DLA SMD-5962-92138-1993 MICROCIRCUIT LINEAR SYNCHRO RESOLVER-TO-DIGITAL CONVERTER 16-BIT MICROPROCESSOR COMPATIBLE HYBRID《混合微处理器兼容16比特同步解算器到数字转换器 直线式微型电路》.pdf

《DLA SMD-5962-92138-1993 MICROCIRCUIT LINEAR SYNCHRO RESOLVER-TO-DIGITAL CONVERTER 16-BIT MICROPROCESSOR COMPATIBLE HYBRID《混合微处理器兼容16比特同步解算器到数字转换器 直线式微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-92138-1993 MICROCIRCUIT LINEAR SYNCHRO RESOLVER-TO-DIGITAL CONVERTER 16-BIT MICROPROCESSOR COMPATIBLE HYBRID《混合微处理器兼容16比特同步解算器到数字转换器 直线式微型电路》.pdf（13页珍藏版）》请在麦多课文档分享上搜索。

1、SMD-5762-92138 m 9999996 0042340 441 m DESCRIPTION DATE (YR-MO-DA) LTR APPROVED RLy_t_tt SHEET SHEET R-_t_t+ SHEET 123 REV STATUS OF SHEETS SIZE A PMIC NIA CAGE CODE 5962-92138 67268 STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF

2、DEFENSE AMSC N/A REV PREPARED BY Steve Duncan CHECKED BY Michael Jones APPROVED BY Kendall A. Cottongim DRAWING APPROVAL DATE 93-06-01 REVISION LEVEL DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUIT, LINEAR, CONVERTER, 16-BIT, MICROPROCESSOR COMPATIBLE, HYBRID SYNCHRO/RESOLVER-TO-DI

3、GITAL )ESC FORM 193 JUL 91 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. 5962-E579-92 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-92138 = 77777b 0042343 388 , 1.1 ccope. This drawing forms a part of a

4、one part - one part number documentation system (see 6.6 herein). This drawing describes device requirements for hybrid microcircuits to be processed in accordance with MIL-H-38534. product assurance classes, military high reliability (device class H) and space application (device class K) and a cho

5、ice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. Two 1.2 m. The PIN shall be as shown in the following example: - X X H - - I I 5962 92138 - o1 - I

6、 I I I I t I I I I Lead Case Device Device II Federal RHA stock ctass designator tYPe class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) I Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes ti and K RHA marked devi

7、ces shall meet the A dash (-1 indicates a MIL-H-38534 specified RHA levels and shall be marked uith the appropriate RHA designator. non-RHA device. 1. SCOPE STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 5962-92138 SIZE A REVISION LEVEL SHEET 2 1.2.2 Device type(s

8、1. The device type(c) shall identify the circuit function as follows: Device type Generic number Circuit function Accuracy I M o2 03 o4 HSRD1006-341VR/2 11.8 V, 400 Hz, S-R/D converter 11.3 arcmin res mode 12.6 arcmin syn mode HSRD1006-341VS/2 11.3 arcmin syn mode 12.6 arcmin res mode HSRD1006-341H/

9、2 11.8 V, 400 Hz, S-R/D converter 12.6 arcmin both modes HSRD1006-341 S/2 15.2 arcmin both modes 11.8 V, 400 Hz, S-R/D converter 11.8 V, 400 Hz, S-R/D converter Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-92L3B W 9999996 0042342 214 W ST

10、ANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 1.3 Absolute maximum ratings. 11 Signal inputs Reference inputs Supply voltage (VL) . Digital input voltage range . , Storage temperature range Junction temperature (TJ): Junction rise above case . Junction rise above a

11、mbient Power dissipation (PD) . Lead temperature (soldering, 10 seconds) Junction temperature (TJ) 1.4 Recommended operating conditions. SIZE 5962-92138 A REVISION LEVEL SHEET 3 Twice normal voltage (23.6 V rms) 20 V rms +IO V dc -0.3 V dc to VL -65C to t15O“C 3OC/U 12“C/U 110 mW 150C t300“ c I Supp

12、ly voltage range (VL) Signal input 11.8 V ac rms Frequency range . 360 Hz to 10 Hz +4.5 V dc to +5.5 V dc Ambient operating temerature range (TA) . -55C to t125C 2. APPLICABLE DOCUMENTS 2.1 Government Specification, standards, and handbook. Unless otherwise specified, the following specification, st

13、andards, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-H-38534 - Hybrid Microcircuits, General Specification for.

14、STANDARDS MIL I TARY MIL-STD-480 - Configuration Control-Engineering Changes, Deviations and Waivers. MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-1835 - Microcircuit Case Outlines. HANDBOOK MILITARY MIL-HDBK-780 - Standardized Military Drawings. (Copies of the specificati

15、on, standards, and handbook required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the reference

16、s cited herein, the text of this drawing shall take precedence. - I/ Stresses above the absolute maximum rating may cause permanent damage to the device. maximum levels may degrade performance and affect reliability. Extended operation at the Provided by IHSNot for ResaleNo reproduction or networkin

17、g permitted without license from IHS-,-,-SHD-5962-92L38 H b 0042343 I150 H STANDADI ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 3. REWIRENENTS 3.1 herein. Item requirements. The individual item requirements shall be in accordance with MIL-H-38534 and as specified SIZE 5

18、962-92138 A REVISION LEVEL SHEET 4 3.2 Desim, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-H-38534 and herein. 3.2.1 3.2.2 Terminal connections. 3.3 Electrical performance characteristics. Case outLineW. The case outline(s) sha

19、ll be in accordance with 1.2.4 herein and figure 1. The terminal connections shall be as specified on figure 2. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrica

20、l test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-H-38534. The part shall be marked with the PIN listed in 1.2 herein. In addition,

21、the manufacturers PIN may also be marked as listed in QML-38534. 3.6 Nanufacturer elioibility. In addition to the general requirements of MIL-H-38534, the manufacturer of the part described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspect

22、ion group A lot sample, produced on the certified line, for each device type listed herein. also include a summary of all parameters manually tested, and for those which, if any, are guaranteed. shall be maintained under document revision level control by the manufacturer and be made available to th

23、e preparing activity (DESC-Et) upon request. The data should This data 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to The certificate of compliance submitted to DESC-EC shall affirm that the manufacturers supply to this drawing. product m

24、eets the requirements of MIL-H-38534 and the requirements herein. 3.8 Certificate of conformance. A certificate of conformance as required in NIL-H-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. 4.2 Scree

25、ning. Screening shall be in accordance with MIL-H-38534. The following additional criteria shall apply: Sampling and inspection procedures shall be in accordance with MIL-H-38534. a. Burn-in test, method 1015 of HIL-STD-883. (1) Test condition A, 6, C, or D. The test circuit shall be maintained by t

26、he manufacturer under document revision level control and shall be made available to either DESC-EC or the acquiring activity upon request. applicable, in accordance with the intent Specified in test method 1015 of MIL-STD-883. TA as specified in accordance with table I of method 1015 of MIL-STD-883

27、. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as (2) b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. D

28、ESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-72138 777777b 0042344 097 I TABLE I. Electrical performance characteristics. I STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I I I I I

29、I l SIZE 5962-92138 A REVISION LEVEL SHEET DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-72138 W 9999996 0042345 T23 STANDARIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962-92138 A

30、REVISION LEVEL SIIEET 6 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92l138 m 9999996 0042346 96T m STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER SIZE 5962-92138 A DAYTON, OHIO 45444 1 REVISION LEVEL SHEET I I 7 DESC FOR

31、M 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92138 W 9999996 OOY23L17 8Tb width I TABLE I. Electrical performance characteristics - Continued. I I I I l I I I I I Test STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPL

32、Y CENTER DAYTON, OHIO 45444 I SY*l I Condit ions I Group A 1 Device I Limits 1 Unit SIZE 5962-92138 A REVISION LEVEL SHEET I -Soc 9 TA 5 +125“C I Sbgroups I type I I VL = +5.0 U dc I I I I I I Min I Max I I I I l I unless otheruise specified 1 I DYNAHIC CHARACTERISITICS - Continued I 1 I 1- Small si

33、gcial settling itS2 116-bit de i 9,19,11 i All time, (for 1.4 step I I I I settling to 1 LsB) s/ 1 (14-bit inode I c t I I I 1 I I I l I I 7,8 I All 116-bit mode Converter bandwidth lW l 114-bit mode I l e I 1 I blaximum acceleration 3/ IACELMAX 116-bit mode 1 9,10,11 I All I I I I 114-bit mode Accu

34、racy is measured and recorded in the highest accupacy mode with nominal voltage and frequency *IO percent. The alternate mode is tested on a go-no-go basis. Accuracy is measured and recorded in the synchro mode. The resolver niode is tested on a go-no-go basis. Parameters shall be tested as part of

35、device initial characterization and after design and process changes. Parameter shall be gauranteed to the limits specified in table I for all lots not specifically tested. These parameters are tested on a go-no-go basis only or in conjunction with other measured parameters and are not directly test

36、able. DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92138 D 9999996 0042348 732 i .lo 2.01 1.700 2.005 0 .- 1 “i:, t- 1.895 +.O05 .775 2.005 t! .o9 .O1 + 19 t TOP VIEH .600 2.005 . SIDE VIEH - .lo0 TYP. NONCUMULATIVE

37、HIN 4+ Inches .O05 .o10 .O30 . o55 .O86 .ow .ola STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 mm 0.13 0.25 0.46 0.76 1.40 2.29 2-18 SIZE 5962-92138 A REVISION LEVEL SHEET 9 Inches .loo .I80 .250 .600 .775 1.700 I .a95 mm 2.54 4.57 6.35 15.24 19.69 43.18 48.13 NO

38、TES: 1. Dimensions are in inches. 2. Metric equivalents are given for information only. 3. Lead spacing dimensions apply only at seating plane. 4. Case is electrically floating. 5. Standoffs are ceramic or glass (3 each). FIGURE 1. Case outline X. Provided by IHSNot for ResaleNo reproduction or netw

39、orking permitted without license from IHS-,-,-SMD-5962-92L3 9999996 0042349 679 9 bevice types :ase outline erminal number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 29 30 31 32 33 34 35 36 28 M -04 X .ermi na 1 connect i on SI s2 s3 54 S 5R R RL RH Velocity (6) V e INH

40、CB BIT 148 LEE GND BI 6 BI 5 BI 4 BI 3 BI 2 BI 1 BIO 89 88 07 06 05 84 83 62 BI HBE - - - vL FIGURE 2. Terminat connections. STANDARDIZED * 5962-92138 MILITARY DRAWING DAYTON, OHIO 45444 c DEFENSE. ELECTRONICS SUPPLY, CENTER DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or netwo

41、rking permitted without license from IHS-,-,-SUD-5962-92136 m 9999996 OOY2350 390 m STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 c SIZE 5962-92138 A REVISION LEVEL SHEET TABLE II. Electrical test requirements. Subgroups I (in accordance with I MIL-H-38534, group

42、 A I test table) I I (optional) I I MIL-li-38534 test requirements I Interim electrical parameters I 1,4,7 I* I Final electrical test parameters I 1 ,2,3,4,5,6,7,8, I I 9,10,11 I I I I Group A test requirements I 1,2,3,4,5,6,7,8, I 1 9,10,11 I Group C end-point electrical i 1,2,3,4,7 i paramet ers I

43、 I * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-H-38534 and as specified herein. 4.3.1 a. Group A inspection. Group A inspection shall be in accordance with MIL-li-38534 and as follows: Tests shall be as specified in

44、table II herein. 4.3.2 Group B inspection. 4.3.3 Group C inspection. Group B inspection shall be in accordance with MIL-li-38534. Group C inspection shall be in accordance with MIL-H-38534 and as follows: a. b. Steady-state life test, method 1005 of MIL-STD-883. End-point electrical parameters shall

45、 be as specified in table II herein. (1) Test condition A, 8, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DESC-EC or the acquiring activity upon request. applicable, in accordance with the intent specif

46、ied in test method 1005 of MIL-STD-883. TA as specified in accordance with table I of method 1005 of MIL-STD-883. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as (2) (3) Test duration: 4.3.4 Group D inspection. 5. PACKAGING 1,000 hours, except as permitted

47、 by method 1005 of MIL-STD-883. Group D inspection shall be in accordance with MIL-H-38534. 5.1 6. NOTES Packaging requirements. The requirements for packaging shall be in accordance with MIL-H-38534. 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government micr

48、ocircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a :ontractor-prepared specification or drawing. DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo rep

49、roduction or networking permitted without license from IHS-,-,-r STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of This coordination will be accomplished in accordance with MIL-STD-481 u