ARMY FF-S-1362-1970 STUD PLAIN GENERAL PURPOSE《一般用途的板墙筋和平针》.pdf

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1、MiY 18. I970 SUPERSEDING MILS-I 824.78 July 30, 1964 and Fed. Spec. FF-B-571A Januas 9, 1934 (in part) FEDERAL SPEZIFICATION SRTD, PLAIN; GENERAL FURhsE This specification was approved by the Camdssioner, Federal Supply Service, General Services Administration, for use of all Federal agencies. 1. SC

2、OPE 1.1 This specification covers plain general purpose carbon or alloy steel, corrosion resisting steel, brass, and nickel-copper studs. 2. APPLICABLE DOCUMENTS 2.1 Specifications and-standards. The follawing specifications and standards, of the issue in effect on date of invitations for proposal,

3、form a part of this specification to the extent specified herein. Federal Specifications: QQ-B-637 - Bras8, h.val: QQ-N-281 - Nickel-Copper Alloy Bar, Phte, Rod, Sheet, Strip, Wire, QQ-P-35 QQ-P-416 - Plating, Cadnium (Elec.t;r Test Methods. (Activities outside the Feerai Govermuent may obtaln copie

4、s of Federal Specificptions, Standards, and Hndbooks as outlined under General riZf6ma- tim in he Index of Federal Specifications and Standards and at the prices indicated in the Index. The adex, which includes cumnlative montbly sup- plements as issued, is for sale on a subscription basis by the Su

5、gerintend- ent of Documen MIL-F-495 - Mnish, Chemical, Black, for Copper Allays. MIL-H-3982 - Hardware (fiateners and Related Items), hckaging and Packing for Shipent and Storage of. MIL-1-6866 - Inspection, Penetrant Method of. MIL-I-6868 - inspection rocess , Magnetic Particle . MIL-H-6875 - Heat

6、!treatment of Steels (Aircraft; Practice, Process for). MIL-1-17224 - indicator, Penneability, Low-Mu (Go-No Go). Military Standardti : ML-STher publicatdonS. The follaWin; documents form a part of this specification to the extenti specified herein. Unless a specific issue is dentified, the 5ssue in

7、 effect on date of invitation far bids or request for proposal ahaU apply. National Bureau of Standards Mandbook: 1128, hrts I and II5 - Screw-Thra Standards for Federal Services. (Application for copies should be addressed to the Superintendent of Documents, U. S, Gamment Printing Office, Washingto

8、n, D. C. 20402.) Anerican Rational Standards Institute Stanardt ANSI B1,12 Class 5 Interference - Fit Thread. 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-FF-S-1362 53 9499779 0009106 B W (Application for copies should be addressed to the Americ

9、an National 0 Standards institute, 1430 Broadway, New York, New York 10018.) E8 - Tension Testing of Metallic Materials E10 - Brinell Hardness of Metallic Materials, Test for 18 - Rockwell Hardness and Rockwell Superficial Hardness of Metallic E112 - Eetimating the Average Grain Size of Metals Mater

10、ials, Test for (Application for copies should be addressed to the American Society (Technical society and technical association specifications and stan- for Testing and lulaterials, 1916 Race Street, Philadelphia, Pa. 19103.) dards are generally available for reference from libraries. also distribut

11、ed among technical groups and using Federal agencies. ) O e They are 3. m- shall be de of materials specified in 3.1.1 through 3.1.4 which-meet- the reauiraents of Tables I an II (see 6.2.). and !Table I. cable specification. Studs of MS51864 shall be made in accordance with the appli- QQ-N-281, Cla

12、ss B and !E Tap in canbination with a crest crater are penilissble, provided the imperfection does not Wend deeper than 26 of the basic thread height (See Table V) as measured frcm the thread crest when the thread major diameter is at a minimum size (See Flgure 3). the crest of the thread within the

13、 major diameter limits as sham In Figure 3b. ate slightly fian contour. Slight deviation frcm the thread contour is pedasible at The incomplete thread at each end of the thread may also devi- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-LAPS AND S

14、EAMS NOT PER MI SS I B LE MAJOR DIAMETER PITCH DIAMETER MINOR DIAMETER - Figure 2. PER MI SSI B LE LAPS AND SEAMS MAJOR DIAMETER PITCH DIAMETER MINOR DIAMETER - NOT MORE THAN 20% OF BASIC THREAD HEIGHT Figure 3a. PER MISS I B LE IRREGULARITIES MAJOR DIAMETER SURFACE PITCH DIAMETER -MINOR DIAMETER Fi

15、gure 3b. Lap , Seams, and Surface Irrerements. Except as 42 Uspection terms and definitions. Inspection tem and defini- %ions isha21 be as defined in-STD-lOg, 4,3 Acceptance tests. Test methods for acceptance shaU consist of exarnhtion and testing. 4*4 ISarllplng for lot acceptance. 10 Provided by I

16、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-4.4.1 inspection lot. A lot shall consist of studs of the same type, size, material, coating, and thread series manufactured under like condi- tions and offered for delivery at one time. 4.4.2 Ssmpling for visual an

17、d dimensional examinstion. A randan sample of studs shall be selecte fYan each lot in accorance with MIL- STD-lOS, inspection Level S-4. be as specified in mble VIL. for %est of studs shall be In accordance with ME-STD-105, Inspection Level S1. tive . Tfie Acceptable Quality Levels (AQt) shall 4.4.3

18、 Samplirip: for test. Unless otherwise specified herein, sampling The Acceptable Quality Level (AQ,L) shall be 1.5 percent defec- 4.4.3.1 Sampling for hardness test. Samples shall be drawn from each lot in accorance with MIL-STD-lW, inspection Level S1. The Acceptable Quality Level (AU) shall be 1.5

19、 percent defective. 4.4.3.2 Samp ling for protective finish. Samplirg for test of pro- tective finishes shall be in accorance with Che applicable specifications of 3.2.1thru 3.2.3. 4.4.3.3 Sampling for chemical analysis. For determining khe chemi- cal canpoisition requirements of 3.1, a sample size

20、of studs su1 be drawn fmm each lot presented for acceptance. least 4 ounces of clean fine drfllings, millings, or chips and ahdl can- ply with 4.6.4. The sample shall consist of at 4.4.3.4 Sampling for packaging and packirq. Sampling for inspection of packaging and packing shall be in accordance wit

21、h MIL-H-3982. 4.5 ion of defects for studs shall be as specified in Table Table VJI. Classiflcation of defects Categories Critical 1 MaJor 103, 102 103 104 mj 106 12 Defects AQL - 1,O percent Circwnferential cracks (3.5*1.) AQL = 2.5 percent Srotective finish (3,2) iameter (3.3) Design and dimensiot

22、ls (3.3) Thread size and form (3.3.1.4) incomplete threads (3.3.1.5 Straightness of stud (3.3 2 I Method of nmection Metallographic Microscags Visual Gage and micrameter Masure Scale Surface plate the inclusion of foreign elan&ks. the folding over of metal fins or sharp corners and then rolling or f

23、orging them into the surface, but not welding them. 6,4.3 Seam. A sem is an melded fold or lap which appears a8 an 64.4 Inalusiona. Inclusions are non-metrAlUc material in a solid openhg Ln tho rawmteral as received fran the source. metallic mtrix .- 6.4.5 $sic thread height. %sic thread height i eq

24、uivalent to 0.650 kine8 the pitch. MLITARY CIJS!lODIANS: Army “ wc Navy - None Air Force - 02 Review ackivitiesi: Anay - AV Navy - None Air Force - 85 IXSA - TB m 16 Bepar *bg activity: Am - WC Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-