DLA MIL-DTL-83723 G-2009 CONNECTORS ELECTRICAL (CIRCULAR ENVIRONMENT RESISTING) RECEPTACLES AND PLUGS GENERAL SPECIFICATION FOR.pdf

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1、 MIL-DTL-83723G 7 December 2009 SUPERSEDING MIL-DTL-83723F 20 October 2000 DETAIL SPECIFICATION CONNECTORS, ELECTRICAL, (CIRCULAR, ENVIRONMENT RESISTING), RECEPTACLES AND PLUGS, GENERAL SPECIFICATION FOR This specification is approved for use by all Departments and Agencies of the Department of Defe

2、nse. 1. SCOPE 1.1 Scope. This specification covers the general requirements for environment resisting, circular, electrical connectors and their associated contacts and accessories. These connectors must utilize crimp or solder contacts and be capable of operation within the specified range (see 3.4

3、.6.1). 1.1.1 Series description. Basic series of connectors are as follows: a. Series I - Type B bayonet coupling. Transferred to MIL-DTL-26482 series II, as applicable (see 6.5.1). b. Series II - Type T threaded coupling, intermateable with MIL-DTL-5015. (Inactive for new design, use: MS3450, MS345

4、1, MS3452, MS3456, and MS3459 of MIL-DTL-5015, as applicable.) c. Series III - Type T threaded and type B bayonet coupling connectors, intermateable with applicable MIL-DTL-26500 connectors (see section 6). In addition, requirements for hermetic receptacles with nonremovable contacts are included. T

5、he hermetic receptacle must mate with the appropriate bayonet or threaded type connector and must meet the same temperature requirements. AMSC N/A FSC 5935 INCH - POUND Comments, suggestions, or questions on this document should be addressed to Defense Supply Center Columbus, ATTN: VAI, P.O. Box 399

6、0, Columbus OH 43218-3990 or emailed to circularconnectordscc.dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at https:/assist.daps.dla.mil. Provided by IHSNot for ResaleNo reproduction or networking perm

7、itted without license from IHS-,-,-MIL-DTL-83723G 2 1.2 Classification. The classes and types (either bayonet or threaded coupling) are as follows: Class Type Applicable series Description A B III Aluminum shell, anodize, nonconductive finish, fluid resistant insert. T II, III F Cancelled, supersede

8、d by class R. G B III Stainless steel shell, passivated, fluid resistant insert. T II, III H (Hermetic) B III Steel shell, tin finish, fluid resistant, interfacial sealing gasket, solder cup contacts and feed thru (straight pin) contacts. T II, III J (Hermetic) B III Steel shell, tin finish, fluid r

9、esistant interfacial sealing gasket, eyelet contacts. T II, III K (Firewall) T II, III Stainless steel shell, passivated, fluid resistant insert. L (Hermetic) T III Receptacles, electrodeposited nickel finish, fluid resistant insert, eyelet contacts. M B III Aluminum shell, electrodeposited aluminum

10、, conductive, finish, nonreflective, 500 hours salt spray, fluid resistant insert. T II, III N (Hermetic) T III Plugs, electrodeposited nickel finish, fluid resistant insert, RFI grounding, firewall, self locking. Receptacles, electrodeposited nickel finish, fluid resistant insert, hermetic, solder

11、cup contacts. P (Hermetic) B III Stainless steel shell, passivated, fluid resistant interfacial sealing gasket, eyelet contacts. T III R B III Aluminum shell, electroless nickel, conductive finish, fluid resistant insert. T II, III S T III Stainless steel shell, passivated, fluid resistant insert, f

12、irewall (plug and receptacle), RFI grounding, self locking (plug). T B III Aluminum shell, nickel fluorocarbon polymer, conductive finish, nonreflective, 500 hours salt spray, fluid resistant insert. T II, III W B III Aluminum shell, cadmium, conductive finish 500 hours salt spray, fluid resistant i

13、nsert. T II, III Y (Hermetic) B III Stainless steel shell, passivated, fluid resistant interfacial sealing gasket, solder cup contacts and feed thru (straight pin) contacts. T III Z B III Aluminum shell, zinc nickel alloy, conductive finish, nonreflective, 500 hours salt spray, fluid resistant inser

14、t. T II, III Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-83723G 3 1.2.1 Connector classes physical features. Physical features of the connector classes are specified in table I. TABLE I. Connector classes physical feature. Class A G H 1/

15、J 1/ K 2/ L 1/ M N 2/ N 1/ P 1/ R S T W Y 1/ Z Series II X X X X X X X X X X Series III X X X X X X X X X X X X X X X X Bayonet coupling X X X X X X X X X X X Threaded coupling X X X X X X X X X X X X X X X X Solder hermetic X X X Eyelet X X X Crimp X X X X X X X X X X Grounding fingers X X X X X X

16、X Firewall X X X Temperature C 200 200 150 150 200 200 175 200 200 200 200 200 175 175 200 175 Self-locking coupling nut series III, type T X 3/ X X X X X 3/ X 3/ X X X 1/ Hermetic 2/ Firewall 3/ See the applicable specification sheets for self-locking feature availability. 1.3 Shell sizes and inser

17、t arrangements. Shell sizes and insert arrangements will be in accordance with MIL-STD-1651 for series II and MIL-STD-1554 for series III. 1.4 Insert position. For all series II and III, positions N through 5, the insert position is the angular position of the insert relative to the master key or ke

18、yway of the shell. For series III, positions 6 through Y, the centerline of the insert is aligned on the centerline of the master key/keyway and the angular positions of the minor key/keyway are rotated in reference to the master key/keyway of the shell. Insert positions other than normal must be in

19、dicated by the letter shown in MIL-STD-1651 for series II, and by the numeral or letter shown in MIL-STD-1554 for series III. 1.5 Accessories. Accessories must consist of the items as specified in the supplement to this document. Provided by IHSNot for ResaleNo reproduction or networking permitted w

20、ithout license from IHS-,-,-MIL-DTL-83723G 4 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional infor

21、mation or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.

22、1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATI

23、ONS MIL-DTL-5015 - Connectors, Electrical, Circular Threaded, AN Type, General Specification for. MIL-S-7742 - Screw Threads, Standard, Optimum Selected Series: General Specification for. MIL-A-8625 - Anodic Coatings for Aluminum and Aluminum Alloys. MIL-DTL-14072 - Finishes for Ground Based Electro

24、nic Equipment. MIL-DTL-22520 - Crimping Tools, Wire Terminal, General Specification for. MIL-R-25988/3 - Rubber, Fluorosilicone Elastomer, Oil and Fuel Resistant, O-Rings, Class I, Grade 60. MIL-I-81969/14 - Installing and Removal Tools, Connector, Electrical Contact, Type III, Class 2 Composition B

25、. MIL-I-81969/15 - Installing and Removal Tools, Connector, Electrical Contact, Type II, Class 2, Composition A. MIL-I-81969/29 - Installing and Removal Tools, Connector, Electrical Contact, Type II, Class 1, Composition B. MIL-DTL-83488 - Coating, Aluminum, High Purity. MS3155 - Connector, Electric

26、, Rear Accessory Design Standard. MS3186 - Connector Mounting to Connectors, Mounting Nuts, Plain Hexagon. MS3461 - Test Gage, MIL-C-0026482 Series 2 or MIL-C-81703 Series 3 Contact Retention Feature. (See supplement 1 for list of specification sheets.) DEPARTMENT OF DEFENSE STANDARDS MIL-STD-790 -

27、Standard Practice for Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts. MIL-STD-810 - Environmental Engineering Considerations and Laboratory Tests. MIL-STD-889 - Dissimilar Metals. MIL-STD-1285 - Marking of Electric

28、al and Electronic Parts. MIL-STD-1554 - Insert Arrangements for MIL-DTL-83723 Series III and MIL-DTL-26500 Environment Resisting, Circular, Electrical Connectors. MIL-STD-1651 - Insert Arrangements for MIL-C-5015, MIL-C-22992 (Classes C, J, and R), and MIL-C-83723 (Series II) Electrical Connectors.

29、Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-83723G 5 DEPARTMENT OF DEFENSE HANDBOOK MIL-HDBK-454 - General Guidelines for Electronic Equipment. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or

30、from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Non-Goverment publications. The following documents form a part of this document to the extent specified herein. Unless otherwise specified, the issues of the documents are those cited in

31、 the solicitation or contract (see 6.2). ASME INTERNATIONAL (ASME) ASME-B46.1 - Surface Texture (Surface Roughness, Waviness and Lay). (Copies of these documents are available online at http:/www.asme.org or from ASME International, Three Park Avenue, New York, NY 10016-5990.) AMERICAN SOCIETY FOR T

32、ESTING AND MATERIALS (ASTM) ASTM-B488 - Gold for Engineering Uses, Electrodeposited Coating of. ASTM-B545 - Standard Specification for Electrodeposited Coatings of Tin. ASTM-B841 - Standard Specification for Electrodeposited Coatings of Zinc Nickel Alloy Deposits. (Copies of these documents are avai

33、lable online at http:/www.astm.org or from the ASTM International, P.O. Box C700, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959.) ELECTRONIC INDUSTRIES ALLIANCE (EIA) EIA-359 - EIA Standard Colors for Color Identification and Coding. EIA-364 - Electrical Connector/Socket Test Procedures in

34、cluding Environmental Classifications. EIA-364-02 - Air Leakage Test Procedure for Electrical Connectors. EIA-364-03 - Altitude Immersion Test Procedure for Electrical Connectors. EIA-364-06 - Contact Resistance Test Procedure for Electrical Connectors. EIA-364-10 - Fluid Immersion for Test Procedur

35、e for Electrical Connectors and Sockets. EIA-364-14 - Ozone Exposure Test Procedure for Electrical Connectors. EIA-364-20 - Withstanding Voltage Test Procedure for Electrical Connectors, Sockets and Coaxial Contacts. EIA-364-21 - Insulation Resistance Test Procedure for Electrical Connectors, Socket

36、s, and Coaxial Contacts. EIA-364-24 - Maintenance Aging Test Procedure for Electrical Connectors. EIA-364-26 - Salt Spray Test Procedures for Electrical Connectors, Contacts and Sockets. EIA-364-27 - Mechanical Shock (Specified Pulse) Test Procedures for Electrical Connectors. EIA-364-28 - Vibration

37、 Test Procedure for Electrical Connectors and Sockets. EIA-364-29 - Contact Retention Test Procedure for Electrical Connectors. EIA-364-31 - Humidity Test Procedure for Electrical Connectors and Sockets. EIA-364-32 - Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and So

38、ckets. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-83723G 6 EIA-364-35 - Insert Retention Test Procedure for Electrical Connectors. EIA-364-45 - Firewall Flame Test Procedure for Electrical Connectors. EIA-364-54 - Magnetic Permeability T

39、est Procedure for Electrical Connectors, Contacts and Sockets. EIA-364-78 - Cavity-to-Cavity Leakage Bonding Integrity Test Procedure for Electrical Connectors. EIA-364-83 - Shell-to-Shell and Shell-to-Bulkhead Resistance Test Procedure for Electrical Connectors. EIA-364-105 - Altitude Low Temperatu

40、re Test Procedure for Electrical Connectors. EIA-557 - EIA Statistical Process Control Systems. (Copies of these documents are available online at http:/www.eia.org or from the Electronic Industries Alliance, Technology Strategy small, medium, and large. Specimens shall be less inserts and contacts,

41、 but with RFI backshells, if applicable. d. One wall mounting receptacle counterpart for each of the shell sizes selected for 4.4.1c. Specimens shall be less inserts and coupling pins (type B). e. One mating pair of connectors in each class for each fluid specified in any representative insert arran

42、gement. f. One mating pair of connectors for each fluid specified in classes A, G, M, R, T, W and Z and classes K, N (firewall), or S straight plugs and wall mounting receptacles of various representative shell sizes and insert arrangement. g. Thirty-five pin contacts, classes H, J, N, L, P or Y of

43、each size. Hermetic contacts shall be in shell/insert assemblies. h. Three mating pairs of class K, N, or S plugs and wall mounting receptacles of various representatives shell sizes. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-83723G 25

44、4.4.2 Preparation of samples. 4.4.2.1 Connector samples. Connector samples with crimp contacts under 4.4.1a, 4.4.1b, and 4.4.1e shall be terminated to a workable length of suitable wire. Half the samples shall utilize wire with outer diameters approaching the maximum limit in table III, and the rema

45、inder shall utilize wire with outer diameters approaching the minimum limit in table III. Connector samples with solder contacts (classes H, N, or Y) shall have 3 feet of suitable nominal gauge terminated thereto. Guidelines for soldering are referenced in MIL-HDBK-454. 4.4.3 Inspection routine. a.

46、Samples provided under 4.4.1a shall be divided into two numerically equal groups. Each group shall contain roughly the same number of samples with the larger diameter wire as with the smaller diameter wire. One group shall be subjected to the tests of group 1, table XIV, in the sequence indicated. T

47、he other group shall be subjected to the tests of group 2, table XIV in the sequence indicated. b. Samples provided under 4.4.1b shall be divided into two similar groups. One group shall be subjected to the tests of group 1, table XIV, in the sequence indicated. The other group shall be subjected to

48、 the tests of group 3, table XIV, in the sequence indicated. c. Samples provided under 4.4.1c shall be subjected to the tests of group 4, table XIV, in the sequence indicated. d. Samples provided under 4.4.1d shall serve as counterparts for the tests in group 4, table XIV. e. Samples provided under

49、4.4.1e shall be subjected to the tests of group 5 table XIV, in the sequence indicated. f. Samples provided under 4.4.1f shall be subjected to the tests of group 6, table XIV, in the sequence indicated. g. Samples provided under 4.4.1g shall be divided and subjected to the tests of group 7, table XIV, in the quantities indicated therein. No