DLA DSCC-DWG-94022 REV G-2000 SEMICONDUCTOR DEVICE DIODE STANDARD RECOVERY《标准恢复二极管半导体器件》.pdf
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1、LTR ake changes to 4.2,4.3.2, and table II. DESCRIPTION DATE APPROVED PREVIOUS CAGE CODE 14933 SUPERSEDED BY 03723. THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. PMIC NIA PreDared in accordance with MIL-STD-100 Selected item drawina PREPARED BY Robert Petty DEFENSE SUPPLY CENTER, COLUMB
2、US COLUMBUS, OH Original date of drawing CHECKED BY Alan Barone TITLE SEMICONDUCTOR DEVICE, DIODE, STANDARD RECOVERY APPROVEDBY Monica Poelking SIZE CODE IDENT. NO. DWG NO. A I REV G I PAGE I OF IO 03723 94022 AMSC NIA DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
3、 5905-E246 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SCOPE I FSM 1 .I Scope. This drawing describes the requirements for standard recovery rectifiers. lo 1.2 Part or Identifvinq Number (PIN). The complete PIN shall be as follows: RNL X94022-
4、O1 XV I I TOP Device type (see 1.2.1) Drawing number L = ,375 1.2.1 Device tvpes. The device type(s) identify the lead length and voltage of the devices as follows: and Device tvpe 94022-01 TXV 94022-1 1 TX 94022-02TXV 94022-1 2TX 94022-03TXV 94022-1 3TX 94022-04TXV 94022-1 4TX inches Fiqure number
5、1 1 1 1 1 1 1 1 TSTG Packaqes Axial lead Axial lead Axial lead Axial lead Axial lead Axial lead Axial lead Axial lead CODE IDENT NO. 03723 1.3 Maximum ratinq. I DWG NO. 94022 VRWM I L = ,375 inches A(PK) 375 375 200 200 375 375 300 300 A(PK) 375 375 94022-01 94022-1 1 94022-04 94022-1 4 94022-02 940
6、22-1 2 94022-03 94022-1 3 500 500 600 600 800 800 1,000 1,000 20 20 20 20 20 20 20 20 1.4 Primarv electrical characteristics. Unless otherwise specified, primary electrical characteristics at TL = +25“C. I R2 VR = rated VRWM TA = +I 00C - mA 0.5 0.1 01 IA 10 3 3 um 1 .O5 1 .O5 1.10 1.10 1.15 1.15 1.
7、15 1.15 um 2.5 2.5 um 1.15 1.15 1.20 1.20 1.25 1.25 1.25 1.25 um E 5 5 5 5 5 5 2.8 5 2.8 5 94022-01 94022-1 1 94022-02 94022-1 2 94022-03 94022-1 3 94022-04 94022-1 4 DEFENSE SUPPLY CENTER, COLUMBUS I COLUMBUS, OHIO SIZE A REV G I PAGE 2 I Provided by IHSNot for ResaleNo reproduction or networking p
8、ermitted without license from IHS-,-,-2. APPLICABLE DOCUMENTS DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO 2.1 Government documents. SIZE CODE IDENT NO. DWG NO. A 03723 94022 REV G PAGE 3 2.1 .I Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
9、 part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation (see 6.2). SPEC IF I CAT I ON D
10、EPARTMENT OF DEFENSE MIL-PRF-19500 - Semiconductor Devices, General Specification for. STANDARD DEPARTMENT OF DEFENSE MIL-STD-750 - Test Methods for Semiconductor Devices. (Unless otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the Defe
11、nse Automated Printing Service, Building 4D (DPM-DODSSP), 700 Robbins Avenue, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, how
12、ever, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Interface and phvsical dimensions. The interface and physical dimensions shall be as specified in MIL-PRF-19500. Package dimensions shall be in accordance with figure 1 herein. 3.1 .I.
13、 Lead material and finish. Lead material shall be copper. Lead finish shall be hot solder dip. Where a choice of lead finish is desired, it shall be specified in the acquisition document. 3.1.2 Internal construction. Multiple chip construction shall not be permitted. 3.2. Abbreviations, svmbol, and
14、definitions. Abbreviations, symbols, and definitions used herein shall be as specified in MIL-PRF-19500. 3.3 Recvcled, recovered, or environmentallv preferable materials. Recycled, recovered, or environmentally preferable materials should be used to the maximum extent possible provided that the mate
15、rial meets or exceeds the operational and maintenance requirements, and promotes economically advantageous life cycle costs. 3.4. Markinq. Marking shall be in accordance with MIL-PRF-19500. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Symbol Inche
16、s Min Max BL 94022-01, -1 1, -02, -12, -03, -13 (94022-04, -14) Millimeters Min Max BD 94022-01, -1 1, -02, -12, -03, -13 (94022-04, -14) PD 94022-01, -1 1, -02, -12, -03, -13 (94022-04, -14) LD ECT 1 .o0 B 94022-01, -1 1, -02, -12, -03, -13 (94022-04, -14) 0.19 4.83 25.4 i-Ec1 0.215 Dimensions 0.22
17、 5.59 0.235 5.46 5.97 0.12 0.057 .O01 0.2 o.12 I 0.14 3.05 3.55 0.063 1.45 1.60 .O25 5.08 I 3.05 I DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE CODE IDENT NO. DWG NO. A 03723 94022 REV G PAGE 4 I 0.37 I 9.40 NOTES: 1. Cathode is marked with a contrasting color band, or three dots spaced 120“
18、apart. 2. B is the dimension of the ceramic only, except for 94022-04, -14 where it designates the glass sleeve. FIGURE 1. Semiconductor device, diode all tvpes. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3.5 Manufacturer eliqibility. To be elig
19、ible to supply devices to this drawing, the manufacturer shall have an approved facility in accordance with MIL-PRF-19500 for at least one line and at least one qualified JAN device listed on QPL-19500. In addition, all devices specified herein shall meet all requirements of MIL-PRF-19500 except qua
20、lification requirements. It is prohibited for a manufacturer not listed on the DESC drawing approval bulletin to mark devices with this drawing number. appendix E MIL-PRF-19500) - 11 3 3.6. Certificate of compliance. A certificate of compliance shall be required from manufacturers requesting to be a
21、 suggested source of supply. TX and TXV levels MIL-STD-750, method 3101 (see 4.4.3 herein) 3.7 Submission of certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in 6.5 herein. The certificate of compliance
22、 submitted of DSCC-VAC, prior to listing as an approved source of supply shall state that the manufacturers product meets the requirements of MIL-PRF-19500 and the requirements herein. 9 10 11 12 - 2/31 13 3.8 Workmanship. The semiconductor shall be uniform in quality and free from any defects that
23、will affect life, serviceability, or appearance. Not applicable Not applicable Subgroup 2 of table I herein and table II herein, steps 1 and 2. MIL-STD-750, method 1038, test condition A, t = 96 hours minimum, TA = +125“C Subgroup 2 of table I herein and table II herein, steps 1 and 2. Scope display
24、 in accordance with method 4023 of MIL-STD-750. 4. VERIFICATION DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO 4.1 Samplinq and inspection. Unless otherwise specified, sampling and inspection procedures shall be performed in accordance with MIL-PRF-19500, and as specified herein. SIZE CODE IDENT NO.
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