DLA SMD-5962-87571 REV H-2013 MICROCIRCUIT LINEAR RADIATION HARDENED TWO TERMINAL TEMPERATURE TRANSDUCER MONOLITHIC SILICON.pdf

《DLA SMD-5962-87571 REV H-2013 MICROCIRCUIT LINEAR RADIATION HARDENED TWO TERMINAL TEMPERATURE TRANSDUCER MONOLITHIC SILICON.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-87571 REV H-2013 MICROCIRCUIT LINEAR RADIATION HARDENED TWO TERMINAL TEMPERATURE TRANSDUCER MONOLITHIC SILICON.pdf（16页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Sheet 4: Table I, conditions block, delete “VS= 5 V” and substitute “VS= +5 V”. Table I, nonlinearity (NL) test, conditions column, delete “-55C to +150C with ambient error (E) set to zero. 1/ 2/”, and substitute “-55C to +150C”. Sheet 5: Table I

2、, conditions block, delete “VS= 5 V” and substitute “VS= +5 V”. Sheet 6: Figure 1, case outline X, add “NOTE: Top view”. Changes in accordance with NOR 5962-R036-93. 92-12-23 M. A. Frye B Change boilerplate to add one-part numbers. Add table IIB for delta limits. Editorial changes throughout. Redraw

3、n 97-03-07 R. Monnin C Add radiation hardness assurance requirements. Update boilerplate. -rrp 98-06-18 R. Monnin D Changes to 1.5, table IIB, and 4.4.4.1. -rrp 99-04-12 R. Monnin E Changes to table IIA footnotes and table IIB. rrp 00-09-15 R. Monnin F Add device type 04 to the post irradiation valu

4、e for the ambient error test in table I. Update boilerplate. -rrp 02-05-24 R. Monnin G Add paragraph 4.4.4.1. Editorial changes throughout. -rrp 07-05-14 Robert M. Heber H Add device type 05. Delete figure 4 radiation exposure circuit. - ro 13-01-14 C. Saffle THE ORIGINAL FIRST PAGE OF THIS DRAWING

5、HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV H H H H H H H H H H H H H H OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Marcia B. Kelleher DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS A

6、VAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCenzo APPROVED BY Nelson Hauck MICROCIRCUIT, LINEAR, RADIATION HARDENED, TWO TERMINAL TEMPERATURE TRANSDUCER, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-09-21 AMSC N/A REVISION LEVEL H SIZE A CAGE CODE

7、67268 5962-87571 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E031-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87571 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 2 DSCC FORM 2234

8、APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When

9、 available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following examples. For device class M and Q: 5962 - 87571 01 X X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Case outline (see 1.2.4)

10、Lead finish (see 1.2.5) / / Drawing number For device class V: 5962 R 87571 01 V X X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device

11、classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-

12、RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 AD590J Temperature transducer 02 AD590K Temperature transducer 03 AD590L Temperature transducer 04 AD590M Temperature transducer 05 AD590M Temperature transdu

13、cer 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q designators will not be included in the PIN

14、and will not be marked on the device. Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 Pro

15、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87571 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated i

16、n MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 2 Flat package Y See figure 1 3 Metal can 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1.3 Ab

17、solute maximum ratings. 1/ Forward voltage (E+ to E-) +44 V dc Reverse voltage (E+ to E-) -20 V dc Breakdown voltage (case to E+ or E-) . 200 V dc Rated performance temperature range . -55C to +150C 2/ Storage performance temperature range -65C to +155C Lead temperature range (soldering, 10 seconds)

18、 +300C Thermal resistance (JA): MEDIUM JC+ CA (C/W) TS 3/ Y 4/ X 4/ Y 4/ X 4/ Aluminum block 30 10 0.6 0.1 Stirred oil 5/ 42 60 1.4 0.6 Moving air 6/ with heat sink 45 - 5.0 - without heat sink 115 190 13.5 10.0 Still air with heat sink 191 - 108 - without heat sink 480 650 60 30 1.4 Recommended ope

19、rating conditions. Supply voltage range (VCC) 4 V dc to 30 V dc Operating ambient temperature range . -55C to +150C 2/ _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/

20、 Device types 02, 03, 04, and 05 class V rated performance temperature range = -55C to +125C. 3/ The time constant is defined as the time required to reach 63.2 percent of an instantaneous temperature change. 4/ Y 3-pin can; X 2-pin flat package. 5/ T is dependent upon velocity of oil: average of se

21、veral velocities listed above. 6/ Air velocity = 9 feet per second. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87571 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 4 DSCC FORM 223

22、4 APR 97 1.5 Radiation features. Maximum total dose available (dose rate = 50 300 rads(Si)/s): Device class V: Device types 03 and 04 100 krads(Si) 7/ Maximum total dose available (dose rate 10 mrads(Si)/s): Device class V: Device type 05 50 krads(Si) 7/ 2. APPLICABLE DOCUMENTS 2.1 Government specif

23、ication, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-

24、38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit

25、Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a co

26、nflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item

27、requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requ

28、irements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for devi

29、ce classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figures 1 and 2. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 3. 3.2.3 Radiation exposure circuit

30、. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. _ 7/ Device types 03 and 04 may be dose rate sensitive in a space environment and may demonstrate enhanced

31、low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A for device types 03 and 04, condition D for device type 05. Provided by IHSNot for ResaleNo reproduction or networking permitted withou

32、t license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87571 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical per

33、formance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each

34、 subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not m

35、arking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/complianc

36、e mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall

37、 be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein).

38、 The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements o

39、f MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification

40、 of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA L

41、and and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for devic

42、e class M. Device class M devices covered by this drawing shall be in microcircuit group number 59 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87571 DLA LAND AND MARITIME

43、COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TA+125C VS= +5 V unless otherwise specified Group A subgroups Device type Limits Unit Min Max Ambient error E Nominal output current is 1 All 5.

44、0 C 298.15 A at +25C 12 01 5.0 12 02 2.5 12 03 1.0 12 04, 05 0.5 M,D,P,L,R 12 03, 04 -10.0 1.0 M, D, P, L 12 05 -10.0 1.0 Absolute error EA-55C to +150C without external calibration 3/ 2, 3 01 10 C -55C to +125C without 2, 3 02 5.5 external calibration 3/ 2, 3 03 3 2, 3 04, 05 1.7 Calibrated absolut

45、e error EC-55C to +150C with ambient error (E) set to zero. 3/ 4/ 2, 3 01 3 C -55C to +125C without 2, 3 02 2 external calibration. 3/ 4/ 2, 3 03 1.6 2, 3 04, 05 1 Nonlinearity NL -55C to +150C 3/ 4/ 5/ 2, 3 01 1.5 C -55C to +125C without 2, 3 02 0.8 external calibration. 2, 3 03 0.4 3/ 4/ 5/ 2, 3 0

46、4, 05 0.3 Repeatability RPT Max deviation between +25C readings after temperature. Cycling between -55C and +150C. 3/ 5/ 6/ 1, 2, 3 All 0.1 C Long-term drift E/T Constant +5 V; Constant +125C 3/ 5/ All 0.1 C/ month See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networ

47、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87571 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ 2/ -55C TA+125C VS= +5 V unl

48、ess otherwise specified Group A subgroups Device type Limits Unit Min Max Power supply rejection ratio PSRR +4 V VS +5 V 3/ 5/ 1 All 1 C/V +5 V VS +15 V 3/ 5/ 0.4 +15 V VS +30 V 3/ 5/ 0.2 Power supply voltage range VS3/ 5/ 1 All +4 V +30 1/ Device types 03 and 04 supplied to this drawing have been characterized through all levels P, L, R of irradiation. Device type 05 supplied to this drawing has been characterized through all levels P and L of irradiation. Howev