UL 498A CRD-2011 UL Standard for Safety Current Taps and Adapters - Section Paragraph Reference (New) Para 7 10 7 10 1 8 2 5 Sections 39 through 42 (Revised) Table 18 1 Subject Cur.pdf
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1、UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULUNDERWRITERS LABORATORIES INC. CERTIFICATION REQUIREMENT DECISIONThis Certification Requirement Decision is prepared and published by Underwriters Laboratories Inc.(UL). It is normative for the a
2、pplicable UL Product Certification Program(s); however, it is currently notpart of the UL Standard(s) referenced below.Product Category (CCN): EMDVStandard Number: UL 498AEdition Date: January 23, 2008Edition Number: 2Section / Paragraph Reference: (New) Para. 7.10; 7.10.1; 8.2.5; Sections 39 throug
3、h42; (Revised) Table 18.1Subject: Current Tap with an integral thermal interruption feature.DECISION:In addition to the applicable requirements contained in UL 498A, the following requirements shall beapplied to evaluate a current tap with an integral thermal interruption feature.(New) 7.10 Current
4、Tap employing an Integral Thermal Interruption Feature(New) 7.10.1 A current tap employing an integral thermal interruption feature shall be marked on the facewhere visible during installation. ATTENTION” in letters at least 3/32 inch (2.4 mm) high- This deviceemploys a non-resettable thermal interr
5、uption feature. When tripped, replacement is required, orequivalent.(New) 8.2.5 A current tap employing an integral thermal interruption feature shall not be of the re-settabledesign. The current tap shall incorporate a visual means of conveying the tripped condition to the user.Table 18.1 (Revised)
6、Summary of tests Current taps and adaptersSection Test sequences No. of devicesaDetails19 Comparative Tracking Index 5 Materials to be evaluated in accordance withException No. 1 to 10.3.1.20 Glow Wire 3 Materials to be evaluated in accordance withException No. 1 to 10.3.2.21 High-Current Arc Resist
7、ance toIgnition3 Materials to be evaluated in accordance withException No. 2 to 10.3.224 Dielectric Voltage Withstand 6 All devices.22 Mold Stress Relief Devices employing thermoplastic materials.24 Dielectric Voltage Withstand(Repeated)Devices subjected to Mold Stress Relief Test.23 Moisture Absorp
8、tion Resistance 3 Conducted on vulcanized fibre, fuseholders andinsulating backplates. Use insulating materialportion of device only.25 Accelerated Aging 6 Materials to be evaluated in accordance withthe Exception to 10.4.1.27 Security of Blades Devices rated 15A or less and 250 V or less.UL COPYRIG
9、HTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULTable 18.1 (Revised) ContinuedSection Test sequences No. of devicesaDetails26 Insulation Resistance 6 Devices molded of rubber or similar materials,or any material containing enough free carbonto render th
10、e material grey or black.27 Security of Blades 6 Devices rated 15 A or less and 250 V or lessthat are not subjected to the Accelerated AgingTest.28 Contact Security 6 Devices having 1-15P configuration bladesonly.29 Retention of Plugs 6 Devices having a 1-15R, 5-15R, 5-20R, 6-15R,or 6-20R configurat
11、ion.30 Overload31 Temperature32 Retention of Plugs (Repeated) Devices having a 1-15R, 5-15R, 5-20R, 6-15R,or 6-20R configuration.33 Resistance to Arcing Required only for devices having 1-15R, 5-15R,5-20R, 6-15R, or 6-20R configurations notemploying phenolic, urea, or melamine in theoutlet face.34 F
12、useholder Temperature 6 Devices with fuseholders only.35 Improper Insertion 12 Devices having a1-15R or 5-15R outlet faceconfiguration only.36 Grounding Contact 6 Devices that can accommodate a 3-wiregrounding attachment plug have one of the5-15R, 5-20R, 6-15R, 6-20R, 7-15R, 14-15R, or15-15R configu
13、rations only.37 Supplementary OvercurrentProtector Temperature1 Devices employing supplementary overcurrentprotectors.38 Obstruction 1 All devices with a face or obstructions otherthan shown in Figures 11.3 or 11.4.39 (New) Abnormal Slow Heat Rise, NoCurrent Flow Test followed byDielectric Voltage W
14、ithstand testing.2 Current Tap employing an integral thermalinterruption feature40 (New) Abnormal Fast Heat Rise, NoCurrent Flow Test followed byDielectric Voltage Withstand testing.2 Current Tap employing an integral thermalinterruption feature41 (New) Slow Rise With Current Flow Testfollowed by Di
15、electric VoltageWithstand testing.2 Current Tap employing an integral thermalinterruption feature42 (New) Fast Rise With Current Flow Testfollowed by Dielectric VoltageWithstand testing.2 Current Tap employing an integral thermalinterruption featureaA set of representative devices is not prohibited
16、from being used for more than one group of tests when agreeable to allconcerned.(New) 39 Abnormal Slow Heat Rise, No Current Flow Test followed by Dielectric Voltage WithstandTestSTANDARD NUMBER: UL 498A -2-UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMIS
17、SION FROM UL39.1 At the conclusion of this test a current tap that employs an integral thermal interruption feature shallinterrupt current flow within the manufacturers temperature specification for each thermal interruptionlocation as identified in paragraph 39.5. Additionally, each device shall be
18、 subjected to the DielectricVoltageWithstand test described in Section 24. The current tap is not required to be subjected to thehumidity conditioning described in Section 24.3.39.2 A sample of a current tap employing an integral thermal interruption feature shall be rigidly supportedwith the outlet
19、 slots of the current tap facing upward. An individual solid copper alloy test blade, with adetent hole, complying with the Wiring Device-Dimensional Specifications, ANSI/WD6, is to be fullyinserted into each outlet slot of the current tap. The inserted test blade is to be positioned to permit thehe
20、ating element probe to contact and to transfer heat to each outlet slot contact under test.39.3 A new sample shall be used for each individual application of the heating element to each individuallocation as identified in paragraph 39.5.39.4 The heating element probe shall be pre-heated to a tip tem
21、perature of 55C and positioned to makecontact with the inserted test blade. The heating element probe temperature shall then be increasedslowly in increments of 10C at fifteen-minute intervals. Temperatures are to be monitored every fifteenseconds along with a means to detect device trip (thermal li
22、nk activation). During application of heatingelement both temperature and time of each measurement shall be recorded. If the device does not trip atthe maximum temperature limit as specified by the manufacturer, the heating probe is to be increased 10degrees above this maximum temperature and held a
23、t the temperature for 3 minutes. If the device doesnot trip within 3 minutes at applied temperature, the test is terminated and considered noncompliant.39.5 The following heating element probe locations and thermocouple locations are to be tested andmonitored:Heating Element Probe Locations:A. Test
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