IEEE 1450-1999 en Standard Test Interface Language (STIL) for Digital Test Vector Data (IEEE Computer Society)《数字试验向量的标准界面试验语言(STIL)》.pdf

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1、IEEE Std 1450-1999(R2011) IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 18 March 1999 Reaffirmed 16 June 2011 IEEE-SA Standards Board Abstract: Standard Test Interface Language (STIL) provid

2、es an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of

3、digital test vectors to a DUT; and (c) sup-ports the volume of test vector data generated from structured tests. Keywords: automatic test pattern generator (ATPG), built-in self-test (BIST), computer-aided engineering (CAE), cyclize, device under test (DUT), digital test vectors, event, functional v

4、ectors, pattern, scan vectors, signal, structural vectors, timed event, waveform, waveshape The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 1999 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Publi

5、shed 1 September 1999. Printed in the United States of America. Print: ISBN 0-7381-1646-7 SH94734 PDF: ISBN 0-7381-1647-5 SS94734 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Sta

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23、yright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 1999 IEEE. All rights reserved. iiiI

24、ntroduction(This introduction is not part of IEEE Std 1450-1999, IEEE Standard Test Interface Language (STIL) for Digital TestVector Data.)Standard Test Interface Language (STIL) was initially developed by an ad-hoc consortium of test equipmentvendors, computer-aided engineering (CAE) and computer-a

25、ided design (CAD) vendors, and integrated cir-cuit (IC) manufacturers, to address the lack of a common solution for transferring digital test data from thegeneration environment to the test equipment.The need for a common interchange format for large volumes of digital test data was identified as an

26、 overrid-ing priority for the work; as such, the scope of the work was constrained to those aspects of the test environ-ment that contribute significantly to the volume issue, or are necessary to support the comprehension of thatdata. Binary representations of data were a key consideration in these

27、efforts, resulting in a proposal to incor-porate the compression of files as part of this standard.Limiting the scope of any standards project is a difficult thing to do, especially for a room full of engineers.However, issues that did not impact the scope as identified were dropped from considerati

28、on in this versionof the standard. Subclause 1.1 covers, specifically, the capabilities that are not intended to be part of this firststandard.Early work in this consortium consisted of identifying the requirements necessary to address this problemand reviewing existing options and languages in the

29、industry. All options proposed fell short of addressingthe requirements, and the consortium started to define a new language. This work was executed with heavyleverage from some existing languages and environments, and STIL owes much to the groundwork estab-lished by these other languages.Participan

30、tsWhen the STIL Working Group approved this standard, it had the following membership:Greg Maston, Co-chairTony Taylor, Co-chairThe technical subgroup consisted of the following members:Other working group members were as follows:Dave DowdingBrady HarveyBrad HinckleLarry MoranGary MurrayChris Nelson

31、Don OrganMike PurtellJim WardGregg WilderSrinivas AjjarapuPhil BarchAjit BhaveFred BernecheJoe CarboneDon DenburgGivargis A. DanialyTom MunnsEric ParkerFrank PeytonGary RainesTim WagnerTom WilliamsPeter WohlStefan Zschiegneriv Copyright 1999 IEEE. All rights reserved.The following members of the bal

32、loting committee voted on this standard:The Working Group thanks those companies that contributed concepts and ideas to this effort, in addition topeople and time. These contributions helped to define the language presented in this standard. In particular,the Working Group would like to thank: LTX C

33、orporation, for providing information about the enVisionenvironment; Motorola, Incorporated, for providing information about the Universal Test Interface Code(UTIC); Test Systems Strategies, Incorporated, for providing information about the Waveform GenerationLanguage (WGL); and Texas Instruments, I

34、ncorporated, for providing information about the Test Descrip-tion Language (TDL).When the IEEE-SA Standards Board approved this standard on 18 March 1999, it had the followingmembership:Richard J. Holleman, Chair Donald N. Heirman, Vice ChairJudith Gorman, Secretary*Member EmeritusAlso included is

35、the following nonvoting IEEE-SA Standards Board liaison:Robert E. HebnerJanet RutiglianoIEEE Standards Project EditorPhil BarchKenneth M. ButlerJoe CarboneDonald DenburgDave DowdingGrady GilesGary GinnGary HancockBrady HarveyMitsuaki IshikawaBrion KellerFadi MaamariGregory A. MastonColin MaunderLarr

36、y L. MoranTom MunnsWayne NeedhamChris NelsonJim OReillyFrank PeytonMike PurtellHira RangaGordon RobinsonJohn W. SheppardWilliam R. SimpsonTony TaylorJon UdellJim WardGregg WilderPeter WohlStefan ZschiegnerSatish K. AggarwalDennis BodsonMark D. BowmanJames T. CarloGary R. EngmannHarold E. EpsteinJay

37、Forster*Ruben D. GarzonJames H. GurneyLowell G. JohnsonRobert J. KennellyE. G. “Al” KienerJoseph L. Koepfinger*L. Bruce McClungDaleep C. MohlaRobert F. MunznerLouis-Franois PauRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonAkio TojoHans E. WeinrichDonald W. ZipseCopyright 1999 IEEE

38、. All rights reserved. vContents1. Overview 11.1 Scope 31.2 Purpose. 42. References 43. Definitions, acronyms, and abbreviations 43.1 Definitions 43.2 Acronyms and abbreviations 74. Structure of this standard . 75. STIL orientation and capabilities tutorial (informative)85.1 Hello Tester 85.2 Basic

39、LS245. 135.3 STIL timing expressions/”Spec” information 175.4 Structural test (scan) 225.5 Advanced scan . 265.6 IEEE Std 1149.1-1990 scan . 325.7 Multiple data elements per test cycle. 375.8 Pattern reuse/direct access test. 415.9 Event data/non-cyclized STIL information . 456. STIL syntax descript

40、ion. 556.1 Case sensitivity 556.2 Whitespace. 556.3 Reserved words 556.4 Reserved characters . 576.5 Comments 586.6 Token length 586.7 Character strings 586.8 User-defined name characteristics . 596.9 Domain names . 596.10 Signal and group name characteristics.606.11 Timing name constructs. 606.12 N

41、umber characteristics. 606.13 Timing expressions and units (time_expr). 616.14 Signal expressions (sigref_expr) 636.15 WaveformChar characteristics. 646.16 STIL name spaces and name resolution. 657. Statement structure and organization of STIL information . 677.1 Top-level statements and required or

42、dering 687.2 Optional top-level statements 707.3 STIL files . 70vi Copyright 1999 IEEE. All rights reserved.8. STIL statement. 708.1 STIL syntax 708.2 STIL example. 709. Header block 719.1 Header block syntax. 719.2 Header example . 7110. Include statement . 7110.1 Include statement syntax 7210.2 In

43、clude example. 7210.3 File path resolution with absolute path notation 7210.4 File path resolution with relative path notation . 7211. UserKeywords statement . 7311.1 UserKeywords statement syntax 7311.2 UserKeywords example. 7312. UserFunctions statement 7312.1 UserFunctions statement syntax 7412.2

44、 UserFunctions example 7413. Ann statement 7413.1 Annotations statement syntax 7413.2 Annotations example . 7414. Signals block 7414.1 Signals block syntax 7514.2 Signals block example . 7715. SignalGroups block 7715.1 SignalGroups block syntax 7715.2 SignalGroups block example . 7815.3 Default attr

45、ibute values 7815.4 Translation of based data into WaveformChar characters. 7916. PatternExec block 8016.1 PatternExec block syntax. 8116.2 PatternExec block example 8117. PatternBurst block 8117.1 PatternBurst block syntax 8217.2 PatternBurst block example . 83Copyright 1999 IEEE. All rights reserv

46、ed. vii18. Timing block and WaveformTable block 8318.1 Timing and WaveformTable syntax 8418.2 Waveform event definitions. 8718.3 Timing and WaveformTable example . 8918.4 Rules for timed event ordering and waveform creation. 9018.5 Rules for waveform inheritance. 9319. Spec and Selector blocks . 941

47、9.1 Spec and Selector block syntax 9419.2 Spec and Selector block example 9620. ScanStructures block 9720.1 ScanStructures block syntax 9820.2 ScanStructures block example . 9921. STIL Pattern data . 10021.1 Cyclized data 10021.2 Multiple-bit cyclized data 10121.3 Non-cyclized data 10221.4 Scan data

48、 10221.5 Pattern labels 10322. STIL Pattern statements. 10322.1 Vector (V) statement 10322.2 WaveformTable (W) statement 10422.3 Condition (C) statement. 10422.4 Call statement. 10522.5 Macro statement. 10522.6 Loop statement. 10622.7 MatchLoop statement. 10622.8 Goto statement . 10722.9 BreakPoint

49、statements 10722.10 IDDQTestPoint statement 10722.11 Stop statement 10822.12 ScanChain statement 10823. Pattern block 10823.1 Pattern block syntax. 10823.2 Pattern initialization. 10923.3 Pattern examples 10924. Procedures and MacroDefs blocks. 10924.1 Procedures block 11024.2 Procedures example . 11124.3 MacroDefs block 11124.4 Scan testing 11124.5 Procedure and Macro Data substitution. 112viii Copyright 1999 IEEE. All rights reserved.Annex A (informative) Glossary . 116Annex B (informative) STIL data model. 117Annex C (informative) GNU GZIP reference . 122Annex D (informativ