NAVY MIL-C-60555-1966 CARTRIDGE INITIATOR DELAY M113《M113型延迟引发炮筒》.pdf
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1、MIL-C-60555 (MU) SUPERSEDING FA-PD-MI-2361, Rev 1 NIL-C-bKl55S 33 99997006 0434523 O - v“ 19 August 1966 20 July 1961 I I 1. SCOPE 1.1 %is specification covers Cartridge, aitiator, Delay, M3.13$ for use 2. Al?mICcmLE P)ocmN%s 2.1 for bids extent specified herein: with propellant: actuated devices in
2、 aircrew emergency escape system. The following documents of the issue in effect on date of invitation or request for proposal, fom a part of the specification to the SPEC E%CATEONS Military MIL-8-2550 MIL-E-5292 - mnitio and Special Weapons o General Specifica- - Environmental Testing, Aeronautical
3、 and Associ- tiOR For ated Equipment, Genera1 Specification For - Sampling Procedures and Tables for bSgeCti,OR by - Quality Assurance Terns and Definitions - Sapling Procedures and Tables for Inspection by Variables for Percefit Defective - Surface Roughness Qalues Preferred for Amy Ordnance Materi
4、el - Armminition Data Card Attributes DRAWINGS Munitions Cormand D8596114 - Cartridge, Initiator, Belay, Ml13 Assembly B8799620 - Box, Packing, Ammunition for Cartridge, Initiator, $8999621 - Carton, Packing, Amwunition for Cartridge, DX,-8596114 - ot. 4.3.1.1 Submission of uroduct.- The product sha
5、ll be submitted in accord- ance with MPL-SIPD-105 or M%L-STD-4%4, as applicable. 4.3.1.2 a lot shall consist of 600 cartridges, maximum, exclusive of tese samples, and shall consist of: Size of lot,- Unless otherwise specified by the procuring agency, a. be ao Primers from not more than one lot. d.
6、Delay element from not more than OR lot. Components produced by a homogeneous process. Propellant from not more than one lot. 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-4.3.2 Examination.- One hundred percent examination shall be performed for
7、 a% critical defects. on a defect: basis in accordance with the classification of defects, using the sampling plans and criteria in tables II and 11%. For an individual defect (single characteristic) the criteria in table I% shall be used. within a major OP minor class, the criteria in table III sha
8、ll be used, nonconforming material shall be rejected. used in performing visual examination for such defects as burr and foreign matter. used as a basis of comparison for surface roughness determination, Table II Examination for major and minor defects shall be performed For total defects All Four p
9、ower (4X) magnification may be The Ordnance Standard Finish Blocks prescribed in MPL-STD-639 shall be Acc eptance Numbers Minor P Lot Size Sauplbe Size Major 1 - a00 108 % examination o Ca 301 1,300 Il0 ib ,2 1,301 - 3,200 150 2 3 We+ of Defects in Class Total mjor Defects Afhwable 2- 3 3. 4- 7 2 8
10、- 19 3 mbet of Defects in Class Total t4h=m Defects Allowable 2- 3 2 4- 7 3 8 - 3.6 4 4.3.2 e l Xassification of efacts o 4.3.2.1.1 Cartridge, Initiator, Belay, Ml3, Assembly, WJg D8596114. Defect Method of Inspection CRITICAL 1. Any part missing X-ray/Visua% L/ 2. Improper assembly X-ray/Visual &/
11、3, Mixed ammnition Visual 4. Metal defective Visual. 5. Crimp missing OF incOrKeCt Visual 6 e Marking missing, incorrect or illegible Visual MAJOR 10%. Cartridge profile failure 102, Dimeter of body, IBX 103. Dtamter of head, mix 104. 105. O-ring split, cracked or cut Length to datum diameter, max 4
12、 Gage mage Gage Gage Visual Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Defect Method of Inspect ion _. 106. Protective finish inadequate or defective Visual 109. Burr Visual 108. Foreign matter Visual MINOR 201. Total length 202. Bent 203. Brav7
13、 scratch 204. Fold, wrinkle, buckle or bulge 205. Varnish inadequate OF missing 206 Surface finish improper Gage Visual Visuab Visual Visual Visual - i/ The assembled cartridge shall be x-rayed with the bong axis of the cartridge perpendicular to the rays of the x-ray machine. properly identified, s
14、hall be forwarded to the procuring agency. fie x-ray negatives, 4,3. 2.1.2 covering a detail of Dwg D8596ll.4. CRITICAL 1. Metal defective MAJOR 101. Rockie%l hardness incorrect 102. Large diameter, max 103. Small diameter, IMX 104. Base wall thickness 105. Wall thickness 106. Length to datum diamet
15、er, max 109, Concentricity of large and small diameters MINOR 201. Total. length, max 202. Fold, wrinkle, buckle or bulge 203. Surface finish improper 204. Burr 205. Overall length 206. Radii incorrect 207. Drap7 scratch Visual Gage Gaga Gage . Gage Gage Gage Gage Gage Visual Visual. Visual Gage Gag
16、e/Visual Visual 4,3.2.1,3 covering a detail of Bwg D85961l4. CRITICA% l Weal defectcve baAJOR 101, Diameter, max 102, Thieknesa, mx 10%. Marking missing, incorrect QF illegible 201. Dent MINOR prisilab Gage Gage Visual Visual 5 Provided by IHSNot for ResaleNo reproduction or networking permitted wit
17、hout license from IHS-,-,-4.3.2.1.3 (cont) Defect 202. Varnish inadequate or missing 203. Surface finish improper 4.3.2.1.4 Carton, Packing, Dwg B8799621. CRITICAL None defined MAJOR None defined. MINOR 201. Contents loose 202. Quantity of contents incorrect 203. Separator or filler missing 204. Hea
18、t sealer incomplete, loose or distorted 205. 206. Marking missing, incorrect or illegible Cut or damaged through impregnated box 4.3.2.1,5 Box, Packing, Dwg B8799620. CRITICAL None defined. MAJOR None defined. MXNOR 201. Contents loose 202. Hardware missing, loose, broken or improperly engaged 203.
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