ANSI IEEE C37 09B-2010 Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendment 2 To Change the Description of Transie.pdf

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1、 IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization with IEC 62271-100 Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 13 Ma

2、y 2011 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2011 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C37.09b-2010,

3、IEEE Standard for Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization with IEC 62271-100. This standard has been revised to change text, tables and figures concerning the TRV d

4、escriptions to be consistent with IEEE Std C37.04b-2008 (Amendment to IEEE Std C37.04-1999) Entitled “IEEE Standard for Rating Structure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis” Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization w

5、ith IEC 62271-100. The major changes implemented in this revision of the standard are listed as follows: The TRV capability of circuit breakers according to this amendment to IEEE Std C37.09-1999 is described by 2 or 4 parameter envelopes in place of 1-cosine and exponential-cosine envelopes. Everyw

6、here the words “1-cosine” appear, they are replaced by”2-parameter.” Everywhere the words “exponential-cosine” appear, they are replaced by”4-parameter.” Figure 6 is redrawn to replace the exponential-cosine wave forms with 4-parameter wave forms. Figure 8 and Figure 9 have a label changed from “exp

7、onential-cosine” to ”4-parameter.” Test Duties 1, 2, 3, 4 and 5 are changed to T10, T30, T60, T100s and T100a respectively. Test Duties 4a and 4b are changed to T100s a and T100s b. Test Duties 6 and 7 are changed to T100s 1Ph and T100a 1Ph. Test Duties 8 and 9 are L75 and L90 (Short Line Faults at

8、75% and 90% respectively). Test Duty 10 is changed to STC (Short Time Current). Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory req

9、uirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so

10、. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods.

11、By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. v Copyright 2011 IEEE. All rights reserved. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be

12、 superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata th

13、en in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the addr

14、ess listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/r

15、eading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implement

16、ation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for whi

17、ch a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminat

18、ory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2011 IEEE. All rights re

19、served. Participants At the time this IEEE standard was completed, the TRV Work Group had the following membership: R. Kirkland Smith, Chair Robert J. Behl William J. Bergman Stan Billings Ivano Bonfanti Anne Bosma John H. Brunke Frank Chapman Chih C. Chow Pierre Denommee Patrick Dilillo Randall Dot

20、son Denis Dufournet Kenneth S. Edwards Leslie T. Falkingham Thomas E. Field Marcel Fortin Detlef Fredrich Ruben D. Garzon Charles R. Hampe, Jr. Helmut Heiermeier Richard Jackson Paul P. Leufkens R. William Long Antonio Mannarino Neil McCord Georges Montillet Yasin I. Musa Hugh Ross John Ross Roger A

21、. Sarkinen Rod Sauls H. Mel Smith David Stone Charles L. Wagner Terry Williams Richard A. York Xi ZhuThe following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Roy Alexander Mauricio Aristizabal Adam Bagby Mu

22、nnu Bajpai Robert Barnett W. J. Bergman Stan Billings Wallace Binder Thomas Blair Frank Blalock William Bloethe Anne Bosma Steven Brockschink Steven Brown Gustavo Brunello John H. Brunke Ted Burse Eldridge Byron Yunxiang Chen Chih C. Chow Tommy Cooper John Crouse Stephen Dare J. Disciullo Randall Do

23、tson Dana Dufield Denis Dufournet Douglas Edwards Kenneth S. Edwards Gary Engmann C. Erven Leslie T. Falkingham Thomas E. Field Marcel Fortin George Gela Kenneth Gettman Randall Groves Helmut Heiermeier Gary Heuston Scott Hietpas David Horvath Dennis Horwitz James Houston Richard Jackson Anders John

24、son Yuri Khersonsky Joseph L. Koepfinger Jim Kulchisky Saumen Kundu Carl Kurinko Chung-Yiu Lam Stephen Lambert Gerald Lee Boyd Leuenberger Jason Jy-Shung Lin Hua Liu Albert Livshitz R. William Long Thomas Lundquist Greg Luri Keith Malmedal Frank Mayle Nigel Mcquin Peter Meyer Gary Michel Georges Mon

25、tillet Anne Morgan Charles Morse Jerry Murphy Yasin I. Musa Jeffrey Nelson Michael S. Newman Joe Nims T Olsen Miklos Orosz Donald Parker R Parry David Peelo Paulette Payne Powell Iulian Profir Ryland Revelle Michael Roberts Charles Rogers Steven Sano Bartien Sayogo Thomas Schossig Devki Sharma Hyeon

26、g Sim H. Mel Smith James Smith R Kirkland Smith David Stone James Swank S. Telander Malcolm Thaden Norbert Trapp Michael Wactor Charles L. Wagner Keith Wallace Joe Watson James Wilson Larry Yonce Richard A. York Janusz Zawadzki Xi Zhu Ahmed Zobaavii Copyright 2011 IEEE. All rights reserved. When the

27、 IEEE-SA Standards Board approved this standard on 9 December 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Yo

28、ung Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Agga

29、rwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Matthew Ceglia IEEE Standards Program Manager, Document Development Michelle D. Turner IEEE Standards Program Manager, Technical Program Development viii Copyright 2011 IEEE. All rights reserved. Conte

30、nts 2. Normative references 2 4. Design tests. 2 4.7 TRV test. 2 4.8 Short-circuit current interrupting tests. 3 4.12 Out-of-phase switching current tests . 8 1 Copyright 2011 IEEE. All rights reserved. IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current

31、Basis Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization with IEC 62271-100 IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriate sa

32、fety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Impor

33、tant Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. NOTE The editing instructions contained in this amendment define how to merge the material contained therein into

34、the existing base standard and its amendments and corrigendum to form the comprehensive standard. The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and replace. Change is used to make corrections in existing text or tables. The editing ins

35、truction specifies the location of the change and describes what is being changed by using strikethrough (to remove old material) and underscore (to add new material). Delete removes existing material. Insert adds new material without disturbing the existing material. Insertions may require renumber

36、ing. If so, renumbering instructions are given in the editing instruction. Replace is used to make changes in figures or equations by removing the existing figure or equation and replacing it with a new one. Editing instructions, change markings, and this NOTE will not be carried over into future ed

37、itions because the changes will be incorporated into the base standard. IEEE Std C37.09b-2010 IEEE Standard for Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization with IEC 622

38、71-100 2 Copyright 2011 IEEE. All rights reserved. 2. Normative references Change Clause 2 title as shown above. Replace the introductory sentence in Clause 2 with the following: The following referenced documents are indispensable for the application of this document (i.e., they must be understood

39、and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. Change the followi

40、ng references as shown below: IEEE Std C37.011-1994 2005, IEEE Application Guide for Transient Recovery Voltage for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis. Insert the following reference alphabetically as it should appear in Clause 2: IEC 62271-1 (Ed. 1.0)-2007, High-V

41、oltage Switchgear and Controlgear Part 1: Common Specifications. IEC 62271-100 (Ed. 2.0)-2008, High-Voltage Switchgear and Controlgear Part 100: Alternating-Current Circuit-Breakers. IEEE Std C37.04b-2008, IEEE Standard for Rating Structure for AC High-Voltage Circuit Breakers Rated on a Symmetrical

42、 Current Basis Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization with IEC 62271-100. IEEE Std C37.06-2009, IEEE Standard for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Preferred Ratings and Related Required Capabilities for Voltages Abo

43、ve 1000 V. Delete the following references as shown below: IEC 60056-1987, High Voltage Alternating Current Circuit Breakers. IEC 60694-1996, Common Specifications for High-Voltage Switchgear and Controlgear Standards. 4. Design tests 4.7 TRV test Change sentence as shown below: The ability to withs

44、tand rated TRVs, as specified in ANSI C37.06-1997 IEEE Std C37.06-2009, for rated symmetrical current, is demonstrated during the performance of short-circuit current interrupting tests. IEEE Std C37.09b-2010 IEEE Standard for Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrica

45、l Current Basis Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization with IEC 62271-100 3 Copyright 2011 IEEE. All rights reserved. 4.8 Short-circuit current interrupting tests 4.8.1.5 Recovery voltage Change item b) as shown below: TRV. The inherent TRV of the test

46、 circuit shall meet or exceed the rated envelopes as defined in IEEE Std C37.04-1999 IEEE Std C37.04b-2008. The rated envelopes are required for rated symmetrical short circuit currents. For short circuit currents other than rated, the envelope shall be adjusted to establish the capabilities as stat

47、ed in ANSI C37.06-1997 and ANSI C37.06.1-1997 IEEE Std C37.04b-2008. Change last sentence of the last paragraph as shown below: The circuit breaker shall be considered to have passed the test if the actual measured TRV meets or exceeds the modified inherent TRV (see IEC 60056-1987, Annex F IEEE Std

48、C37.04b-2008, Annex A). Replace Figure 6 in 4.8.1.5 as shown below: Figure 6 A test circuit designed to simulate the effect of circuit breaker modifying impedance IEEE Std C37.09b-2010 IEEE Standard for Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendmen

49、t 2: To Change the Description of Transient Recovery Voltage for Harmonization with IEC 62271-100 4 Copyright 2011 IEEE. All rights reserved. 4.8.1.6 Short-line fault test conditions Change fourth paragraph in this subclause as shown below: The peak value E2ucfor the source side component of the TRV is equal to where Kaf 0.816 Urwhere Kaf= Amplitude factor = 1.4 for circuit breakers above 100 kV or 1.54 for class S2 circuit breakers below 100 kV. This amplitude is obtained for a grounded fault at the circuit breaker terminals only.