IEC 60444-5-1995 Measurement of quartz crystal unit parameters - Part 5 Methods for the determination of equivalent electrical parameters using automatic networ.pdf

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1、NORME CE1 INTERNATIONALE INTERNATIONAL STANDARD IEC 444-5 Premire dition First edition 1995-03 Mesure des paramtres des rsonateurs quartz - Partie 5: Mthodes pour la dtermination des paramtres lectriques quivalents utilisant des analyseurs automatiques de rseaux et correction des erreurs Measurement

2、 of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction Numro de rfrence Reference number CEI/IEC 444-5: 1995 Numros des publications Depuis le ler janvier 1997, les publications d

3、e la CE1 sont numrotes partir de 60000. Publications consolides Les versions consolides de certaines publications de la CE1 incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporan

4、t lamendement 1, et la publicatior? de base incorporant les amendements 1 et 2. Validit de la prsente publication Le contenu technique des publications de la CE1 est constamment revu par la CE1 afin quil reflte ltat actuel de ia technique. Des renseignements relatifs la date de reconfir- mation de l

5、a publication sont disponibles dans le Catalogue de la CE. Les renseignements relatifs 2i des questions ltude et des travaux en c -Urs entrepris par le comit technique qui a tabli cette publication, ainsi que la liste des publications tablies, se trouvent dans les documents ci- dessous: Cite webn de

6、 ia CEI Catalogue des publications de la CE1 Publi annuellement et mis jour rgulirement (Catalogue en ligne) Bufietin de ia CEi Disponible la fois JU . de la CEI“ et comme priodique imprim Terminologie, symboles graphiques et littraux En ce qui concerne la terminologie gnrale, le lecteur se reporter

7、a la CE1 60050: Vocabulaire flectro- technique International (VEI). Pour les symboles graphiques, les symboles littraux et les signes d cage gnrai approuvs par la CEI, le lecteur consulterg la CE1 60027: Symboles littraux a utiliser en lectrotechnique, la CE1 6041 7: Symboles graphiques utilisables

8、sur le matriel. Index, relev et compilation des feuilles individuelles, et la CE1 60617: Symboles graphiques pour schmas. * Voir adresse -site web, sur la page de titre. Numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. Consolidated publications

9、 Consolidated versions of some IEC publications including amendments are available. For example, edition numbers 1 .O, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incor- porating amendment 1 and the base publication incorporating amendments 1 and 2. Validity of thi

10、s publication The technical content of IEC publications is kepi under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to the date of the reconfirmation of the publication is available in the IEC catalogue. Information on the subjects under

11、 consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is to be found at the following IEC sources: IEC web site* Catalogue of iEC publications Published yearly with regular updates (On-line catalogue

12、) Available both at the IEC web site* and as a printed periodical iEC Bulletin Terminology, graphical and letter symbols For general terminology, readers are referred to IEC 60050: International flectrotechnical Vocabulary (IEV). For graphical symbols, and letter symbols and signs approved by the IE

13、C for general use, readers are referred to publications IEC 60027: Letter symbols to be used in electrical technology, IEC 6041 7: Graphical symbols for use on equipment. Index, survey and compilation of the single sheets and IEC 60617: Graphical symbols for diagrams. * See web site address on title

14、 page. NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 444-5 Premire dition First edition 1995-03 Mesure des paramtres des rsonateurs quartz - Partie 5: Mthodes pour la dtermination des paramtres lectriques quivalents utilisant des analyseurs automatiques de rseaux et correction des erreurs Meas

15、urement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction 0 CE1 1995 Drois de reproduction rservs - Copyright - all rights reserved Aucune partie de cette publication ne peut

16、any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the international Organization for St

17、andardization (ISO) in accordance with conditions determined by agreement between the two organizations: 2) The formal decisions or agreements of the IEC on technical matters, prepared by technical committees on which all the National Committees having a special interest therein are represented, exp

18、ress, as nearly as possible, an international consensus of opinion on the subjects dealt with. 3) They have the form of recommendations for international use published in the form of standards, technical reports or guides and they are accepted by the National Committees in that sense. 4) In order to

19、 promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regionai standard shall be clear

20、ly indicated in the latter. International Standard IEC 444-5 has been prepared by IEC technical committee 49: Piezoelectric and dielectric devices for frequency control and selection. It forms Part 5 of a series of publications dealing with the measurements of piezoelectric quartz crystal unit param

21、eters. Part I: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a n-network, is issued as IEC 444-1. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units, is issued as IEC 444-2.

22、 Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a n-nework with compensation of parallel capacitance Co, is issued as IEC 444-3. Part 4: Method for the measurement of the load resonance frequency ffi load resonance resi

23、stance, R, and the calculation of other derived values of quartz crystal units, up to 30 MHz, is issued as IEC 444-4. Part 6: Measurement of drive level dependence (DLD), is issued as IEC 444-6. The text of this standard is based on the following documents: I DIS Report on voting Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Annex A forms an integral part of this standard. Annexes B and C are for information only.