IEEE 181-2011 en Transitions Pulses and Related Waveforms《越迁 脉冲和相关波形》.pdf

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1、 IEEE Standard for Transitions, Pulses, and Related Waveforms Sponsored by the Waveform Generation, Measurement, and Analysis Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 6 September 2011 IEEE Instrumentation and Measurement Society IEEE Std 181-2011(Revision ofIEEE Std 181-2003)IEEE Std

2、 181-2011 (Revision of IEEE Std 181-2003) IEEE Standard for Transitions, Pulses, and Related Waveforms Sponsor Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement Society Approved 16 May 2011 IEEE-SA Standards Board Abstract: Approximately 100 terms a

3、nd their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as tran

4、sition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-sta

5、te single-transition waveforms. Keywords: aberration, algorithms, compound waveform, histogram, IEEE 181, levels, pulse, pulse amplitude, pulse definitions, pulse measurement, states, state boundaries, state levels, transients, transitions, transition duration, waveforms, waveform analysis, waveform

6、 definitions, waveform parameters, waveform terms The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2011 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 6 September 2011. Printed in the Unit

7、ed States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2011 IEEE. All rights reserved. Introduction Th

8、is introduction is not part of IEEE Std 181-2011, IEEE Standard for Transitions, Pulses, and Related Waveforms. This standard was developed by the Subcommittee on Pulse Techniques (SCOPT). It supersedes IEEE Std 181-2003a. The SCOPT is a subcommittee of the Waveform Generation, Measurement, and Anal

9、ysis Committee (TC-10) of the IEEE Instrumentation and Measurement (I&M) Society. The SCOPT comprises an international group of electronics engineers, mathematicians, and physicists with representatives from national metrology laboratories, national science laboratories, academia, and electronic ind

10、ustries (semiconductor, computing, telecommunication, test instrumentation, and so forth). This standard facilitates accurate and precise communication concerning parameters of transition, pulse, and related waveforms, and the techniques and procedures for measuring them. Because of the broad applic

11、ability of electrical pulse technology in the electronics industries (such as computer, telecommunication, and test-instrumentation industries), the development of unambiguous definitions for pulse terms, and the presentation of methods and/or algorithms for their calculation is important for commun

12、ication between manufacturers and consumers within the electronics industry. The availability of standard terms, definitions, and methods for their computation helps improve the quality of products and helps the consumer better compare the performance of different products. Improvements to digital w

13、aveform recorders have facilitated the capture, sharing, and processing of waveforms. Frequently these waveform recorders have the ability to process the waveform internally and provide pulse parameters. This process is done automatically and without operator intervention. Consequently, a standard i

14、s needed so that the definitions and methods of computation for pulse parameters are consistent. The purpose of this revision was to update terminology, correct errors in the previous revision, and add a newly developed method for computing state levels. A Project Authorization Request (PAR) was sub

15、mitted to the IEEE Standards Board in March 2008 to develop this revision. The PAR was approved on 19 May 2008. History Between 1996 and 2003, the SCOPT prepared a revision to the now withdrawn IEEE Std 181-1977, Standard on Pulse Measurement and Analysis by Objective Techniques, and withdrawn IEEE

16、Std 194,b,-1977, Standard Pulse Terms and Definitions. These standards dealt with terms and definitions for describing and computing waveform parameters and for describing the waveform measurement process. IEEE Std 181-2003 combined the information of and superseded IEEE Std 181-1977 and IEEE Std 19

17、4-1977, both of which were withdrawn. IEEE Std 181-1977 superseded IEEE Std 181-1955. Information about IEEE Std 181-1955 and the history of the development of IEEE Std 181-1977 is located in the Foreword of the latter. The IEEE Std 194-1977 superseded IEEE Std 194-1951, IEEE Standard on Pulses: Def

18、inition of TermsPart 1. Information about IEEE Std 194-1951 is also located in the Foreword of IEEE Std 194-1977. The work that resulted in IEEE Std 181-2003 began in September 1996, when SCOPT submitted a PAR to the IEEE Standards Board to combine IEEE standards 181 and 194 into a single document a

19、nd revise the subsequently merged document. The PAR was approved on 11 December 1996 and work on the revised and combined draft began in February 1997. The PAR expiration date was December 2002. Because of delays, SCOPT and TC-10 received approval from the IEEE for a one-year extension to enable bal

20、loting and revision as required. The draft went through several major revisions that resulted in IEEE Std 181-2003. aIEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854-4141, USA (http:/standards.ieee.org/). bThe IEEE standa

21、rds or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc. v Copyright 2011 IEEE. All rights reserved. Other than the merger of the two withdrawn standards, IEEE Std 181-1977 and IEEE Std 194-1977, respectively, the two major changes to t

22、he content of the standard were in the parameter definitions and algorithms. Changes to the definitions included the addition of new terms and definitions, deleting unused terms and definitions, expanding the list of deprecated terms, and updating and modifying existing definitions. This standard co

23、ntains definitions for approximately 100 terms commonly used to describe the waveform measurement and analysis process and waveform parameters. Many of the terms in the 1977 versions of these standards have been deleted entirely or deprecated. Deprecated terms were kept in the standard to provide co

24、ntinuity between this and the withdrawn standards. Terms are deprecated whenever they cannot be defined unambiguously or precisely. Terms that were deleted had to do with signal shaping terminology and pulsed radio frequency signals, which were not within the scope of the standard, as determined by

25、SCOPT. Development of a set of agreed-upon terms and definitions presented the greatest difficulty because of the pervasive misuse, misrepresentation, and misunderstanding of terms. Legacy issues for instrumentation manufacturers and terms of common use also had to be addressed. These revisions also

26、 resulted in the development of algorithms for computing the values of certain waveform parameters in all cases where these algorithms could be useful or instructive to the user of the standard. The intention of the SCOPT in adding these algorithms, which are recommended for use, was to provide indu

27、stry with a common and communicable reference for these parameters and their computation. Heretofore, this was not available and there existed much debate and misunderstanding between various groups measuring the same parameters. Similarly, this is the reason the SCOPT decided to add several example

28、s of basic waveforms, with formulae. The SCOPT focused these algorithms on the analysis of two-state, single-transition waveforms. The analysis of compound waveforms (waveforms with two or more states and/or two or more transitions) is accomplished by first decomposing the compound waveform into its

29、 constituent two-state, single-transition waveforms. A method for performing this decomposition is provided. Algorithms for the analysis of fluctuation and random jitter of waveforms were also introduced into the standard. These algorithms describe the computation of the mean and standard deviation

30、of jitter and fluctuation. The standard also contains methods to estimate the accuracy of the standard deviation and to correct its value. The SCOPT added Annex A into this standard, which contains numerous figures depicting different types of waveforms. These waveform examples, with the associated

31、expressions used to generate them, help the reader understand the use of certain defined terms and provide a common ground for communicating waveform types and how they can be computed. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations.

32、Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge a

33、ction that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and

34、 use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. vi Copyright 2011 IEEE. All righ

35、ts reserved. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in

36、time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Sta

37、ndards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata

38、, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standa

39、rds.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent

40、rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with su

41、bmission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Fur

42、ther information may be obtained from the IEEE Standards Association. vii Copyright 2011 IEEE. All rights reserved. Participants At the time this standard was completed, the Transitions, Pulses, and Related Waveforms Working Group had the following membership: Nicholas G. Paulter, Chair Jim Antonell

43、is Eulalia Balestrieri Jerome Blair John Calvin Dominique Dallet Pasquale Daponte Luca De Vito Matthew Harper Jeffery Jargon Beverly Klemme Thomas Linnenbrink Bin Ni Sergio Rapuano Steve Tilden The following members of the individual balloting committee voted on this standard. Balloters may have vot

44、ed for approval, disapproval, or abstention. Martin J. Bishop William Boyer Carlo Donati Neal Dowling Chris Gorringe Werner Hoelzl Yuri Khersonsky Jim Kulchisky Benjamin Lanz Thomas Linnenbrink Greg Luri Edward McCall Daleep Mohl Ulrich Pohl Iulian Profir Sergio Rapuano Robert Robinson Bartien Sayog

45、o Gil Shultz Joseph Stanco Walter Struppler Fang Xu Jian Yu When the IEEE-SA Standards Board approved this standard on 16 May 2011, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past President Judith Gorman, Secretary Masayuki Ariyoshi William Bart

46、ley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Joseph L. Koepfinger* David Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Phil Winston Howard L. Wolfman Don Wright *Member Emerit

47、us viii Copyright 2011 IEEE. All rights reserved. Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Francesca Drago IEEE Standards Program Manager, Document Develop

48、ment Kathryn Bennett IEEE Standards Program Manager, Technical Program Developmentix Copyright 2011 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 1 3. Definitions, symbols and deprecated terms 2 3.1 Definitions . 2 3.2 Symbols . 11 3.3 Deprecat

49、ed terms . 12 4. Measurement and analysis techniques 12 4.1 Descriptions of techniques and procedures 12 4.2 Method of waveform measurement . 13 4.3 Description of the waveform measurement process 13 4.4 Waveform epoch determination. 14 5. Analysis algorithms for waveforms 15 5.1 Introduction and guidance . 15 5.2 Selecting state levels 15 5.3 Determination of other single transition waveform parameters. 22 5.4 Analysis of single and repetitive pulse waveforms 28 5.5 Analysis of compound waveforms 30 5.6 Analysis of impulse-like waveforms . 33 5.7 Analysis of time rela