IEC 61340-2-3-2016 Electrostatics - Part 2-3 Methods of test for determining the resistance and resistivity of solid materials used to avoid electrostatic charg.pdf
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1、 IEC 61340-2-3 Edition 2.0 2016-06REDLINE VERSIONElectrostatics Part 2-3: Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation IEC 61340-2-3:2016-06 RLV(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyr
2、ight 2016 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member Nati
3、onal Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. IEC Central Office Tel.: +41 2
4、2 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related t
5、echnologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catalogue - webstore.iec.ch/catalogue The stand-alone application for
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8、vailable online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and French, with equivalent terms in 15 additional languages. Also known as the International
9、 Electrotechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary 65 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC TC
10、37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC 61340-2-3 Edition 2.0 2016-06REDLINE VERSIONElectrostatics Part 2-3: Methods of test
11、 for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 17.220.99; 29.020 ISBN 978-2-8322-3499-0 Registered trademark of the International Electrotechnical Commission Warning! Make sure th
12、at you obtained this publication from an authorized distributor. colour inside 2 IEC 61340-2-3:2016 RLV IEC 2016 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references . 7 3 Terms and definitions. 8 4 Conditioning and test environment . 9 5 Selection of test method. 10 6 Resistance
13、measurements of for solid conductive materials . 10 7 Resistance measurements of for solid insulating materials . 10 8 Resistance measurements of for planar electrostatic dissipative materials (used to avoid electrostatic charge accumulation) 11 8.1 Instrumentation . 11 8.1.1 General 11 8.1.2 Instru
14、mentation for laboratory evaluation 11 8.1.3 Instrumentation for acceptance testing . 11 8.1.4 Instrumentation for compliance verification (periodic testing) 11 8.2 Electrode assemblies 12 8.2.1 General 12 8.2.2 Assembly for the measurement of surface resistance . 12 8.2.3 Assembly for the measureme
15、nt of volume resistance 13 8.2.4 Assembly for the measurement of resistance to ground/groundable point and point-to-point resistance 13 8.2.5 Test support . 14 8.3 Sample preparation and handling 15 8.4 System verification fixtures for surface resistance 8.4 Test procedures 16 8.4.1 Surface resistan
16、ce measurements 16 8.4.2 Volume resistance measurements 17 8.4.3 Resistance to groundable point measurements . 17 8.4.4 Point-to-point resistance measurements . 18 8.5 System verification for volume resistance measurements 9 Conversion to resistivity values 19 9.1 Surface resistivity s. 19 9.2 Volum
17、e resistivity v19 10 Resistance measurements for non-planar materials and products with small structures 20 10.1 General considerations 20 10.2 Equipment . 20 10.2.1 Probe . 20 10.2.2 Sample support surface . 22 10.2.3 Resistance measurement apparatus . 22 10.2.4 Test leads 23 10.3 Test procedure 24
18、 11 Repeatability and reproducibility . 24 12 Test report . 25 Annex A (normative) System verification . 27 IEC 61340-2-3:2016 RLV IEC 2016 3 A.1 System verification for surface resistance measurements 27 A.1.1 Fixture and procedure for lower resistance range . 27 A.1.2 Fixture and procedure for upp
19、er resistance range and determination of electrification period . 28 A.2 System verification for volume resistance measurements 29 A.2.1 Fixture and procedure for lower resistance range . 29 A.2.2 Fixture and procedure for upper resistance range and determination of electrification period . 29 A.3 S
20、ystem verification for resistance measurements for non-planar materials and products with small structures . 29 A.3.1 Verification fixtures 29 A.3.2 Verification procedure 30 Figure 1 Example of an assembly for the measurement of surface and volume resistance . 13 Figure 2 Example of an assembly for
21、 the measurement of resistance to ground/groundable point and point-to-point resistance . 14 Figure 2 Basic connections of the electrodes for surface resistance measurements . 16 Figure 3 Basic connections of the electrodes for volume resistance measurements 17 Figure 4 Principle of resistance to gr
22、oundable point measurements 18 Figure 5 Principle of point-to-point measurements 19 Figure 6 Configuration for the conversion to surface or volume resistivity 20 Figure 8 Two-point probe configuration . 22 Figure 9 Probe to instrumentation connection . 23 Figure 10 Spring compression for measurement
23、 . 24 Figure A.1 Lower resistance range verification fixture for surface resistance measurements 27 Figure A.3 Resistance verification fixture 30 Table 1 Material for two-point probe . 21 4 IEC 61340-2-3:2016 RLV IEC 2016 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROSTATICS Part 2-3: Methods o
24、f test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC Nat
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