IEEE 1799-2012 en Recommended Practice for Quality Control Testing of External Discharges on Stator Coils Bars and Windings《定子线圈、棒材和绕组外部放电的的质量控制试验用IEEE推荐实施规程》.pdf
《IEEE 1799-2012 en Recommended Practice for Quality Control Testing of External Discharges on Stator Coils Bars and Windings《定子线圈、棒材和绕组外部放电的的质量控制试验用IEEE推荐实施规程》.pdf》由会员分享,可在线阅读,更多相关《IEEE 1799-2012 en Recommended Practice for Quality Control Testing of External Discharges on Stator Coils Bars and Windings《定子线圈、棒材和绕组外部放电的的质量控制试验用IEEE推荐实施规程》.pdf(48页珍藏版)》请在麦多课文档分享上搜索。
1、 IEEE Recommended Practice for Quality Control Testing of External Discharges on Stator Coils, Bars, and Windings Sponsored by the Electric Machinery Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 30 November 2012 IEEE Power and Energy Society IEEE Std 1799-2012IEEE Std 1799-2012 IEEE Reco
2、mmended Practice for Quality Control Testing of External Discharges on Stator Coils, Bars, and Windings Sponsor Electric Machinery Committee of the IEEE Power and Energy Society Approved 19 October 2012 IEEE-SA Standards Board Abstract: The procedure for quality control testing of external discharge
3、s on stator coils, bars and windings of large air-cooled ac electric machines is described in this recommended practice. Keywords: ac, corona-imaging instrument, discharge inception voltage, electrical insulation, external discharges, IEEE 1799, stator winding, ultraviolet radiation The Institute of
4、 Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2012 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 30 November 2012. Printed in the United States of America. IEEE is a registered trademark in the U.S. P
5、atent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2012 IEEE. All rights reserved. ivNotice to users Laws and regulations Users of IEEE Standards documents should cons
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7、, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These inclu
8、de both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyr
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11、, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, i
12、f any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of su
13、bject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assuran
14、ce, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable te
15、rms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Copyright 2012 IEEE. All rights reserved. vEssential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying E
16、ssential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements ar
17、e reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyri
18、ght 2012 IEEE. All rights reserved. viParticipants At the time this IEEE recommended practice was completed, the P1799 Working Group had the following membership: Remi Tremblay, Chair Claude Hudon, Secretary David Agnew Kevin Alewine Raymond Bartnikas Kevin Backer Stefano Bomben Andy Brown Donald Ca
19、mpbell William Chen Doug Conley Ian Culbert Jeffrey Fenwick Shawn Filliben Nancy Frost Paul Gaberson Michel Gagn Bal Gupta Gary Heuston Richard Huber Marcelo Jacob Aleksandra Jeremic Aleksandr Khazanoy Amir Khosravi Thomas Klamt Inna Kremza Laurent Lamarre Gerhard Lemesch Rimma Malamud William McDer
20、mid David McKinnon Charles Millet Glenn Mottershead Beant Nindra Sophie Noel Ramtin Omranipour Howard Penrose Helene Provencher Emad Sharifi John Schmidt Jeffrey Sheaffer Reza Soltani Gregory Stone Chuck Wilson Hugh Zhu The following members of the individual balloting committee voted on this recomm
21、ended practice. Balloters may have voted for approval, disapproval, or abstention. Michael Adams David Agnew Martin Baur Thomas Bishop Stefano Bomben Steven Brockschink Chris Brooks Donald Campbell Weijen Chen Ian Culbert Matthew Davis Ray Davis Gary Donner Gary Engmann Jeffrey Fenwick Jorge Fernand
22、ez Daher Sudath Fernando Rostyslaw Fostiak Paul Gaberson Michel Gagn Randall Groves Bal Gupta Werner Hoelzl Claude Hudon Innocent Kamwa Jim Kulchisky Chung-Yiu Lam Benjamin Lanz William Lockley Greg Luri Rimma Malamud William McBride William McCown William McDermid David McKinnon Don McLaren James M
23、ichalec G. Harold Miller Charles Millet Jerry Murphy Arthur Neubauer Michael S. Newman William Newman Sophie Noel Lorraine Padden Christopher Petrola Alvaro Portillo Iulian Profir Bartien Sayogo John Schmidt Jeffrey Sheaffer Gil Shultz Reza Soltani Gary Stoedter Gregory Stone James Timperley Remi Tr
24、emblay John Vergis Kenneth White Hugh Zhu Copyright 2012 IEEE. All rights reserved. viiWhen the IEEE-SA Standards Board approved this recommended practice on 19 October 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Konstantinos Kar
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