ISO TR 14187-2011 Surface chemical analysis - Characterization of nanostructured materials《表面化学分析 纳米结构材料的特性》.pdf
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1、 Reference number ISO/TR 14187:2011(E) ISO 2011TECHNICAL REPORT ISO/TR 14187 First edition 2011-08-15 Surface chemical analysis Characterization of nanostructured materials Analyse chimique des surfaces Caractrisation des matriaux nanostructurs ISO/TR 14187:2011(E) COPYRIGHT PROTECTED DOCUMENT ISO 2
2、011 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the co
3、untry of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2011 All rights reservedISO/TR 14187:2011(E) ISO 2011 All rights reserved iiiContents Page Foreword iv I
4、ntroduction . v 1 Scope 1 2 Terms and definitions . 1 3 Symbols and abbreviated terms 1 4 Characterization of nanostructured materials with surface analysis methods 3 4.1 Introduction 3 4.2 Electron Spectroscopies (AES and XPS) 6 4.2.1 Surface functionalization and product formation 7 4.2.2 Presence
5、 of contamination and coatings . 8 4.2.3 Orientation of surface molecules 8 4.2.4 Coating or layer thickness . 8 4.2.5 Near-surface elemental distribution 10 4.2.6 Particle size 10 4.2.7 Particle location, composition and shape 11 4.2.8 Other properties: electronic characteristics and surface acidit
6、y . 11 4.3 Ion-beam surface analysis methods (SIMS and LEIS) . 12 4.3.1 SIMS and examples of SIMS applications . 12 4.3.2 Low energy ion scattering and applications to nanomaterials 13 4.4 Scanning probe microscopy 14 4.5 Surface characterization of carbon nanostructures 15 5 Analysis considerations
7、, issues and challenges associated with characterization of nanostructured materials: Information for the analyst. 15 5.1 Introduction 15 5.2 General considerations and analysis challenges 16 5.3 Physical properties . 17 5.4 Particle stability and damage: influence of size, surface energy and conflu
8、ence of energy scales 18 5.4.1 Crystal structure 18 5.4.2 Damage and probe effects . 19 5.4.3 Time and environment 19 5.5 Sample mounting and preparation considerations . 24 5.6 Specific considerations for analysis of nanostructured materials using XPS, AES, SIMS and SPM . 24 5.6.1 Introduction 24 5
9、.6.2 Issues related to application of XPS to nanomaterials . 24 5.6.3 Issues related to the application of AES to nanostructured materials 27 5.6.4 Issues related to application of SIMS to nanoparticles . 27 5.6.5 Issues related to the application of scanning probe methods to nanoparticles 29 6 Gene
10、ral characterization needs and opportunities for nanostructured materials . 29 Bibliography 31 ISO/TR 14187:2011(E) iv ISO 2011 All rights reservedForeword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of
11、 preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental
12、, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main
13、task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. In ex
14、ceptional circumstances, when a technical committee has collected data of a different kind from that which is normally published as an International Standard (“state of the art”, for example), it may decide by a simple majority vote of its participating members to publish a Technical Report. A Techn
15、ical Report is entirely informative in nature and does not have to be reviewed until the data it provides are considered to be no longer valid or useful. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held respon
16、sible for identifying any or all such patent rights. ISO/TR 14187 was prepared by Technical Committee ISO/TC 201, Surface chemical analysis, Subcommittee SC 5, Auger electron spectroscopy. ISO/TR 14187:2011(E) ISO 2011 All rights reserved vIntroduction As engineered nanomaterials of many types play
17、an increasing role in many different technologies 1, international organizations (including ISO, ASTM, the International Bureau of Weights of Measures (BIPM), Consultative Committee for Amount of Substance: Metrology in Chemistry (CCQM) and the Organization for Economic Cooperation and Development (
18、OECD)1 are working to identify critical properties 2 and measurements that must be understood to adequately define the nature of the materials being used. An inherent property of any nanostructured material, whether a particle, fibre or other object, is that a large percentage of the material is ass
19、ociated with a surface or interface. Therefore, surface composition and chemistry have been identified as being part of a minimum set of chemical parameters need to characterize nanomaterials and it would naturally seem that the wide range of tools developed for surface characterization could or sho
20、uld be routinely applied to these materials. Two different issues, however, have limited the impact of traditional surface analysis tools in some areas of nanoscience and nanotechnology. First, many of the tools do not have sufficient spatial resolution in three dimensions needed to analyse individu
21、al nanostructured materials (or, equivalently, variations of composition within that material). For this reason, some researchers do not consider application of the tools even though they can often provide very important information. Second, surface analytical (and other) tools are often applied to
22、nanostructured materials without appropriately considering several analytical challenges or issues that these materials present. Such challenges include environmentally altered behaviours of nanoparticles (including effects of making measurements in vacuum), time-dependent characteristics of nanostr
23、uctured materials, the influence of particle shape on analysis results, and the increased possibility of altering the structure or composition of the nanomaterial by the incident radiation (typically electrons, X-rays, or ions) during the analysis. This Technical Report gives information on these im
24、portant issues. The report first describes the types of information that can be obtained about nanostructured materials, sometimes using analytical approaches beyond those in standard applications. Second, the report examines the technical challenges generally faced when applying surface analysis to
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