ASTM C1109-2010 Standard Practice for Analysis of Aqueous Leachates from Nuclear Waste Materials Using Inductively Coupled Plasma-Atomic Emission Spectrometry《使用电感耦合等离子体原子发射光谱法分析核废.pdf
《ASTM C1109-2010 Standard Practice for Analysis of Aqueous Leachates from Nuclear Waste Materials Using Inductively Coupled Plasma-Atomic Emission Spectrometry《使用电感耦合等离子体原子发射光谱法分析核废.pdf》由会员分享,可在线阅读,更多相关《ASTM C1109-2010 Standard Practice for Analysis of Aqueous Leachates from Nuclear Waste Materials Using Inductively Coupled Plasma-Atomic Emission Spectrometry《使用电感耦合等离子体原子发射光谱法分析核废.pdf(7页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: C1109 10Standard Practice forAnalysis of Aqueous Leachates from Nuclear WasteMaterials Using Inductively Coupled Plasma-AtomicEmission Spectroscopy1This standard is issued under the fixed designation C1109; the number immediately following the designation indicates the year oforiginal a
2、doption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice is applicable to the determination of lowconcentration
3、and trace elements in aqueous leachate solutionsproduced by the leaching of nuclear waste materials, usinginductively coupled plasma-atomic emission spectroscopy(ICP-AES).1.2 The nuclear waste material may be a simulated (non-radioactive) solid waste form or an actual solid radioactivewaste material
4、.1.3 The leachate may be deionized water or any natural orsimulated leachate solution containing less than 1 % totaldissolved solids.1.4 This practice should be used by analysts experienced inthe use of ICP-AES, the interpretation of spectral and non-spectral interferences, and procedures for their
5、correction.1.5 No detailed operating instructions are provided becauseof differences among various makes and models of suitableICP-AES instruments. Instead, the analyst shall follow theinstructions provided by the manufacturer of the particularinstrument. This test method does not address comparativ
6、eaccuracy of different devices or the precision between instru-ments of the same make and model.1.6 This practice contains notes that are explanatory and arenot part of the mandatory requirements of the method.1.7 The values stated in SI units are to be regarded as thestandard.1.8 This standard does
7、 not purport to address all of thesafety problems, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Stand
8、ards:2C859 Terminology Relating to Nuclear MaterialsC1009 Guide for Establishing a QualityAssurance Programfor Analytical Chemistry Laboratories Within the NuclearIndustryC1220 Test Method for Static Leaching of MonolithicWaste Forms for Disposal of Radioactive WasteD1193 Specification for Reagent W
9、aterD7035 Test Method for Determination of Metals and Met-alloids in Airborne Particulate Matter by InductivelyCoupled Plasma Atomic Emission Spectrometry (ICP-AES)E135 Terminology Relating to Analytical Chemistry forMetals, Ores, and Related MaterialsE177 Practice for Use of the Terms Precision and
10、 Bias inASTM Test Methods2.2 ISO and European Standards:3ISO 1042 Laboratory GlasswareOne-mark VolumetricFlasksISO 3585 Borosilicate Glass 3.3PropertiesISO 8655 Piston-Operated Volumetric Instruments (6 parts)3. Terminology3.1 For definitions of pertinent terms not listed here, seeTerminology C859.3
11、.2 Definitions:3.2.1 atomic emissioncharacteristic radiation emitted byan electronically excited atomic species. D70353.2.1.1 DiscussionIn atomic (or optical) emission spec-trometry, a very high-temperature environment, such as a1This practice is under the jurisdiction of ASTM Committee C26 on Nucle
12、arFuel Cycle and is the direct responsibility of Subcommittee C26.05 on Methods ofTest.Current edition approved Oct. 1, 2010. Published December 2010. Originallyapproved in 1988. Last previous edition approved in 2004 as C1109 04. DOI:10.1520/C1109-10.2For referenced ASTM standards, visit the ASTM w
13、ebsite, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Available from American National Standards Institute (ANSI), 25 W. 43rd St.,4th Floor, New York, NY 10036, h
14、ttp:/www.ansi.org.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.plasma, is used to create excited state atoms. For analyticalpurposes, characteristic emission signals from elements in theirexcited states are then measured at specif
15、ic wavelengths.3.2.2 background correctionprocess of correcting the in-tensity at an analytical wavelength for the intensity due to theunderlying spectral background of a blank. D70353.2.2.1 DiscussionDuring sample analysis, measurementsare made of the background intensity near the peak wavelengthof
16、 the analytical lines. Correction of the analytical line peakintensity to yield the net line intensity can be made bysubtraction of either (a) a single intensity measurement per-formed on the high or low wavelength side of the analyticalline (single-point background correction), or (b) an interpo-la
17、ted background intensity from background measurementsacquired on both the high and low wavelength sides of theanalytical line (double-point background correction).3.2.3 biasbetween the expectation of the test results andan accepted reference value. E1773.2.4 calibrationthe process by which the relat
18、ionshipbetween net signal intensity and elemental concentration isdetermined for a specific element analysis.3.2.5 calibration blank solutioncalibration solution pre-pared without the addition of any reference solutions. D70353.2.6 calibration curveplot of net signal intensity versuselemental concen
19、tration using data obtained during calibration.3.2.7 calibration reference solution(s)solutions contain-ing known concentrations of one or more elements in 1 % (v/v)nitric acid for instrument calibration.3.2.8 critical limit (LC)minimum significant value of anestimated net signal or concentration, a
20、pplied as a discrimina-tor against background noise. (1)3.2.9 inductively coupled plasma (ICP)a high-temperature discharge generated by a flowing conductive gas,normally argon, through a magnetic field induced by a load coilthat surrounds the tubes carrying the gas. D70353.2.10 instrument check solu
21、tion(s)solution(s) containingall the elements to be determined at concentration levelsapproximating the concentrations in the samples. These solu-tions must also contain 1 % (v/v) nitric acid.3.2.11 interelement correctiona spectral interference cor-rection technique in which emission contributions
22、from inter-fering elements that emit radiation at the analyte wavelengthare subtracted from the apparent analyte emission after mea-suring the interfering element concentrations at other wave-lengths. D70353.2.12 limit of detection (LD)value for which the falsenegative error is B using a given criti
23、cal limit. (1)3.2.12.1 DiscussionIf the analytical standard deviation isconstant with respect to concentration, this can be computed as3.7 times the standard deviation of the analytical results fromten matrix blank samples spiked at approximately the antici-pated detection limit; otherwise, see refe
24、rences (1, 2) foradditional guidance.3.2.13 linear dynamic rangethe elemental concentrationrange over which the calibration curve remains linear to withinthe precision of the analytical method.3.2.14 linearity check solution(s)solution(s) containingthe elements to be determined at concentrations tha
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