DLA SMD-5962-88652-1989 MICROCIRCUIT DIGITAL FAST CMOS HIGH SPEED CARRY LOOKAHEAD GENERATOR MONOLITHIC SILICON《硅单片高速向前进行发电机高速互补型金属氧化物半导体数字微电路》.pdf

《DLA SMD-5962-88652-1989 MICROCIRCUIT DIGITAL FAST CMOS HIGH SPEED CARRY LOOKAHEAD GENERATOR MONOLITHIC SILICON《硅单片高速向前进行发电机高速互补型金属氧化物半导体数字微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88652-1989 MICROCIRCUIT DIGITAL FAST CMOS HIGH SPEED CARRY LOOKAHEAD GENERATOR MONOLITHIC SILICON《硅单片高速向前进行发电机高速互补型金属氧化物半导体数字微电路》.pdf（15页珍藏版）》请在麦多课文档分享上搜索。

1、REVISIONS LTR DESCRIPTION DATE (VR-MO-PA) APPROVED t REV SHEET REV SHEET REV STATUS REV OF SHEETS I 1 SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 PMIC NIA STANDARDIZED MILITARY DRAWING MIS DRAWING IS AVAILABLE OR USE BY ALL DEPARTMENTS AND AGENCIES OFME DEPARTMENT OF DEFENSE AMSC NIA DEFENSE ELECTRONI

2、CS SUPPLY CENTER DAYTON, OHIO 45444 I SILICON CAGE CODE SIZE 20 JUNE 1989 A 67268 596-52 REVISION LEVEL I I SHEET 1 OF 15 II U.S. GOVEiiMEHT CRINlINO OFFKE: 1987 - 746.129/60911 DESC FORM 193 SEP 87 5962-E1257-3 DISTRIBUTION STATEMENT A. Approved lor public release; dlstrlbutlon Is unlimited. Provid

3、ed by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SCOPE 1.1 SCO e. This drawing describes device requirements for class B microcircuits 3n accordance with 1.d of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN dev

4、ices“, 1.2 Part number. The complete part number shall be as shown in the following example: 5962-88652 1 I “f- 1 E -r I X -I- I 1 I 1 I I I I 1 Drawing number Device type Case outline (12.11 (1.2.2) MI L-M- 385 10 1.2.1 Device types, The device types shall identify the circuit function as follows:

5、Device type Generic number Circuit function o1 02 54FCT 182 54FCT182A High speed carry lookahead generator High speed carry lookahead generator 1.2.2 Case outlines. The case outlines shalJ be as designated in appendix C of MIL-M-38510, and IS follows: Outline letter Case outline E D-2 (16-lead, .MOH

6、 x ,310“ x .200“), dual-3n-line package F 2 F-5 (16-lead, ,440 x .285“ x .085“), flat package C-2 (20-terminal, ,358“ x ,358“ x .loo“), square chip carrier package 1.3 Absolute maximum ratings. L/ Supply voltage range - - - - - - - - - - - - - - - - Input voltage range- - - - - - - - - - - - - - - -

7、 - Output voltage range - - - - - - - - - - - - - - - - DC input diode current (I DC output diode current (iO)- - - - - - - - - - - - DC output current- - - - - - - - - - Maximum power dissipation (PD) 2/- - - - - - - - - - Thermal resistance, junction-tGcase (ojC) - - - - - Storage temperature rang

8、e- - - - - - - - - - - - - - Junction temperature (TJ)- - - - - - - - - - - - - - Lead temperature (soldering, 10 seconds) - - - - - - -9.5 V dc to t6.0 V dc -0.5 Y dc to Vcc + 0.5 V dc -0.5 Y dc to VCc + 0.5 V dc - - - - - - - - - - - - -20 mR -50 m9 500 mW See MIL-M-38510, appendix C -65C to +15Oo

9、C +175:C +300 C - - - - - - - *loo m4 1.4 Recomnended operating conditions. Supply volta e ran e (Vcc) - - - - - - - - - - - - - Maximum low fevel Qnput voltage (V Minimum high level input voltage (b1 - - - - - - - Case operating temperature (TC)- - - - - - - - - - - *4.5 V dc to t5.5 V dc - - - - -

10、 - - 0.8 V dc 2.0 V dc -55C to t125C /voltages referenced to GND. / Must withstand the added PD due to short circuit test; e.g., os. SIZE A L 5962-88652 STANDARDIZED MILITARY DRAWING I DEFENCE UECTRONW SUPPLY CENTER RAYTON, OHIO 45444 I 3 !SC FORM 193A SEP 87 *U. 8. OOVERNMENT PRtNTiNoFFIDE: 108(1-i

11、O-W4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- DESC-DWG-b52 57 m 7777775 00L3bL2 2 SIZE A STANDARDIZED I 2. APPLICABLE DOCUMENTS 5962-88652 2.1 Government specification and standard. Unless otherwise specified, the following Specification and

12、Standard, of the issue listed in that issue of the Department of Defense Index of I Specifications and Standards sDecified.in the solicitation. form a Dart of this drawing to the extent specified herein. SP ECIFICATI ON MILITARY MIL-K 38510 - Microcircuits, General Specification for. STANDARD MILITA

13、RY MI L-STD-883 - Test Methods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity. 1 - references citedp

14、nerein, Be text of this drawing shall take precedence. 2.2 Order of recedence. In the event of a conflict between the text.of this drawing and the 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-WJ, “Provisions for the use of MIL-S

15、TD-883 in conjunction with compliant non-JAN devices“ and as specified herein. 3.2 Design, construction, and hysical dimensions. The design, construction, and physical dimensions shall be as specified tn MIL-M-38ISlO and herein. I 3.2.1 Terminal connections. The terminal connections shall be as spec

16、ified on figure 1. 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.3 Logic diagram, The logic diagram shall be as specified on figure 3. 3.2.4 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless other

17、wise specified, the electrical performance characteristics are as specified in table I and apply over the full case operating temperature range. 3.4 Markin . Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked de part number listed in 1.2 herein. In addition, t

18、he manufacturers part number may also be marked as listed in 6.4 herein 3.5 Certificate of com liance. A certificate of compliance shall be required from a manufacturer in order to be listed as in approved source of supply in 6.4. The certificate of compliance submitted to DESC-ECS prior to listing

19、as an approved source of supply shall state that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirements herein. herein) shall be provided with each lot of microcircuits delivered to this drawing. 3.6 Certificate of conformance. A certificate of conforma

20、nce as required in MIL-STD-883 (see 3.1 rt U. S. QOVERNMENT PRINTING OFFICE: 1W-549-%U Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE I. Electrical performance characteristics. Test Condi tions I Group A IDevicel Limits IUnit jsmbol 1 -55C Vcc

21、 = 5.0 5.3 V, I 1, 2, 3 I ll I I 1.51 n Power supply (AICC IVcc = 5.5 V, VIN = 3.4 V g/ I 1, 2, 3 I All I I 2.01 n I vcc I I 1 (CMOS inputs) I I I I 1 I current (TTL inputs high) I I I I I I 1 I I Dynamic ower supply = 5.5 v I 4 1 I I I cur rent I 5.3 V or VIN 5 0.2 V, lone bft toggling: 50!% duty c

22、ycle I I I 1 I 1 I 4 I I I See footnotes at end of table. SIZE MILlTARY DRAWING A 62-am 1 STANDARDIZED MfENSE ELEcTRcIN1cc SUPPLY CENTER REVISION LEVEL SMEr v DAYTN,OHiO 45444 4 it u. a BOVERNMENTPR*ITKIG OFFIDE: I#c at fi / The #inlmm limftc #re guaranteed, ff not teCted, to the lim#ts speciffed fr

23、i table . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Definition of functional term T I r IPin names I Description I I I I 1% i Carry input i IFOS 3

24、2 lG1 1 Carry generate input (active low) I k3 I Carry generate input (active low) I I I I I Carry generate inputs (active low) I lO, Pl I Carry propagate inputs (active low) I Carry propagate input (active low) 13 I Carry propagate input (actfve low) IC, + x - Cn + 2 I Carry outputs IG f Carry gene

25、rate output (active low) I Carry propagate output (active low) I I FIGURE i. Terminal connections - Continued. CIZE A 5962-88652 STANDARDIZED MILTTAW DRAWING REVISIONLEVEL ISH= 8 MFENCEELECfl6NfCS SUPPLY CEHIER DAYTON, H0 45444 I DESC FORM 193A .k U GWERNMENTPRHWGOFFCE. 108749088 SEP 87 Provided by

26、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- DESC-DWG-8652 57 m 7777775 OOL36L 3 m 1 STANDARDIZED SIZE MILITARY DRAWING A 5962-88652 MFENSE ELECTRONICS SUPPLY CENTER REVISfN LEVEL SHEET 9 DAm, OHIO 45444 Inputs I .gutputs I I I IXXXHH IXHHHX ILHXHX IXXXLX IX

27、LXXL IHXLXL I I I , ,I ix Iir IL IX IX IX IH X L X L X L I i I I X XXXXHHI I I I H I I I I X XXHHHXI H I X HHHXHXI H I H HXHXHXI H XXXXLXI L I x LXXLXLI XLXLXLI L L I L I I ir XXLXXLI I I j I HXXX I XHXX I XXHX I XXXH I LLLL I HI HI HI HI LI I I i H = High voltage level L = Low voltage level X = Irr

28、elevant Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I I - - DESC-DWG-Bab52 57 7777775 OOL36L7 5 I Cntx I Cn+ y I Cnt z G FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DE

29、SC-DWG-b52 57 7777795 0033620 I m DUT - ) T PULSE GENERATOR 41 L NOTES: 1. Pulse generator for all pulses: PRR i 1.0 MHz; tr = tf 2.5 ns. FIGURE 4. Test circuit and switching waveforms. - SIZE 5962-88652 STANDARDIZED MILITARY DRAWING A 1 SHEET 11 MFENSE ELECTRONICS SUPPLY CENTER D“, OHK) 4!j444 RMSI

30、ON LEVEL 3C FORM 193A * US GOVERNMENTPRINTINGOFFICE 1W7-5490% SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-b52 57 7777975 0033623 3 i Propagation delay 3v - /I IL ov OUTPUT 1,5 V OPPOSITE PHASE INPUT TRANSITION u ov FIGURE 4. Test

31、circuit and switching waveforms - Continued. STANDARMZED MILITARY DRAWING 5962-88652 I DEFENSE ELECTRONICS SUPPLY CENTER DAWN, OHi 45444 IREVWNLEVEL I 12 SC FORM 193A SEP a7 r“r US. QOVERNMENT PAHTINQ OFWE 18874SOW Provided by IHSNot for ResaleNo reproduction or networking permitted without license

32、from IHS-,-,-DESC-DWG-b52 57 7777775 0033622 5 * STANDARDIZED MILTTAW DRAWING 3.7 Notification of change. Notification of change to DESC-ECS shall be required in accordance with MIL-STD-883 ( see 3.1 herei n) . SIZE a 5962-88652 3.8 Verification and review. DESC, DESCs agent, and the acquirin activi

33、ty retain the option to review the manufacturers facility and applicable required documentat!on. Offshore documentation shall be made available onshore at the option of the reviewer. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordanc

34、e with section 4 of MIL - M 38510 to the extent specified in MIL-STD-883 (see 3.1 herein). 4.2 Screenin . Screening shall be in accordance with method 5004 of MIL-STD-883,.and shall-be conduct devices prior to quality conformance inspection. The following additional cri teria shall apply: a. Burn-in

35、 test, method 1015 of MIL-STD-883. (1) Test condition A, 8, C, or D using the circuit submitted with the certificate of cmpl iance (see 3.5 herein) . (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, exce t interim electrical parameter

36、 tests prior to burn-in are optional at the discretion of tRe manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 500s Of MIL-STD-883 i ncluding groups A, 8, C, and D inspections. The following additional criteria shall apply. 4.3.1 Gro

37、up A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CN and COUT measurements) shall be measured only for the initial test and after process or design changes which may affect capacitance. Tes

38、t all applicable pins on five devices with zero failures. d. Subgroups 7 and 8 tests shall verify the truth table as specified on figure 2 herein. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, meth

39、od 1005 of MIL-STD-883. (1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.5 herein). (2) TA = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. DEFENSE ELECTRONICS SUPPLY CENTER REVISIONLEVEL SHEET

40、I DAYTON, OHIO 45444 13 t U. S. GOVERNMENT PRINTING MCE: IWE-S49.804 ESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- TABLE II, Electrical test requirements. u grou s I I MIL-STD-883 test requirements I (!e! metftod I I 1 5005, t

41、able I) I I I I I 1 I SIZE A STANDARDIZED i I interim electrical parameters I - I (method 5004) I I I I I I Final electrical test parameters I 1*,2,3,7,8,9, I I (method 5004) 1 10,ll I I I I 5962-88652 I Group A test requirements i 1,2,3,4,7,8,9, i I (method 5005) I 10,ll I I I I i Groups C and D en

42、d-point i 1,2,3 i I electrical arameters I 1 I (method 5Od) I I * FDA applies to subgroup 1. 5, PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with 6. NOTES IIL-M-38510. 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when

43、military ;pecifications do not exist and qualified military devices that will perform the required function ire not available for OEM application. When a military specification exists and the product covered )y this drawing has been qualified for listing on QPL-38510, the device specified herein wil

44、l be Inactivated and will not be used for new design. The QPL-38510 product shall be the preferred Item or all applications. :overe*or-prepared specification or drawing. 6.2 Re laceability, Microcircuits covered by this drawing will replace the same generic device 6.3 Comments, Comments on this draw

45、ing should be directed to DES-ECS, Dayton, Ohio 45444, or ;el ephoE3T3Z96-537 5. DESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-88652 59 9999975 0013624 9 W .P 6.4 Approved source of supply. An approved source of suppl

46、y is listed herein. Additional sources will be added as they become available, The vendar listed herein has agreed to this drawing and a certificate of compliance (see 3.5 herein) has been submitted to DESC-ECS. I I I Military drawing I CAGE I similar part I I part number I number I number L/ I I I

47、I I I I I f 1 Vendor I Vendor I I 5962-8865201EX I 61772 I IDT54FCT182DB I I I I 5962-8865201FX I 61772 I IDT54FCT182EB I I I I 5962-88652012X 1 61772 I IDT54FCT182LB I I 1 I I I I 5962-8865202EX I 61772 I IDT54FCT182ADB I I I I I I I I 5962-8865202FX I 61772 I IDT54FCT182AEB I I I .I I I I 5962-886

48、52022X I 61772 I IDT54FCT182ALB i/ Caution. Do not use this number for item acquisition. Items acquired by this number may not satisfy the performance requirements of this drawing. - Vendor CAGE number 61772 Vendor name and address Integrated Device Technology 3236 Scott Boulevard Santa Clara, CA 95052 STANDARDIZED SIZE MILITARY DRAWING A 5962-88652 DEFENSE ELEClRONiCS SUPPLY CENTER SHEET I DAYION, OHIO 45444 15 QU. 9. QOVERNMW PRINTINQ OFFICE. l.%-549-801 ESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from I