DLA DSCC-VID-V62 11613 REV B-2011 MICROCIRCUIT DIGITAL MIXED SIGNAL MICRCONTROLLER MONOLITHIC SILICON.pdf
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1、 REVISIONS LTR DESCRIPTION DATE APPROVED Prepared in accordance with ASME Y14.24 Vendor item drawing REV PAGE REV PAGE 18 19 20 21 22 23 24 25 26 27 28 29 30 REV STATUS OF PAGES REV PAGE 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 PMIC N/A PREPARED BY Phu H. Nguyen DLA LAND AND MARITIME COLUMBUS, OHIO
2、 43218-3990 http:/www.dscc.dla.mil Original date of drawing YY MM DD CHECKED BY Phu H. Nguyen TITLE MICROCIRCUIT, DIGITAL, MIXED SIGNAL MICRCONTROLLER, MONOLITHIC SILICON 11-10-27 APPROVED BY Thomas M. Hess SIZE A CODE IDENT. NO. 16236 DWG NO. V62/11613 REV PAGE 1 OF 30 AMSC N/A 5962-V083-11 Provide
3、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/11613 REV PAGE 2 1. SCOPE 1.1 Scope. This drawing documents the general requirements of a high performance mixed signal microcontrol
4、ler microcircuit, with an operating temperature range of -40C to +125C. 1.2 Vendor Item Drawing Administrative Control Number. The manufacturers PIN is the item of identification. The vendor item drawing establishes an administrative control number for identifying the item on the engineering documen
5、tation: V62/11613 - 01 X E Drawing Device type Case outline Lead finish number (See 1.2.1) (See 1.2.2) (See 1.2.3) 1.2.1 Device type(s). Device type Generic Circuit function 01 MSP430F2013 Mixed signal microcontroller 1.2.2 Case outline(s). The case outlines are as specified herein. Outline letter N
6、umber of pins JEDEC PUB 95 Package style X 15 JEDEC MO-220 Quad flatpack, No-leads 1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacturer: Finish designator Material A Hot solder dip B Tin-lead plate C Gold plate D Palladium E Gold
7、 flash palladium Z Other Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/11613 REV PAGE 3 1.3 Absolute maximum ratings. 1/ Voltage applied at VCCto VSS-0.3 V to +17 V Voltag
8、e apply to any pin -0.3 V to VCC+ 0.3 V 2/ Diode current at any device terminal . 2 mA Storage temperature 3/ Unprogrammed device -55C to 150C Programmed device -40C to 150C Thermal information 4/ Case outline letter X Units Junction to ambient thermal resistance(JA) 5/ 38.1 C/W Junction to case (to
9、p) thermal resistance (JCtop) 6/ 26 Juntion to board thermal resistance (JB) 7/ 7.5 Junction to top characterization parameter (JT) 8/ 0.3 Junction to board characterization parameter (JB) 9/ 5.7 Junction to case (bottom) thermal resistance (JCbot) 10/ 1.9 1.4 Recommended operating conditions. Suppl
10、y voltage (VCC) During program execution 1.8 V to 3.6 V During flash program/erase 2.2 V to 3.6 V Supply voltage (VSS) 0 V Operating free air temperature (TA) -40C to 125C Processor frequency (maximum MCLK frequency) 11/ 12/ VCC= 1.8 V, Duty cycle = 50% 10% 6 MHz VCC= 2.7 V, Duty cycle = 50% 10% 12
11、MHz VCC= 3.3 V, Duty cycle = 50% 10% 16 MHz 1/ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended oper
12、ating conditions” is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. 2/ All voltage referenced to VSS. The JTAG fuse blow voltage, VFBis allow to exceed the absolute maximum rating. The voltage is applied to the TEST pin when blowing the
13、 JTAG fuse. 3/ Higher temperature may be applied during board soldering according to the current JEDEC J-STD 020 specification with peak reflow temperatures not higher than classified on the device label on the shipping boxes or reels. 4/ For more information about traditional and new thermal metric
14、s, see manufacturer data. 5/ The junction to ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC standard, high K board, as specified in JESD51-7, in an environment described in JESD51-2a. 6/ The junction to case (top) thermal resistance is obtained by simulati
15、ng a cold plate test on the package top. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. 7/ The junction to board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperatur
16、e, as described in JESD51-8. 8/ The junction to top characterization parameter, JT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining JA, using a procedure described in JESD51-2a (section 6 and 7). 9/ The junction to top character
17、ization parameter, JB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining JA, using a procedure described in JESD51-2a (section 6 and 7). 10/ The junction to case (bottom) thermal resistance is obtained by simulating a cold plate t
18、est on the exposed (power) pad. No specific JEDEC standard exists, but a close description can be found in the ANSI SEMI standard G30-88. 11/ This MSP430 CPU is clocked directly with MCLK. Both the high and low phase of MCLK must not exceed the pulse width of the specified maximum frequency. 12/ Mod
19、ules might have a different maximum input clock specification of the respective module in manufacturer data sheet. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/11613 REV
20、PAGE 4 2. APPLICABLE DOCUMENTS JEDEC SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC) JEDEC PUB 95 Registered and Standard Outlines for Semiconductor Devices JEDEC STD 51-7 High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages (Copies of these documents are available online at h
21、ttp:/www.jedec.org or from JEDEC Solid State Technology Association, 3103 North 10th Street, Suite 240S, Arlington, VA 22201.) 3. REQUIREMENTS 3.1 Marking. Parts shall be permanently and legibly marked with the manufacturers part number as shown in 6.3 herein and as follows: A. Manufacturers name, C
22、AGE code, or logo B. Pin 1 identifier C. ESDS identification (optional) 3.2 Unit container. The unit container shall be marked with the manufacturers part number and with items A and C (if applicable) above. 3.3 Electrical characteristics. The maximum and recommended operating conditions and electri
23、cal performance characteristics are as specified in 1.3, 1.4, and table I herein. 3.4 Design, construction, and physical dimension. The design, construction, and physical dimensions are as specified herein. 3.5 Diagrams. 3.5.1 Case outline. The case outline shall be as shown in 1.2.2 and figure 1. 3
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