DLA SMD-5962-88630 REV G-2013 MICROCIRCUIT LINEAR INSTRUMENTATION AMPLIFIER MONOLITHIC SILICON.pdf

《DLA SMD-5962-88630 REV G-2013 MICROCIRCUIT LINEAR INSTRUMENTATION AMPLIFIER MONOLITHIC SILICON.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88630 REV G-2013 MICROCIRCUIT LINEAR INSTRUMENTATION AMPLIFIER MONOLITHIC SILICON.pdf（13页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes to slew rate test. Changes IAW NOR 5962-R194-93. 93-08-25 M. A. FRYE B Changes boilerplate to add one-part numbers. Add device type 03. Add delta test limits. Redrawn. 97-06-03 R. MONNIN C Change to group A subgroups for TCVOOSin table I.

2、 Update boilerplate. - rrp 00-10-26 R. MONNIN D Add device type 01 limits to table IIB. - ro 02-11-22 R. MONNIN E Drawing updated to reflect current requirements. - ro 06-05-16 R. MONNIN F Make changes to the VOOStest for device type 03 as specified under Table I and Table IIB. - ro 08-07-01 R. HEBE

3、R G Update drawing to current MIL-PRF-38535 requirements. -rrp 13-02-14 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV G G G G G G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY CHARLES E. BESORE DLA LAND AND MARI

4、TIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY WILLIAM J. JOHNSON THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, INSTRUMENTATION AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPART

5、MENT OF DEFENSE DRAWING APPROVAL DATE 88-09-13 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 67268 5962-88630 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E269-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-8863

6、0 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and

7、 lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following examples. For device classes M and Q: 5962 - 88630 01 V A Federal stock

8、 class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Case outline (see 1.2.4) Lead finish (see 1.2.5) / / Drawing number For device class V: 5962 - 88630 01 V V A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (s

9、ee 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specif

10、ied RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 AMP-01A Low-noise, precision, instrumentation amplifier 02 AMP-0

11、1B Low-noise, precision, instrumentation amplifier 03 AMP01 Low-noise, precision, instrumentation amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed below. Since the device class designator has been added after th

12、e original issuance of this drawing, device classes M and Q designators will not be included in the PIN and will not be marked on the device. Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits

13、in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88630 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVIS

14、ION LEVEL G SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style K GDFP2-F24 or CDFP3-F24 24 Flat pack V GDIP1-T18 or CDIP2-T18 18 Dual-in-line 3 CQCC1-N28 28 Square le

15、adless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1.3 Absolute maximum ratings. 1/ Supply voltage (VS) . 18 V dc Power dissipation (PD) 500 mW 2/ Common mode input voltage Supply voltage

16、 Differential input voltage: RG 2 k 20 V dc RG 2 k 10 V dc Output short circuit duration Indefinite Storage temperature range . -65C to +150C Lead temperature (soldering, 60 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case

17、 V . 120C/W Case 3 104C/W Case K . 69C/W 1.4 Recommended operating conditions. Supply voltage (VS) . 15 V dc Ambient operating temperature range (TA) . -55C to +125C _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may

18、 degrade performance and affect reliability. 2/ Must withstand the added PDdue to short circuit test, e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88630 DLA LAND AND MARITIME COLUMBUS, OHIO 4321

19、8-3990 REVISION LEVEL G SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these docu

20、ments are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Com

21、ponent Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbi

22、ns Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless

23、a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in th

24、e QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The desig

25、n, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal

26、connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance c

27、haracteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The

28、 electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of th

29、e entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marki

30、ng for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535

31、, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88630 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristi

32、cs. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input bias current IB1 01, 03 4 nA 2, 3 10 1 02 6 2, 3 15 Input offset current IIO1 01, 03 1 nA 2, 3 3 1 02 2 2, 3 6 Offset referred to input vs. positive supply +PSR V+ = +5 V to

33、 +15 V, V- = -15 V, G = 1000 1, 2, 3 01, 03 120 dB V+ = +5 V to +15 V, V- = -15 V, G = 100 110 V+ = +5 V to +15 V, V- = -15 V, G = 10 95 V+ = +5 V to +15 V, V- = -15 V, G = 1 75 V+ = +5 V to +15 V, V- = -15 V, G = 1000 02 110 V+ = +5 V to +15 V, V- = -15 V, G = 100 100 V+ = +5 V to +15 V, V- = -15 V

34、, G = 10 90 V+ = +5 V to +15 V, V- = -15 V, G = 1 70 Offset referred to input vs. negative supply -PSR V- = -5 V to -15 V, V+ = +15 V, G = 1000 1, 2, 3 All 105 dB V- = -5 V to -15 V, V+ = +15 V, G = 100 90 V- = -5 V to -15 V, V+ = +15 V, G = 10 70 V- = -5 V to -15 V, V+ = +15 V, G = 1 50 See footnot

35、e at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88630 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characte

36、ristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Common mode rejection CMR VCM= 10 V, 1 k source imbalance, G = 1000 1 01, 03 125 dB VCM= 10 V, 1 k source imbalance, G = 100 120 VCM= 10 V, 1 k source imbalance, G

37、= 10 100 VCM= 10 V, 1 k source imbalance, G = 1 85 VCM= 10 V, 1 k source imbalance, G = 1000 2, 3 120 VCM= 10 V, 1 k source imbalance, G = 100 115 VCM= 10 V, 1 k source imbalance, G = 10 95 VCM= 10 V, 1 k source imbalance, G = 1 80 VCM= 10 V, 1 k source imbalance, G = 1000 1 02 115 VCM= 10 V, 1 k so

38、urce imbalance, G = 100 110 VCM= 10 V, 1 k source imbalance, G = 10 95 VCM= 10 V, 1 k source imbalance, G = 1 75 VCM= 10 V, 1 k source imbalance, G = 1000 2, 3 110 VCM= 10 V, 1 k source imbalance, G = 100 105 VCM= 10 V, 1 k source imbalance, G = 10 90 VCM= 10 V, 1 k source imbalance, G = 1 75 See fo

39、otnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88630 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance cha

40、racteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Gain equation accuracy GE G = 20RS/ RG, TA= +25C Accuracy measured at G = 1, 10, 100, and 1000 1 01 0.6 % 02, 03 0.8 Gain range G TA= +25C 1 All 1 1000 V/V Out

41、put short circuit Current IOS+TA= +25C 1 All 60 120 mA IOS-120 -60 Reference input Resistance RINREFTA= +25C 1 All 35 65 k Quiescent current IQ+V linked to +VOP-V linked to -VOP1, 2, 3 All 4.8 mA Input offset voltage VIOS4 01 50 V 5, 6 80 4 02, 03 100 5, 6 150 Output offset voltage VOOS4 01 3 mV 5,

42、6 6 4 02 6 5, 6 10 4, 5, 6 03 10 Output offset voltage drift TCVOOSRG= 8 01, 03 50 V/C 02 120 See footnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88630 DLA LAND AND MARITIME COLUMBUS

43、, OHIO 43218-3990 REVISION LEVEL G SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage swing VORL= 500 , 2 k 4 All 13 V RL= 50 2.5

44、RL= 500 , 2 k 5, 6 12 Slew rate SR G = 10 4 01 3.5 V/s 5, 6 2.75 4 02, 03 3.0 5, 6 2.0 Average input offset voltage drift TCVIOSTA= -55C, +125C 8 01 0.3 V/C 02, 03 1.0 1/ VS= 15 V, RS= 10 k, RL= 2 k, unless otherwise specified. 3.6 Certificate of compliance. For device classes Q and V, a certificate

45、 of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103

46、 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M

47、, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawi

48、ng. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA L