JEDEC JESD55-1996 Standard for Description of Low-Voltage TTL-Compatible BiCMOS Logic Devices《低电压TTL的描述标准 兼容BiCMOS逻辑设备》.pdf
《JEDEC JESD55-1996 Standard for Description of Low-Voltage TTL-Compatible BiCMOS Logic Devices《低电压TTL的描述标准 兼容BiCMOS逻辑设备》.pdf》由会员分享,可在线阅读,更多相关《JEDEC JESD55-1996 Standard for Description of Low-Voltage TTL-Compatible BiCMOS Logic Devices《低电压TTL的描述标准 兼容BiCMOS逻辑设备》.pdf(21页珍藏版)》请在麦多课文档分享上搜索。
1、EIA JESD55 b 3234600 057L7L.5 OB0 1811 EINJl3DEC STANDARD Standard for Description of Low-Voltage TTL-Compatible BiCMOS Logic Devices EIAiJESD55 MAY 1996 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT COPYRIGHT Electronic Industries AllianceLicensed by Information Handling ServicesIA JESD5
2、5 96 W 3234bOO 0573736 TI7 = NOTICE EWJEDEC Standards and Publications contain material that has been prepared, progressively reviewed, and approved through the JEDEC Council level and subsequently reviewed and approved by the EL4 General Counsel. EWJEDEC Standards and Publications are designed to s
3、erve the public interest through eliminating misunderstandings between manufacturers and purchases, facilitating interchangeability and improvement of products, and assisting the purchaser is selecting and obtaining with minimum delay the proper product for his particular need. Existence of such sta
4、ndards shall not in any respect preclude any member or nonmember of JEDEC from manufacturing or selling products not mnfonning to such standards, nor shall the existence of such standards preclude their voluntary use by those other than EM members, whether the standard is to be used either domestica
5、lly or internationally. EIAIJEDEC Standards and Publications are adopted without regard to whether their adoption may involve patents or articles, materials, or processes. By such action, EIA/JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parti
6、es adopting the EWJEDEC Standards or Publications. The information included in EWJEDEC Standards and Publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. Within the EIA/JEDEC organization there are proCsdur
7、es whereby an EWJEDEC Standard or Publication may be further processed and ultimately becomes an ANSVELA Standard. Inquiries, comments, and suggestions relative to the content of this EWJEDEC Standard or Publication should be addressed to the JEDEC Executive Secretary at EL4 Headquarters, 2500 Wilso
8、n Boulevard, Arlington, VA 2220 1. Published by OELECTRONIC INDUSTRIES ASSOCIATION 1996 Engineering Department 2500 Wilson Boulevard Arlington, VA 2220 1 “Copyright“ does not apply to JEDEC member companies as they are free to duplicate this document in accordance with the latest revision of the JED
9、EC Publication 2 1 “Manual of Organization and Procdure“. PRICE: Please refer to the current Catalog of EIA, JEDEC, and TIA STANDARDS and ENGINEERING PUBLICATIONS or call Global Engineering Documents, USA and Canada (1-800-854-7179) International (303-397-7956) Printed in U.S.A. All rights reserved
10、COPYRIGHT Electronic Industries AllianceLicensed by Information Handling ServicesEIA JESD.55 96 3234600 05LL 953 W JEDEC STANDARD No. 55 Page 1 Standard for Description of Low-Voltage lTL-Compati ble BICMOS Loglc Devices (From JEDEC Council Ballot, JCB-95-66, formulated under the cognizance of the J
11、C-40 Committee on Standardidion of Digital Logic) 1 INTERFACE STANDARD 1.1 Purpose: To provide a standard for Low-Voltage BiCMOS Logic series specifications for uniformity, multiplicity of sources, elimination of confusion, and ease of device specification and design by users, 1.2 Scope: This standa
12、rd defines dc interface and switching parameters for a high-speed, low-voltage BiCMOS digital logic family. This standard covers specifications for BiCMOS Logic series as defined in Section 2. 2 DEFINmONS BiCMOS Series Includes devices combining bipolar and silicon-gate complementary metal-oxide-sem
13、iconductor (CMOS) field effect devices in a single-chip integrated circuit. Includes devices whose input logic levels are TTL compatible, whose outputs are specified at TTL levels. Compliant with current revision of JEDEC standard 8-A. Prefixes Prefix 74“ immediately preceding family name indicates
14、the operating temperature range. 74XXX refers to the Commercial (COML) version of devices which are specified over40“C to 85C. COPYRIGHT Electronic Industries AllianceLicensed by Information Handling ServicesEIA JESD55 9h 3234b00 0571718 B9T Symbol VDD VIN VOUT TA AVAv JEDEC STANDARD No. 55 Page 2 P
15、arameter Supply voitage (Note 1 ) Input Vdtage Output voltage (Note 2) operating fm4r temperature input transition rise or fail rate (Note 3) 3 STANDARD SPECIFICATIONS 3.1 Supply Voltage, VDD 4.5 V to 4.6 V dc input voltage, VI (Note 3) . -0.5 V to 7 V dc output voltage, VO -0.5 V to 5.5 V dc input
16、clamp current, IIK (VI O) . -18 mA dc output clamp current, OK (Vo O) . -30 mA * IOL( rated) dc current into any output in the low state, IOL (Note 4) dc current into any output in the high state, IOH (Note 5) 2 lOH(rated) Storage temperature range -65C to 150C Absolute Maximum Continuous Ratings (N
17、otes 1 and 2): . Note I: Absdute maximum continuous ratings are those Values beyond which damage to the device may occur. Exposure to these conditions or conditions beyond those indicated may adversely affect device reliability. Functional operation under absolute-maximum-rated conditions is not imp
18、lied. Under transient conditions these ratings may be exceeded as defined elsewhere in this speafication. The dc inpu negative voltage rating may be exceeded if the dc input clamp current ratings are observed. Not to exceed 70 mA. Not to exceed -35 mA. Note 2: Note 3: Note 4: Note 5: 3.2 Recommended
19、 Operating Conditions: COPYRIGHT Electronic Industries AllianceLicensed by Information Handling ServicesEIA JESB5.5 %b U 3234600 057L7L 726 JEDEC STANDARD No. 55 Page 3 3.3 dc SDecifications: Symbol VIH VIL VIK “OH “OL I IH IL OZH Test CondWlons I I HigMevel input voltage 2 Low-level input voitage I
20、nput clamp voltage VDD = MIN, il = -18 mA HlgMevd cuipul voltage Low-level ouipui voltage 2.4 2 2 input current Low-level inputcurrent VDD = MAX. 1 VI = 0.5 V pons VDD = MAX, vo 5.5 v 1 m-stam output current VDD = MAX. except poits (Note i) VO = 0.5 V 110 ports 1 0.8 il 5 COPYRIGHT Electronic Indust
21、ries AllianceLicensed by Information Handling ServicesEIA JESD55 96 = 3234600 0573720 448 W Symbol Parameter Bus-hol low sustaining current Bus-hoM high sustaining current Buc-hdd low overdrive Bus-hoid high overdrive current Static supply current, one output in the high- impedance state Static supp
22、ly current, Static supply current Stak supply current per input at a IBHLO current DDZ IDDH one output high $DL outputslow *IDD specified levei JEDEC STANDARD No. 55 Page 4 74 seriea MIN MAX Test Conditions Unit VDD = 3 V, VI = 0.8 V, (Note 3) 75 ClA VDD = 3 V, VI = 2 V, (Note 4) -75 iIA VDD = 3.6 V
23、, (Note 5) 500 PA VDD = 3.6 V, (Note 6) -500 PA VDD = MAX. 25 VI = VDD 01 GND (Note7) PA VDD = MAX, 25 VI = VDD or GND (Note 7) PA (Note2) mA VDD = MAX, VI = VDD or GND 0.2 mA VI = VDD - 0.6 V. other inputs at VDD or GND. VDD = MIN to MAX COPYRIGHT Electronic Industries AllianceLicensed by Informati
24、on Handling ServicesEIA JESD55 76 H 3234600 05711723 384 Generator I JEDEC STANDARD No. 55 Page 5 = CL 4 TEST CIRCUITS AND SWITCHING WAVEFORMS Test tpLH (except open-collector outputs) Switch Open t PZH t PZL tPHZ 6V OPEN GND GND 6V GND I tPLH (open-collector outputs) I 6V I I tPHL (except open-coii
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