DLA SMD-5962-87569 REV D-2007 MICROCIRCUIT DIGITAL ECL DUAL 4-5 INPUT OR NOR GATE MONOLITHIC SILICON《硅单块 双4-5输入或非门 发射极耦合逻辑 数字微型电路》.pdf

《DLA SMD-5962-87569 REV D-2007 MICROCIRCUIT DIGITAL ECL DUAL 4-5 INPUT OR NOR GATE MONOLITHIC SILICON《硅单块 双4-5输入或非门 发射极耦合逻辑 数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-87569 REV D-2007 MICROCIRCUIT DIGITAL ECL DUAL 4-5 INPUT OR NOR GATE MONOLITHIC SILICON《硅单块 双4-5输入或非门 发射极耦合逻辑 数字微型电路》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R063-92. 91-12-09 Monica L. Poelking B Changes in accordance with NOR 5962-R171-92. 92-04-17 Monica L. Poelking C Changes in accordance with NOR 5962-R127-93. 93-04-12 Monica L. Poelking D Redrawn with changes.

2、 Update drawing to current requirements. Editorial changes throughout. - gap 07-06-12 Robert M. Heber The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Monica L. Gr

3、osel DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT, DIGITAL, ECL, DUAL 4-5 AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAW

4、ING APPROVAL DATE 87-07-17 INPUT OR/NOR GATE, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-87569 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E220-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWIN

5、G SIZE A 5962-87569 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2

6、Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87565 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic numbe

7、r Circuit function 01 10H609 Dual 4-5 input OR/NOR gate 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat pack 2 CQCC1-N2

8、0 20 leadless square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range -8.0 V dc to 0.0 V dc Input voltage range . 0.0 V dc to -5.2 V dc Storage temperature range . -65C to +165C Lead temperature (solderin

9、g, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) 211 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) . -5.46 V minimum to -4.94 V maximum Ambient operating temperature range (TA) . -55C

10、to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V dc TA= +125C -0.650 V dc TA= -55C . -0.840 V dc Maximum low level input voltage (VIL) . -1.950 V dc Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

11、A 5962-87569 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specifi

12、ed herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard

13、Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quic

14、ksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes p

15、recedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and

16、as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers a

17、pproved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications sh

18、all not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-P

19、RF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The log

20、ic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as speci

21、fied in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reprodu

22、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87569 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shal

23、l be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compli

24、ance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Cert

25、ificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the m

26、anufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of

27、change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall

28、be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on a

29、ll devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available

30、 to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall

31、 be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87569 DEFENS

32、E SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 Quiescent conditions 1/ VIHVIL-0.

33、780 -1.950 1 -1.010 -0.780 -0.650 -1.950 2 -0.860 -0.650 High level output voltage VOH-0.840 -1.950 3 -1.060 -0.840 V -0.780 -1.950 1 -1.950 -1.580 -0.650 -1.950 2 -1.950 -1.565 Low level output voltage VOL-0.840 -1.950 3 -1.950 -1.610 V -1.110 -1.480 1 -1.010 -0.780 -0.960 -1.465 2 -0.860 -0.650 Hi

34、gh level threshold output voltage VOHA-1.160 -1.510 3 -1.060 -0.840 V -1.110 -1.480 1 -1.950 -1.580 -0.960 -1.465 2 -1.950 -1.565 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V VCC= 0.0 V VEE= -5.2 V 2/ -1.160 -1.510 3 -1.950 -1.610 V 1 -30 Power supply drain current

35、 IEE3/ 2, 3 -33 mA 1 350 2 915 High level input current IIH3 560 A 1, 3 0.5 Low level input current IILOutputs terminated through 100 to -2.0 V VEE= -5.2 V VCC= 0.0 V All inputs 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens

36、e from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87569 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified G

37、roup A subgroups Min Max Unit Cases E and F DC rapid test conditions 4/ VIHVIL-0.789 -1.950 1 -1.018 -0.789 -0.660 -1.950 2 -0.869 -0.660 High level output voltage VOH-0.850 -1.950 3 -1.069 -0.850 V -0.789 -1.950 1 -1.950 -1.583 -0.660 -1.950 2 -1.950 -1.568 Low level output voltage VOL-0.850 -1.950

38、 3 -1.950 -1.613 V -1.118 -1.483 1 -1.018 -0.789 -0.969 -1.468 2 -0.869 -0.660 High level threshold output voltage VOHA-1.169 -1.513 3 -1.069 -0.850 V -1.118 -1.483 1 -1.950 -1.583 -0.969 -1.468 2 -1.950 -1.568 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V VCC= 0.0

39、V VEE= -5.2 V 2/ -1.169 -1.513 3 -1.950 -1.613 V 1 -29 Power supply drain current IEE3/ 2, 3 -32 mA 1 335 2 900 High level input current IIH3 545 A 1, 3 0.5 Low level input current IILOutputs terminated through 100 to -2.0 V VEE= -5.2 V VCC= 0.0 V All inputs 2 0.3 A See footnotes at end of table. Pr

40、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87569 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Co

41、ntinued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Case 2 DC rapid test conditions 4/ VIHVIL-0.795 -1.950 1 -1.024 -0.795 -0.666 -1.950 2 -0.875 -0.666 High level output voltage VOH-0.856 -1.950 3 -1.075 -0.856 V -0.795 -1.950 1 -1.950 -1.5

42、85 -0.666 -1.950 2 -1.950 -1.570 Low level output voltage VOL-0.856 -1.950 3 -1.950 -1.615 V -1.124 -1.485 1 -1.024 -0.795 -0.975 -1.470 2 -0.875 -0.666 High level threshold output voltage VOHA-1.175 -1.515 3 -1.075 -0.856 V -1.124 -1.485 1 -1.950 -1.585 -0.975 -1.470 2 -1.950 -1.570 Low level thres

43、hold output voltage VOLAOutputs terminated through 100 to -2.0 V VCC= 0.0 V VEE= -5.2 V 2/ -1.175 -1.515 3 -1.950 -1.615 V 1 -29 Power supply drain current IEE3/ 2, 3 -32 mA 1 335 2 900 High level input current IIH3 545 A 1, 3 0.5 Low level input current IILOutputs terminated through 100 to -2.0 V V

44、EE= -5.2 V VCC= 0.0 V All inputs 2 0.3 A Cases E, F, and 2 AC test conditions 9 0.40 1.50 10 0.40 1.60 Transition time tTLH, tTHL, t+, t- 11 0.40 1.35 ns 9 0.40 1.40 10 0.40 1.90 Propagation delay time, any input to any output tPHH, tPLL, tPHL, tPLHVEE= -2.94 V VCC= 2.0 V CL 5 pF Load all outputs th

45、rough 100 to ground All inputs See figure 4 11 0.40 1.30 ns 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C air blowing on the unit and with power applied for at least 4 minu

46、tes before the reading is taken. 2/ The high and low level output current varies with temperature, and shall be calculated using the following formulas: IOH= (-2.0 V - VOH)/100 IOL= (-2.0 V - VOL)/100 3/ The IEElimits, although specified in the minimum column, shall not be exceeded, in magnitude, as

47、 a maximum value. 4/ The dc rapid test forcing functions and limits are used for all dc testing. These limits are determined for each device type based on the power dissipation and package type. The rapid test (delta V) limits and forcing functions are skewed allowing rapid testing to be performed a

48、t standard temperatures without the addition of delta Ts. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87569 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case outlines E F 2 Terminal number Terminal symbol 1 VCC1B5 NC 2 Y1 2Y VCC13 1Y Y2 Y1 4 A1 VCC21Y 5 A2 VCC1A1 6 A3 Y1 NC 7 A4 1Y A2 8 VEEA1 A3 9 B1 A2 A4 10 B2 A3 VEE11 B3 A4 NC 12 B4 VEEB1 13 B5 B1 B2 14 2Y B2 B3 15 Y2 B3 B4 16