IEEE 1445-1998 en Standard for Digital Test Interchange Format (DTIF)《数字试验交换格式(DTIF)标准》.pdf

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1、The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1999 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 10 March 1999. Printed in the United States of America.Print: ISBN 0-7381-1553-3 SH

2、94715PDF: ISBN 0-7381-1554-1 SS94715No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 1445-1998(R2009)IEEE Standard for Digital Test Interchange Format (DTIF)SponsorIEEE Standards

3、Coordinating Committee 20 onTest and Diagnosis for Electronic SystemsReaffirmed 9 December 2009Approved 8 December 1998IEEE-SA Standards BoardReaffirmed 8 July 2004Approved 16 November 1999American National Standards InstituteAbstract: The information content and the data formats for the interchange

4、 of digital test programdata between digital automated test program generators (DATPGs) and automatic test equipment(ATE) for board-level printed circuit assemblies are defined. This information can be broadlygrouped into data that defines the following: UUT Model, Stimulus and Response, Fault Dicti

5、onary,and Probe.Keywords: automatic test equipment (ATE), digital automated test program generator (DATPG), digital test interchange format (DTIF), Fault Dictionary dataAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on June 16,2010 at 16:57:11 UTC from IEEE Xplore. Restriction

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22、gal validity orscope of those patents that are brought to its attention.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on June 16,2010 at 16:57:11 UTC from IEEE Xplore. Restrictions apply. Copyright 1999 IEEE. All rights reserved.iiiIntroductionThis introduction is not part of

23、 IEEE Std 1445-1998, IEEE Standard for Digital Test Interchange Format (DTIF).A digital automated test program generator (DATPG) produces test pattern and diagnostic data that can beused for testing printed circuit assemblies on automatic test equipment (ATE). The use of several DATPGs,all with indi

24、vidual output formats, created a need for many unique post-processors to be developed andmaintained for the life of the ATE. These post-processors supported the link from specic DATPGs tospecic testers. The proliferation of unique formats and post-processors created logistical support problemsand th

25、erefore identied a need for standardization. A DATPG and ATE independent output data format isrequired to limit the number of post-processors (one for each ATE) requiring life cycle support. The digitaltest interchange format (DTIF) was chosen because of its wide use and because it was becoming know

26、n inindustry as the de facto standard.This document provides the basis to standardize digital test information for use on ATE. The digital testinformation consists of the unit under test (UUT) Model information, Stimulus and Response data, FaultDictionary data, and Probe data.DTIF is unique from oth

27、er standards such as IEEE P1450 (Draft 0.95, dated July 1998),1Draft Standard TestInterface Language (STIL) for Digital Test Vector Data, and IEEE Std 1029.1-1991, IEEE Standard forWaveform and Vector Exchange Specication (WAVES). STIL is being developed to standardize the outputinterface of existin

28、g computer-aided engineering (CAE) tools with the input interface of ATE for integratedcircuit (IC) testing only. WAVES is a hardware descriptive language used for dening stimulus and response,and their associated timing for IC/board-level design. Neither STIL nor WAVES provides for board-levelfault

29、 diagnostics.A future revision of this standard will consider the use of the information model.ParticipantsThe ATPG Subcommittee consisted of the following members who provided signicant input toward thedevelopment of this standard:Mukund U. Modi,ATPG US Co-chairJose De La Cruz,Working Group ChairHa

30、rold E. Davis,Secretary 1IEEE P1450 is an IEEE authorized standards project that was not approved by the IEEE-SA Standards Board at the time this publica-tion went to press. For information about obtaining the draft, contact the IEEE.Guy AdamJean-Yves BarbierAnn F. BautistaAldo BernalMichael BlairJo

31、anne K. BuckleyAntonius BunsenKenneth M. ButlerLarry D. CarpenterAlexander CherfasRichard ChurcherTim CogginsRonald CoxDavid DalbackaDanny C. DavisBernd DinklageBernard DugasMichael T. EllisWilliam Brit FrankArnold M. GreenspanJoel GuerraArthur HannGary L. HardenburgRobert G. HayesRaymond L. Heather

32、Ashley M. B. HulmePatrick JohnsonAl KaraliusLarry V. KirklandRobert MadisonGregory A. MastonMark McCooeyHarry McGuckinWilliam P. NeblettJames NicholsonHans ObermeierLeslie A. OrlidgeGaspare PantanoEdward G. PerkinsJean PouillyNarayanan RamachandranWilliam C. RodriguezDavid RoggendorffDavid E. Rolinc

33、eEric SacherHoward SavageJohn W. SheppardWilliam R. Simpson*Butch SneadeJoseph J. StancoWilliam John TaylorJanette TuttleChristine M. West*William A. WhitakerWilliam W. YoungJehuda Ziegler* Voting IEEE Standards Board Liaison* Contributing Non-Voting MemberAuthorized licensed use limited to: IHS Ste

34、phanie Dejesus. Downloaded on June 16,2010 at 16:57:11 UTC from IEEE Xplore. Restrictions apply. ivCopyright 1999 IEEE. All rights reserved.The following individuals are non-voting IEEE-SA Standards Board Liaisons:The following members of the balloting committee voted on this standard:When the IEEE-

35、SA Standards Board approved this standard on 8 December 1998, it had the followingmembership:Richard J. Holleman,ChairDonald N. Heirman,Vice ChairJudith Gorman,Secretary*Member EmeritusValerie E. ZelentyIEEE Standards Project EditorWilliam Brenner Jim IsaakRobert C. RassaOscar SeppGuy AdamJean-Yves

36、BarbierAnne F. BautistaAldo BernalJoanne K. BuckleyAntonius BunsenKenneth M. ButlerLarry D. CarpenterAlexander CherfasTim CogginsRonald CoxDavid DalbackaDanny C. DavisHarold E. DavisJose De La CruzBernd DinklageBernard DugasWilliam Brit FrankArnold M. GreenspanArthur HannRobert G. HayesAshley M. B.

37、HulmeAl KaraliusLarry V. KirklandGregory A. MastonMukund U. ModiWilliam P. NeblettJames NicholsonHans ObermeierLeslie A. OrlidgeGaspare PantanoEdward G. PerkinsJean PouillyNarayanan RamachandranWilliam C. RodriguezDavid E. RolinceEric SacherHoward SavageJohn W. SheppardWilliam R. SimpsonButch Sneade

38、Joseph J. StancoWilliam John TaylorJanette TuttleWilliam A. WhitakerWilliam W. YoungJehuda ZieglerSatish K. AggarwalClyde R. CampJames T. CarloGary R. EngmannHarold E. EpsteinJay Forster*Thomas F. GarrityRuben D. GarzonJames H. GurneyJim D. IsaakLowell G. JohnsonRobert KennellyE. G. Al KienerJoseph

39、L. Koepnger*Stephen R. LambertJim LogothetisDonald C. LoughryL. Bruce McClungLouis-Franois PauRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonHans E. WeinrichDonald W. ZipseAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on June 16,2010 at 16:57:11 UTC from IEE

40、E Xplore. Restrictions apply. Copyright 1999 IEEE. All rights reserved.vContents1. Overview 11.1 Scope 11.2 Purpose. 11.3 Application. 12. References 23. Denitions and acronyms 23.1 Denitions 23.2 Acronyms. 44. Data organization overview of the DTIF standard environment 44.1 UUT Model Group. 54.2 St

41、imulus and Response Group. 54.3 Fault Dictionary Group 54.4 Probe Group. 55. File specications. 65.1 HEADER le . 75.2 STIMULUS le . 95.3 PO_RESPONSE le 105.4 PI_NAMES le 115.5 PO_NAMES le 125.6 MAIN_MODEL le. 135.7 COMPONENT_TYPE le. 145.8 USER_NODE le 155.9 INPUT_PIN_NAMES le . 165.10 OUTPUT_PIN_NA

42、MES le . 175.11 NEAR_FROMS_POINTERS le 185.12 NEAR_FROMS le . 195.13 EVENT le 205.14 SETTLED_STATE_ONLY le 225.15 SETTLED_STATE_b) Stimulus and Response;c) Fault Dictionary;d) Probe.1.2 PurposeThe purpose of this standard is to provide a standard output format for test data generated by a DATPG. ADA

43、TPG produces test patterns and fault diagnostic data for ATE. This data is used in applications such asboard-level assemblies where diagnostic data interchange is important.1.3 ApplicationThis standard is primarily intended for use by digital simulator developers/maintainers and TPS developers/maint

44、ainers.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on June 16,2010 at 16:57:11 UTC from IEEE Xplore. Restrictions apply. IEEEStd 1445-1998 IEEE STANDARD FOR DIGITAL TEST2Copyright 1999 IEEE. All rights reserved.2. ReferencesThis standard shall be used in conjunction with th

45、e following standards. When the following standards aresuperseded by an approved revision, the revision shall apply.ANSI X3.4-1986 (Reaff 1997), Information SystemsCoded Character Sets7-Bit American NationalStandard Code for Information Interchange (7-Bit ASCII).1IEEE Std 100-1996, IEEE Standard Dic

46、tionary of Electrical and Electronics Terms.23. Denitions and acronyms3.1 DenitionsThe following denitions are for use with this standard. For other uses and for denitions not containedherein, see IEEE Std 100-1996. Unless otherwise indicated, the ATPG subcommittee formulated all termsdened in this

47、subclause.3.1.1 burst:A set of stimulus patterns and related unit under test (UUT) responses that are set up, applied,and read as a group. A test program may employ more than one burst to provide the stimuli and responsesnecessary to test the UUT.3.1.2 channel:The tester electronics associated with

48、a digital input/output (I/O) pin that either drives orsenses a particular node on the unit under test (UUT).3.1.3 circuit simulator:A software program that predicts a circuits response to a given stimulus.3.1.4 digital automatic test program generator (DATPG):A program, often based on simulation, th

49、at aidsin the development of test patterns and diagnostic information from the model of a unit under test (UUT).3.1.5 dynamic patterns: A set of controlled, time-variant patterns within a time interval.3.1.6 edge:A logic state transition that is considered instantaneous for a given pattern in the simulation pro-cess.3.1.7 end-to-end test: A test sequence to establish pass (functioning properly) or fail (not functioning prop-erly) conditions. Syn:go/nogo test.3.1.8 fault set:A group of one or more faults with the same fault signature.3.1.9 faul