、LICON DRAWING APPROVAL DATE 00-04-05 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-00516 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E331-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00516 DLA LAND
5、 AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead fini
6、shes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 R 00516 01 V G A Federal stock class designator RHA designator (see
7、 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Devi
8、ce class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit funct
9、ion 01 REF05A +5 volt precision voltage reference with adjustable output 02 REF05A +5 volt precision voltage reference with adjustable output 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirem
10、ents documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-S
11、TD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can H GDFP1-F10 or CDFP2-F10 10 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for devic
12、e classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00516 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234
13、 APR 97 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) . 40 V dc Power dissipation (PD) 500 mW Output short circuit duration . Indefinite Storage temperature -65C to +150C Lead temperature (soldering, 60 seconds) +300C Junction temperature (TJ) -65C to +150C Thermal resistance, junction-to-cas
14、e (JC) See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G . 150C/W Case H . 180C/W Case P . 148C/W Case 2 95C/W 1.4 Recommended operating conditions. Input voltage (VIN) . +15 V Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features: Maximum total dose ava
15、ilable (dose rate = 50 300 rads(Si)/s): Device type 01 . 100 krads(Si) 2/ Maximum total dose available (dose rate 10 mrads(Si)/s): Device type 02 . 50 krads(Si) 3/ _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may d
16、egrade performance and affect reliability. 2/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, conditi
17、on A. 3/ Device type 02 radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883 method 1019, condition D. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A
18、 5962-00516 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein.
19、 Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircu
20、its. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/
21、or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, h
22、owever, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacture
23、rs Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 D
24、esign, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with
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