IEEE 529-1980 en Supplement for Strapdown Applications to IEEE Standard Specification Format Guide and Test Procedure for Single-Degree-of-Freedom Rate-Integrat.pdf
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1、_Copyright 1980 byThe Institute of Electrical and Electronics Engineers, Inc.No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the priorwritten permission of the publisher.IEEE Std 529-1980(R2010)(Supplement to IEEE Std 517-1974, R1980
2、)Supplement for Strapdown Applicationsto IEEE Standard Specification FormatGuide and Test Procedure for Single-Degree-of-Freedom Rate-IntegratingGyrosSponsorGyro and Accelerometer Panelof theIEEE Aerospace and Electronic Systems SocietyReaffirmed September 30, 2010Approved September 27, 1979IEEE-SA
3、Standards BoardReaffirmed June 7, 2000Approved May 5, 1983American National Standards InstituteiiApproved September 27, 1979IEEE Standards BoardJoseph L. Koepfinger, ChairIrvin N. Howell, Jr, Vice Chair Ivan G. Easton, Secretary C. Y. R. AllenWilliam E. AndrusC. N. BerglundEdward ChellottiEdward J.
4、CohenWarren H. CookR. O. DuncanJay ForsterHarold S. GoldbergRichard J. GowenH. Mark GroveLoering M. JohnsonIrving KolodnyW. R. KruesiLeon LevyJ. E. MayDonald T. Michael*R. L. PritchardF. RosaRalph M. ShowersJ. W. SkooglundW. E. VannahB. W. Whittington*Member emeritusiiiForeword(This Foreword is not
5、a part of IEEE Std 529-1980, Supplement for Strapdown Applications to IEEE Standard Specification FormalGuide and Test Procedure for Single-Degree-of-Freedom Rate-Integrating Gyros.)This standard was prepared by the Gyro and Accelerometer Panel of the Aerospace Electronics Systems Society of theInst
6、itute of Electrical and Electronics Engineers. It is a supplement to IEEE Std 517-1974 (R1980), StandardSpecification Format Guide and Test Procedure for Single-Degree-of-Freedom Rate-Integrating Gyros, which consistsof two parts.Part I of IEEE Std 517-1974 (R1980) is a specification format guide fo
7、r the preparation of a rate-integrating gyrospecification. Part II is a compilation of recommended procedures for testing a rate-integrating gyro.The paragraphs in this supplement are to be used in substitution for or in addition to comparable paragraphs of IEEEStd 517-1974 (R1980). The numerical id
8、entification should make it readily apparent when a paragraph is substitutedor added; a Users Cross Reference has also been included. The supplement contains additional performancerequirements and tests which should be specified for a single-degree-of-freedom rate-integrating gyro when it is usedas
9、a strapdown sensor in operating environments typical of aircraft and missile applications.This supplement applies to both parts of IEEE Std 517-1974 (R1980) and must be used in conjunction with both PartsI and II. The format of the supplement is the same as that of IEEE Std 517-1974 (R1980), and the
10、 same use is madeof blank spaces, brackets, and boxed comments. Refer to the Foreword in that standard for guidelines on their use. Theterminology used conforms to the gyro terminology that is contained in ANSI/IEEE Std 100-1977, StandardDictionary of Electrical and Electronics Terms.This supplement
11、, when combined with IEEE Std 517-1974 (R1980), defines the requirements and test procedures interms of characteristics unique to the gyro or those applications in which the dynamic angular inputs are significantlygreater than the limitations identified in IEEE Std 517-1974 (R1980). The strapdown ra
12、te-integrating gyro, because itis captured through an external loop using the gyro torquer, provides a voltage, current, or pulse train proportional toangular rate about the input axis. An example of a model equation containing the additional terms which describe thegyro in strapdown applications is
13、 contained in 6.3. The characteristics of the external capture loop are considered to theextent necessary to define the gyro performance, even though such a loop is not part of the gyro.This standard represents a group effort on a large scale. A total of 111 individuals attended 26 meetings of the G
14、yroand Accelerometer Panel while this standard was in preparation.At the time this standard was approved the members of the working group were:C. O. Swanson, ChairR. F. AsmarC. E. BossonA. T. CampbellJ. ClaassenJ. F. ConroyJ. H. CrittendenH. B. DiamondR. H. FallA. FerrarisT. A. FuhrmanK. N. GreenK.
15、W. HombC. A. JonesK. J. KlarmanM. G. KoningJ. J. MeehanG. E. MorrisonG. C. MurrayR. B. PetersM. J. RupertW. F. SappB. SchwartzA. ScovilleN. F. SinnottG. R. TaylorB. J. WimberivUsers Cross ReferenceThis cross reference compiles the sections of IEEE Std 517-1974 (R1980) affected by the Strapdown Suppl
16、ement. Allof the supplement sections of IEEE Std 517-1974 (R1980) are indicated by an asterisk (*) and the sections of thissupplement are listed as either superseding or providing additional information. The title of each subsection in thissupplement is listed in the table of contents.IEEE Std 517-1
17、974 (R1980) STRAPDOWN SUPPLEMENTSECTIONSUPERSEDINGINFORMATIONADDITIONALINFORMATIONPart I Specification Format*1. Scope 12. Applicable Documents*2.2 Standards 2.2.2(1)3. Requirements*3.2.2 Definitions 3.2.2*3.3.9 Torquer Performance 3.3.9.2.13.3.9.2.2*3.3.18 Output Noise 3.3.18*3.3.22 Reference Const
18、ants 3.3.22.53.3.23 Polarity3.3.243.3.253.3.25.13.3.25.23.3.25.33.3.263.3.273.3.28*3.6.4 Environments 3.6.4.13.6.4.1.13.6.4.1.24. Quality Assurance Provisions*4.6 Test Methods 4.64.6.18.5.14.6.18.5.25. Preparation for Delivery6. Notes*6.3 Model Equation 6.3Part II Test Procedure7. Scope8. Descriptio
19、nv9. Test Conditions and Test Equipment*9.1.1 Ambient Environment 9.1.1.49.1.1.4.19.1.1.4.2*9.2.2 Standard Operating Equipment9.2.210. Test Procedures*10.7 Torquer Test Series 10.7*10.7.1 Purpose 10.7.1*10.7.2 Test Equipment 10.7.2*10.7.3 Test Setup and Procedure 10.7.310.7.3.110.7.3.1.110.7.3.1.210
20、.7.3.1.310.7.3.1.410.7.3.1.510.7.3.1.610.7.3.1.6.110.7.3.1.6.210.7.3.4*10.7.4 Test Results 10.7.4.1.310.7.4.1.410.7.4.1.510.7.4.1.610.7.4.1.6.110.7.4.1.6.210.7.4.410.10 Axis Alignment 10.10.3.1*10.10.3 Test Setup and Procedure 10.10.3.210.10.4.1*10.10.4 Test Results10.13 Drift Rate Test Series*10.13
21、.1 Purpose 10.13.1*10.13.2 Test Equipment 10.13.2IEEE Std 517-1974 (R1980) STRAPDOWN SUPPLEMENTSECTIONSUPERSEDINGINFORMATIONADDITIONALINFORMATIONvi*10.13.3 Test Setup and Procedure 10.13.3.510.13.3.5.110.13.3.5.210.13.3.610.13.3.710.13.3.7.110.13.3.7.210.13.3.810.13.3.9*10.13.4 Test Results 10.13.41
22、0.13.4.510.13.4.5.110.13.4.5.210.13.4.610.13.4.6.110.13.4.6.210.13.4.710.13.4.7.110.13.4.7.210.13.4.810.13.4.910.14 Output Noise10.14.1 Purpose*10.14.2 Test Equipment 10.14.2*10.14.3 Test Setup and Procedure 10.14.310.14.3.110.14.3.2*10.14.4 Test Results 10.14.410.14.4.110.14.4.2*10.18 Environmental
23、 Test Series 10.18TABLES*Table 3 Environmental Test Series Table 3IEEE Std 517-1974 (R1980) STRAPDOWN SUPPLEMENTSECTIONSUPERSEDINGINFORMATIONADDITIONALINFORMATIONviiCLAUSE PAGEPart ISpecification Format1. Scope .13.2.2 Definitions .13.3.9.2.1 Command Rate Scale Factor Errors . 23.3.9.2.2 Command Rat
24、e Scale Factor Sensitivities 23.3.18 Output Noise. 23.3.22.5 Torquer Time Constant33.3.24 Anisoinertia Drift Rate Coefficient 33.3.25 Cross-Coupling Drift Rate 33.3.25.1 Nonoscillatory .33.3.25.2 Spin-Input Rectification 33.3.25.3 Spin-Output Rectification33.3.26 Torquer Current Rectification Drift
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