EN 61338-1-5-2015 en Waveguide type dielectric resonators - Part 1-5 General information and test conditions - Measurement method of conductivity at interface between conductor lay.pdf

《EN 61338-1-5-2015 en Waveguide type dielectric resonators - Part 1-5 General information and test conditions - Measurement method of conductivity at interface between conductor lay.pdf》由会员分享，可在线阅读，更多相关《EN 61338-1-5-2015 en Waveguide type dielectric resonators - Part 1-5 General information and test conditions - Measurement method of conductivity at interface between conductor lay.pdf（26页珍藏版）》请在麦多课文档分享上搜索。

1、BSI Standards PublicationWaveguide type dielectric resonatorsPart 1-5: General information and test conditions Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequencyBS EN 61338-1-5:2015National forewordThis British Standard is the UK i

2、mplementation of EN 61338-1-5:2015. It isidentical to IEC 61338-1-5:2015. It supersedes DD IEC/PAS 61338-1-5:2010which is withdrawn.The UK participation in its preparation was entrusted to TechnicalCommittee EPL/49, Piezoelectric devices for frequency control and selection.A list of organizations re

3、presented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2015.Published by BSI Standards Limited 2015ISBN 978 0 5

4、80 82905 5ICS 31.140Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 30 September 2015.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STAND

5、ARDBS EN 61338-1-5:2015EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61338-1-5 August 2015 ICS 31.140 English Version Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectr

6、ic substrate at microwave frequency (IEC 61338-1-5:2015) Rsonateurs dilectriques modes guids - Partie 1-5: Informations gnrales et conditions dessais - Mthode de mesure de la conductivit au niveau de linterface entre une couche conductrice et un substrat dilectrique fonctionnant aux hyperfrquences (

7、IEC 61338-1-5:2015) Dielektrische Resonatoren vom Wellenleitertyp - Teil 1-5: Allgemeine Informationen und Prfbedingungen - Messverfahren fr die Leitfhigkeit an der Grenzflche zwischen Leiterschicht und dielektrischem Trger im Mikrowellen-Frequenzbereich (IEC 61338-1-5:2015) This European Standard w

8、as approved by CENELEC on 2015-07-30. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning su

9、ch national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member int

10、o its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of M

11、acedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit

12、Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 61338-1-5:2015 E BS EN

13、61338-1-5:2015EN 61338-1-5:2015 2 European foreword The text of document 49/1089/CDV, future edition 1 of IEC 61338-1-5, prepared by IEC/TC 49 “Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection“ was submitted to the IEC-CENELE

14、C parallel vote and approved by CENELEC as EN 61338-1-5:2015. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2016-04-30 latest date by which the national standards confl

15、icting with the document have to be withdrawn (dow) 2018-07-30 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The

16、text of the International Standard IEC 61338-1-5:2015 was approved by CENELEC as a European Standard without any modification. BS EN 61338-1-5:2015EN 61338-1-5:2015 3 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following

17、documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an Intern

18、ational Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 61338-1-3 - Wave

19、guide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency EN 61338-1-3 - IEC 62252 - Maritime navigation and radiocommunication equipment and systems - Radar for

20、 craft not in compliance with IMO SOLAS Chapter V - Performance requirements, methods of test and required test results EN 62252 - BS EN 61338-1-5:2015 2 IEC 61338-1-5:2015 IEC 2015 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope 6 2 Normative references. 6 3 Measurement and related parameters 6 4 Ca

21、lculation equations for Riand i. 8 5 Preparation of specimen 12 6 Measurement equipment and apparatus . 12 6.1 Measurement equipment . 12 6.2 Measurement apparatus 12 7 Measurement procedure 13 7.1 Set-up of measurement equipment and apparatus 13 7.2 Measurement of reference level . 13 7.3 Measureme

22、nt procedure of Qu. 13 7.4 Determination of iand measurement uncertainty 15 8 Example of measurement result . 15 Annex A (informative) Derivation of Equation (4) for Ri17 Annex B (informative) Calculation uncertainty of parameters in Figure 3 . 19 Bibliography . 20 Figure 1 Surface resistance Rs, su

23、rface conductivity s, interface resistance Ri, and interface conductivity i. 7 Figure 2 TE01mode dielectric rod resonator to measure i. 8 Figure 3 Parameters chart of f0, g, Prod and Psubfor reference sapphire rod . 10 Figure 4 Parameters chart of f0, g, Prodand Psubfor reference (Zr,Sn)TiO4rod . 11

24、 Figure 5 Schematic diagram of measurement equipments . 12 Figure 6 Schematic diagram of measurement apparatus for i. 13 Figure 7 Frequency response for reference sapphire rod with two dielectric substrates as shown in Figure 2. . 14 Figure 8 Resonance frequency f0, insertion attenuation IA0and half

25、-power band width fBW. 15 Table 1 Specifications of reference rods . 9 Table 2 rodand tanrodof reference rods measured by the method of IEC 61338-1-3 15 Table 3 suband tansubof an LTCC test substrate measured by the method of IEC 62562 16 Table 4 Measurement results of iand riof a copper layer in LT

26、CC substrate 16 Table B 1 Parameters obtained by FEM and rigorous analysis of IEC 61338-1-3 for the TE011 mode resonator 19 Table B.2 Calculated parameters f0, g, Prod, Psub, Ri, iand rifor the TE01 mode resonator 19 BS EN 61338-1-5:2015IEC 61338-1-5:2015 IEC 2015 3 INTERNATIONAL ELECTROTECHNICAL CO

27、MMISSION _ WAVEGUIDE TYPE DIELECTRIC RESONATORS Part 1-5: General information and test conditions Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide org

28、anization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities

29、, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt

30、 with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined b

31、y agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3

32、) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they ar

33、e used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and t

34、he corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsi

35、ble for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical commit

36、tees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publication

37、s. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. International Standard IEC 61338-1-5 has been prepared by IEC technical committee 49: Piezoelectric, dielectric and ele

38、ctrostatic devices and associated materials for frequency control, selection and detection. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition: a) description of technical

39、 content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction; b) changes to normative references; c) addition to bibliography. The text of this standard is based on the following documents: BS EN 61338-1-5:2015 4 IEC 61338-1-5:2015 IEC 2015 CDV Report on voting 49/1

40、089/CDV 49/1103/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 61338 series, published under th

41、e general title Waveguide type dielectric resonators, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific public

42、ation. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. BS EN 61338-1-5:2015IEC 61338-1-5:2015 IEC 2015 5 INTRODUCTION IEC 61338 consists of the following parts, under the general title Waveguide type dielectric resonators: Part 1: Generic spec

43、ification Part 1-3: General information and test conditions Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency Part 1-4: General information and test conditions Measurement method of complex relative permittivity for dielectric resonator mat

44、erials at millimeter-wave frequency Part 2: Guidelines for oscillator and filter applications Part 4: Sectional specification Part 4-1: Blank detail specification The International Electrotechnical Commission (IEC) draws attention to the fact that it is claimed that compliance with this document may

45、 involve the use of a patent concerning: The use of a TE01mode dielectric rod resonator for the interface resistance and the interface conductivity measurement, given in Clause 4; The use of a substrate/conductor/substrate layer structure, where a conductor is formed between two dielectric substrate

46、s, for the interface resistance and interface conductivity measurement, given in Clause 5. IEC takes no position concerning the evidence, validity and scope of this patent right. The holder of this patent right has assured the IEC that he/she is willing to negotiate licences under reasonable and non

47、-discriminatory terms and conditions with applicants throughout the world. In this respect, the statement of the holder of this patent right is registered with IEC. Information may be obtained from: KYOCERA Corporation 6 Takeda Tobadono-cho, Fushimiku, Kyoto 612-8501, Japan Attention is drawn to the

48、 possibility that some of the elements of this standard may be the subject of patent rights other than those identified above. IEC shall not be held responsible for identifying any or all such patent rights. ISO (www.iso.org/patents) and IEC (http:/patents.iec.ch) maintain on-line data bases of pate

49、nts relevant to their standards. Users are encouraged to consult the data bases for the most up to date information concerning patents. BS EN 61338-1-5:2015 6 IEC 61338-1-5:2015 IEC 2015 WAVEGUIDE TYPE DIELECTRIC RESONATORS Part 1-5: General information and test conditions Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency 1 Scope Microwave circuits are p