DLA MIL-PRF-11693 E-2012 CAPACITORS FEED THROUGH RADIO-INTERFERENCE REDUCTION DC (HERMETICALLY SEALED IN METAL CASES) ESTABLISHED AND NON-ESTABLISHED RELIABILITY GENERAL SPECIFICAT.pdf

《DLA MIL-PRF-11693 E-2012 CAPACITORS FEED THROUGH RADIO-INTERFERENCE REDUCTION DC (HERMETICALLY SEALED IN METAL CASES) ESTABLISHED AND NON-ESTABLISHED RELIABILITY GENERAL SPECIFICAT.pdf》由会员分享，可在线阅读，更多相关《DLA MIL-PRF-11693 E-2012 CAPACITORS FEED THROUGH RADIO-INTERFERENCE REDUCTION DC (HERMETICALLY SEALED IN METAL CASES) ESTABLISHED AND NON-ESTABLISHED RELIABILITY GENERAL SPECIFICAT.pdf（25页珍藏版）》请在麦多课文档分享上搜索。

1、 AMSC N/A FSC 5910 INCH-POUND MIL-PRF-11693E 17 August 2012 SUPERSEDING MIL-PRF-11693D 9 August 2001 PERFORMANCE SPECIFICATION CAPACITORS, FEED THROUGH, RADIO-INTERFERENCE REDUCTION, DC (HERMETICALLY SEALED IN METAL CASES), ESTABLISHED AND NON-ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR This s

2、pecification is approved for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the general requirements for established reliability (ER) and non-ER capacitors designed for operation with direct current (dc), paper, paper plastic, and plas

3、tic (extended foil) dielectric, radio-interference-reduction, feed-through capacitors, hermetically sealed in metal cases (see 6.6.2), for use primarily in broadband, radio-interference suppression application. Capacitors meeting the established reliability requirements specified herein have a maxim

4、um failure rate of 1.0 percent per 1,000 hours. This failure rate is established with a 90-percent confidence limit based on the life test parameters specified and are maintained at a 10-percent producers risk. An acceleration factor of 5:1 has been used to relate the life test data obtained at 140

5、percent of rated dc voltage at the applicable high test temperature to the rated voltage at the applicable high test temperature. 1.2 Classification. 1.2.1 Part or Identifying Number (PIN). The PIN is in the following form, and as specified (see 3.1): CZR23 B K B 473 M ER Style Current Characteristi

6、c Voltage Capacitance Failure rate level (1.2.1.1) (1.2.1.2) (1.2.1.3) (1.2.1.4) (1.2.1.5) (1.2.1.6) CZ23 B K B 473 NON-ER Style Current Characteristic Voltage Capacitance (1.2.1.1) (1.2.1.2) (1.2.1.3) (1.2.1.4) 1.2.1.5 Comments, suggestions or questions on this document should be addressed to DLA L

7、and and Maritime, ATTN: VAT, Post Office Box 3990, Columbus, OH 43218-3990, or emailed to capacitorfilterdla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at https:/assist.dla.mil. Provided by IHSNot for Re

8、saleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-11693E 2 1.2.1.1 Style. The style is identified by either the three-letter symbol “CZR” or the two-letter symbol “CZ” followed by a two-digit number. The letters identify dc, radio-interference reduction feed through ca

9、pacitors, hermetically sealed in metal cases. The symbol “CZR” identifies established reliability (ER) capacitors; the symbol “CZ” identifies capacitors for which no specific reliability requirements are specified (non-ER). The first digit following the letter symbols identifies the general shape of

10、 the case, and the second digit identifies specific details other than case size. Each style designation may include a family of case sizes. 1.2.1.2 Current. The current rating is identified by a single letter in accordance with table I. TABLE I. Current rating. Symbol Current rating (dc amperes) B

11、10 1.2.1.3 Characteristic. The characteristic is identified by a single letter in accordance with table II. TABLE II. Characteristic. Values for characteristics K E High ambient test temperature, degrees Celsius 3C +125 +85 Low ambient test temperature, degrees Celsius 3C -55 -55 Life-test voltage (

12、see 4.7.19), in percent of rated dc voltage rating 140 140 Capacitance tolerance (percent) 10 10 1.2.1.4 Voltage. The voltage rating is identified by a single letter in accordance with table III. TABLE III. Voltage rating. Symbol Voltage rating (Volts, dc) B 100 C 200 E 400 F 600 1.2.1.5 Capacitance

13、. The nominal capacitance value expressed in picofarad (pF) is identified by a three-digit number; the first two digits represent significant figures and the last digit specifies the number of zeros to follow. 1.2.1.6 Failure rate level. The failure rate level of 1.0 percent per 1,000 hours is ident

14、ified by a symbol M, and is based on operation at rated working voltage and maximum rated temperature. 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include documents cited in other sections of

15、 this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3 and 4 of this specification, whether or

16、 not they are listed. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-11693E 3 2.2 Government documents. 2.2.1 Specifications. standards. and handbooks. The following specifications, standards, and handbooks form a part of this document to th

17、e extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract (See 6.2). FEDERAL STANDARDS FED-STD-H28 - Screw-Thread Standards for Federal Services. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-11693/7 - Capacitors, Feed Through

18、, Radio-Interference Reduction, DC (Hermetically Sealed in Metal Cases), Established and Non-Established Reliability, Styles CZ23, CZ24, CZR23 and CZR24. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Method Standard Electronic and Electrical Component Parts. MIL-STD-220 - Method of Insertion Lo

19、ss Measurement. MIL-STD-690 - Failure Rate Sampling Plans and Procedures. MIL-STD-790 - Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications. MIL-STD-1285 - Marking of Electrical and Electronic Parts. (Cop

20、ies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Non-Government publications. The following documents form a part of this document to the extent specif

21、ied herein. Unless otherwise specified, the issues of the documents are those listed in the solicitation or contract. ASTM INTERNATIONAL (ASTM) ASTM D92 - Standard Test Method for Flash and Fire Points by Cleveland Open Cup Tester. (Copies of this document are available online at www.astm.org or fro

22、m ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959.) INTERNATIONAL ORGANIZATION FOR STANDARDIZATION (ISO) ISO 10012 - Measurement Management Systems - Requirements for Measurement Processes and Measuring Equipment. (Copies of this document are available online at www.iso.o

23、rg or from the International Organization for Standardization, 1, ch. de la Voie-Creuse, Case postale 56, CH-1211 Geneva 20, Switzerland.) NATIONAL CONFERENCE OF STANDARDS LABORATRIES (NCSL) NCSL Z540.3 - Requirements for the Calibration of Measuring and Test Equipment. (Copies of this document are

24、available online at www.ncsli.org or from NCSL International, 1800 30th Street, Suite 305, Boulder, CO 80701-1026.) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-11693E 4 TECHAMERICA EIA-554-1 - Assessment of Average Outgoing Quality Levels

25、 in Parts per Million (PPM) . EIA-557 - Statistical Process Control Systems. (Copies of these documents are available online at http:/www.techamerica.org or from TechAmerica, 601 Pennsylvania Ave. NW, North Building Ste. 600, Washington DC, 20004-2650.) 2.4 Order of precedence. Unless otherwise note

26、d herein or in the contract, in the event of a conflict between the text of this document and the references cited herein (except for related specification sheets), the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a spec

27、ific exemption has been obtained. 3. REQUIREMENTS 3.1 Specification sheets. The individual item requirements shall be as specified herein and in accordance with the applicable specification sheets. In the event of any conflict between the requirements of this specification and the specification shee

28、t, the latter shall govern. 3.2 Qualification. Capacitors furnished under this specification shall be products that are authorized by the qualifying activity for listing on the applicable qualified products list (QPL) before contract award. In addition, the manufacturer shall obtain certification fr

29、om the qualifying activity that the QPL system requirements of 3.3 and 4.4 have been met and are being maintained. Authorized distributors that are approved to MIL-STD-790 distributor requirements by the QPL manufacturers are listed in the QPL. 3.3 QPL system. The manufacturer shall establish and ma

30、intain an internal documentation system for qualified products covered by this specification. Requirements for this system are specified in MIL-STD-690 and MIL-STD-790. In addition, the manufacturer shall establish a Statistical Process Control (SPC) and Part Per Million (PPM) system that meets the

31、requirements of 3.3.1 and 3.3.2, respectively. The following MIL-STD-790 exceptions are allowed: a. Under Description of production processes and controls, the procedure for identification of each production lot shall include only the manufacturer shall as a minimum be able to identify the time peri

32、od during which the final production operation was performed on each item of product prior to final test. The date or lot code marked on each part shall be identified to a production lot. b. Traceability of materials shall not apply. 3.3.1 SPC system. As part of the overall MIL-STD-790 QPL system, t

33、he manufacturer shall establish a SPC system which meets the requirements of EIA-557. Typical manufacturing processes for application of a SPC include pre-assembly, assembly, encapsulation, and packaging. 3.3.2 PPM system. As part of the overall MIL-STD-790 QPL system, the manufacturer shall establi

34、sh a PPM system for assessing the average outgoing quality of lots in accordance with EIA-554-1. Data exclusion, in accordance with EIA-554-1, may be used with approval of the qualifying activity. The PPM system shall identify the PPM rate at the end of each month and shall be based on a six month m

35、oving average. 3.4 Materials. The materials shall be as specified herein. However, when a definite material is not specified, a material shall be used which will enable the capacitors to meet the performance requirements of this specification. Acceptance or approval of any constituent material shall

36、 not be construed as a guaranty of the acceptance of the finished product. 3.4.1 Impregnating and filling compounds. Compounds used in the impregnation and filling of capacitors shall be chemically inactive with respect to the capacitor element and the case (see 3.5.1). The compound either in the st

37、ate of original application or as a result of having aged, shall have no adverse effect on the performance of the capacitor. For liquid-filled capacitors, the same material shall be used for impregnating as is used for filling. Provided by IHSNot for ResaleNo reproduction or networking permitted wit

38、hout license from IHS-,-,-MIL-PRF-11693E 5 3.5 Interface and physical dimension requirements. Capacitors shall meet the interface and physical dimensions specified (see 3.1). 3.5.1 Case. Each capacitor shall be enclosed in a hermetically sealed metal case that will prevent leakage of the impregnant

39、or filling compound, and will protect the capacitor element from moisture and mechanical damage under all test conditions specified herein. 3.5.2 Finish. All exposed metal surfaces shall be suitably protected against corrosion by plating, or other means (see 3.15). The resultant finish shall form a

40、good electrical conductor and shall be free from defects that may affect its protective value. 3.5.2.1 Pure tin. The use of pure tin, as an underplate or final finish, is prohibited both internally or externally, including nuts and washers. Tin content of capacitor components and solder shall not ex

41、ceed 97 percent, by mass. Tin shall be alloyed with a minimum of 3 percent lead, by mass (see 6.9). Lead-free, tin alloy high temperature solders may be used where high temperature solder is necessary with the approval of the qualifying activity. The tin content of lead-free high temperature solders

42、 shall not exceed 97 percent, by mass. 3.5.3 Threaded parts. All threaded parts shall be as specified (see 3.1) and in accordance with FED-STD-H28. Aluminum nuts shall not be used. 3.5.3.1 Engagement of threaded parts. All threaded parts shall engage by at least two full threads. 3.6 Seal. When capa

43、citors are tested as specified in 4.7.2, there shall be no continuous visible stream of bubbles or other evidence of leakage. 3.7 Terminal strength. When capacitors are tested as specified in 4.7.3, no part of the terminal shall loosen or rupture, and there shall be no other damage. Stud-type termin

44、als shall exhibit no perceptible movement relative to the case, under the applied torque. 3.8 Dielectric withstanding voltage. When capacitors are tested as specified in 4.7.4, there shall be no visible damage, flashover, breakdown, open-circuiting or short-circuiting. 3.9 Insulation resistance. Whe

45、n measured as specified in 4.7.5, the insulation resistance, shall be not less than the applicable value specified in table IV and shown on figure 1. For measurements made at temperatures between +20 and +35C, the applicable correction factor specified in table V shall be applied. TABLE IV. Insulati

46、on resistance measurements. Capacitance rating Minimum insulation resistance Characteristic K At +25C 0 to 0.33 microfarads A 18,000 megohms Greater than 0.33 microfarads 6,000 megohm-microfarads 1/ At +125C 0 to 0.067 microfarads 150 megohms Greater than 0.067 microfarads 10 megohm-microfarads 1/ C

47、haracteristic E At +25C 0 to 0.33 microfarads 6,000 megohms Greater than 0.33 microfarads 2,000 megohm-microfarads 1/ At +85C 0 to 0.033 microfarads 600 megohms Greater than 0.033 microfarads 20 megohm-microfarads 1/ 1/ Product obtained by multiplying the capacitance in microfarads (F) by the insula

48、tion resistance. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-11693E 6 TABLE V. Insulation-resistance correction factors. Temperature (Degrees C) Correction factor 1/ Temperature (Degrees C) Correction factor 1/ Temperature (Degrees C) Cor

49、rection factor 1/ Temperature (Degrees C) Correction factor 1/ 20 1.42 24 1.08 28 0.82 32 0.63 21 1.33 25 1.00 29 0.76 33 0.59 22 1.24 26 0.94 30 0.71 34 0.55 23 1.16 27 0.87 31 0.67 35 0.51 1/ These correction factors are to be applied to the required values, not to the measured values. FIGURE 1. Insulation-resistance curve for characteristics K and E. Provided by IHSNot for ResaleNo reproduction or networking permit