DLA DSCC-DWG-11019-2011 INDUCTORS SMD CHIP THIN FILM TIGHT TOLERANCE 0805.pdf
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1、 REVISIONS LTR DESCRIPTION DATE APPROVED Prepared in accordance with ASME Y14.100 Source control drawingREV STATUS REV OF PAGES PAGES 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY Ken Beymer DESIGN ACTIVITY DLA LAND AND MARITIME COLUMBUS, OH 43218-5000 Original date of drawing 12 September 2011 CHECKED BY Ke
2、n Beymer TITLE INDUCTORS, SMD, CHIP, THIN FILM, TIGHT TOLERANCE, 0805 APPROVED BY Michael A. Radecki SIZE A CODE IDENT. NO. 037Z3 DWG NO. 11019 REV PAGE 1 OF 8 AMSC N/A 5950-2011-E03Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIM
3、E COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 11019 REV PAGE 2 1. SCOPE 1.1 Scope. This drawing describes the requirements for inductors, SMD, chip. These inductors are composed of a single or double layer dielectric thin film and are of small size and tight tolerances. 1.2 Part or Identifyin
4、g Number (PIN) The complete PIN is as follows: 11019- 100 J U * Drawing Number Inductance Value (see 1.2.1) Inductance Tolerance (see 1.2.2) Termination Finish (see 1.2.3) Additional Testing Option (see 1.2.4) 1.2.1 Inductance Value. The nominal inductance value, expressed in nanohenries (nH), is id
5、entified by a three-digit number. The first two digits represent significant figures and the last digit specifies the number of zeros to follow. When the nominal value is less than 10 nH, the letter “R” is used to indicate the decimal point. 1R2 indicates 1.2 nH; 150 indicates 15.0 nH. 1.2.2 Inducta
6、nce Tolerance. The inductance tolerance is identified by a single letter in accordance with table I. TABLE I. Inductance Tolerance. Symbol Inductance Tolerance () B 0.1 nH C 0.2 nHD 0.5 nH G 2 percent J 5 percent 1.2.3 Termination Finish. Termination finish is identified by a single letter as shown
7、in table II. TABLE II. Termination Finish. Symbol Termination FinishU Base metallization-barrier metal-solder coated (tin/lead alloy with a minimum of 4 percent lead). 1.2.4 Testing Option. To require additional group C testing, use the appropriate letter from table III. If additional testing is not
8、 desired, leave this location blank. TABLE III. Testing Options. Letter Testing Option C Full additional testing L 500 hours life test only H 500 hours steady state humidity only T 100 temperature cycles only - No additional testing Provided by IHSNot for ResaleNo reproduction or networking permitte
9、d without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 11019 REV PAGE 3 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in section 3 this specification. This section does not include documents cited in other sec
10、tions of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents in section 3 of this specification, whether or not
11、they are listed. 2.2 Government Documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation
12、 or contract. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Methods Standard Electronic and Electrical Component Parts. MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1285 - Marking of Electrical and Electronic Parts. (Copies of these documents are available online at https/assist.da
13、ps.dla.mil/quicksearch or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094). 2.3 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these
14、 documents are those cited in the solicitation or contract. AGILENT TECHNOLOGIES Agilent Application Note 1369-6 - How To Accurately Evaluate Low ESR, High Q RF Chip Devices. Agilent Literature Number 5968-5162E - 8720E Family Network Analyzers Configuration Guide. (Copies of these documents are ava
15、ilable online at http:/ or from Agilent Technologies, Inc., 5301 Stevens Creek Blvd., Santa Clara CA 95051). INTERNATIONAL ELECTROTECHNICAL COMMISION (IEC) IEC 60068-2-58 - Test Methods for Solderability, Resistance to Dissolution of Metallization and to Soldering Heat of Surface Mounting Devices (S
16、MD). IEC 60068-2-21 - Robustness of Terminations and Integral Mounting Devices. (Copies of these documents are available online at http:/ or from Global Engineering Documents, Attn: Customer Service Department, 15 Inverness Way East, Englewood CO 80112-5776). 2.4 Order of precedence. Unless otherwis
17、e noted herein or in the contract, in the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. Pr
18、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 11019 REV PAGE 4 TW B2 LB13. REQUIREMENTS 3.1 Item Requirements. The individual item requirements shall be as specified herein. The
19、se inductors shall be capable of meeting all stated electrical, environmental, and mechanical requirements. 3.2 Pure Tin. The use of pure tin, as an underplate or final finish, is prohibited both internally and externally. Tin content of inductor components and solder shall not exceed 96 percent, by
20、 mass. Tin shall be alloyed with a minimum of 4 percent lead or 4 percent silver, by mass (see 6.4). 3.3 Interface and Physical Dimensions. The interface and physical dimensions shall be as specified herein (see figure 1). NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for gener
21、al information only. FIGURE 1. Physical Dimensions and Configuration. 3.4 Electrical Characteristics. 3.4.1 Electrical Testing. When 100 percent electrically tested, the following conditions will apply: a. Inductance (L) (at +25C): Shall be as specified in 3.4.2. b. Quality Factor (Q) (at +25C): Sha
22、ll be as specified in 3.4.3. c. Direct Current Resistance (Rdc) (at +25C): Shall be as specified in 3.4.4. Inches mm .0039 0.100 .0051 0.130 .0059 0.150 .0098 0.250 .0358 0.910 .0590 1.500 .0831 2.110 Dimensions L .0039 W .0039 T .0051 B1 .0059 B2 .0059 .0831 .0590 .0358 .0098 .0098 Provided by IHSN
23、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 11019 REV PAGE 5 3.4.2 Inductance (L). When tested on Agilent RF Impedance/Material Analyzer in accordance with Agilent Tecnologies Application N
24、ote 1369-6, the Inductance shall be as shown in table IV within required tolerance as shown in table I. Test Frequency: 450 MHz 50MHz. 3.4.3 Quality Factor (Q). When tested on Agilent RF Impedance/Material Analyzer in accordance with Agilent Tecnologies Application Note 1369-6, the Quality Factor sh
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