EN ISO TS 19397-2018 Determination of the film thickness of coatings using an ultrasonic gage.pdf

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1、Determination of the film thickness of coatings using an ultrasonic gage (ISO/TS 19397:2015)PD CEN ISO/TS 19397:2018BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06National forewordThis Published Document is the UK implementation of CEN ISO/TS 19397:2018. It is ident

2、ical to ISO/TS 19397:2015.The UK participation in its preparation was entrusted to Technical Committee STI/10, Test methods for paints.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary prov

3、isions of a contract. Users are responsible for its correct application. The British Standards Institution 2018 Published by BSI Standards Limited 2018ISBN 978 0 580 99245 2ICS 87.040Compliance with a British Standard cannot confer immunity from legal obligations.This Published Document was publishe

4、d under the authority of the Standards Policy and Strategy Committee on 30 April 2018.Amendments/corrigenda issued since publicationDate Text affectedPUBLISHED DOCUMENTPD CEN ISO/TS 19397:2018TECHNICAL SPECIFICATIONSPCIFICATION TECHNIQUETECHNISCHE SPEZIFIKATIONCEN ISO/TS 19397March 2018ICS 87.040EUR

5、OPEAN COMMITTEE FOR STANDARDIZATIONCOMIT EUROPEN DE NORMALISATIONEUROPISCHES KOMITEE FR NORMUNGCEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2018 CEN Ref. No. CEN ISO/TS 19397:2018: EAll rights of exploitation in any form and by any means reserved worldwide for CEN national Member

6、sDetermination of the film thickness of coatings using an ultrasonic gage (ISO/TS 19397:2015)Dtermination de lpaisseur du feuil de revtement par mesurage ultrasons (ISO/TS 19397:2015)Bestimmung der Schichtdicke von Beschichtungen mittels Ultraschallmessung (ISO/TS 19397:2015)This Technical Specifica

7、tion (CEN/TS) was approved by CEN on 18 January 2018 for provisional application.The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to submit their comments, particularly on the question whether the CEN/TS can be converted

8、into a European Standard.CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in parallel to the CEN/TS) un

9、til the final decision about the possible conversion of the CEN/TS into an EN is reached.CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, I

10、celand, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.English VersionCEN ISO/TS 19397:2018 (E)European forewordThe text of ISO/TS 19397:2015 has been prepared by

11、Technical Committee ISO/TC 35 “Paints and varnishes“ of the International Organization for Standardization (ISO) and has been taken over as CEN ISO/TS 19397:2018 by Technical Committee CEN/TC 139 “Paints and varnishes” the secretariat of which is held by DIN.Attention is drawn to the possibility tha

12、t some of the elements of this document may be the subject of patent rights. CEN shall not be held responsible for identifying any or all such patent rights.According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this

13、Technical Specification: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Ser

14、bia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.Endorsement noticeThe text of ISO/TS 19397:2015 has been approved by CEN as CEN ISO/TS 19397:2018 without any modification.2PD CEN ISO/TS 19397:2018ISO/TS 19397:2015Foreword iv1 Scope .12 Normative references 13 Terms

15、 and definitions .14 Principle 35 Physical principles of the measuring method and of the application .36 Apparatus and materials56.1 Ultrasonic film thickness measuring device 56.2 Couplant 56.3 Calibration standards 57 Calibration, adjustment and checking of the measuring device . 67.1 Calibration

16、67.2 Adjustment . 67.3 Checking the adjustment 68 Procedure of measurement . 69 Temperature influence during the measurement . 610 Precision .710.1 General . 710.2 Repeatability limit 710.3 Reproducibility limit 811 Test report .8Annex A (informative) Qualification of the personnel 10Annex B (inform

17、ative) Determination of precision .11Bibliography .17 ISO 2015 All rights reserved iiiContents PagePD CEN ISO/TS 19397:2018ISO/TS 19397:2015ForewordISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of prepari

18、ng International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in lia

19、ison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Dir

20、ectives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).Attention is drawn to the possibility that s

21、ome of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent decla

22、rations received (see www.iso.org/patents).Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation on the meaning of ISO specific terms and expressions related to conformity assessment, as well as information ab

23、out ISOs adherence to the WTO principles in the Technical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary informationThe committee responsible for this document is ISO/TC 35, Paints and varnishes, Subcommittee SC 9, General test methods for paints and varnishes.iv ISO 2015 Al

24、l rights reservedPD CEN ISO/TS 19397:2018Determination of the film thickness of coatings using an ultrasonic gage1 ScopeThis Technical Specification describes a method for determining the film thickness of coatings on metallic and non-metallic substrates using an ultrasonic gauge.2 Normative referen

25、cesThe following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.ISO 4

26、618, Paints and varnishes Terms and definitions3 Terms and definitionsFor the purposes of this document, the terms and definitions given in ISO 4618 and the following apply.3.1ultrasonic waveacoustic wave having a frequency higher than the range of audibility of the human ear, generally taken as hig

27、her than 20 kHzSOURCE: EN 1330-4:2010, 3.1.13.2longitudinal wavecompressional wavewave in which the particle motion in a material is in the same direction as the propagation of the waveSOURCE: EN 1330-4:2010, 2.3.13.3echoultrasonic pulse reflected to the probeSOURCE: EN 1330-4:2010, 5.5.23.4echo hei

28、ghtecho amplitudeheight of an echo (3.3) indication on the screenSOURCE: EN 1330-4:2010, 5.5.53.5ultrasonic impulseshort-lived ultrasound signal3.6ultrasonic sensorultrasonic probedevice for sending and receiving ultrasonic waves (3.1), mostly based on piezoelectric materialsTECHNICAL SPECIFICATION

29、ISO/TS 19397:2015 ISO 2015 All rights reserved 1PD CEN ISO/TS 19397:2018ISO/TS 19397:20153.7acoustic impedanceZproduct of sound velocity and density of a material3.8reflection coefficientratio of total reflected sound pressure to incident sound pressure at a reflecting surfaceSOURCE: EN 1330-4:2010,

30、 3.4.11Note 1 to entry: For a wave the reflection coefficient R is calculated from the acoustic impedances (3.7) Z1and Z2of the bordering media, for which 1 is the medium of the incoming sound: RZZZZ=+2121For a negative reflection coefficient the phase (3.9) of the reflected signal is changed by 180

31、.3.9phasefraction of a complete wave cycle, expressed as an angleSOURCE: EN 1330-4:2010, 2.2.53.10interfaceboundary between two media, in acoustic contact, having different acoustic impedances (3.7)SOURCE: EN 1330-4:2010, 3.4.13.11sound path travel timetime needed for the sound path travel distanceS

32、OURCE: EN 1330-4:2010, 5.6.33.12couplantcoupling filmmedium interposed between the probe and the object under examination to enable the passage of ultrasonic waves (3.1) between themSOURCE: EN 1330-4:2010, 5.3.23.13A-scan presentationdisplay of the ultrasonic signal in which the X-axis represents th

33、e time and the Y-axis the amplitudeSOURCE: EN 1330-4:2010, 5.5.16Note 1 to entry: Ultrasonic film thickness measuring devices, besides the numerical values of the obtained film thicknesses, normally display A-scans for checking the echo forms and echo sequences on a screen as well.2 ISO 2015 All rig

34、hts reservedPD CEN ISO/TS 19397:2018ISO/TS 19397:20153.14calibrationoperation that, under specified conditions, in a first step, establishes a relation between the quantity values with measurement uncertainties provided by measurement standards and corresponding indications with associated measureme

35、nt uncertainties and, in a second step, uses this information to establish a relation for obtaining a measurement result from an indicationNote 1 to entry: A calibration may be expressed by a statement, calibration function, calibration diagram, calibration curve or calibration table. In some cases,

36、 it may consist of an additive or multiplicative correction of the indication with associated measurement uncertainty.Note 2 to entry: Calibration should not be confused with adjustment of a measuring system (3.15), often mistakenly called “self-calibration”, nor with verification of calibration.Not

37、e 3 to entry: Often, the first step alone in the above definition is perceived as being calibration.SOURCE: ISO/IEC Guide 99:2007, 2.393.15adjustment of a measuring systemadjustmentset of operations carried out on a measuring system so that it provides prescribed indications corresponding to given v

38、alues of a quantity to be measuredNote 1 to entry: Types of adjustment of a measuring system include zero adjustment of a measuring system, offset adjustment and span adjustment (sometimes called “gain adjustment”).Note 2 to entry: Adjustment of a measuring system should not be confused with calibra

39、tion (3.14), which is a prerequisite for adjustment.Note 3 to entry: After adjustment of a measuring system, the measuring system normally should be recalibrated.SOURCE: ISO/IEC Guide 99:2007, 3.113.16working standardstandard which is traceable to the national standardSOURCE: EN 60731:2007, 3.4.1.24

40、 PrincipleThe method described in this Technical Specification determines single film thicknesses from the times of flight of an ultrasonic impulse that is partially reflected at the interfaces of the coating system. The strengths and weaknesses of the method are shown by measuring data for the diff

41、erent film-substrate combinations that are relevant in practice.5 Physical principles of the measuring method and of the applicationWhen measuring the film thickness using ultrasound, longitudinal waves are used because they can be easily generated and can be coupled into a work piece with almost ev

42、ery liquid. As shown in Figure 1, a sensor (6) consists of a piezoelectric disc, for sound generation and for reception, and of a “delay path”. The ultrasonic impulse generated in the sensor first passes the delay path and then spreads through layers 1 to 3 down to the substrate (1) and beyond.On ea

43、ch interface, a fraction of the impinging ultrasonic wave is reflected as a new ultrasonic impulse, while another fraction passes through. The first reflection occurs in the ultrasonic sensor when the ultrasonic impulse impinges on layer 1 (4). ISO 2015 All rights reserved 3PD CEN ISO/TS 19397:2018I

44、SO/TS 19397:2015654321Key1 substrate2 layer 33 layer 24 layer 15 couplant (liquid)6 ultrasonic sensor (sender and receiver)E echo 1, 2, 3Figure 1 Ultrasonic methodUltrasonic impulses are recorded when they are received in the ultrasonic sensor. The distances of time between the ultrasonic impulses c

45、orrespond to the sound path travel times Ti(i = 1, 2, 3) in the three individual layers. The amplitude or echo height of the ultrasonic impulse reflected on each interface depends on the respective reflection factors. If the sound velocity in each single layer is known, the respective film thickness

46、 can be calculated by means of the times of flight. For each layer, Formula (1) applies:vtT=d/2(1)wherev is the sound velocity;tdis the dry film thickness;T is the sound path travel time in the layer (back and forth).In order to be able to resolve echoes with short intervals of sound path travel tim

47、es with the naked eye (e.g. 20 ns in a 20 m thick coating), the ultrasonic impulses shall be at least just as short. For this, the ultrasonic frequencies shall be respectively high (at least the reciprocal of half of the time of flight) or the A-scan shall be generated from lower frequencies by mean

48、s of digital signal processing. For an example of an A-scan, see Figure 2.When layers are too thin, the echoes of the individual layers merge into each other. In this case, an optic control of the evaluation in the A-scan presentation is no longer possible.In cases where the A-scan presentation show

49、s positive and negative half-waves, it shall be taken into account that for a negative reflection factor (Z2200 MHz. Devices with frequencies below 200 MHz are not suitable for all substrates.Prior to measuring, all of the devices were calibrated in accordance with the manufacturers information.B.4 Repeat determinationOn each test specimen the determination was carried out in triplicate.The three measuring points were marked on each test specimen.B.5 EvaluationB.5.1 GeneralThe evaluation of the measuring results was carried out i