IEC 61786-1998 Measurement of low-frequency magnetic and electric fields with regard to exposure of human beings - Special requirements for instruments and guid.pdf

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1、NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD61786Premire ditionFirst edition1998-08Mesure de champs magntiques et lectriques basse frquence dans leur rapport lexpositionhumaine Prescriptions spciales applicablesaux instruments et recommandationspour les procdures de mesureMeasurement of low-freque

2、ncy magneticand electric fields with regard to exposureof human beings Special requirements forinstruments and guidance for measurementsNumro de rfrenceReference numberCEI/IEC 61786:1998Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reprodu

3、ction or networking permitted without license from IHS-,-Numros des publicationsDepuis le 1er janvier 1997, les publications de la CEIsont numrotes partir de 60000.Publications consolidesLes versions consolides de certaines publications dela CEI incorporant les amendements sont disponibles.Par exemp

4、le, les numros ddition 1.0, 1.1 et 1.2indiquent respectivement la publication de base, lapublication de base incorporant lamendement 1, et lapublication de base incorporant les amendements 1et 2.Validit de la prsente publicationLe contenu technique des publications de la CEI estconstamment revu par

5、la CEI afin quil reflte ltatactuel de la technique.Des renseignements relatifs la date dereconfirmation de la publication sont disponibles dansle Catalogue de la CEI.Les renseignements relatifs des questions ltude etdes travaux en cours entrepris par le comit techniquequi a tabli cette publication,

6、ainsi que la liste despublications tablies, se trouvent dans les documents ci-dessous: Site web de la CEI* Catalogue des publications de la CEIPubli annuellement et mis jour rgulirement(Catalogue en ligne)* Bulletin de la CEIDisponible la fois au site web de la CEI* etcomme priodique imprimTerminolo

7、gie, symboles graphiqueset littrauxEn ce qui concerne la terminologie gnrale, le lecteurse reportera la CEI 60050: Vocabulaire Electro-technique International (VEI).Pour les symboles graphiques, les symboles littrauxet les signes dusage gnral approuvs par la CEI, lelecteur consultera la CEI 60027: S

8、ymboles littraux utiliser en lectrotechnique, la CEI 60417: Symbolesgraphiques utilisables sur le matriel. Index, relev etcompilation des feuilles individuelles, et la CEI 60617:Symboles graphiques pour schmas.* Voir adresse site web sur la page de titre.NumberingAs from 1 January 1997 all IEC publi

9、cations areissued with a designation in the 60000 series.Consolidated publicationsConsolidated versions of some IEC publicationsincluding amendments are available. For example,edition numbers 1.0, 1.1 and 1.2 refer, respectively, tothe base publication, the base publicationincorporating amendment 1

10、and the base publicationincorporating amendments 1 and 2.Validity of this publicationThe technical content of IEC publications is kept underconstant review by the IEC, thus ensuring that thecontent reflects current technology.Information relating to the date of the reconfirmation ofthe publication i

11、s available in the IEC catalogue.Information on the subjects under consideration andwork in progress undertaken by the technicalcommittee which has prepared this publication, as wellas the list of publications issued, is to be found at thefollowing IEC sources: IEC web site* Catalogue of IEC publica

12、tionsPublished yearly with regular updates(On-line catalogue)* IEC BulletinAvailable both at the IEC web site* and as aprinted periodicalTerminology, graphical and lettersymbolsFor general terminology, readers are referred toIEC 60050: International Electrotechnical Vocabulary(IEV). For graphical sy

13、mbols, and letter symbols and signsapproved by the IEC for general use, readers arereferred to publications IEC 60027: Letter symbols tobe used in electrical technology, IEC 60417: Graphicalsymbols for use on equipment. Index, survey andcompilation of the single sheets and IEC 60617:Graphical symbol

14、s for diagrams.* See web site address on title page.Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD61786Premire ditionFirst editio

15、n1998-08Mesure de champs magntiques et lectriques basse frquence dans leur rapport lexpositionhumaine Prescriptions spciales applicablesaux instruments et recommandationspour les procdures de mesureMeasurement of low-frequency magneticand electric fields with regard to exposureof human beings Specia

16、l requirements forinstruments and guidance for measurementsCommission Electrotechnique InternationaleInternational Electrotechnical CommissionPour prix, voir catalogue en vigueurFor price, see current catalogue IEC 1998 Droits de reproduction rservs Copyright - all rights reservedAucune partie de ce

17、tte publication ne peut tre reproduite niutilise sous quelque forme que ce soit et par aucunprocd, lectronique ou mcanique, y compris la photo-copie et les microfilms, sans laccord crit de lditeur.No part of this publication may be reproduced or utilized inany form or by any means, electronic or mec

18、hanical,including photocopying and microfilm, without permission inwriting from the publisher.International Electrotechnical Commission 3, rue de Varemb Geneva, SwitzerlandTelefax: +41 22 919 0300 e-mail: inmailiec.ch IEC web site http: /www.iec.chCODE PRIXPRICE CODEXCCopyright International Electro

19、technical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,- 2 61786 CEI:1998SOMMAIREPagesAVANT-PROPOS 4INTRODUCTION . 6Articles1 Domaine dapplication. 82 Rfrences normatives . 83 Dfinitions 104 Symboles 205 Mesure des c

20、hamps magntiques alternatifs . 225.1 Spcifications relatives aux instruments . 225.2 Etalonnage 305.3 Incertitude de mesure 385.4 Enregistrement et consignation des rsultats de mesure 405.5 Mthode de mesure . 426 Mesure des champs lectriques alternatifs 446.1 Spcifications relatives aux instruments

21、. 446.2 Etalonnage 486.3 Incertitude de mesure 546.4 Enregistrement et consignation des rsultats de mesure 546.5 Mthode de mesure . 56AnnexesA (normative) Mthodes dtalonnage. 60B (normative) Sources dincertitude de mesure. 82C (informative) Caractristiques gnrales des champs lectriqueset magntiques

22、104D (informative) Capteurs dinduction magntique (capteurs de champmagntique) Recommandations pour les mesures . 112E (informative) Capteurs de champ lectrique Recommandations pour les mesures 142F (informative) Instruments de mesure de champs magntiques statiques . 164G (informative) Units 166H (in

23、formative) Bibliographie 168Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-61786 IEC:1998 3 CONTENTSPageFOREWORD . 5INTRODUCTION . 7Clause1 Scope. 92 Normative references 93 De

24、finitions 114 Symbols . 215 Measurement of alternating magnetic fields 235.1 Instrumentation specifications 235.2 Calibration . 315.3 Measurement uncertainty. 395.4 Recording and reporting measurement results 415.5 Measurement procedure 436 Measurement of alternating electric fields . 456.1 Instrume

25、ntation specifications 456.2 Calibration . 496.3 Measurement uncertainty. 556.4 Recording and reporting measurement results 556.5 Measurement procedure 57AnnexesA (normative) Calibration methods 61B (normative) Sources of measurement uncertainty 83C (informative) General characteristics of quasi-sta

26、tic magneticand electric fields . 105D (informative) Magnetic flux density meters (magnetic field meters) Guidance for measurements. 113E (informative) Electric field strength meters (electric field meters) Guidance for measurements. 143F (informative) Static magnetic field-measuring instrumentation

27、 . 165G (informative) Units 167H (informative) Bibliography . 169Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,- 4 61786 CEI:1998COMMISSION LECTROTECHNIQUE INTERNATIONALE_MESUR

28、E DE CHAMPS MAGNTIQUES ET LECTRIQUES BASSE FRQUENCE DANS LEUR RAPPORT LEXPOSITION HUMAINE PRESCRIPTIONS SPCIALES APPLICABLES AUX INSTRUMENTSET RECOMMANDATIONS POUR LES PROCDURES DE MESUREAVANT-PROPOS1) La CEI (Commission Electrotechnique Internationale) est une organisation mondiale de normalisation

29、 composede lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet defavoriser la coopration internationale pour toutes les questions de normalisation dans les domaines dellectricit et de llectronique. A cet effet, la CEI, entre autres activits, publie des N

30、ormes internationales.Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par lesujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, enliaison avec la CEI, participent galement aux travaux. La CEI collabo

31、re troitement avec lOrganisationInternationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations.2) Les dcisions ou accords officiels de la CEI concernant les questions techniques reprsentent, dans la mesuredu possible un accord international sur les sujets t

32、udis, tant donn que les Comits nationaux intressssont reprsents dans chaque comit dtudes.3) Les documents produits se prsentent sous la forme de recommandations internationales. Ils sont publiscomme normes, rapports techniques ou guides et agrs comme tels par les Comits nationaux.4) Dans le but denc

33、ourager lunification internationale, les Comits nationaux de la CEI sengagent appliquer defaon transparente, dans toute la mesure possible, les Normes internationales de la CEI dans leurs normesnationales et rgionales. Toute divergence entre la norme de la CEI et la norme nationale ou rgionalecorres

34、pondante doit tre indique en termes clairs dans cette dernire.5) La CEI na fix aucune procdure concernant le marquage comme indication dapprobation et sa responsabilitnest pas engage quand un matriel est dclar conforme lune de ses normes.6) Lattention est attire sur le fait que certains des lments d

35、e la prsente Norme internationale peuvent fairelobjet de droits de proprit intellectuelle ou de droits analogues. La CEI ne saurait tre tenue pourresponsable de ne pas avoir identifi de tels droits de proprit et de ne pas avoir signal leur existence.La Norme internationale CEI 61786 a t tablie par l

36、e comit dtudes 85 de la CEI:Appareillage de mesure des grandeurs lectromagntiques.Le texte de cette norme est issu des documents suivants:FDIS Rapport de vote85/191/FDIS 85/193/RVDLe rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayantabouti lapprobation de cett

37、e norme.Les annexes A et B font partie intgrante de cette norme.Les annexes C, D, E, F, G et H sont donnes uniquement titre dinformation.Les termes en caractres gras sont dfinis larticle 3.Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo repr

38、oduction or networking permitted without license from IHS-,-61786 IEC:1998 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION_MEASUREMENT OF LOW-FREQUENCY MAGNETIC AND ELECTRIC FIELDSWITH REGARD TO EXPOSURE OF HUMAN BEINGS SPECIAL REQUIREMENTS FOR INSTRUMENTS ANDGUIDANCE FOR MEASUREMENTSFOREWORD1) The IEC

39、(International Electrotechnical Commission) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and el

40、ectronic fields. Tothis end and in addition to other activities, the IEC publishes International Standards. Their preparation isentrusted to technical committees; any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governmental and

41、non-governmental organizations liaisingwith the IEC also participate in this preparation. The IEC collaborates closely with the International Organizationfor Standardization (ISO) in accordance with conditions determined by agreement between the twoorganizations.2) The formal decisions or agreements

42、 of the IEC on technical matters express, as nearly as possible, aninternational consensus of opinion on the relevant subjects since each technical committee has representationfrom all interested National Committees.3) The documents produced have the form of recommendations for international use and

43、 are published in the formof standards, technical reports or guides and they are accepted by the National Committees in that sense.4) In order to promote international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently to the maximum extent possible in t

44、heir national and regional standards. Anydivergence between the IEC Standard and the corresponding national or regional standard shall be clearlyindicated in the latter.5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for anyequipment declared to b

45、e in conformity with one of its standards.6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subjectof patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.International Standard IEC 61786 has bee

46、n prepared by IEC technical committee 85:Measuring equipment for electromagnetic quantities.The text of this standard is based on the following documents:FDIS Report on voting85/191/FDIS 85/193/RVDFull information on the voting for the approval of this standard can be found in the report onvoting in

47、dicated in the above table.Annexes A and B form an integral part of this standard.Annexes C, D, E, F, G and H are for information only.Words in bold in the text are defined in clause 3.Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduc

48、tion or networking permitted without license from IHS-,- 6 61786 CEI:1998INTRODUCTIONLintrt croissant pour caractriser lexposition des tre humains aux champs magntiques etlectriques quasi statiques dans bon nombre denvironnements a conduit au dveloppement et la commercialisation dun grand nombre dinstruments de mesure de champs avec unegrande varit de spcifications. Parmi les sources de champs quasi statiqu