BS CECC 90202-1990 Specification for harmonized system of quality assessment for electronic components - Blank detail specification integrated operational amplifiers《电子元器件用质量评估协调体系.pdf

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1、BRITISH STANDARD BS CECC 90202:1990 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Blankdetail specification Integrated operational amplifiersBSCECC90202:1990 BSI 03-2000 ISBN0 580 35828 3 Amendments issued since publication Amd. No.

2、 Date of issue Comments 8293 August 1994 Indicated by a sideline in the marginBSCECC90202:1990 BSI 03-2000 i Contents Page National foreword ii Foreword iii Text of CECC 90202 1BSCECC90202:1990 ii BSI 03-2000 National foreword This British Standard has been prepared under the direction of the Electr

3、onic Components Standards Policy Committee. It is identical with CENELEC Electronic Components Committee CECC90202:1989 “Harmonized system ofquality assessment for electronic components. Blank detail specification: Integrated operational amplifiers”, as amended by Amendment No.1 publishedin 1994. Th

4、is standard is a harmonized specification within the CECC System. BSCECC90202:1985 remains valid for existing qualification approvals untilfurther notice. Cross-references. The British Standard which implements CECC00100 is BS9000 General requirements for a system for electronic components of assess

5、edquality Part2:1983 Specification for national implementation of CECCbasic rules and rules of procedure. The Technical Committee has reviewed the provisions of IEC747, IEC748 andIEC749, to which reference is made in the text, and has decided that theyare acceptable for use in conjunction with this

6、standard. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordancewith BSCECC90200 in any detail specification for these devices. Detail specification layout. The front page of detail specifications released t

7、o BSCECC family or blank detail specification will be in accordance with BS9000 Circular Letter No.15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standa

8、rd does not of itself confer immunity from legal obligations. International Standards a Corresponding British Standards IEC 68-2-30:1980 BS 2011 Environmental testing Part 2.1 Db:1981 Test Db and guidance: Damp heat, cyclic 12 + 12 hour cycle (Identical) CECC 90000:1985 BS CECC 90000:1985 Harmonized

9、 system of quality assessment for electronic components. Generic specification: Monolithic integrated circuits (Identical) CECC 90100:1986 BS CECC 90100:1986 Harmonized system of quality assessment for electronic components: Sectional specification: Digital monolithic integrated circuits (Identical)

10、 CECC 90200:1987 BS CECC 90200:1988 Harmonized system of quality assessment for electronic components: Sectional specification: Analogue monolithic integrated circuits (Identical) a Undated in text. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theCEC

11、C title page, pages ii to iv, pages 1 to 14 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BSCECC90202:1990 ii BSI 03-2000 Contents Page Foreword iii 1 Front page

12、1 2 Ratings (limiting values) 3 3 Recommended conditions of use and associated characteristics 3 4 Test conditions and inspection requirements 4 Annex A Electrical endurance operating mode 13BSCECC90202:1990 BSI 03-2000 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of t

13、hosemember countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System forelectronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and qualit

14、y assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This specification has been formally approved by

15、the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for INTEGRATED OPERATIONAL AMPLIFIERS. Itshould be read in conjunction with the current regulations for the CECC System. At the date of printing of this specification th

16、e member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the UnitedKingdom, and copies of it can be obtained from the addresses shown on the blue fly sheet. Preface This blank detail spe

17、cification (BDS) was prepared by CECCWG9 “INTEGRATED CIRCUITS”. It is based, wherever possible, on the Publications of the International Electrotechnical Commission and in particular on IEC747: Semiconductor devices: Discrete devices and integrated circuits, IEC748: Semiconductor devices: Integrated

18、 circuits, IEC749: Semiconductor devices: Mechanical and climatic test methods. The text of this second Issue consists of the text of CECC90202 Issue1(1985) amended in accordance with the ratified new material introduced by the following document. It is recognized that the layout proposed cannot app

19、ly to all detail specifications based on this document. For example when several similar devices are covered by the same detail specification, it may be convenient to give the limiting values in a table. In accordance with the decision of the CECC Management Committee this specification is published

20、 initially in French and English. The German text will follow as soon as it has been prepared. Effective date This second Issue of CECC90202 shall become effective for all new qualification approvals on18December1989. Issue1 will continue to remain effective to cover all past approvals. Document Dat

21、e of Voting Report on the Voting CECC (Secretariat) 2166 February 1988 CECC (Secretariat) 2297iv blankBSCECC90202:1990 BSI 03-2000 1 1 Front page The front page of the DS shall be laid out as shown on the following page. The numbers between square brackets correspond to the following indications whi

22、ch shall be given: Identification of the DS and of the component: 1 The name of the National Standards Organization under whose authority the DS is published and, ifapplicable, the organization from whom the DS is available. 2 The CECC Symbol and the CECC number allotted to the DS by the CECC Genera

23、l Secretariat. 3 The number and issue number of the CECC generic or sectional specification as relevant; also national reference if different. 4 If different from the CECC number, the national number of the DS, date of issue and any further information required by the national system, together with

24、any amendment numbers. 5 Type number, a short description of the type by: function (for example differential inputs operational amplifier) number of independent circuits per package number and kind of inputs and outputs material and type of construction (silicon, monolithic, multichip, bipolar, MOS,

25、 etc.) performance, for example high output power, high speed, low power consumption electrostatic sensitivity (where appropriate). 6 Information on typical construction (if applicable) For 5 and 6 the text to be given in the DS should be suitable for an entry in CECC00200 or CECC00300. 7 An outline

26、 drawing with main dimensions which are of importance for interchangeability, and/or reference to the appropriate national or international document for outlines. Alternatively, this drawing may be given in an annex to the DS. 8 Quality assessment level(s) 9 Reference data giving information on the

27、most important properties of the component, which allow comparison between the various component types intended for the same, or for similar, applications. Identification of the component and supplementary information: Description of the materials for the package (for example, glass, ceramic, silico

28、ne) and information relating to the mounting (welding, soldering), lead material and finish. Inside the sketch of the package, the terminal connections to the inputs, outputs or other important points of the circuit shall be identified. This can be shown by a functional block diagram. Description of

29、 the numbering of the terminals with the identification of pin number1. Marking on the device in accordance with the GS (see2.5 of CECC90000).BSCECC90202:1990 2 BSI 03-2000 Layout for front page of detail specification BSCECC90202:1990 BSI 03-2000 3 2 Ratings (limiting values) (Not for inspection pu

30、rposes) These apply over the operating temperature range, unless otherwise stated (see CECC90200). 3 Recommended conditions of use and associated characteristics (notforinspectionpurpose) The following characteristics shall apply over the full ambient operating temperature range unless otherwise spe

31、cified. Where the stated performance of the circuit varies over the ambient operating temperature range the values of the input and output voltages and their associated currents shall be statedat25 C and at the extremes of the operating temperature range. Where it is necessary to use external elemen

32、ts to ensure stable operation of the amplifier, the values ofthecharacteristics specified refer to the amplifier with such elements connected. 2.1 Maximum (and where appropriate minimum) value of voltage between the reference terminal and each of the other terminals. 2.2 Any other limiting value(s)

33、of voltage between any specified terminals as appropriate. 2.3 Maximum continuous output current. I O 2.4 Maximum continuous internal power dissipation with reference to a deratingcurve or factor related to the reference point temperature or ambient temperature. P D 2.5 Maximum common mode input vol

34、tage. V IC 2.6 Maximum differential mode input voltage. V ID 2.7 Maximum and minimum ambient or reference point operating temperature. T amb 2.8 Maximum and minimum storage temperature. T stg 2.9 Any specific mechanical or environmental ratings peculiar to the device. 2.10 Any interdependence of lim

35、iting conditions. 2.11 Maximum value of output short-circuit current and duration (whereappropriate). I OS , t OS Characteristics Symbol Method (See4.1.1 of CECC90200) 3.0 General measurement conditions and corresponding figures. + V CC , V EE 3.1 Input voltage(s). V I 3.2 Output voltage. V O 3.3 Ou

36、tput current (if applicable). I O 3.4 Power supply currents. I S A-01 3.5 Small signal input impedance (if applicable). Z i A-02 3.6 Output impedance (if applicable). Z o A-03 3.7 Input offset voltage of a differential input integrated amplifier (where appropriate) V IO A-04 3.8 Bias voltage of a si

37、ngle ended input integrated amplifier (whereappropriate) V IB A-04 3.9 Input offset current. I O A-05 3.10 Input bias current. I IB A-06 3.11 Input offset voltage temperature coefficient (if applicable). ! VIO A-07 3.12 Input offset current temperature coefficient (if applicable). ! IIO A-08BSCECC90

38、202:1990 4 BSI 03-2000 4 Test conditions and inspection requirements See3.6 of CECC90000 with the following special requirements: The values and exact test conditions to be used shall be specified as required in the detail specification relevant to a given type, in line with the indications given in

39、 CECC90200 for the relevant test. External elements necessary to ensure stable operation shall be specified and shall be connected for allelectrical tests. Characteristics Symbol Method (See4.1.1 of CECC90200) 3.14 Open-loop differential mode voltage amplification (whereappropriate). A VD A-09 3.15

40、Cut-off frequency (frequencies, high and low) (if applicable, seenote5 of Sub-GroupA5). f a , f b A-10 3.16 Common mode rejection ratio (at25 C only) of differential inputoperational amplifier (where appropriate). k CMR A-11 3.17 Supply voltage(s) rejection ratio (at25 C only). k SVR A-12 3.18 Outpu

41、t voltage range for differential amplifiers (d.c.measurementonly). V OPP A-13 3.19 Response times (if applicable) A-14 delay time rise time fall time ripple time total response time t d t r t f t rip t tot 3.20 Noise (if applicable) A-15 noise voltage noise current and burst noise V n I n V bn 3.21

42、Average rate of change of the output voltage (ifapplicable:seenote5 of Sub-GroupA5). S VOAV A-16 3.22 Real Gain-Bandwidth product (where appropriate). GW r A-17 3.23 Crosstalk attenuation between any two channels (whereappropriate) a ct S-05 (See4.1 of CECC90100) 3.24 Output short-circuit current I

43、OS 4.1.4BSCECC90202:1990 BSI 03-2000 5 Examination ortest D ND Conditions of test Limits to be specified Group A Inspection Sub-Group A2 Verification of the function at25 C GS/Note 5 ND Open loop voltage amplification Method SS2/A-09 See relevant DS A VB OR OR Open loop differential mode voltage amp

44、lification Method SS2/A-09 A VDB Sub-Group A3 Static characteristics at25 C ND Power supply current(s) Method SS2/A-01 See relevant DS I SA Input offset voltage Method SS2/A-04 See relevant DS V IOA Input offset current Method SS2/A-05 See relevant DS I IOA Input bias current Method SS2/A-06 See rel

45、evant DS I IBA Output voltage range Method SS2/A-13 See relevant DS V OPPB Output short-circuit current Method SS1/4.1.4 See relevant DS I OSA , if applicable: I OSB Common mode rejection ratio (whereappropriate) Method SS2/A-11 See relevant DS k CMRB Supply voltage rejection ratio Method SS2/A-12 S

46、ee relevant DS k SVRBBSCECC90202:1990 6 BSI 03-2000 Examination or test D ND Conditions of test Limits to be specified Sub-Group A4a Static characteristics at maximum operating temperature ND T amb= T ambmax. Electrical conditions as for Sub-Group A3 Limits may be different from those in Sub-Group A

47、3 Power supply current(s) Method SS2/A-01 Output short-circuit current Method SS1/4.1.4 Input offset voltage Method SS2/A-04 Input offset current Method SS2/A-05 Input bias current Method SS2/A-06 Output voltage range Method SS2/A-13 Input offset voltage temperature coefficient (ifapplicable) Method

48、 SS2/A-07 See relevant DS VIOA Input offset current temperature coefficient (ifapplicable) Method SS2/A-08 See relevant DS IIOABSCECC90202:1990 BSI 03-2000 7 Examination or test D ND Conditions of test Limits to be specified Sub-Group A4b Static characteristics at minimum operating temperature ND T

49、amb= T ambmin. Electrical conditions as for Sub-Group A3 Limits may be different from those in Sub-Group A3 Power supply current(s) Method SS2/A-01 Output short-circuit current Method SS1/4.1.4 Input offset voltage Method SS2/A-04 Input offset current Method SS2/A-05 Input bias current Method SS2/A-06 Output voltage range Method SS2/A-13 Input offset voltage temperature coefficient (ifapplicable) Method SS2/A-07 See relevant DS VIOA Input offset current temperature coefficient (ifapplicable) Method SS2/A-08 See releva